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| Number | Title | Issue Date |
| 7822174 | Cryotomography x-ray microscopy state An x-ray microscope stage enables alignment of a sample about a rotation axis to enable three dimensional tomographic imaging of the sample using an x-ray microscope. A heat exchanger assembly provides cooled gas to a sample during x-ray microscopic imaging. ... | 10/26/2010 |
| 7796725 | Mechanism for switching sources in x-ray microscope An x-ray imaging system uses a synchrotron radiation beam to acquire x-ray images and at least one integrated x-ray source. The system has an imaging system including sample stage controlled by linear translation stages, objective x-ray lens, and x-ray sensitive det... | 09/14/2010 |
| 7792246 | High resolution imaging A method and apparatus for providing image data which can be used to construct a high resolution image of a region of a target object is disclosed. An embodiment of the method includes the acts of providing incident radiation from a radiation source at a target obje... | 09/07/2010 |
| 7787588 | System and method for quantitative reconstruction of Zernike phase-contrast images The principle of reciprocity states that full-field and scanning microscopes can produce equivalent images by interchanging the roles of condenser and detector. Thus, the contrast transfer function inversion previously used for images from scanning systems can be ap... | 08/31/2010 |
| 7623620 | Reflective X-ray microscope and inspection system for examining objects with wavelengths <100 nm There is provided a reflective X-ray microscope for examining an object in an object plane. The reflective X-ray microscope includes (a) a first subsystem, having a first mirror and a second mirror, disposed in a beam path from the object plane to the image plane, a... | 11/24/2009 |
| 7583787 | Device for improving the resolution capability of an x-ray optical apparatus A device for improving resolution capability of an x-ray optical apparatus for an x-ray incident from a direction of incidence includes a mirror element including a mirror edge formed as a cylindrical shell section around an edge axis. The mirror element is spaced a... | 09/01/2009 |
| 7499521 | System and method for fuel cell material x-ray analysis An imaging technology for fuel cells is based on x-ray microscopy. A metrology system images the electro-chemical interaction areas of solid-oxide fuel cells (SOFC) in-situ. This system takes advantage of both the penetrating power and elemental absorption contrast ... | 03/03/2009 |
| 7474729 | Soft X-ray microscope A soft X-ray microscope includes a table (10); a housing (20) installed to the upper side of the table (10) and having a partition (22); a light source chamber (30) installed lower than the partition (22) of the housing (... | 01/06/2009 |
| 7466796 | Condenser zone plate illumination for point X-ray sources An improved short-wavelength microscope is described in which a specimen sample is placed between a condenser zone plate lens and an objective zone plate lens so that the specimen is aligned with a diffraction order of the condenser zone plate lens that is greater t... | 12/16/2008 |
| 7427757 | Large collection angle x-ray monochromators for electron probe microanalysis X-ray monochromators and electron probe micro-analysis (EPMA) systems using such monochromators are disclosed. A turretless x-ray monochromator may have a cassette of reflectors instead of a turret. The cassette stores a plurality of reflectors that can be inserted ... | 09/23/2008 |
| 7414245 | Scintillator-based micro-radiographic imaging device A scintillation based imaging system. The device utilizes a single-crystal inorganic scintillator to convert ionizing radiation to light in a spectral range or ranges within the visible or ultraviolet spectral ranges. The conversion takes place inside the single cry... | 08/19/2008 |
| 7412131 | Multilayer optic device and system and method for making same An optic device, system and method for making are described. The optic device includes a first solid phase layer having a first index of refraction with a first photon transmission property and a second solid phase layer having a second index of refraction with a se... | 08/12/2008 |
| 7406151 | X-ray microscope with microfocus source and Wolter condenser An x-ray microscope uses a microfocus x-ray source with a focus spot of less than 10 micrometers and a Wolter condenser having a magnification of about four or more for concentrating x-rays from the source onto a sample. A detector is provided for detecting the x-ra... | 07/29/2008 |
| 7394890 | Optimized x-ray energy for high resolution imaging of integrated circuits structures An x-ray imaging system uses particular emission lines that are optimized for imaging specific metallic structures in a semiconductor integrated circuit structures and optimized for the use with specific optical elements and scintillator materials. Such a system is ... | 07/01/2008 |
| 7369695 | Method and apparatus for metal artifact reduction in 3D X-ray image reconstruction using artifact spatial information The present invention relates to a method and apparatus for reducing metal artifact in image reconstruction. In at least one embodiment, the method for reducing metal artifacts in image reconstruction comprises collecting at least one uncalibrated image (an X-ray or... | 05/06/2008 |
| 7369644 | Printed circuit board inspection system combining X-ray inspection and visual inspection A circuit board inspection system combining an X-RAY inspection and a visual inspection comprises a transfer unit (3) that lands an inspected object (1) safely thereon and transfers the inspected object (1) to a predetermined position; a light g... | 05/06/2008 |
| 7352840 | Micro CT scanners incorporating internal gain charge-coupled devices The present invention provides internal gain charge coupled devices (CCD) and CT scanners that incorporate an internal gain CCD. A combined positron emission tomography and CT scanner is also provided. ... | 04/01/2008 |
| 7342995 | Apparatus for estimating specific polymer crystal A specific macromolecule crystal evaluating device according to the present invention is equipped with a sample detecting stage for detecting a protein crystal in a sample container, an X-ray measuring stage that is spaced from the sample detecting stage and carries... | 03/11/2008 |
| 7338178 | Interstellar light collector Devices and methods that collect, concentrate, and disperse celestial light into spectra of different wavelengths by utilizing a large collection mirror and a means for dispersion located at a focal point. ... | 03/04/2008 |
| 7331714 | Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument A multifunctional hard x-ray nanoprobe instrument for characterization of nanoscale materials and devices includes a scanning probe mode with a full field transmission mode. The scanning probe mode provides fluorescence spectroscopy and diffraction contrast imaging.... | 02/19/2008 |
| 7317784 | Multiple wavelength X-ray source A multiple wavelength X-ray source includes an electron-generating cathode and an anode with multiple target regions, each of which emits X-rays at a different characteristic wavelength in response to the electrons. The different X-ray radiation outputs are focused ... | 01/08/2008 |
| 7312432 | Single axis illumination for multi-axis imaging system A single-axis illumination system for a multiple-axis imaging system, particularly an array microscope. A single-axis illumination system is used to trans-illuminate an object viewed with an array of imaging elements having multiple respective axes. The numerical ap... | 12/25/2007 |
| 7312462 | Illumination system having a nested collector for annular illumination of an exit pupil There is provided an illumination system. The illumination system includes a source for light having a wavelength ≦193 nm, a field plane, and a collector having a mirror shell for receiving a part of the light. The mirror shell is arranged so that a real image of ... | 12/25/2007 |
| 7310408 | System and method for X-ray generation by inverse compton scattering A system for generating a tunable X-ray pulse comprises a first electron beam source configured to direct a first electron pulse of predetermined energy and pulse length towards a first interaction zone, a laser beam source configured to direct a first photon pulse ... | 12/18/2007 |
| 7304448 | Developing apparatus and image processing system with the developing apparatus A developing apparatus is capable of moving a stage for supporting a substance to be developed from a detachable position to a developing area below a developing unit, and two-dimensional movement. The present developing apparatus includes a developing device, a fir... | 12/04/2007 |
| 7289597 | Optical axis adjusting mechanism for X-ray lens, X-ray analytical instrument, and method of adjusting optical axis of X-ray lens An optical axis adjusting mechanism for an X-ray lens, an X-ray analytical instrument and a method of adjusting an optical axis of an X-ray lens, capable of enhancing detection efficiency of an X-ray while preventing degradation of the device performance are provide... | 10/30/2007 |
| 7286628 | Phase-contrast enhanced computed tomography A phase-contrast x-ray computed tomography scanner, a monochromatic diffraction computed tomography scanner, a rotatable monochromatic diffraction computed tomography scanner, and a combination phase-contrast and monochromatic computed tomography scanner are provide... | 10/23/2007 |
| 7280634 | Beam conditioning system with sequential optic An x-ray beam conditioning system with a first diffractive element and a second diffractive element. The two diffractive elements are arranged in a sequential configuration, and one of the diffractive elements is a crystal. The other diffractive element may be a mul... | 10/09/2007 |
| 7268945 | Short wavelength metrology imaging system An extreme ultraviolet (EUV) AIM tool for both the EUV actinic lithography and high-resolution imaging or inspection is described. This tool can be extended to lithography nodes beyond the 32 nanometer (nm) node covering other short wavelength radiation such as soft... | 09/11/2007 |
| 7257193 | X-ray source assembly having enhanced output stability using tube power adjustments and remote calibration An x-ray source assembly includes an anode having a spot upon which electrons impinge based on power level supplied to the assembly, and an optic coupled to receive divergent x-rays generated at the spot and transmit output x-rays from the assembly. A control system... | 08/14/2007 |
| 7245696 | Element-specific X-ray fluorescence microscope and method of operation An element-specific imaging technique utilizes the element-specific fluorescence X-rays that are induced by primary ionizing radiation. The fluorescence X-rays from an element of interest are then preferentially imaged onto a detector using an optical train. The pre... | 07/17/2007 |
| 7242744 | X-ray diffraction apparatus and method In accordance with the present invention, an x-ray diffraction apparatus and method are provided in which an x-ray or goniometer head can be adjusted in different directions to allow the head to direct x-rays at a part from various positions. In this manner, measure... | 07/10/2007 |
| 7238947 | Medical information processor, image photographing system, and absorption coefficient calibration method Data of arbitrary penetration thickness can be easily obtained in carrying out a beam hardening calibration. A center tomographic image reconstructed parallel to a center line of a projection data of a water phantom and an X-ray tube is read from an image data serve... | 07/03/2007 |
| 7238943 | Asymmetrically placed cross-coupled scintillation crystals Systems and methods are described for asymmetrically placed cross-coupled scintillation crystals. A method includes coupling a plurality of photomultiplier tubes to a scintillation crystal array, the scintillation crystal array defining a plurality of corner edges, ... | 07/03/2007 |
| 7237914 | Light condenser A light condenser suitable for EUV lithography that includes reflective rings concentric to an optical axis. Each ring has a reflective surface to reflect light rays emanating from a light source so that the light rays converge towards a mask to produce Köhler illu... | 07/03/2007 |
| 7233642 | Radiation imaging apparatus In an apparatus without a helical movement, a reconstruction error considerably increases as a radiation angle increases. In a prior art embodiment, for example, a one-side value of the radiation angle is 9.5 degrees, and it is predicted that the reconstruction erro... | 06/19/2007 |
| 7231017 | Lobster eye X-ray imaging system and method of fabrication thereof A Lobster Eye X-ray Imaging System based on a unique Lobster Eye (LE) structure, X-ray generator, scintillator-based detector and cooled CCD (or Intensified CCD) for real-time, safe, staring Compton backscatter X-ray detection of objects hidden under ground, in cont... | 06/12/2007 |
| 7221731 | X-ray microscopic inspection apparatus To provide an X-ray microscopic inspection apparatus capable of performing non-destructive inspection with high resolving power within a very short period, and having advantageous functions such as a high precision electron probe control function, a CT function, an ... | 05/22/2007 |
| 7221449 | Apparatus for assaying fluorophores in a biological sample An optical device adapted to detect fluorescence from a biological sample. The optical device includes an optical relay to collect fluorescence emitted by the fluorophores and to direct the collected fluorescence towards a detector. ... | 05/22/2007 |
| 7220969 | Mask blanks inspection tool Embodiments include determining whether defects exist in an extreme ultraviolet (EUV) light mask blank. Incident EUV light scattered or diffused by abnormalities in the layers of the mask blank may be measured, normalized, and compared to threshold values to determi... | 05/22/2007 |
