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Patent No. 6055910

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A gun that fires a missile, powered by gas "discharged by the operator of the toy."

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Class 378/75 - Powder technique


Subclass of Class 378 - X-ray or gamma ray systems or devices
Definition: Subject matter wherein the crystal is in pulverized form
No. of patents: 35
Last issue date: 02/07/2012


NumberTitleIssue Date
8111807Crystallite size analysis method and apparatus using powder X-ray diffraction
A sample is supported on a flat rotary specimen stage and irradiated at an incidence angle θ via a divergence slit with an x-ray beam emitted by an x-ray source, the diffraction beam from the sample is received via a divergence slit and the light-receiving slit by ...
02/07/2012
7860217X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same
An X-ray diffraction measuring apparatus equipped with Debye-Scherrer optical system therein, comprises a generator for generating a characteristic X-ray to be irradiated upon a sample to be measured; an X-ray detector being disposed to surround that sample around; ...
12/28/2010
7702071Method for performing power diffraction analysis
A method for successively performing a powder diffraction analysis of at least two powder samples being contained in sample holding means. Use is made of an apparatus comprising:—a source of radiation being adapted to direct a radiation beam to a power sample,—a...
04/20/2010
7469036Analysis of macromolecules, ligands and macromolecule-ligand complexes
A method for determining atomic level structures of macromolecule-ligand complexes through high-resolution powder diffraction analysis and a method for providing suitable microcrystalline powder for diffraction analysis are provided. In one embodiment, powder diffra...
12/23/2008
7372941System and method for matching diffraction patterns
A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a simi...
05/13/2008
7269245Combinatorial screening system and X-ray diffraction and Raman spectroscopy
A sample analysis system makes use of both X-ray diffraction analysis and Raman spectroscopy of a sample. The sample is part of a sample library that is mounted on an XYZ stage that allows each sample to be examined in turn, as the XYZ stage is moved to position suc...
09/11/2007
7263162Sample mounts for microcrystal crystallography
Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surfac...
08/28/2007
7200200X-ray fluorescence measuring system and methods for trace elements
An X-ray fluorescence measuring system and related measuring methods are disclosed, the system using X-ray energy at a level of less than 80 KeV may be directed toward a material, such as coal. The energy fluoresced may be detected (10) and used to measure th...
04/03/2007
7145637Illumination system having a more efficient collector optic
An illumination system having a light source is disclosed, the light source having a source size and emitting radiant power in a spatial angle element Ω(α), α indicating the aperture angle, a collector, which collects radiant power from the source up to a first m...
12/05/2006
7116754Diffractometer
A monochromator 4 is used to direct X-rays from X-ray source 2 onto a sample 14 as a convergent beam. The sample 14 is in a growth chamber. The sample is rotated, and diffraction measurements are made in parallel with multichannel detecto...
10/03/2006
6859519Method and system for analyzing diffraction data from crystalline systems
A method and system for indexing powder diffraction data are disclosed comprising choosing a maximum impurity peak tolerance level for a crystallography data search, choosing a range of number of calculated peaks for possible indexing solutions having a minimum numb...
02/22/2005
6813338Method for measuring powder x-ray diffraction data using one-or-two-dimensional detector
High-resolution powder diffraction is performed using high-energy synchrotron radiation as an x-ray source in such a way that a detector mounted on a measuring instrument such as a diffractometer is moved by smaller distances than the distance between adjacent x-ray...
11/02/2004
6806093Process of parallel sample preparation
An apparatus and process for forming an array of powder samples arranged in predefined locations where all samples have a flat surface in a common plane has been developed. A monolithic block having a main support section having at least N perforations from a first ...
10/19/2004
6782075Method of making <200 nm wavelength fluoride crystal lithography/laser optical elements
The invention provides for the making of
08/24/2004
6751287Method and apparatus for x-ray analysis of particle size (XAPS)
The apparatus comprises an X-ray source (112), a monochromator (118), a goniometer (170), a position sensitive detector (150), a mechanism to rock or rotate the sample or the X-ray source and computer means (160) for interpreting t...
06/15/2004
6678347Method and apparatus for quantitative phase analysis of textured polycrystalline materials
A method for quantitatively determining the phase composition of a sample mixture that comprises two or more textured polycrystalline materials, based on corrected and integrated x-ray diffraction intensities. The effect of texture has been analytically e...
01/13/2004
6677162Process of parallel sample preparation
A process of forming an array of powder samples arranged in predefined locations where all samples have a flat surface in a common plane has been developed. A main support having at least N perforations from a first surface of the main support through a s...
01/13/2004
6327334Method of rapidly screening X-ray powder diffraction patterns
A method for rapidly screening multiple X-ray powder diffraction patterns, such as those generated through combinatorial chemistry, has been developed. The method is directed toward measuring X-ray powder diffraction patterns of a set of samples, factorin...
12/04/2001
6192103Fitting of X-ray scattering data using evolutionary algorithms
Evolutionary algorithms are used to find a global solution to the fitting of experimental X-ray scattering data to simulated models. A recombination operator combines two or more parameter vectors from one iteration of simulated scattering data to form a ...
02/20/2001
5084910X-ray diffractometer sample holder
The present invention relates to a sample holder to be used with an x-ray powder diffractometer. One of the novel features resides in the fact that the sample holder is made of single crystal silicon grown in the [100] direction. This sample holder may ha...
01/28/1992
5003570Powder diffraction method and apparatus
In a stimulable phosphor powder diffraction apparatus, a circularly symmetric diffraction pattern is recorded in the stimulable phosphor. The 2-D diffraction pattern is read out, and the resulting signal is processed to produce a 1-D signal representing t...
03/26/1991
4991191Quantitative analysis of the active table ingredient by power x-ray diffractometry
A method for quantitatively analyzing solid mixtures of a crystalline ingredient and an excipient component in commercial pharmaceutical tablets by x-ray powder diffractometry using the intact tablet as is, without special sample preparation. The method c...
02/05/1991
4800580X-ray analysis apparatus
In an X-ray analysis apparatus provided with a detector comprising photodiode-detection elements, it is possible to eliminate the dark current and the background current from the measurement signals due to the fact that elements in the signal reading devi...
01/24/1989
4796284Polycrystalline X-ray spectrometer
A wavelength dispersive X-ray spectrometer is provided with a polycrystalline analyzer for analyzing characteristic spectra of a sample. The polycrystalline analyzer provides a multiple spectrum of characteristic lines which are separated by appropriate p...
01/03/1989
4770593Sample changer for X-ray diffractometer
A sample changer for powder X-ray diffractometry includes a cylindrical dispensing container for holding a stack of pre-test sample holders, a cylindrical receiving container for holding a stack of post-test sample holders and a changer arm which automati...
09/13/1988
4642811EXAFS spectrometer
An apparatus for performing extend X-ray absorption fine structure (EXAFS) measurements on materials. The EXAFS apparatus is constructed using a conventional X-ray powder diffractometer assembly with a rotating anode X-ray source affixed to the diffractom...
02/10/1987
4592082Quantitative determination of mineral composition by powder X-ray diffraction
An external standard intensity ratio method is used for quantitatively determining mineralogic compositions of samples by x-ray diffraction. The method uses ratios of x-ray intensity peaks from a single run. Constants are previously determined for each mi...
05/27/1986
4413354X-Ray diffraction camera
An X-ray diffraction camera having a hypocycloidal gear train adapted to cause rotation of the sample within the camera about two generally normal axes....
11/01/1983
4274000X-ray powder diffractometer
An X-ray powder diffractometer functioning as a goniometer is disclosed wherein a monochromatic X-ray source is provided together with a sample to be analyzed and a detector means with position sensitive behavior. A transport system for digitally controll...
06/16/1981
4247771Parafocusing diffractometer
A novel parafocusing X-ray diffractometer operates by irradiating a thin ring of fine crystals with a point source of monochromatic X-rays and passing the cone of diffracted X-rays at each focal point through a pinhole to an X-ray sensor, thereby obtainin...
01/27/1981
4199678Asymmetric texture sensitive X-ray powder diffractometer
An interactive computer controlled asymmetric texture-sensitive parafocussing X-ray powder diffractometer employs an incremental rotating specimen device which permits azimuthal rotation (through the angle $c; of the disc-shaped specimen about its surf...
04/22/1980
4144450X-ray powder diffractometer
An X-ray powder diffractometer and associated computing system is disclosed for diffraction analysis of samples by the generation of an intensity diagram. A detector having a position sensitive element is advanced along an arc over a desired angle by a st...
03/13/1979
4094893Isonitrile intercalation complexes
A complex is described of the formula: TX2 (RNC)y wherein TX2 is the inorganic host in which T is selected from the group consisting of titanium, zirconium, hafnium, vanadium, niobium, tantalum, molybdenum and tungsten and mixt...
06/13/1978
4076981Position sensitive area detector for use with X-ray diffractometer or X-ray camera
A position sensitive detector including a curved detector housing having a hollow detector chamber therein, the housing having an elongate opening in the curved side wall thereof and an x-ray transmissive material adjacent thereto to render the detector c...
02/28/1978
3969623Variable temperature flat plate powder diffraction camera
A flat-plate camera for X-ray diffraction studies of powdered materials under various conditions of temperature. A spindle assembly is provided for rotating a sample specimen about the longitudinal axis of the sample and such that the axis of an X-ray bea...
07/13/1976
 
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