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| Number | Title | Issue Date |
| 7978820 | X-ray diffraction and fluorescence An instrument capable of both X-ray diffraction, XRD, and X-ray fluorescence measurements, XRF, arranges an X-ray source 10 creating an incident X-ray beam directed to a sample on a sample stage. An X-ray detection system is mounted at a fixed angle 2θ | 07/12/2011 |
| 7831019 | System and methods for characterizing a substance A system and methods for characterizing an unknown substance is described. One of the methods include determining an effective atomic number of the unknown substance as a first function of a first gradient of a first line. ... | 11/09/2010 |
| 7778389 | X-ray imaging system and method The present invention provides an X-ray imaging system and method capable of performing time-resolved observation in a short measurement time at the same density resolution and in the same dynamic range as those for a diffraction enhanced X-ray imaging method, and a... | 08/17/2010 |
| 7742563 | X-ray source and detector configuration for a non-translational x-ray diffraction system A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locati... | 06/22/2010 |
| 7715527 | System and method for matching diffraction patterns A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a simi... | 05/11/2010 |
| 7653177 | Measurement system and method for the noninvasive determination of properties of an object to be examined and contrast medium X-ray phase-contrast measurement A method and a measurement system are disclosed for the noninvasive determination of properties of an object to be examined and to the use of a contrast medium for X-ray phase-contrast measurement. in at least one embodiment of the invention, a mixture (suspension) ... | 01/26/2010 |
| 7620148 | X-ray diffraction (Xrd) means for identifying the content in a volume of interest and a method thereof The present invention discloses an XRD means for identifying the content of a volume of interest (VOI) and a method thereof. A remote XRD means is comprised inter alia of a plurality of x-ray sources target toward the VOI. A plurality of x-ray detectors adapted to r... | 11/17/2009 |
| 7529340 | Systems and methods for identifying a substance A method for iteratively identifying a substance is described. The method includes determining whether a function of a difference between an updated diffraction profile and an original diffraction profile of the substance exceeds a parameter. ... | 05/05/2009 |
| 7519153 | X-ray metrology with diffractors An electron probe microanalysis (EPMA) system includes a graded multilayer diffractor for tightly focusing output x-rays onto an x-ray detector. The graded multilayer construction of the diffractor allows a high x-ray flux to be generated in a small measurement spot... | 04/14/2009 |
| 7483512 | Variable centre diffractometer A diffractometer, having variable center and suitable for performing analysis on hidden or hardly accessible bodies or specimens is described. Said variable center diffractometer is equipped with an analytical unit that comprises: a circle arc structure, called Eule... | 01/27/2009 |
| 7474732 | Calibration of X-ray reflectometry system A method for inspection of a sample includes irradiating the sample with a beam of X-rays and measuring a distribution of the X-rays that are emitted from the sample responsively to the beam, thereby generating an X-ray spectrum. An assessment is made of an effect o... | 01/06/2009 |
| 7418073 | Computed tomography device and method with three-dimensional backprojection The invention relates to a computed tomography method in which an examination zone is irradiated along a circular trajectory by a fan-shaped radiation beam. Radiation coherently scattered in the examination zone is measured by a detector unit, the variation in space... | 08/26/2008 |
| 7415096 | Curved X-ray reflector A method for producing X-ray optics includes providing a wafer of crystalline material having front and rear surfaces and a lattice spacing suitable for reflecting incident X-rays of a given wavelength. A thin film is deposited on the front surface of the wafer so a... | 08/19/2008 |
| 7403593 | Hybrid x-ray mirrors An x-ray mirror provides focusing and monochromatization while maintaining a high degree of reflectivity. The mirror has at least two mirror portions, one with a multilayer surface that provides the desired monochromating, and the other with a total external reflect... | 07/22/2008 |
| 7403592 | Digital lock-in detection of site-specific magnetism in magnetic materials The polarization and diffraction characteristics of x-rays incident upon a magnetic material are manipulated to provide a desired magnetic sensitivity in the material. The contrast in diffracted intensity of opposite helicities of circularly polarized x-rays is meas... | 07/22/2008 |
| 7397900 | Micro beam collimator for high resolution XRD investigations with conventional diffractometers A micro collimator for compressing X-ray beams for use in a X-ray diffractometer is described, wherein said collimator has a channel means for providing a channel guiding said X-ray beams, said channel having a channel entrance portion and a channel exit portion. Th... | 07/08/2008 |
| 7372941 | System and method for matching diffraction patterns A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a simi... | 05/13/2008 |
| 7359206 | Radio frequency isolation system and cover assembly for vacuum electron device A self-guiding cover assembly for a vacuum electron device (VED) enclosure (704, 1316) has a cover (1002, 1302), a pair of guide plates, and a pair of guide elements (1304, 1306). The cover has at least one electrical connector (1314) dis... | 04/15/2008 |
| 7356119 | X-ray examination method and apparatus An X-ray examination method comprises setting a tube voltage of an X-ray tube to a tube voltage that makes an X-ray absorptance difference between a first X-ray propagation medium and a second X-ray propagation medium in an object become not more than 10%, applying ... | 04/08/2008 |
| 7352845 | Energy dispersion type X-ray diffraction/spectral device A white X-ray generating means and an X-ray detecting means are respectively moved to a first position and a second position that are separated, X-ray intensities, for each energy, detected at respective positions by the X-ray detecting means are obtained as first d... | 04/01/2008 |
| 7317784 | Multiple wavelength X-ray source A multiple wavelength X-ray source includes an electron-generating cathode and an anode with multiple target regions, each of which emits X-rays at a different characteristic wavelength in response to the electrons. The different X-ray radiation outputs are focused ... | 01/08/2008 |
| 7311407 | Mirror unit, method of producing the same, and exposure apparatus and method using the mirror unit Disclosed are a mirror unit and a method of producing the same. In one preferred embodiment, the mirror unit includes a mirror with a multilayered film formed on a substrate, the multilayered film having two materials periodically laminated in layers on the substrat... | 12/25/2007 |
| 7295650 | Method for operating a primary beam stop A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source (1) from which corresponding radiation is guided as a primary beam (2) to a sample (4) under investigation, with an X-ray or neutron de... | 11/13/2007 |
| 7286637 | Optical thin film and mirror using the same To provide an optical thin film structure capable of efficiently dissipating heat in an optical thin film which is generated upon irradiating a surface of an X-ray mirror made up of the optical thin film with an X-ray. The optical thin film having an isotope purity ... | 10/23/2007 |
| 7286628 | Phase-contrast enhanced computed tomography A phase-contrast x-ray computed tomography scanner, a monochromatic diffraction computed tomography scanner, a rotatable monochromatic diffraction computed tomography scanner, and a combination phase-contrast and monochromatic computed tomography scanner are provide... | 10/23/2007 |
| 7280634 | Beam conditioning system with sequential optic An x-ray beam conditioning system with a first diffractive element and a second diffractive element. The two diffractive elements are arranged in a sequential configuration, and one of the diffractive elements is a crystal. The other diffractive element may be a mul... | 10/09/2007 |
| 7280636 | Device and method for producing a spatially uniformly intense source of x-rays An x-ray source for producing a uniformly intense area x-ray beam. The x-ray source includes a vacuum chamber. An area electron emitter is disposed at a first end of the vacuum chamber. A target material is disposed at a second end of the vacuum chamber and spaced a... | 10/09/2007 |
| 7277231 | Projection objective of a microlithographic exposure apparatus A projection objective of a microlithographic projection exposure apparatus has a correction device which can correct photoinduced imaging errors without optical elements having to be removed for this purpose. The correction device includes a first optical element a... | 10/02/2007 |
| 7272206 | Method and apparatus for void content measurement and method and apparatus for particle content measurement A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film having voids or particles disorderly dispersed in the matrix, the diffraction peaks being not available for such a sample. The invention incl... | 09/18/2007 |
| 7269245 | Combinatorial screening system and X-ray diffraction and Raman spectroscopy A sample analysis system makes use of both X-ray diffraction analysis and Raman spectroscopy of a sample. The sample is part of a sample library that is mounted on an XYZ stage that allows each sample to be examined in turn, as the XYZ stage is moved to position suc... | 09/11/2007 |
| 7265754 | Method for displaying material characteristic information A system and method for displaying graphical information indicative of a plurality of material characteristics for a portion of a part under test. Energy is directed at the selected portion of the part under test. Resultant energy is detected from the selected porti... | 09/04/2007 |
| 7263161 | Analysis device with variably illuminated strip detector An X-ray or neutron-optical analysis device comprising means for directing radiation from a source (1) onto a sample (2), and a detector (7) with n substantially identical detector elements (Di) which are disposed parallel, next to ea... | 08/28/2007 |
| 7258485 | X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer An X-ray thin film inspection apparatus including a sample table on which an inspection target such as a product wafer or the like is mounted, a positioning mechanism for moving the sample table, a goniometer having first and second swing arms, at least one X-ray ir... | 08/21/2007 |
| 7257192 | Method and apparatus for X-ray reflectance measurement In a method for X-ray reflectance measurement in which an intensity of a reflected X-ray is observed for each incident angle, a measuring scale for the incident angle ω is corrected, before the reflectance measurement, using an analyzer crystal. In the corrective o... | 08/14/2007 |
| 7253901 | Laser-based cleaning device for film analysis tool A system for analyzing a thin film uses an energy beam, such as a laser beam, to remove a portion of a contaminant layer formed on the thin film surface. This cleaning operation removes only enough of the contaminant layer to allow analysis of the underlying thin fi... | 08/07/2007 |
| 7248669 | Method for analyzing membrane structure and apparatus therefor A method and apparatus for analyzing a membrane structure by fitting simulated operation data to measured data obtained by X-ray reflectivity measurement to analyze the membrane structure. The analysis result obtained by the fitting can be prevented from falling int... | 07/24/2007 |
| 7242745 | X-ray diffraction screening system convertible between reflection and transmission modes An X-ray diffraction apparatus provides analysis in either transmission or reflective mode and easy conversion between the two modes. An X-ray source and X-ray detector are each connected to a different circle of a goniometer. The two circles may be rotated independ... | 07/10/2007 |
| 7242135 | High voltage connection for vacuum electron device A high voltage direct current contact for a vacuum electron device (VED), including (a) an outer cathode line having a first hollow cylinder having a first VED connection end, (b) a contact block removably positioned within the outer cathode line, having a heater co... | 07/10/2007 |
| 7236566 | In-situ X-ray diffraction system using sources and detectors at fixed angular positions An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation—with a collimating optic disposed with respect to t... | 06/26/2007 |
| 7231016 | Efficient measurement of diffuse X-ray reflections A method for inspection of a sample having a surface layer. The method includes acquiring a first reflectance spectrum of the sample while irradiating the sample with a collimated beam of X-rays, and processing the first reflectance spectrum to measure a diffuse ref... | 06/12/2007 |
