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| Number | Title | Issue Date |
| 8139715 | Method and composition for crystallizing G protein-coupled receptors Certain embodiments provide a method for crystallizing a GPCR. The method may employ a fusion protein comprising: a) a first portion of a G-protein coupled receptor (GPCR), where the first portion comprises the TM1, TM2, TM3, TM4 and TM5 regions of the GPCR; b) a st... | 03/20/2012 |
| 8130908 | X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on... | 03/06/2012 |
| 7885383 | Method for measuring crystallite size with a two-dimensional X-ray diffractometer Crystallite size in a sample is determined by performing a quantitative γ-profile analysis on a diffraction ring in a two-dimensional X-ray diffraction pattern. In particular, a two-dimensional X-ray diffraction system is first calibrated with a sample having a kno... | 02/08/2011 |
| 7844028 | X-ray diffraction method An X-ray diffraction method for the analysis of polycrystalline materials, the method comprising: (a) providing a polycrystalline material for analysis; (b) providing a polychromatic X-ray source, wherein the source produces X-rays by accelerating charged particles ... | 11/30/2010 |
| 7792250 | Method of selecting a wellbore cement having desirable characteristics A method for determining the ability of a cement composition to withstand subterranean formation conditions comprising obtaining an experimental diffraction pattern of the cement composition, generating a theoretical diffraction pattern of the cement composition, co... | 09/07/2010 |
| 7769135 | X-ray diffraction wafer mapping method for rhombohedral super-hetero-epitaxy A new X-ray diffraction (XRD) method is provided to acquire XY mapping of the distribution of single crystals, poly-crystals, and twin defects across an entire wafer of rhombohedral super-hetero-epitaxial semiconductor material. In one embodiment, the method is perf... | 08/03/2010 |
| 7680246 | Method and device for judging polarity of single crystal sample Wavelength dependence of diffraction X-ray intensity of a single crystal sample is measured using an X-ray incident optical system of simple structure so that the polarity of the single crystal sample can be judged. When the polarity of the {111} face of a GaAs sing... | 03/16/2010 |
| 7438472 | Automatic cryoloop alignment for protein crystals Methods and apparatus for implementing robust and efficient cryoloop auto-centering for crystal location and alignment to the x-ray beam are provided. Image processing techniques are used for recognition of the small protein crystals. The detected crystal location e... | 10/21/2008 |
| 7421060 | Method of determining an orientation of a crystal lattice of a first substrate relative to a crystal lattice of a second substrate According to an illustrative embodiment disclosed herein, a semiconductor structure comprising a first crystalline substrate and a second crystalline substrate is provided. The semiconductor structure is irradiated with a radiation. Both the first crystalline substr... | 09/02/2008 |
| 7372941 | System and method for matching diffraction patterns A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a simi... | 05/13/2008 |
| 7352845 | Energy dispersion type X-ray diffraction/spectral device A white X-ray generating means and an X-ray detecting means are respectively moved to a first position and a second position that are separated, X-ray intensities, for each energy, detected at respective positions by the X-ray detecting means are obtained as first d... | 04/01/2008 |
| 7342995 | Apparatus for estimating specific polymer crystal A specific macromolecule crystal evaluating device according to the present invention is equipped with a sample detecting stage for detecting a protein crystal in a sample container, an X-ray measuring stage that is spaced from the sample detecting stage and carries... | 03/11/2008 |
| 7337098 | Diffraction condition simulation device, diffraction measurement system, and crystal analysis system A diffraction condition simulation device capable of calculating the UB matrix and the rotation matrix R and also their multiplication RUB, thereby obtaining and displaying any Bragg reflection conditions of any Bragg reflections desired by an operator of said devic... | 02/26/2008 |
| 7310410 | Single-leaf X-ray collimator A single-leaf X-ray collimator comprises at least one collimating leaf member having at least one collimating aperture. The collimating leaf member is adapted to be configured to rotate about at least one of a vertical or horizontal plane. The collimator provides el... | 12/18/2007 |
| 7276219 | Preparation of 157nm transmitting barium fluoride crystals with permeable graphite The present invention is directed to a method of making large diameter metal fluoride sungle crystals that can be used in optical lithograpby systems, for example, excimer laser that operate below 200 nm. In addition, the invention is directed to metal fluoride sing... | 10/02/2007 |
| 7269245 | Combinatorial screening system and X-ray diffraction and Raman spectroscopy A sample analysis system makes use of both X-ray diffraction analysis and Raman spectroscopy of a sample. The sample is part of a sample library that is mounted on an XYZ stage that allows each sample to be examined in turn, as the XYZ stage is moved to position suc... | 09/11/2007 |
| 7263162 | Sample mounts for microcrystal crystallography Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surfac... | 08/28/2007 |
| 7263161 | Analysis device with variably illuminated strip detector An X-ray or neutron-optical analysis device comprising means for directing radiation from a source (1) onto a sample (2), and a detector (7) with n substantially identical detector elements (Di) which are disposed parallel, next to ea... | 08/28/2007 |
| 7258485 | X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer An X-ray thin film inspection apparatus including a sample table on which an inspection target such as a product wafer or the like is mounted, a positioning mechanism for moving the sample table, a goniometer having first and second swing arms, at least one X-ray ir... | 08/21/2007 |
| 7260178 | Diffractometer and method for diffraction analysis Diffractometer and method for diffraction analysis making use of two Euler cradles, a primary and a secondary Euler cradle. The primary Euler cradle supports a source of a radiation beam, having a collimation axis, and a radiation beam detector, having a reception a... | 08/21/2007 |
| 7245695 | Detection of dishing and tilting using X-ray fluorescence A method for testing a material applied to a surface of a sample includes directing an excitation beam, having a known beam-width and intensity cross-section, onto a region of the sample. An intensity of X-ray fluorescence emitted from the region responsively to the... | 07/17/2007 |
| 7234862 | Apparatus for measuring temperatures of a wafer using specular reflection spectroscopy An apparatus (295) using specular reflection spectroscopy to measure a temperature of a substrate (135). By reflecting light (100) from a substrate, the temperature of the substrate can be determined using the band-edge characteristics of the su... | 06/26/2007 |
| 7236565 | Tamper to delay motion and decrease ionization of a sample during short pulse x-ray imaging A system for x-ray imaging of a small sample comprising positioning a tamper so that it is operatively connected to the sample, directing short intense x-ray pulses onto the tamper and the sample, and detecting an image from the sample. The tamper delays the explosi... | 06/26/2007 |
| 7231315 | Distribution goodness-of-fit test device, consumable goods supply timing judgment device, image forming device, distribution goodness-of-fit test method and distribution goodness-of-fit test program A distribution goodness-of-fit test device for testing whether measured data matches an estimated probability distribution has a counting section determination unit, a counting unit and a goodness-of-fit test unit. The counting section determination unit determines ... | 06/12/2007 |
| 7227983 | Automated macromolecular crystal detection system and method An automated macromolecular method and system for detecting crystals in two-dimensional images, such as light microscopy images obtained from an array of crystallization screens. Edges are detected from the images by identifying local maxima of a phase congruency-ba... | 06/05/2007 |
| 7209542 | Simultaneous measurement of the reflectivity of X-ray with different orders of reflections and apparatus for measurement thereof Disclosed are an apparatus and a method for simultaneously measuring integrated reflectivity of X-rays with different orders of reflections in crystal. Continuous X-rays are incident into the crystal and reflection intensities of the X-rays reflected from the crysta... | 04/24/2007 |
| 7208580 | Atomic structure of the hemalbumin complex and its use in designing therapeutic compounds A high resolution structure of the hemalbumin binding complex is provided which includes the detailed atomic coordinates which reflect the binding site and the binding characteristics of the structure. This high resolution structure can be used in methods of determi... | 04/24/2007 |
| 7193628 | Significance-based display Provided is a technique for displaying information. Initially, a number of data points is obtained, each data point including an estimated statistic. A measure of the statistical significance for each estimated statistic also is obtained, and a graph of the data poi... | 03/20/2007 |
| 7184517 | Analytical method for determination of crystallographic phases of a sample An analytical method for determining crystallographic phases of a measuring sample comprises the steps of acquiring a diffraction pattern of the measuring sample and qualitative phase analysis of the measured diffraction pattern, acquiring an element spectrum of the... | 02/27/2007 |
| 7183547 | Element-specific X-ray fluorescence microscope and method of operation An element-specific imaging technique utilizes the element-specific fluorescence X-rays that are induced by primary ionizing radiation. The fluorescence X-rays from an element of interest are then preferentially imaged onto a detector using an optical train. The pre... | 02/27/2007 |
| 7161160 | Needle-shaped cylindrical storage phosphor crystals Needle-shaped CsBr:Eu2+ storage phosphor crystal particles in form of a cylinder suitable for use in flat storage phosphor panels have been provided, wherein said particles have an average cross-section in the range from 1 μm up to 30 μm and an average length, mea... | 01/09/2007 |
| 7160718 | Controlled sample environment for analytical devices Apparatus for examining a sample by microscopy, spectroscopy or crystallography under controlled environmental conditions. The apparatus comprises a sample chamber (1) which is fed by a gas stream (19) having a known vapor content, which is generated b... | 01/09/2007 |
| 7158609 | X-ray crystal orientation measuring method and X-ray crystal orientation measuring apparatus An X-ray crystal orientation measuring apparatus and a method thereof, for enabling to measure distribution of crystal orientations upon a crystal having the sub-grain structure, lineage structure, other than the single domain, with using X-ray, comprises, an XY sta... | 01/02/2007 |
| 7154993 | Method of determining parameters of a sample by X-ray scattering applying an extended genetic algorithm with truncated use of the mutation operator A method of determining parameters of a sample by X-ray scattering comprising the steps of exposing the sample to X-rays and measuring scattered X-ray intensity, generating a parameterized model of the sample which is used for numerical simulation of scattered X-ray... | 12/26/2006 |
| 7149280 | Synthesis and screening of ligands using X-ray crystallography A method for identifying a ligand of a target macromolecule is disclosed, comprising the steps of: soaking one or more crystals of the target macromolecule in a solution containing a collection of compounds generated in situ or separate from the crystal, where the s... | 12/12/2006 |
| 7149279 | Detecting unit for X-ray diffraction measurements Detecting unit comprises position-sensitive detector 1 and collimating system 2, situated in front of its window 19. Collimating system being made in the form of honeycomb structure comprising multitude of tubular channels for transmittance of d... | 12/12/2006 |
| 7145983 | X-ray analysis apparatus An X-ray analysis apparatus is disclosed, in which X-rays emitted from an X-ray source are applied to a sample and a two-dimensional CCD sensor detects the X-rays diffracted by the sample. The X-ray analysis apparatus has a 2θ-rotation drive and a program. The 2θ-... | 12/05/2006 |
| 7144457 | Methods and devices for analyzing crystalline content of precipitates and crystals without isolation Systems and methods are provided for evaluating a crystallization experiment, where a crystallization experiment of a molecule is to X-rays while housed within a container in which the crystallization experiment is performed; and one or more X-ray diffraction patter... | 12/05/2006 |
| 7120227 | Method of displaying dynamically scattering vector of X-ray diffraction The scattering vector of X-ray diffraction is dynamically displayed on a screen. A dynamic motion and tracks of the tip location of the scattering vector of X-ray diffraction is displayed two-dimensionally or three-dimensionally under changing measuring conditions o... | 10/10/2006 |
| 7116753 | Method for determination of elastic strains present in single-crystal wafers and device for its realization Action on the tested wafer 1 is rendered with X-ray beam 3 converging in a point located inside the wafer or under it. Determination of relative position of the interference maxima is performed for diffraction reflections from crystallographic planes h... | 10/03/2006 |
