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Class 377/19 - Measuring or testing


Subclass of Class 377 - Electrical pulse counters, pulse dividers, or shift registers: circuits and systems
Definition: Subject matter where pulses are counted in systems for determining
No. of patents: 149
Last issue date: 05/08/2012


1        
NumberTitleIssue Date
8175213System and method for setting counter threshold value
A system and method for configuring threshold values for fixed time delay counters of a System on a Chip (SoC) uses a reference clock signal and one or more frequency sub-range control signals corresponding to a frequency sub-range of the reference clock signal. A f...
05/08/2012
7873139Signal processing device
A signal processing device includes a detecting part that detects intensity of an input signal, a timer part that includes a time constant circuit and measures time based on a time constant of the time constant circuit, and a determination circuit that counts the nu...
01/18/2011
7370535State measuring apparatus and operation control method for the same
An oscillation-type state measuring apparatus has an oscillation-type sensor, a reference oscillation signal generating circuit for producing reference oscillation signals, a beat signal generating circuit for generating beat signals having a beat frequency by synth...
05/13/2008
7339389Semiconductor device incorporating characteristic evaluating circuit operated by high frequency clock signal
In a semiconductor device, a main circuit is operated by a first clock signal, and at least one characteristic evaluating circuit is operated by a second clock signal whose frequency is higher than a frequency of the first clock signal. Also, at least one deteriorat...
03/04/2008
7284445Strain waveform control apparatus, strain waveform regulating member, strain waveform control method by using strain waveform control apparatus, and strain waveform control program
A strain waveform control apparatus of the present invention is adapted to horizontally supporting a printed circuit board over a trestle and cause strains on the printed circuit board by a dropped rigid ball with buffer blocks being located on both surfaces of the ...
10/23/2007
7283926Counter circuits and distance estimation methods
Counting circuits applied to distance estimation for ultra wideband (UWB) application, in which a first counting unit generates a sequence of pseudo-random number series not including zero, a first recoding unit records a first series and a second series from the se...
10/16/2007
7243169Method, system and program for oscillation control of an internal process of a computer program
A method for reducing oscillations of an output value associated with a program to be operatively coupled to a data processing system. The program having an internal process configured to read an input value provided by the program, the input value adjusting a perfo...
07/10/2007
7235987Sensor device using pair of resistive sensor controlled beat oscillators
A sensor device is disclosed that includes a sensor, in which a resistance value is changed in accordance with a change in an environment of the sensor. The sensor device also includes a beat oscillator having plural oscillators of different oscillating frequencies....
06/26/2007
7165463Determination of young's modulus and poisson's ratio of coatings from indentation data
A method is provided for determining Young's modulus and, if desired, Poisson's ratio of a coating on a substrate wherein load-displacement indentation data in the elastic region (either elastic loading or unloading) generated using an indenter is analyzed to interp...
01/23/2007
6998881Semiconductor integrated circuit device
In a circuit for converting an input signal Data1 of high frequency to an output signal Data4 of low frequency, a signal of the frequency band (for example, 10 GHz to 2.5 GHz) which can be processed only with a bipolar ECL circuit is processed with a b...
02/14/2006
7000162Integrated circuit phase partitioned power distribution for stress power reduction
Disclosed is an integrated circuit device, comprising: a first power rail for supplying power to first latch and a circuit during a first clock phase; a second power rail for supplying power to a second latch during a second clock phase; and the circuit coupled betw...
02/14/2006
6978411Memory test system for peak power reduction
A memory test system for peak power reduction. The memory test system includes a plurality of memories, a plurality of memory built-in self-test circuits and a plurality of delay units. Each of the memory built-in self-test circuits comprises a built-in self-test co...
12/20/2005
6947043Method of operating an oscilloscope
An oscilloscope that is capable of displaying simultaneously multiple waveforms representing time evolution of a signal during respective acquisition intervals acquires waveform data using a first set of acquisition parameters and generates a display based on that w...
09/20/2005
6934652On-chip temperature measurement technique
A temperature monitoring technique that eliminates the need for bipolar devices. In one embodiment of the present invention, a long-channel MOS transistor is configured in a diode connection to sense change in temperature. The diode drives a linear regulator and an ...
08/23/2005
6931344Test circuit and semiconductor integrated circuit effectively carrying out verification of connection of nodes
A test circuit is incorporated in a device having an output circuit for outputting a signal, and the test circuit carries out a verification of a connection of nodes of the device. The test circuit has a test data generating circuit and a test output buffer connecte...
08/16/2005
6917191Frequency measurement circuit
A frequency measurement circuit measures a frequency of an input signal. The frequency measurement circuit includes a frequency measurement unit for counting a reference clock during a counting period having a predetermined number of waves of the input signal. The f...
07/12/2005
6882697Digital counter
A digital counter with a dial position having a hardware part which determines the n lowest-value bits of the dial position and a software part which determines the remaining higher-value bits of the dial position includes first and a second software parts as the so...
04/19/2005
6865703Scan test system for semiconductor device
There is provided a scan test system comprising: a semiconductor device including a scan register connected between an input/output pin on an analog input side and an internal system logic; a semiconductor device including a scan register connected between an input/...
03/08/2005
6839397Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits
A circuit configuration for generating control signals for testing high-frequency synchronous digital circuits, especially memory chips, is described. A p-stage shift register which is clocked at a clock frequency corresponding to the high clock frequency of the dig...
01/04/2005
6828817Testing device included in the electrooptic device
The invention provides an electrooptic device and an electronic apparatus, in which the electrical characteristics of many thin-film switching elements formed in a substrate to support an electrooptic material can be accurately inspected. The invention also provides...
12/07/2004
6617610Semiconductor integrated circuit
In a dynamic-type semiconductor integrated circuit in which precharge and evaluation operations are preformed per cycle, an IDDQ test and a light detection test can be conducted during an evaluation period for facilitating diagnosis and failure analysis s...
09/09/2003
6453250Method and apparatus for detection of missing pulses from a pulse train
A method and apparatus for detection of missing pulses from a repetitive pulse train including signal detection circuits for capturing the rising and/or falling edges of an input signal, time-stamping the captured edges, calculating the maximum and minimu...
09/17/2002
6385273Device for testing clock pulse generating circuit
A testing device for checking a clock signal generated by a clock pulse generating circuit. The clock pulse generating circuit outputs a clock signal and a multiplied clock second signal. The testing device includes a reset circuit, a dividing unit and a ...
05/07/2002
6385272Method of counting microorganisms and device for accomplishing the counting
A filter on which living bacteria are captured is processed with an extraction reagent and a luminescence reagent. The state of luminescence of the filter is photographed by a television camera 1 including an optical system and an image acquisition means ...
05/07/2002
6333958Advanced electronics for faster time-correlation analysis of pulse sequences
This invention relates to a method and apparatus for improving the precision of at least one of neutron coincidence counting and neutron multiplicity counting. The method includes the steps of: (1) sampling the real and accidental coincident pulses at the...
12/25/2001
6330297Semiconductor integrated circuit device capable of reading out chip-specific information during testing and evaluation
A semiconductor integrated circuit device has a data holding section for storing information, a counter for counting the number of externally applied pulses, and a comparison/verification section. The comparison/verification section compares an output of ...
12/11/2001
6285730Dust/particle monitor
The invention relates to dust/particle monitors, and particularly but not necessarily exclusively to a method of monitoring fine particles harmful to humans in working environments. Equipment and methods of detection are known but which have several disad...
09/04/2001
6188742Event counter and method for driving a circuit device
An event counter is disclosed which, in one embodiment, provides a reaction timer to time a user's response time to an event. In a second embodiment, the event counter provides a counting device to count the number of occurrences of events or the magnitud...
02/13/2001
6078637Address counter test mode for memory device
A memory having a circuit including a built-in address counter with a test mode. The address counter may be used to generate the memory array addressing for the different array test patterns. The circuit may comprise a logic circuit and a counter circuit....
06/20/2000
5937023Method and circuit for detecting small variations in capacity via delay accumulation
The present invention relates to a method for detecting a minor variation of capacity via accumulation and a circuit for detecting the same. An oscillated pulse signal is generated by a delay accumulating circuit which includes a logic device having an op...
08/10/1999
5764524Method and apparatus for detection of missing pulses from a repetitive pulse train
A method and apparatus for detection of missing pulses from a repetitive pulse train including signal detection circuits for capturing the rising and/or falling edges of an input signal, time-stamping the captured edges, calculating the maximum and minimu...
06/09/1998
5586130Method and apparatus for detecting fault conditions in a vehicle data recording device to detect tampering or unauthorized access
A system and method for detecting fault conditions within a vehicle recording device are disclosed herein. The fault detection technique may be implemented in a vehicle in which are incorporated one or more vehicle sensors for monitoring one or more opera...
12/17/1996
5309087Air core gauge, multi-frequency pulse width modulator system therefor
A pulse-width modulation system provides means for controlling dual-coil, air-core gauges at a various rates over 360 degrees. The system moves a dial needle from one octant of the gauge to the next in response to coded data representing measurands by hol...
05/03/1994
5293774Shaft breakage detection apparatus
Sensors are provided for monitoring the speeds of a turbine and a compressor interconnected by a shaft. Signals from the sensors are used to control the direction of counting of a counter. If the shaft is intact, the counter repeatedly counts up from and ...
03/15/1994
5245873Capacitance-type material level indicator and method of operation
A system and probe for indicating the level of material in a vessel as a function of material capacitance comprising a resonant circuit including a capacitance probe adapted to be disposed in a vessel so as to be responsive to variations in capacitance as...
09/21/1993
5245311Logical comparison circuit for an IC tester
In the case of setting one comparison timing in one operation period, a select signal is set to the "0" level, by which first, second and third counters are each put in the state of operation of a 1-to-4 frequency dividing counter which produces four freq...
09/14/1993
5191295Phase shift vernier for automatic test systems
A phase shift vernier for providing an output signal with continuously variable delay based on an input phase delay is disclosed. The apparatus comprises delay value means, a ring oscillator, a multiplexer, a DAC, and a signal combiner. The delay value me...
03/02/1993
5185709Apparatus and method for measuring pressure changes within pressure vessels
Apparatus and methods for detecting pressure changes within the chamber of a pressure vessel are disclosed. The apparatus includes a pressure transducer which is gauge-referenced to atmospheric pressure and has bi-directional capability of determining pre...
02/09/1993
5123034Automatic anomalous event detection
An automatic anomalous event detection method uses a pair of counters to count the occurrence of main triggers simultaneously with the occurrence of advanced triggers indicative of anomalous events as defined by an operator. The anomalous events may be de...
06/16/1992
5111134Method and apparatus for determining the frequency of short oscillation bursts of electrical signals
In a method and an apparatus for determining the frequency of short oscillation bursts of electrical signals firstly oscillation bursts in desired number are read into a storage means and read out again cyclically adjoined to each other so that an oscilla...
05/05/1992
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