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| Number | Title | Issue Date |
| 8036338 | Method and device for simultaneous measurement of magnetostriction and magnetization Since measurement of magnetostriction is accompanied by measurement of magnetization, magnetostriction and magnetization are measured conventionally by separately prepared devices, with efforts for observing the same region of the sample. Measurement of the magnetos... | 10/11/2011 |
| 7983388 | X-ray analysis instrument with adjustable aperture window An X-ray analysis instrument, in particular, an X-ray diffractometer (21), has an X-ray source (22; SC) that emits an X-ray beam (23), an X-ray optics (24), in particular a multi-layer X-ray mirror, and a collimator mechanism (BM), wherei... | 07/19/2011 |
| 7924977 | Methods, a processor, and a system for improving an accuracy of identification of a substance Methods, a processor, and a system for improving an accuracy of identification of a substance are described. One of the methods includes determining whether a relative molecular interference function of the substance includes at least one peak. ... | 04/12/2011 |
| 7856083 | System and method to account for cross-talk among coherent scatter detectors A method to account for cross-talk among a plurality of coherent scatter detectors of a multi-detector inverse fan beam x-ray diffraction imaging (MD-IFB XDI) system. The MD-IFB XDI system includes a multi-focus x-ray source (MFXS) that emits radiation sequentially ... | 12/21/2010 |
| 7817779 | Nondestructive analysis method, nondestructive analysis device, and specific object analyzed by the method/device Non-destructive analysis is carried out by irradiating an object with X-rays, for example, so that the X-rays from the object are incident on an analyzer crystal. The analyzer crystal can be of a transmission-type or a reflection-type. A pre-crystal device is used t... | 10/19/2010 |
| 7801272 | X-ray diffraction apparatus and X-ray diffraction method In an X-ray diffraction method using the parallel beam method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The reflective surface of the mirror has a sh... | 09/21/2010 |
| 7742564 | Systems and methods for detecting an image of an object by use of an X-ray beam having a polychromatic distribution Systems and methods for detecting an image of an object using an X-ray beam having a polychromatic energy distribution are disclosed. According to one aspect, a method can include detecting an image of an object. The method can include generating a first X-ray beam ... | 06/22/2010 |
| 7711088 | Method and system for X-ray diffraction measurements using an aligned source and detector rotating around a sample surface An x-ray diffraction measurement apparatus for measuring a sample, having an x-ray source and detector coupled together in a combination for coordinated rotation around the sample, such that x-ray diffraction data can be taken at multiple phi angles. The apparatus m... | 05/04/2010 |
| 7697664 | Systems and methods for determining an atomic number of a substance A method for determining a type of substance is described. The method includes determining an effective atomic number of the substance based on a measured ratio of numbers of detected x-ray scatter photons in a diffraction profile. ... | 04/13/2010 |
| 7672430 | Area X-ray or UV camera system for high-intensity beams A system in one embodiment includes a source for directing a beam of radiation at a sample; a multilayer mirror having a face oriented at an angle of less than 90 degrees from an axis of the beam from the source, the mirror reflecting at least a portion of the radia... | 03/02/2010 |
| 7646847 | Handheld two-dimensional X-ray diffractometer A handheld X-ray diffractometer comprises a miniaturized X-ray source and multiple area detectors to allow the diffractometer to obtain two-dimensional X-ray diffraction images in a large diffraction space without rotating the sample. The source and detectors are lo... | 01/12/2010 |
| 7623624 | Method and apparatus for labeling using optical identification elements characterized by X-ray diffraction An optical identification element for identifying an item. The optical identification element includes a binder material and one or more materials embedded in the binder material. The one or more materials provides an encoded composite X-ray diffraction pattern when... | 11/24/2009 |
| 7590220 | X-ray inspection and detection system and method An X-ray detection and inspection system is disclosed. The system includes an X-ray source configured to generate an interrogating X-ray beam, wherein the X-ray beam is directed towards a probe volume in a sample, one or more two-dimensional area detectors, wherein ... | 09/15/2009 |
| 7564947 | Tomographic energy dispersive X-ray diffraction apparatus comprising an array of detectors of associated collimators A tomographic energy dispersive diffraction imaging apparatus comprises a radiation source for directing incident radiation (1, 3) at a sample (4) mounted on a support, and detection means (9, 10) mounted for detecting radiation transmitted thro... | 07/21/2009 |
| 7558371 | Method of generating X-ray diffraction data for integral detection of twin defects in super-hetero-epitaxial materials A method provides X-ray diffraction data suitable for integral detection of a twin defect in a strained or lattice-matched epitaxial material made from components having crystal structures having symmetry belonging to different space groups. The material is mounted ... | 07/07/2009 |
| 7492863 | Method for developing an x-ray diffraction imaging system A method for developing a virtual representation of an x-ray diffraction imaging system includes generating a symmetry axis, generating a conical shape having a base diameter, a vertex angle α, and a vertex point, locating the vertex point at an origin point on the... | 02/17/2009 |
| 7483513 | Measurement of properties of thin films on sidewalls A method for X-ray analysis of a sample includes directing a beam of X-rays to impinge on an area of a periodic feature on a surface of the sample and receiving the X-rays scattered from the surface in a reflection mode so as to detect a spectrum of diffraction in t... | 01/27/2009 |
| 7471766 | X-ray diffraction apparatus Disclosed is an X-ray apparatus having an X-ray source, an X-ray detector, a divergence slit, and a scattering slit. The incident angle θ of X-ray to be irradiated on a sample is changed at a predetermined angular speed at measurement time and diffracted X-ray dete... | 12/30/2008 |
| 7443952 | X-ray diffraction measurement method and X-ray diffraction apparatus Disclosed is an X-ray diffraction apparatus that irradiates a sample with X-ray emitted from an X-ray source by resting the X-ray using a divergence slit and detects diffracted X-ray generated from the sample using an X-ray detector. The divergence angle of the dive... | 10/28/2008 |
| 7421060 | Method of determining an orientation of a crystal lattice of a first substrate relative to a crystal lattice of a second substrate According to an illustrative embodiment disclosed herein, a semiconductor structure comprising a first crystalline substrate and a second crystalline substrate is provided. The semiconductor structure is irradiated with a radiation. Both the first crystalline substr... | 09/02/2008 |
| 7412131 | Multilayer optic device and system and method for making same An optic device, system and method for making are described. The optic device includes a first solid phase layer having a first index of refraction with a first photon transmission property and a second solid phase layer having a second index of refraction with a se... | 08/12/2008 |
| 7409041 | Methods of transmission mode X-ray diffraction analysis and apparatuses therefor Methods for transmission mode X-ray diffraction analysis of a sample by means of apparatuses comprising an X-ray radiation source that provides X-ray radiation for irradiating the sample and a detector for detecting X-ray radiation transmitted through and diffracted... | 08/05/2008 |
| 7403592 | Digital lock-in detection of site-specific magnetism in magnetic materials The polarization and diffraction characteristics of x-rays incident upon a magnetic material are manipulated to provide a desired magnetic sensitivity in the material. The contrast in diffracted intensity of opposite helicities of circularly polarized x-rays is meas... | 07/22/2008 |
| 7372941 | System and method for matching diffraction patterns A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a simi... | 05/13/2008 |
| 7352845 | Energy dispersion type X-ray diffraction/spectral device A white X-ray generating means and an X-ray detecting means are respectively moved to a first position and a second position that are separated, X-ray intensities, for each energy, detected at respective positions by the X-ray detecting means are obtained as first d... | 04/01/2008 |
| 7342997 | Method for measuring dead time of X-ray detector The dead time of a pulse type X-ray detector is measured without estimation of a true X-ray intensity. The first and the second conditions are used for varying an intensity of an X-ray entering the X-ray detector. The first condition may be the slit width of a recei... | 03/11/2008 |
| 7336012 | Motor, robot, substrate loader, and exposure apparatus An apparatus that reduces vibration generation and magnetic leakage, wherein the apparatus is a motor, an articulated serial robot that has a motor built in, a substrate loader that includes the articulated robot, and a related exposure apparatus equipped with the s... | 02/26/2008 |
| 7331714 | Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument A multifunctional hard x-ray nanoprobe instrument for characterization of nanoscale materials and devices includes a scanning probe mode with a full field transmission mode. The scanning probe mode provides fluorescence spectroscopy and diffraction contrast imaging.... | 02/19/2008 |
| 7295650 | Method for operating a primary beam stop A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source (1) from which corresponding radiation is guided as a primary beam (2) to a sample (4) under investigation, with an X-ray or neutron de... | 11/13/2007 |
| 7292261 | Virtual reality camera A camera including a camera lens, acquisition circuitry receiving images via the camera lens, for acquiring a first field of view when the camera lens is in a first orientation and for acquiring a second field of view when the camera lens is in a second orientation,... | 11/06/2007 |
| 7283613 | Method of measuring the momentum transfer spectrum of elastically scattered X-ray quanta A method of measuring a momentum transfer spectrum of elastically scattered X-ray quanta which emanate from a scatter voxel inside an object to be examined is described. A scatter voxel emits X-radiation in an X-direction and has a primary collimator which allows th... | 10/16/2007 |
| 7283612 | X-ray diffraction method An open beam x-ray diffraction system and method are provided including modular x-ray heads for being detachably connected to a base unit having a common drive assembly that shifts the heads in an arcuate path during an x-ray diffraction measurement operation. The h... | 10/16/2007 |
| 7269245 | Combinatorial screening system and X-ray diffraction and Raman spectroscopy A sample analysis system makes use of both X-ray diffraction analysis and Raman spectroscopy of a sample. The sample is part of a sample library that is mounted on an XYZ stage that allows each sample to be examined in turn, as the XYZ stage is moved to position suc... | 09/11/2007 |
| 7263161 | Analysis device with variably illuminated strip detector An X-ray or neutron-optical analysis device comprising means for directing radiation from a source (1) onto a sample (2), and a detector (7) with n substantially identical detector elements (Di) which are disposed parallel, next to ea... | 08/28/2007 |
| 7263162 | Sample mounts for microcrystal crystallography Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surfac... | 08/28/2007 |
| 7260178 | Diffractometer and method for diffraction analysis Diffractometer and method for diffraction analysis making use of two Euler cradles, a primary and a secondary Euler cradle. The primary Euler cradle supports a source of a radiation beam, having a collimation axis, and a radiation beam detector, having a reception a... | 08/21/2007 |
| 7258485 | X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer An X-ray thin film inspection apparatus including a sample table on which an inspection target such as a product wafer or the like is mounted, a positioning mechanism for moving the sample table, a goniometer having first and second swing arms, at least one X-ray ir... | 08/21/2007 |
| 7242743 | X-ray diffraction apparatus and method A high resolution X-ray diffraction apparatus includes a source 4 of X-rays and a slit 6 to direct a collimated beam of X-rays 11 onto a sample 16 on a sample stage 8. Detector 10 records the intensity of diffracted X-rays a... | 07/10/2007 |
| 7242744 | X-ray diffraction apparatus and method In accordance with the present invention, an x-ray diffraction apparatus and method are provided in which an x-ray or goniometer head can be adjusted in different directions to allow the head to direct x-rays at a part from various positions. In this manner, measure... | 07/10/2007 |
| 7236566 | In-situ X-ray diffraction system using sources and detectors at fixed angular positions An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation—with a collimating optic disposed with respect to t... | 06/26/2007 |
