Did You Know...
...that in 1800 ether was first used by partyers as a fun diversion? Sniffing the gas led to hilarious and raucous laughter as people watched each other become more and more intoxicated and silly. Several doctors independently realized the value ether would have to anesthetize surgery patients. Of those who claimed rights to the "discovery," none had a happy ending. One had a seizure and died defending his rights. Another spent his life in an asylum because he had been denied acclaim. A third became addicted to chloroform and, in a New York City jail, he soaked a cloth in the drug, severed an artery and bled to death.
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| Number | Title | Issue Date |
| 8155270 | Synergistic energy-dispersive and wavelength-dispersive X-ray spectrometry An X-ray spectroscope collects an energy-dispersive spectrum from a sample under analysis, and generates a list of candidate elements that may be present in the sample. A wavelength dispersive spectral collector is then tuned to obtain X-ray intensity measurements a... | 04/10/2012 |
| 7519154 | Systems and methods for using a crystallinity of a substance to identify the substance A method for naming a substance is described. The method includes using a crystallinity of the substance to name the substance. ... | 04/14/2009 |
| 7358494 | Material composition analysis system and method The material composition of a thin film formed on a substrate or covered by a cap layer that shares one or more elements with the thin film can be determined by combining characteristic material data, such as characteristic x-ray data, from a material composition an... | 04/15/2008 |
| 7321652 | Multi-detector EDXRD A method for analysis of a sample includes irradiating an area of the sample with a polychromatic X-ray beam. X-rays scattered from the sample are detected using a plurality of detectors simultaneously in different, respective positions, whereby the detectors genera... | 01/22/2008 |
| 7310410 | Single-leaf X-ray collimator A single-leaf X-ray collimator comprises at least one collimating leaf member having at least one collimating aperture. The collimating leaf member is adapted to be configured to rotate about at least one of a vertical or horizontal plane. The collimator provides el... | 12/18/2007 |
| 7286628 | Phase-contrast enhanced computed tomography A phase-contrast x-ray computed tomography scanner, a monochromatic diffraction computed tomography scanner, a rotatable monochromatic diffraction computed tomography scanner, and a combination phase-contrast and monochromatic computed tomography scanner are provide... | 10/23/2007 |
| 7254212 | Particulate matter analyzer, collecting filter and system for analyzing and collecting samples from fluids A system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass measuring unit and composition analyzing unit can be provided for eithe... | 08/07/2007 |
| 7248669 | Method for analyzing membrane structure and apparatus therefor A method and apparatus for analyzing a membrane structure by fitting simulated operation data to measured data obtained by X-ray reflectivity measurement to analyze the membrane structure. The analysis result obtained by the fitting can be prevented from falling int... | 07/24/2007 |
| 7239245 | Method and device for monitoring position of radioactive materials in vehicles A method and device for monitoring the position of radioactive materials in vehicles relates to a technical field of monitoring of radioactive materials. The method comprises following steps: powering on a monitoring device, after initializing, the device automatica... | 07/03/2007 |
| 7231016 | Efficient measurement of diffuse X-ray reflections A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse ref... | 06/12/2007 |
| 7184517 | Analytical method for determination of crystallographic phases of a sample An analytical method for determining crystallographic phases of a measuring sample comprises the steps of acquiring a diffraction pattern of the measuring sample and qualitative phase analysis of the measured diffraction pattern, acquiring an element spectrum of the... | 02/27/2007 |
| 7130376 | X-ray reflectometry of thin film layers with enhanced accuracy A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a surface of the sample and sensing the radiation reflected from the su... | 10/31/2006 |
| 7127037 | Soller slit using low density materials A Soller slit device is provided for collimation of high energy radiation, such as X-ray or EUV radiation, and has a low angle of divergence (less than 0.1°) and a high transmission efficiency (60 to 80% or greater). The Soller slit is made up of multiple, parallel... | 10/24/2006 |
| 7123763 | Image discrimination apparatus and image discrimination method An apparatus and method are provided for determining whether diaphragmatic radiation has been employed to obtain an autoradiograph of an object using a radiographic device having a diaphragmatic radiation function. An autoradiographic signal is entered and a first c... | 10/17/2006 |
| 7103142 | Material analysis using multiple X-ray reflectometry models A method for inspection of a sample includes irradiating the sample with a beam of X-rays, measuring a distribution of the X-rays that are emitted from the sample responsively to the beam, thereby generating an X-ray spectrum, and applying a multi-step analysis to t... | 09/05/2006 |
| 7092485 | X-ray inspection system for detecting explosives and other contraband A baggage scanning system and method employ combined angular and energy dispersive x-ray scanning to detect the presence of a contraband substance within an interrogation volume of a baggage item. The interrogation volume is illuminated with penetrating, polychromat... | 08/15/2006 |
| 7062014 | X-ray analyzer for analyzing plastics An object is to reduce the influence of chlorine in plastics when the metal concentrations in the plastics are analyzed. In an X-ray analyzer including an X-ray generating part for irradiating primary X-rays onto a sample and an X-ray detector for detecting an X-ray... | 06/13/2006 |
| 7046834 | Method for measuring bone mineral density by using X-ray image A method for measuring a bone mineral density, by use of an x-ray image, in a bone mineral density measuring system, includes the steps of: (a) obtaining an X-ray image of bone; (b) setting a region of interest on the obtained X-ray image of bone; (c) calculating a ... | 05/16/2006 |
| 7042978 | Examination of material samples A device (1; 1a) for the examination of at least one material sample (3; 3a, 3b, 3c) which can be inserted into the device (1; 1a) and is irradiated by means of electromagnetic waves (4), n... | 05/09/2006 |
| 7039158 | Multi-technique thin film analysis tool A thin film analysis system includes multi-technique analysis capability. Grazing incidence x-ray reflectometry (GXR) can be combined with x-ray fluorescence (XRF) using wavelength-dispersive x-ray spectrometry (WDX) detectors to obtain accurate thickness measuremen... | 05/02/2006 |
| 7035374 | Optical device for directing x-rays having a plurality of optical crystals Devices for improving the capturing and utilization of high-energy electromagnetic radiation, for example, x-rays, gamma rays, and neutrons, for use in physical, medical, and industrial analysis and control applications are disclosed. The devices include optics havi... | 04/25/2006 |
| 7027632 | Image discrimination apparatus and image discrimination method According to the present invention, provided are an image discrimination apparatus and an image discrimination method for determining whether diaphragmatic radiation has been employed to obtain an autoradiograph of an object using a radiographic device having a diap... | 04/11/2006 |
| 6956928 | Vertical small angle x-ray scattering system A small angle x-ray diffraction scattering system has a vertical orientation, allowing for simplified analysis of liquid samples. The system may function in a beam-up or a beam-down configuration. An x-ray source provides an initial x-ray beam that is directed verti... | 10/18/2005 |
| 6947520 | Beam centering and angle calibration for X-ray reflectometry A method for testing a surface of a sample includes irradiating the surface at a grazing incidence with a beam of radiation having a focal region, whereby the radiation is reflected from the surface. At least one of the focal region and the sample is adjusted throug... | 09/20/2005 |
| 6934359 | Wavelength dispersive XRF system using focusing optic for excitation and a focusing monochromator for collection X-ray fluorescence (XRF) spectroscopy systems and methods are provided. One system includes a source of x-ray radiation and an excitation optic disposed between the x-ray radiation source and the sample for collecting x-ray radiation from the source and focusing the... | 08/23/2005 |
| 6907107 | Method and apparatus for the analysis of material composition A method is provided of analysing the composition of a semiconductor material (3) comprising irradiating the material with energy from an energy source (1) which energy is diffracted from the material, detecting one or more portions of the diffracted e... | 06/14/2005 |
| 6788760 | Methods and apparatus for characterizing thin films Methods and apparatus are providing for characterizing thin films in an integrated circuit device. A target including multiple layers is scanned using an x-ray emission inducer. X-ray emissions characteristic of materials in the target are measured. In one example, ... | 09/07/2004 |
| 6744850 | X-ray reflectance measurement system with adjustable resolution An x-ray reflectometry system for measuring thin film samples. The system includes an adjustable x-ray source, such that characteristics of an x-ray probe beam output by the x-ray source can be adjusted to improve the resolution of the measurement system. The x-ray ... | 06/01/2004 |
| 6577705 | Combinatorial material analysis using X-ray capillary optics Method and system for analyzing local composition and structure of a compound having one or more non-zero gradients in concentration for one or more selected constituents in a selected direction. A beam of X rays having representative energy E is received... | 06/10/2003 |
| 6574305 | Device and method for the inspection of the condition of a sample A device and method having a stationary radiation source for directing polychromatic radiation such that the radiation is incident on a sample to be inspected in parallel or diverging rays, and a position-sensitive, energy-sensitive detector for measuring... | 06/03/2003 |
| 6526119 | Method and arrangement for determining the moisture content of wood chips A method and arrangement for measuring the moisture content of a flow of wood chips, through which collimated gamma radiation is directed attenuation of which in the flow of wood chips is measured. The flow of wood chips is shaped by transporting it on a ... | 02/25/2003 |
| 6285736 | Method for X-ray micro-diffraction measurement and X-ray micro-diffraction apparatus An X-ray micro-diffraction measuring method for detecting X-rays diffracted at a minute portion of a specimen upon irradiating the minute portion with X-rays is disclosed. A cylindrical stimulation type fluorescent member is arranged around the specimen. ... | 09/04/2001 |
| 6118850 | Analysis methods for energy dispersive X-ray diffraction patterns Energy dispersive x-ray diffraction spectra are obtained from numerous volume elements within an object. A feature set such as a set of cepstrum coefficients is extracted from each spectrum and classified by a trained classifier such as a neural network t... | 09/12/2000 |
| 6108401 | Method of standard-less phase analysis by means of a diffractogram A method of determining the concentrations of the constituents in a mixture of substances by way of an X-ray diffractogram of the mixture. The fundamental difficulty that it is not possible to determine the entire power spectrum (PS) of the diffraction is... | 08/22/2000 |
| 6040198 | Element concentration measuring method and apparatus, and semiconductor device fabrication method and apparatus X-rays are irradiated to a sample to be measured including at least one layer of film formed on a substrate; an interference oscillation curve of the X-rays incident on the sample to be measured is measured; and a concentration of an element adhered on a ... | 03/21/2000 |
| 6002136 | Microscope specimen holder and grid arrangement for in-situ and ex-situ repeated analysis A specimen holder and specimen grid orientation arrangement facilitating in-situ and ex-situ repeated analysis of a specimen in a microscope. The arrangement includes a specimen grid, to which the specimen is affixed, having an alignment aid. The arrangem... | 12/14/1999 |
| 5923720 | Angle dispersive x-ray spectrometer An x-ray spectrometer is provided comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved crystal monochromator comprising a shape which is substantially identical to a logarith... | 07/13/1999 |
| 5838757 | Hard x-ray polycapillary telescope An x-ray telescope has a tubular housing subdivided into M number of radial segments each having a detector for detecting x-rays and an optic module for focussing x-rays onto the detector. The optic modules have polycapillary fibers assembled in subunit l... | 11/17/1998 |
| 5812630 | Examination method for the evaluation of location-dependent spectra The invention relates to an examination method whereby a respective spectrum with a number of spectral values is measured for a number of locations. Collective evaluation of the old spectra is enabled by the following steps: a) formation of a data matrix ... | 09/22/1998 |
| 5790628 | X-ray spectroscope The following arrangement is adopted to achieve an X-ray spectroscope capable of simultaneously spectrally analyzing, with a single spectral scanning, X-rays emitted from a point-like X-ray source in a plurality of wavelength ranges such that X-rays in a ... | 08/04/1998 |
