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| Number | Title | Issue Date |
| 7974380 | Method and system for crystallization and X-ray diffraction screening An integrated fluidic circuit includes a substrate layer and a first structure coupled to the substrate layer and including a plurality of channels. The first structure is configured to provide for flow of one or more materials through the plurality of channels. The... | 07/05/2011 |
| 7873143 | Sliding sample cell insertion and removal apparatus for x-ray analyzer A sample cell insertion and removal apparatus for an analysis instrument, including a horizontally sliding frame; a sample cell carriage movably mounted to the sliding frame, the sample cell carriage including an area to hold a sample cell; wherein upon sliding into... | 01/18/2011 |
| 7852983 | X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position An X-ray diffractometer has a mechanism without toothed ring and is suited to move the two legs of a goniometer, on which the source and detector are respectively disposed, at the same time and in a correlated fashion. Each goniometer leg (or linkage) thereby has a ... | 12/14/2010 |
| 7848489 | X-ray diffractometer having co-exiting stages optimized for single crystal and bulk diffraction A diffractometer for X-ray diffraction measurements has two co-exiting sample stages which are mounted on the goniometer base simultaneously. A rotation stage is used for single crystal X-ray diffraction and an XYZ stage is used for general X-ray diffraction with bu... | 12/07/2010 |
| 7746980 | X-ray reflectometry system with multiple sample holder and individual sample lifting mechanism An X-ray reflectometry apparatus comprises an X-ray source (1) configured to emit an incident X-ray beam directed onto a sample measuring position and an X-ray detector (2) configured to detect an X-ray beam (3) reflected from a surface of a sel... | 06/29/2010 |
| 7542546 | Sample mounts for microcrystal crystallography Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surfac... | 06/02/2009 |
| 7409041 | Methods of transmission mode X-ray diffraction analysis and apparatuses therefor Methods for transmission mode X-ray diffraction analysis of a sample by means of apparatuses comprising an X-ray radiation source that provides X-ray radiation for irradiating the sample and a detector for detecting X-ray radiation transmitted through and diffracted... | 08/05/2008 |
| 7400704 | High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especi... | 07/15/2008 |
| 7372941 | System and method for matching diffraction patterns A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a simi... | 05/13/2008 |
| 7352845 | Energy dispersion type X-ray diffraction/spectral device A white X-ray generating means and an X-ray detecting means are respectively moved to a first position and a second position that are separated, X-ray intensities, for each energy, detected at respective positions by the X-ray detecting means are obtained as first d... | 04/01/2008 |
| 7331714 | Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument A multifunctional hard x-ray nanoprobe instrument for characterization of nanoscale materials and devices includes a scanning probe mode with a full field transmission mode. The scanning probe mode provides fluorescence spectroscopy and diffraction contrast imaging.... | 02/19/2008 |
| 7311101 | End supporting plate for single crystalline ingot This invention relates to an end supporting plate which can be attached to both ends of cylindrical ingot. By wire saw cutting, semiconductor wafers are sliced from the ingot attached with the end supporting plates. The end supporting plate has an elongated support ... | 12/25/2007 |
| 7274769 | Integrated crystal mounting and alignment system for high-throughput biological crystallography A method and apparatus for the transportation, remote and unattended mounting, and visual alignment and monitoring of protein crystals for synchrotron generated x-ray diffraction analysis. The protein samples are maintained at liquid nitrogen temperatures at all tim... | 09/25/2007 |
| 7269245 | Combinatorial screening system and X-ray diffraction and Raman spectroscopy A sample analysis system makes use of both X-ray diffraction analysis and Raman spectroscopy of a sample. The sample is part of a sample library that is mounted on an XYZ stage that allows each sample to be examined in turn, as the XYZ stage is moved to position suc... | 09/11/2007 |
| 7263162 | Sample mounts for microcrystal crystallography Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surfac... | 08/28/2007 |
| 7258485 | X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer An X-ray thin film inspection apparatus including a sample table on which an inspection target such as a product wafer or the like is mounted, a positioning mechanism for moving the sample table, a goniometer having first and second swing arms, at least one X-ray ir... | 08/21/2007 |
| 7260178 | Diffractometer and method for diffraction analysis Diffractometer and method for diffraction analysis making use of two Euler cradles, a primary and a secondary Euler cradle. The primary Euler cradle supports a source of a radiation beam, having a collimation axis, and a radiation beam detector, having a reception a... | 08/21/2007 |
| 7242743 | X-ray diffraction apparatus and method A high resolution X-ray diffraction apparatus includes a source 4 of X-rays and a slit 6 to direct a collimated beam of X-rays 11 onto a sample 16 on a sample stage 8. Detector 10 records the intensity of diffracted X-rays a... | 07/10/2007 |
| 7242745 | X-ray diffraction screening system convertible between reflection and transmission modes An X-ray diffraction apparatus provides analysis in either transmission or reflective mode and easy conversion between the two modes. An X-ray source and X-ray detector are each connected to a different circle of a goniometer. The two circles may be rotated independ... | 07/10/2007 |
| 7236565 | Tamper to delay motion and decrease ionization of a sample during short pulse x-ray imaging A system for x-ray imaging of a small sample comprising positioning a tamper so that it is operatively connected to the sample, directing short intense x-ray pulses onto the tamper and the sample, and detecting an image from the sample. The tamper delays the explosi... | 06/26/2007 |
| 7227983 | Automated macromolecular crystal detection system and method An automated macromolecular method and system for detecting crystals in two-dimensional images, such as light microscopy images obtained from an array of crystallization screens. Edges are detected from the images by identifying local maxima of a phase congruency-ba... | 06/05/2007 |
| 7190762 | Scanning line detector for two-dimensional x-ray diffractometer A scanning line detector according to the present invention uses a detector with a linear arrangement of detection elements that is moved along a range of diffracted x-ray directions to collect data across a multidimensional detection area. The scanning line detecto... | 03/13/2007 |
| 7162888 | Robot-based automation system for cryogenic crystal sample mounting A method and robot-based automation system are provided for cryogenic crystal sample mounting, for example, for use for cryogenic crystal sample mounting in the x-ray crystallography station at an x-ray source. The system includes a robot arm carrying a handset. The... | 01/16/2007 |
| 7154992 | Phase contrast X-ray device for creating a phase contrast image of an object and method for creating the phase contrast image The invention concerns a phase contrast X-ray device for creating a phase contrast image of at least one object with at least one X-ray source for generating an X-radiation that has a specific spatial coherence within a specific optical distance to the X-ray source ... | 12/26/2006 |
| 7149280 | Synthesis and screening of ligands using X-ray crystallography A method for identifying a ligand of a target macromolecule is disclosed, comprising the steps of: soaking one or more crystals of the target macromolecule in a solution containing a collection of compounds generated in situ or separate from the crystal, where the s... | 12/12/2006 |
| 7130375 | High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especi... | 10/31/2006 |
| 7123686 | Apparatus and method for X-ray analysis An apparatus for X-ray analysis includes (1) a focusing optical system including an X-ray source, a specimen table and a two-dimensional X-ray detector, (2) a device for shifting the angle of incidence of X-rays relative to a specimen supported by the specimen table... | 10/17/2006 |
| 7116754 | Diffractometer A monochromator 4 is used to direct X-rays from X-ray source 2 onto a sample 14 as a convergent beam. The sample 14 is in a growth chamber. The sample is rotated, and diffraction measurements are made in parallel with multichannel detecto... | 10/03/2006 |
| 7116755 | Non-uniform density sample analyzing method, device and system A non-uniform density sample analyzing method for analyzing a distribution state of particle-like matter in a non-uniform density sample, where an actually measured X-ray scattering curve is an in-plane X-ray scattering curve obtained by in-plane diffraction measure... | 10/03/2006 |
| 7085349 | X-ray diffractometer for high flux grazing incidence diffraction An X-ray diffractometer (1) comprising an X-ray source (2) emitting a line focus X-ray beam (3; 11) wherein the larger extension of the beam cross section defines a line direction (4; 12) of the X-ray beam (3; 11), further comprisi... | 08/01/2006 |
| 7079621 | Vertical transmission diffraction analysis The present invention relates to a method for performing a transmission diffraction analysis of an analyte on a support surface, wherein the method comprises: irradiating said analyte with a radiation beam generated by a source of radiation, and detecting said radia... | 07/18/2006 |
| 7069664 | Portable coordinate measurement machine A portable coordinate measurement machine comprises an articulated arm having jointed arm segments. The arm includes joint assemblies which include at least two read heads in communication with a periodic pattern of a measurable characteristic, the pattern and read ... | 07/04/2006 |
| 7042978 | Examination of material samples A device (1; 1a) for the examination of at least one material sample (3; 3a, 3b, 3c) which can be inserted into the device (1; 1a) and is irradiated by means of electromagnetic waves (4), n... | 05/09/2006 |
| 7035373 | X-ray diffraction apparatus An -ray emitted from an incident optical system is incident on a sample supported by a sample support mechanism, and a diffracted X-ray is detected by a receiving optical system. The incident optical system includes an X-ray source and a multilayer-film mirror. An a... | 04/25/2006 |
| 7017275 | Portable coordinate measurement machine with improved handle assembly A portable coordinate measurement machine comprises an articulated arm having jointed arm segments. The arm includes a probe at one end thereof. The probe also includes improved switches and a measurement indicator light. ... | 03/28/2006 |
| 7015041 | Automated method for setting up multiple crystallization experiments in submicroliter volumes A method is provided for performing array microcrystallizations to determine suitable crystallization conditions for a molecule, the method comprising: forming an array of microcrystallizations, each microcrystallization comprising a drop comprising a mother liquor ... | 03/21/2006 |
| 6996912 | Method for improving measurement accuracy of a portable coordinate measurement machine A method for improving the measurement accuracy of a portable coordinate measurement machine which comprises an articulated arm having jointed arm segments is presented. This method includes sensing deformation of a portion of the articulated arm when the arm is pla... | 02/14/2006 |
| 6993113 | Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatus Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to t... | 01/31/2006 |
| 6973734 | Method for providing sensory feedback to the operator of a portable measurement machine A method for providing feedback to the operator of a portable coordinate measurement machine which comprises an articulated arm having jointed arm segments is presented. The method includes sensing deformation of a portion of the articulated arm when the arm is plac... | 12/13/2005 |
| 6970532 | Method and apparatus for measuring thin film, and thin film deposition system The thin film deposition system for depositing a thin film on the surface of substrates disposed in a sealed thin film deposition furnace comprises a measuring unit at a site communicating with the thin film deposition furnace, the measuring unit comprising a thin f... | 11/29/2005 |
