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| Number | Title | Issue Date |
| 7995706 | Electromagnetic wave/particle beam spectroscopic method and electromagnetic wave/particle beam spectroscopic instrument The present invention provides an electromagnetic wave/particle beam spectroscopic instrument that is not easily deteriorated in spectroscopic capability, and is resistant to electromagnetic noise, vibrations, heavy sound, heat and specific particle beams of interes... | 08/09/2011 |
| 7742565 | Method and apparatus for analysis using X-ray spectra A method for precisely measuring and displaying the whole profile of an X-ray spectral waveform, which rises from a background level and finally returns to the background level after passing across a peak. X-rays are counted for a time interval of to at a spectral p... | 06/22/2010 |
| 7688946 | Method and device for measuring bond energy The adhesion between two layers, in particular two thin layers of a microelectronic device, is a data item of importance. It was found that the closure ratio of the interface could be used, in non-destructive manner, to determine a measurement of bond energy. A meth... | 03/30/2010 |
| 7469037 | Method for detecting a mass density image of an object A method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted from the object. The transmitted beam is directed at an angle of incidence upon a crystal analyzer. A diffracted beam is emitt... | 12/23/2008 |
| 7412022 | Non-invasive stationary system for three-dimensional imaging of density fields using periodic flux modulation of compton-scattered gammas A three-dimensional image-generating device is an inspection system incorporating three components: a radiation source, a modulating unit, and a radiation detector. All three components of the inspection system may be stationary. The radiation source irradiates an e... | 08/12/2008 |
| 7394890 | Optimized x-ray energy for high resolution imaging of integrated circuits structures An x-ray imaging system uses particular emission lines that are optimized for imaging specific metallic structures in a semiconductor integrated circuit structures and optimized for the use with specific optical elements and scintillator materials. Such a system is ... | 07/01/2008 |
| 7358494 | Material composition analysis system and method The material composition of a thin film formed on a substrate or covered by a cap layer that shares one or more elements with the thin film can be determined by combining characteristic material data, such as characteristic x-ray data, from a material composition an... | 04/15/2008 |
| 7356119 | X-ray examination method and apparatus An X-ray examination method comprises setting a tube voltage of an X-ray tube to a tube voltage that makes an X-ray absorptance difference between a first X-ray propagation medium and a second X-ray propagation medium in an object become not more than 10%, applying ... | 04/08/2008 |
| 7352845 | Energy dispersion type X-ray diffraction/spectral device A white X-ray generating means and an X-ray detecting means are respectively moved to a first position and a second position that are separated, X-ray intensities, for each energy, detected at respective positions by the X-ray detecting means are obtained as first d... | 04/01/2008 |
| 7346145 | X-ray imaging system To obtain an image that uses both an accurate spatial differential of an object-caused phase shift and the phase shift as contrast at a small observation field of view and under a simplified apparatus configuration , , , . a spatial differential of the object... | 03/18/2008 |
| 7330530 | Diffraction enhanced imaging method using a line x-ray source A method for detecting an enhanced image of an object by independently analyzing, detecting, digitizing, and combining images acquired on a high and a low angle side of a rocking curve of a crystal analyzer. An x-ray beam generated by a line x-ray source is collimat... | 02/12/2008 |
| 7321652 | Multi-detector EDXRD A method for analysis of a sample includes irradiating an area of the sample with a polychromatic X-ray beam. X-rays scattered from the sample are detected using a plurality of detectors simultaneously in different, respective positions, whereby the detectors genera... | 01/22/2008 |
| 7283613 | Method of measuring the momentum transfer spectrum of elastically scattered X-ray quanta A method of measuring a momentum transfer spectrum of elastically scattered X-ray quanta which emanate from a scatter voxel inside an object to be examined is described. A scatter voxel emits X-radiation in an X-direction and has a primary collimator which allows th... | 10/16/2007 |
| 7280636 | Device and method for producing a spatially uniformly intense source of x-rays An x-ray source for producing a uniformly intense area x-ray beam. The x-ray source includes a vacuum chamber. An area electron emitter is disposed at a first end of the vacuum chamber. A target material is disposed at a second end of the vacuum chamber and spaced a... | 10/09/2007 |
| 7248669 | Method for analyzing membrane structure and apparatus therefor A method and apparatus for analyzing a membrane structure by fitting simulated operation data to measured data obtained by X-ray reflectivity measurement to analyze the membrane structure. The analysis result obtained by the fitting can be prevented from falling int... | 07/24/2007 |
| 7242746 | Method for manufacturing a reflector for X-ray radiation A method for manufacturing a reflector (5) for X-ray radiation (2, 3, 10, 11) which is curved in a non-circular arc shape, along a first cross-section (13) in a plane (XZ) which contains a x-direction, wherein the reflector (5) is also cu... | 07/10/2007 |
| 7231071 | Abnormal shadow detecting system In an abnormal shadow detecting system, a characteristic value on the shape and/or the density of a prospective area of a micro calcification shadow set in an image of an object is extracted on the basis of image data representing the image of the object, and whethe... | 06/12/2007 |
| 7231017 | Lobster eye X-ray imaging system and method of fabrication thereof A Lobster Eye X-ray Imaging System based on a unique Lobster Eye (LE) structure, X-ray generator, scintillator-based detector and cooled CCD (or Intensified CCD) for real-time, safe, staring Compton backscatter X-ray detection of objects hidden under ground, in cont... | 06/12/2007 |
| 7224824 | Computerized adaptive imaging Apparatus for computational adaptive imaging comprises the following: an image information acquirer, which provides information relating to the refractive characteristics in a three-dimensional imaged volume; a ray tracer, which uses the information relating to the ... | 05/29/2007 |
| 7209541 | X-ray analysis apparatus An X-ray analysis apparatus in which X-rays emitted from an X-ray source are applied to a sample and a two-dimensional CCD sensor detects the X-rays diffracted by the sample. The X-ray analysis apparatus includes a scan-moving means for scan-moving the two-dimension... | 04/24/2007 |
| 7188998 | Systems and methods for quasi-simultaneous multi-planar x-ray imaging Systems and methods for obtaining two-dimensional images of an object, such as a patient, in multiple projection planes. In one aspect, the invention advantageously permits quasi-simultaneous image acquisition from multiple projection planes using a single radiation... | 03/13/2007 |
| 7189974 | EUV light spectrum measuring apparatus and calculating method of EUV light intensity A measuring apparatus for measuring a spectrum of extreme ultraviolet light that diverges from a divergent center point of an extreme ultraviolet light source, includes a spectrum measuring unit that includes a spectrometer and a detector that has a spatial resoluti... | 03/13/2007 |
| 7130376 | X-ray reflectometry of thin film layers with enhanced accuracy A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a surface of the sample and sensing the radiation reflected from the su... | 10/31/2006 |
| 7116754 | Diffractometer A monochromator 4 is used to direct X-rays from X-ray source 2 onto a sample 14 as a convergent beam. The sample 14 is in a growth chamber. The sample is rotated, and diffraction measurements are made in parallel with multichannel detecto... | 10/03/2006 |
| 7113566 | Enhancing resolution of X-ray measurements by sample motion A method for inspection of a sample includes directing a beam of X-rays toward a sample and configuring an array of detector elements to capture the X-rays scattered from the sample. The sample is shifted in a direction parallel to the axis of the array between at l... | 09/26/2006 |
| 7110491 | Measurement of critical dimensions using X-ray diffraction in reflection mode A method for X-ray analysis of a sample includes directing a beam of X-rays to impinge on an area of a periodic feature on a surface of the sample and receiving the X-rays scattered from the surface in a reflection mode so as to detect a spectrum of diffraction in t... | 09/19/2006 |
| 7103142 | Material analysis using multiple X-ray reflectometry models A method for inspection of a sample includes irradiating the sample with a beam of X-rays, measuring a distribution of the X-rays that are emitted from the sample responsively to the beam, thereby generating an X-ray spectrum, and applying a multi-step analysis to t... | 09/05/2006 |
| 7099437 | Double crystal analyzer linkage A double crystal analyzer linkage includes the fixed pivot point, a fixed pivot point shaft, and three sliding axis points constrained to allow only sliding motion along given linear, parallel paths. The three paths are arranged such that one path passes through the... | 08/29/2006 |
| 7076025 | Method for detecting a mass density image of an object A method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted from the object. The transmitted beam is directed at an angle of incidence upon a crystal analyzer. A diffracted beam is emitt... | 07/11/2006 |
| 7076024 | X-ray apparatus with dual monochromators X-ray apparatus, consisting of a single X-ray tube which is adapted to generate X-rays and a first optic which is adapted to focus a first portion of the X-rays onto a region of a sample via a first beam path, thereby generating first scattered X-rays from the regio... | 07/11/2006 |
| 7068753 | Enhancement of X-ray reflectometry by measurement of diffuse reflections A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse ref... | 06/27/2006 |
| 7062013 | X-ray reflectometry of thin film layers with enhanced accuracy A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a surface of the sample and sensing the radiation reflected from the su... | 06/13/2006 |
| 7062015 | Method and apparatus for obtaining simultaneously absorption and refraction images by use of a monochromator with integrated radiation detector Apparatus for imaging an object (13) irradiated with an X-ray beam (12) by detecting a transmitted X-ray beam transmitted through the object. A crystal analyser (15) receives the transmitted X-ray beam and emits a first diffracted X-ray beam to ... | 06/13/2006 |
| 7035375 | X-ray scattering with a polychromatic source A method for inspection of a sample includes irradiating the sample with a polychromatic beam of X-rays, comprising X-ray photons having a range of respective photon energies. The X-rays scattered from the sample are received at a plurality of scattering angles usin... | 04/25/2006 |
| 7035374 | Optical device for directing x-rays having a plurality of optical crystals Devices for improving the capturing and utilization of high-energy electromagnetic radiation, for example, x-rays, gamma rays, and neutrons, for use in physical, medical, and industrial analysis and control applications are disclosed. The devices include optics havi... | 04/25/2006 |
| 7013037 | Image cropping of imaging data and method A technique for selectively processing data from a digital detector includes determining an image area produced by orientation of a radiation source assembly. The assembly may include a radiation source and a collimator, which may be separately orientable. The image... | 03/14/2006 |
| 7003145 | Image cropping for asymmetrical imaging A technique for selectively processing data from a digital detector includes determining an asymmetrical image area produced by orientation of a radiation source assembly. The assembly may include a radiation source and a collimator, which may be separately orientab... | 02/21/2006 |
| 7003075 | Optical measuring device The present invention provides a measuring device by which, even if a radiation intensity from a light source, a beam size or a beam intensity distribution of the light source changes, an optical characteristic of an optical element to be measured can be measured ve... | 02/21/2006 |
| 6980675 | Method for processing images of coronary arteries A method for processing an image of coronary arteries given by an intensity function I(x,y). A function z(x,y) is obtained describing the heart surface. The image is then processed to produce an image having an intensity function I′(x,y) where I′ is obtained in ... | 12/27/2005 |
| 6947521 | Imaging method based on attenuation, refraction and ultra-small-angle-scattering of x-rays A method for detecting an image of an object by measuring the intensity at a plurality of positions of a transmitted beam of x-ray radiation emitted from the object as a function of angle within the transmitted beam. The intensity measurements of the transmitted bea... | 09/20/2005 |
