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Class 378/80 - With environmental control


Subclass of Class 378 - X-ray or gamma ray systems or devices
Definition: Subject matter including means to alter the pressure, temperature,
No. of patents: 37
Last issue date: 07/15/2008


NumberTitleIssue Date
7400705Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatus
Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film at different humidities are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small ...
07/15/2008
7331714Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument
A multifunctional hard x-ray nanoprobe instrument for characterization of nanoscale materials and devices includes a scanning probe mode with a full field transmission mode. The scanning probe mode provides fluorescence spectroscopy and diffraction contrast imaging....
02/19/2008
7281405Method and device for calibration sensors
A method and device are disclosed for calibrating sensors, which sensors are arranged on semiconductor chips and are e.g. to be used for detecting a substance in a fluid. The sensors are calibrated while they are still assembled on a semiconductor wafer by exposing ...
10/16/2007
7274769Integrated crystal mounting and alignment system for high-throughput biological crystallography
A method and apparatus for the transportation, remote and unattended mounting, and visual alignment and monitoring of protein crystals for synchrotron generated x-ray diffraction analysis. The protein samples are maintained at liquid nitrogen temperatures at all tim...
09/25/2007
7263162Sample mounts for microcrystal crystallography
Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surfac...
08/28/2007
7209541X-ray analysis apparatus
An X-ray analysis apparatus in which X-rays emitted from an X-ray source are applied to a sample and a two-dimensional CCD sensor detects the X-rays diffracted by the sample. The X-ray analysis apparatus includes a scan-moving means for scan-moving the two-dimension...
04/24/2007
7170594Device for polymerase chain reactions
A detection device includes a housing containing a chamber configured to receive a specimen, a heating element disposed in the chamber, and an optical window to permit observation of the chamber. The housing includes a passage configured to allow fluid flow through ...
01/30/2007
7120227Method of displaying dynamically scattering vector of X-ray diffraction
The scattering vector of X-ray diffraction is dynamically displayed on a screen. A dynamic motion and tracks of the tip location of the scattering vector of X-ray diffraction is displayed two-dimensionally or three-dimensionally under changing measuring conditions o...
10/10/2006
7079621Vertical transmission diffraction analysis
The present invention relates to a method for performing a transmission diffraction analysis of an analyte on a support surface, wherein the method comprises: irradiating said analyte with a radiation beam generated by a source of radiation, and detecting said radia...
07/18/2006
7003074Stress measurement method using X-ray diffraction
A stress of a c-axis-oriented specimen of a tetragonal polycrystal is measured using X-ray diffraction under the assumption of a plane stress state. An X-ray optical system is set in the location of φ=0°, 45° or 90°. An X-ray diffracted at a crystal plane (the d...
02/21/2006
6968037High throughput X-ray diffraction filter sample holder
Multiple samples are prepared in slurry form and deposited through a funnel plate by a multiprobe liquid handler into an array of inserts situated in openings in a housing. Each insert has a recess that extends through the insert body and a filter disc situated in t...
11/22/2005
6956928Vertical small angle x-ray scattering system
A small angle x-ray diffraction scattering system has a vertical orientation, allowing for simplified analysis of liquid samples. The system may function in a beam-up or a beam-down configuration. An x-ray source provides an initial x-ray beam that is directed verti...
10/18/2005
6927399Devices and methods for detecting the position of a beam
A device is proposed for the precision rotation of samples on a diffractometer, especially for X-ray or synchrotron radiation diffraction experiments, comprising: a centering element (26) which is held at one end of a motor-...
08/09/2005
6911979Derived data display adjustment system
A derived data display adjustment system for a sample analyzer allows user selection of one or more displayed images to be subjected to a derived data calculation process. A derived data user interface is displayed on a display screen in response to user selection o...
06/28/2005
6909772Method and apparatus for thin film thickness mapping
An apparatus and method for mapping film thickness of textured polycrystalline thin films. Multiple sample films of known thicknesses are provided, and each is irradiated by x-ray at a measurement point to generate a diffraction image that captures a plurality of di...
06/21/2005
6896247X-ray analysis system with humidified sample
An X-ray analysis system controls the humidity of a sample. The analysis system has a device for dividing a gas flow stream into two portions and for submerging a membrane humidifier tube, containing one of the gas flows, in a water bath in which the gas passing thr...
05/24/2005
6836532Diffraction system for biological crystal screening
A biological crystal formation screening apparatus uses an x-ray diffraction technique to analyze the sample containers of a sample tray for the presence of crystal formation. An x-ray source is directed toward a sample under investigation, and a two-dimensional x-r...
12/28/2004
6825048Combinational method for microgram-scale production and characterization of crystalline and amorphous libraries of materials
The present invention relates to a method for the wet chemical preparation of materials libraries consisting of a large number of solids, the solids being deposited from reaction mixtures in microreaction chambers onto a bottom plate which simultaneously serves as t...
11/30/2004
6748048Attachment of x-ray apparatus, high temperature attachment and x-ray apparatus
An attachment 3 mounted on a specimen support portion 2 of an X-ray apparatus 1 includes a cover member 9 covering a specimen S and a scattered ray excluding member 8 provided between the cover member 9 and the specimen S. T...
06/08/2004
6590955Open chamber-type X-ray analysis apparatus
An open chamber-type X-ray fluorescence analysis apparatus is provided to analyze a large-sized sample located outside the open chamber. The apparatus has a helium inlet provided in the open chamber for injecting helium gas into the chamber to replace gas...
07/08/2003
6456688X-ray spectrometer and apparatus for XAFS measurements
An X-ray spectrometer having a curved crystal monochromator which diffracts a continuous X-ray beam from an X-ray source to produce a monochromatic X-ray beam. An angle of incidence of the continuous X-ray beam can be changed with respect to the monochrom...
09/24/2002
6408047Method of providing high throughput protein crystallography
The invention provides a method of performing x-ray crystallography on samples by using a robot to select the target sample, to position the sample for x-ray crystallography, and to deposit the sample, all without transferring the sample to another device...
06/18/2002
5848122Apparatus for rapid in-situ X-ray stress measurement during thermal cycling of semiconductor wafers
An apparatus for making rapid in-situ thermal stress measurements includes a controlled atmosphere test chamber for receiving and holding a test sample, and a heating zone within the test chamber confined to the near vicinity of the test sample. A test sa...
12/08/1998
5832054Fluorescent x-ray analyzer with quickly evacuable cover cases
A fluorescent x-ray analyzer of the type irradiating a sample from below is provided with both a larger outer cover case and a smaller outer cover case respectively for covering a relatively large and small sample placed on top of a base plate at the top ...
11/03/1998
5390230Controlled atmosphere, variable volume sample holder for x-ray diffractomer
A sample holder for diffraction analysis protects air or moisture sensitive samples and accommodates samples of different sizes, both without contributing to background noise. In particular, a sample holder for beam diffractometery includes a holder body ...
02/14/1995
5046077Continuous lattice constant measurments and apparatus therefor within a heat furnace
The invention discloses a method and an apparatus for measuring lattice spacings in particular of a single crystal during the growth thereof by vapor deposition while located in a heating furnace....
09/03/1991
4821303Combined thermal analyzer and x-ray diffractometer
Scientific apparatus and a method are described for observing simultaneously both structural and thermodynamic properties of materials. An X-ray diffractometer and a thermal analyzer and mounted to cooperate and coact on the same sample and to complete a ...
04/11/1989
4658411Goniometric device particularly for X-ray or neutron diffractometry on monocrystals or any other sample
A goniometric device particularly for X-ray or neutron diffractometry on monocrystals or any other sample comprises a sample-holder to maintain the monocrystal to be analyzed in the axis of the incident X-ray or neutron beam. Means for driving this sample...
04/14/1987
4602377Diamond-anvil high-pressure cell with improved X-ray collimation system
An adjustable X-ray collimation system for a diamond-anvil high-pressure cell of the type including a cooperable piston and cylinder and a pair of opposing diamonds located between the head of the piston and the head of the cylinder. The X-ray collimation...
07/22/1986
4263510Combined x-ray diffraction and fluorescence spectroscopy apparatus with environmentally controllable chamber
The sensitivity of XRD-XRF apparatus for elements having atomic no. below 16 can be substantially increased by use of an environmentally controllable three-cylinder x-ray path chamber in combination with such apparatus. Use of the chamber has surprisingly...
04/21/1981
4254335Spectrograph-monochromator of grazing incidence type
This invention relates to a spectrograph-monochromator of grazing incidence type which is particularly but not exclusively designed for examining soft x-ray and ultraviolet radiation. the spectrograph-monochromator according to the invention comprises an ...
03/03/1981
4247771Parafocusing diffractometer
A novel parafocusing X-ray diffractometer operates by irradiating a thin ring of fine crystals with a point source of monochromatic X-rays and passing the cone of diffracted X-rays at each focal point through a pinhole to an X-ray sensor, thereby obtainin...
01/27/1981
4078175Apparatus for use in examining the lattice of a semiconductor wafer by X-ray diffraction
An improved apparatus for examining the crystal lattice of a semiconductor wafer utilizing x-ray diffraction techniques. The apparatus is employed in a method which includes the step of recording the image of a wafer supported in a bent configuration conf...
03/07/1978
4076981Position sensitive area detector for use with X-ray diffractometer or X-ray camera
A position sensitive detector including a curved detector housing having a hollow detector chamber therein, the housing having an elongate opening in the curved side wall thereof and an x-ray transmissive material adjacent thereto to render the detector c...
02/28/1978
3992624Apparatus and method of X-ray topography at cryogenic temperature
A method of x-ray topography of crystals at cryogenic temperatures which s not require continuous pumping of the sample chamber during low-temperature operation. The method eliminates the problems of vibrations degrading the high-resolution photographic ...
11/16/1976
3973120Specimen holder for an X-ray diffraction apparatus
A specimen holder comprising a specimen space to be conditioned for an X-ray diffraction apparatus which is provided with a radiation window which is made of beryllium and which closes an opening in the holder over an arc of 180° in a vacuumtight manner....
08/03/1976
3969623Variable temperature flat plate powder diffraction camera
A flat-plate camera for X-ray diffraction studies of powdered materials under various conditions of temperature. A spindle assembly is provided for rotating a sample specimen about the longitudinal axis of the sample and such that the axis of an X-ray bea...
07/13/1976
 
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