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| Number | Title | Issue Date |
| 8102967 | Goniometer The invention relates to a goniometer and a method for measuring stresses and characterizing microstructure of particles. The goniometer comprises a base (1), and a measurement head (12) including both an X-ray tube and a detector arc (11) movab... | 01/24/2012 |
| 7660389 | Sample alignment mechanism for X-ray diffraction instrumentation In an X-ray diffraction apparatus, a sample holder has a sample mounted on a pin extending a known distance from a cap that mates with a magnetized base on a goniometer. The sample is mechanically positioned in the center of an X-ray beam by a first movable arm whic... | 02/09/2010 |
| 7646848 | Goniometer The invention relates to a goniometer (1) and a method for measuring stresses and characterizing microstructure of particles. The goniometer comprises frame (4), a measurement head (7, 8, 9, 10) movably adapted to the frame (4) by a first... | 01/12/2010 |
| 7583788 | Measuring device for the shortwavelength x ray diffraction and a method thereof A measuring device for the short-wavelength X-ray diffraction for test samples or work pieces made of lower-atomic-number crystalline and a method thereof are disclosed in the present invention. The measuring device comprises: an X-ray tube, an incident diaphragm, a... | 09/01/2009 |
| 7542547 | X-ray diffraction equipment for X-ray scattering An X-ray scattering chamber 12 includes a housing 14 that may be mounted in X-ray diffraction equipment between an X-ray source 2 and an X-ray detector 4, for example on goniometer arm 6. The housing 14 includes sample holde... | 06/02/2009 |
| 7443952 | X-ray diffraction measurement method and X-ray diffraction apparatus Disclosed is an X-ray diffraction apparatus that irradiates a sample with X-ray emitted from an X-ray source by resting the X-ray using a divergence slit and detects diffracted X-ray generated from the sample using an X-ray detector. The divergence angle of the dive... | 10/28/2008 |
| 7365909 | Fabrication methods for micro compounds optics Methods for fabricating refractive element(s) and aligning the elements in a compound optic, typically to a zone plate element. The techniques are used for fabricating micro refractive, such as Fresnel, optics and compound optics including two or more optical elemen... | 04/29/2008 |
| 7352845 | Energy dispersion type X-ray diffraction/spectral device A white X-ray generating means and an X-ray detecting means are respectively moved to a first position and a second position that are separated, X-ray intensities, for each energy, detected at respective positions by the X-ray detecting means are obtained as first d... | 04/01/2008 |
| 7310410 | Single-leaf X-ray collimator A single-leaf X-ray collimator comprises at least one collimating leaf member having at least one collimating aperture. The collimating leaf member is adapted to be configured to rotate about at least one of a vertical or horizontal plane. The collimator provides el... | 12/18/2007 |
| 7283612 | X-ray diffraction method An open beam x-ray diffraction system and method are provided including modular x-ray heads for being detachably connected to a base unit having a common drive assembly that shifts the heads in an arcuate path during an x-ray diffraction measurement operation. The h... | 10/16/2007 |
| 7274769 | Integrated crystal mounting and alignment system for high-throughput biological crystallography A method and apparatus for the transportation, remote and unattended mounting, and visual alignment and monitoring of protein crystals for synchrotron generated x-ray diffraction analysis. The protein samples are maintained at liquid nitrogen temperatures at all tim... | 09/25/2007 |
| 7269245 | Combinatorial screening system and X-ray diffraction and Raman spectroscopy A sample analysis system makes use of both X-ray diffraction analysis and Raman spectroscopy of a sample. The sample is part of a sample library that is mounted on an XYZ stage that allows each sample to be examined in turn, as the XYZ stage is moved to position suc... | 09/11/2007 |
| 7263162 | Sample mounts for microcrystal crystallography Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surfac... | 08/28/2007 |
| 7258485 | X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer An X-ray thin film inspection apparatus including a sample table on which an inspection target such as a product wafer or the like is mounted, a positioning mechanism for moving the sample table, a goniometer having first and second swing arms, at least one X-ray ir... | 08/21/2007 |
| 7257192 | Method and apparatus for X-ray reflectance measurement In a method for X-ray reflectance measurement in which an intensity of a reflected X-ray is observed for each incident angle, a measuring scale for the incident angle ω is corrected, before the reflectance measurement, using an analyzer crystal. In the corrective o... | 08/14/2007 |
| 7245699 | X-ray optical system with adjustable convergence An x-ray optical device includes an optic and an adjustable aperture that selectively occludes a portion of an x-ray beam. The adjustable aperture may be positioned between the optic and a sample and may be integrated with the optic or located in close proximity to ... | 07/17/2007 |
| 7242745 | X-ray diffraction screening system convertible between reflection and transmission modes An X-ray diffraction apparatus provides analysis in either transmission or reflective mode and easy conversion between the two modes. An X-ray source and X-ray detector are each connected to a different circle of a goniometer. The two circles may be rotated independ... | 07/10/2007 |
| 7242744 | X-ray diffraction apparatus and method In accordance with the present invention, an x-ray diffraction apparatus and method are provided in which an x-ray or goniometer head can be adjusted in different directions to allow the head to direct x-rays at a part from various positions. In this manner, measure... | 07/10/2007 |
| 7215736 | X-ray micro-tomography system optimized for high resolution, throughput, image quality A projection x-ray imaging system that possibly utilizes a laboratory-based micro-focused x-ray source is disclosed. Techniques for optimizing the system for high quality, three dimensional image formation with tomographic imaging with the potential for high resolut... | 05/08/2007 |
| 7145983 | X-ray analysis apparatus An X-ray analysis apparatus is disclosed, in which X-rays emitted from an X-ray source are applied to a sample and a two-dimensional CCD sensor detects the X-rays diffracted by the sample. The X-ray analysis apparatus has a 2θ-rotation drive and a program. The 2θ-... | 12/05/2006 |
| 7130375 | High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especi... | 10/31/2006 |
| 7102311 | Drive control method and drive controller A drive controller (10′) of the present invention comprises control means (28, 29, 32 to 38) configured to perform control to cause a driven element to move by a driver (M) and a collision detecting means (20′) configured to detect a ... | 09/05/2006 |
| 7089612 | Motorized operating table with multiple sections An operating table including at least three elements which are moveable in relation to each other; at least two actuators, each controlling displacement of two elements in relation to the other; a controller which drives each actuator; a sensor to detect a risk of c... | 08/15/2006 |
| 7085349 | X-ray diffractometer for high flux grazing incidence diffraction An X-ray diffractometer (1) comprising an X-ray source (2) emitting a line focus X-ray beam (3; 11) wherein the larger extension of the beam cross section defines a line direction (4; 12) of the X-ray beam (3; 11), further comprisi... | 08/01/2006 |
| 7078712 | monitoring on an ion implanter The present invention is directed to in-situ detection of particles and other such features in an ion implantation system during implantation operations to avoid such additional monitoring tool steps otherwise expended before and/or after implantation, for example. ... | 07/18/2006 |
| 7068753 | Enhancement of X-ray reflectometry by measurement of diffuse reflections A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse ref... | 06/27/2006 |
| 7035373 | X-ray diffraction apparatus An -ray emitted from an incident optical system is incident on a sample supported by a sample support mechanism, and a diffracted X-ray is detected by a receiving optical system. The incident optical system includes an X-ray source and a multilayer-film mirror. An a... | 04/25/2006 |
| 6969033 | Camera mount An omni-positional camera mount for the photographing of small objects (24). The mount has a support (4) to hold an object to be photographed. A first frame (9) is pivotally mounted to the support such that the first frame can pivot on a first p... | 11/29/2005 |
| 6947520 | Beam centering and angle calibration for X-ray reflectometry A method for testing a surface of a sample includes irradiating the surface at a grazing incidence with a beam of radiation having a focal region, whereby the radiation is reflected from the surface. At least one of the focal region and the sample is adjusted throug... | 09/20/2005 |
| 6925146 | X-ray diffraction system An open beam x-ray diffraction system and method are provided including modular x-ray heads for being detachably connected to a base unit having a common drive assembly that shifts the heads in an arcuate path during an x-ray diffraction measurement operation. The h... | 08/02/2005 |
| 6888920 | Low-cost, high precision goniometric stage for x-ray diffractography A low-cost, high precision goniometric stage, for use in x-ray diffractography or in optical systems, with a spherical sector supported on at least one bearing, a top surface of the spherical sector that is used for mounting an object, a center of rotation located w... | 05/03/2005 |
| 6882739 | Method and apparatus for rapid grain size analysis of polycrystalline materials An apparatus and method for performing rapid grain size analysis on a textured polycrystalline material, by generating average grain size and grain size distribution data from x-ray diffraction data of such material. Raw diffraction data is obtained by capturing a p... | 04/19/2005 |
| 6859520 | Transmission mode X-ray diffraction screening system A transmission mode x-ray diffraction screening system has a sample support that holds a sample tray with multiple samples to be tested. The sample support is connected to a translation stage that is movable in three dimensions, and that it offset from the location ... | 02/22/2005 |
| 6831962 | Automatic adjusting method for a goniometer and associated device In order to create a method for the automatic relative adjusting of the position coordinates (xp, yp, zp) of at least one sample with respect to the center coordinates (xm, ym, zm) of a goniometer ( | 12/14/2004 |
| 6825048 | Combinational method for microgram-scale production and characterization of crystalline and amorphous libraries of materials The present invention relates to a method for the wet chemical preparation of materials libraries consisting of a large number of solids, the solids being deposited from reaction mixtures in microreaction chambers onto a bottom plate which simultaneously serves as t... | 11/30/2004 |
| 6748048 | Attachment of x-ray apparatus, high temperature attachment and x-ray apparatus An attachment 3 mounted on a specimen support portion 2 of an X-ray apparatus 1 includes a cover member 9 covering a specimen S and a scattered ray excluding member 8 provided between the cover member 9 and the specimen S. T... | 06/08/2004 |
| 6697453 | Portable X-ray diffractometer In one embodiment, a portable apparatus adapted to be battery powered is used to scan an object in situ with x-rays and measure the intensity of the diffracted x-rays. The apparatus includes a scanning head having an x-ray source that is battery powered a... | 02/24/2004 |
| 6690763 | Device for micro-manipulation of small samples The present invention is directed to a x-y-axis device and a x-y-z-axis device for micro-manipulating or positioning a crystal for x-ray diffraction. More specifically, the devices which may be placed on the head on a goniometer have small footprints (sma... | 02/10/2004 |
| 6518778 | Method of determining angle-of-cut Methods are included for determining deviations from $c;=0° in test resonators based on the quasi-pure modes' displacement ratio variations with $c; angle. A direct relationship between deviation from $c;=0° and the c-mode displacement ratio ha... | 02/11/2003 |
| 6516047 | X-ray diffraction apparatus and method An x-ray diffraction apparatus for qualitatively analyzing a sample uses a fixed or variable divergence slit to irradiate a portion of its surface and intensity data are collected at different angles of diffraction. When measured data thus obtained are co... | 02/04/2003 |
