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"What, sir, would you make a ship sail against the wind and currents by lighting a bonfire under her deck? I pray you, excuse me, I have not the time to listen to such nonsense."
Napoleon Bonaparte ; When told of the Robert Fulton steamboat
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| Number | Title | Issue Date |
| 7425896 | Tag testing device, tag testing method, and tag testing program A tag testing device uses an infrared camera to take an image of a plurality of radio frequency identification tags, compares the image with a stored standard tag pattern image storage, and detects defective tags based on the comparison. A radio wave transceiver bul... | 09/16/2008 |
| 7407325 | Method and apparatus for measuring thermophysical properties The present invention provides a method for measuring thermophysical properties that includes: rapid resistive self-heating of a specimen by using a heating current; emitting a light to the specimen heated by the rapid resistive self-heating of the specimen; measuri... | 08/05/2008 |
| 7390123 | Variable emittance surfaces Designs for constructing a surface with variable emittance are described. This is achieved by making a surface where the emissivity varies on a scale smaller than the resolution of a thermal imager viewing the surface. One design utilizes many cylindrical surfaces w... | 06/24/2008 |
| 7325971 | Method and apparatus for locating hydrocarbon deposits A method and apparatus for locating hydrocarbon deposits includes temperature 16 sensor for measuring earth surface temperature at each of a plurality of locations, and a solar absorption sensor 14 for measuring the absorption coefficient of the earth'... | 02/05/2008 |
| 7318671 | Heat-flux based emissivity/absorptivity measurement A mechanism and method for directly observing data from which the thermal emissivity or absorptivity of a surface can be calculated. The invention teaches the use of a substantially planar heat-flux or heat-flow sensor employing a thermopile, to measure the rate of ... | 01/15/2008 |
| 7316505 | Method of defining the emission coefficient of a surface to be heated A method of defining the emission coefficient of a surface to be heated by measuring the temperature of a heating surface and the flow of heat from the heating surface to a surface to be heated to derive a pair of values representative thereof and of selecting a pre... | 01/08/2008 |
| 7205231 | Method for in-situ uniformity optimization in a rapid thermal processing system The present invention is directed to a method for thermally processing a substrate in a thermal processing system. The method provides an amount of heat to the substrate and obtains information associated with the substrate when the amount of heat is provided. For e... | 04/17/2007 |
| 7186978 | Compact emissivity and temperature measuring infrared detector A hand-held, fleet deployable infrared camera with integrated hardware and software providing real time processing of infrared images. The camera senses variable temperature images over a selected object of interest and senses variable emissivities over the object. ... | 03/06/2007 |
| 7156717 | situ finishing aid control A method of using finishing aids for advanced finishing control is described. A finishing surface is used generally to induce frictional wear. The finishing aids with preferred in situ control can improve control of the coefficient of friction, the tangential force ... | 01/02/2007 |
| 7131890 | In situ finishing control An apparatus and method of using a in situ finishing information for finishing semiconductor wafers is described. The method uses operative sensors such as friction sensors for detecting and improving control during finishing. The method can aid control of finishing... | 11/07/2006 |
| 7118271 | Calibrating temperature sensors of weathering devices by means of contactless temperature measurement Calibrating temperature sensors of weathering devices by means of contactless temperature measurement A temperature sensor (10) which is, for example, designed as a black standard sensor and is typically used in apparatuses for artificial weathering of... | 10/10/2006 |
| 7075636 | Apparatus and methods for evaluating performance of endoscopy devices and systems A test and measurement system to assess performance characteristics of an endoscope or other optically based diagnostic or treatment devices. The performance characteristics can include the photometric characteristics, the imaging characteristics and the physical ch... | 07/11/2006 |
| 7059765 | Temperature measuring apparatus and related improvements An apparatus for measuring the temperature of an object. The apparatus includes a device for establishing a standing wave pattern or radiation emanating from the object and a coupling device for coupling the radiation to a detector, such as a measuring radiometer. | 06/13/2006 |
| 7037733 | Method for measuring temperature, annealing method and method for fabricating semiconductor device When the emissivity ε on the reverse face of a substrate 10 is measured during annealing processing for the substrate 10, films made from a material that varies the emissivity ε, such as a first DPS film 15 used for forming a plug 15A, ... | 05/02/2006 |
| 6971793 | Test handler temperature monitoring system The invention provides a temperature monitoring system for a semiconductor test handler. A preparation stage brings a test device to a predetermined temperature for testing at a test platform at said predetermined temperature. At least one radiation sensor, such as ... | 12/06/2005 |
| 6964514 | Temperature measuring apparatus An improved apparatus for measuring the temperature of an object such as a food object. Also, a related method, container, transportation member and production line which utilizes this apparatus. The apparatus includes a coupling device for coupling radiation emanat... | 11/15/2005 |
| 6963692 | Heat-treating methods and systems A method involves increasing a temperature of a workpiece over a first time period to an intermediate temperature, and heating a surface of the workpiece to a desired temperature greater than the intermediate temperature, the heating commencing within less time foll... | 11/08/2005 |
| 6941063 | Heat-treating methods and systems A method involves pre-heating a workpiece to an intermediate temperature, heating a surface of the workpiece to a desired temperature greater than the intermediate temperature, and enhancing cooling of the workpiece. Enhancing cooling may involve absorbing radiation... | 09/06/2005 |
| 6796144 | System and method for glass processing and temperature sensing Techniques for measuring the temperature at various locations through the thickness of glass products and to control the glass processing operation with the sensed temperature information are disclosed. Fluorescence emission of iron or cerium in glass is excited and... | 09/28/2004 |
| 6461036 | System and method for determining stray light in a thermal processing system A system and method for determining the stray radiation within a heating chamber of a thermal processing apparatus. The stray radiation is determined by moving a generally unheated wafer vertically through the heating chamber, and measuring with a detecto... | 10/08/2002 |
| 6379038 | Temperature determining device and process The present invention relates to a device useful for the measurement of the temperature of a radiating body. More particularly, the present invention relates to a radiation pyrometer that detects and compensates for emissivity that changes with wavelength... | 04/30/2002 |
| 6375348 | System and method for the real time determination of the in situ emissivity and temperature of a workpiece during processing A system and method for determining the reflectivity of a workpiece during processing in a heating chamber of a thermal processing apparatus. The system first determines directly the reflectivity of the workpiece outside of the heating chamber of the ther... | 04/23/2002 |
| 6369363 | Method of measuring electromagnetic radiation A method is provide for measuring electromagnetic radiation radiated from a surface of an object that is irradiated by electromagnetic radiation given off by at least one radiation source. The radiation given off by the radiation source is determined by a... | 04/09/2002 |
| 6183127 | System and method for the real time determination of the in situ emissivity of a workpiece during processing A system and method for determining the reflectivity of a workpiece during processing in a heating chamber of a thermal processing apparatus. The system first determines directly the reflectivity of the workpiece outside of the heating chamber of the ther... | 02/06/2001 |
| 6156148 | Process for producing a protective cap for an infrared radiation thermometer that can be introduced into a body cavity The invention is directed to a process for manufacturing a protective cap which is adapted to be fitted to an ear canal temperature measurement probe of an infrared radiation thermometer and to be introduced into a body cavity. The protective cap (1) is f... | 12/05/2000 |
| 6056434 | Apparatus and method for determining the temperature of objects in thermal processing chambers The present invention is generally directed to a system and process for accurately determining the temperature of an object, such as a semiconductive wafer, by sensing and measuring the object radiation being emitted at a particular wavelength. In particu... | 05/02/2000 |
| 5993059 | Combined emissivity and radiance measurement for determination of temperature of radiant object A system and method of measurement of emissivity and radiance of a wafer in a rapid thermal processing chamber enables determination of wafer temperature and control of temperature of the wafer. Mirrors enclose the chamber and reflect radiation from lamps... | 11/30/1999 |
| 5868496 | Non-contact surface temperature, emissivity, and area estimation Method and apparatus for non-contact temperature, emissivity and area estimation for gray and non-gray (uniform and non-uniform surface emissivity) are disclosed. Optical power measurements are obtained for radiation from a surface of interest in multiple... | 02/09/1999 |
| 5864776 | Apparatus and method for detecting an error in the placement of a lead frame on a surface of a die mold A position detection system is provided which, without physical contact, by the use of detected infrared energy emissions determines whether there is correct placement of one or more small objects, e.g., lead frames, on the lower half of a two-part die mo... | 01/26/1999 |
| 5822222 | Multi-wavelength imaging pyrometer An apparatus and method for non-contact real-time measurements of temperature and emissivity profiles of radiant targets with unknown spectral emissivity. The selected points or regions on the radiant target are imaged onto an array of photodetectors thro... | 10/13/1998 |
| 5785426 | Self-calibrated active pyrometer for furnace temperature measurements Pyrometer with a probe beam superimposed on its field-of-view for furnace temperature measurements. The pyrometer includes a heterodyne millimeter/sub-millimeter-wave or microwave receiver including a millimeter/sub-millimeter-wave or microwave source for... | 07/28/1998 |
| 5772323 | Temperature determining device and process The present invention relates to a totally novel device and process useful for the measurement of the temperature of a radiating body. More particularly, the present invention relates to a device that enhances the resolution and repeatability of the measu... | 06/30/1998 |
| 5769540 | Non-contact optical techniques for measuring surface conditions Thermal, optical, physical and chemical characteristics of a substrate (11) surface are determined with non-contact optical techniques that include illuminating (23) the surface with radiation having a ripple intensity characteristic (51), and then measur... | 06/23/1998 |
| 5738440 | Combined emissivity and radiance measurement for the determination of the temperature of a radiant object A system and method of measurement of emissivity and radiance of a wafer in a rapid thermal processing chamber enables determination of wafer temperature and control of temperature of the wafer. Mirrors enclose the chamber and reflect radiation from lamps... | 04/14/1998 |
| 5727017 | Method and apparatus for determining emissivity of semiconductor material A method and apparatus for measuring the emission coefficient of a semiconductor material for light of wavelength λ having photon energy less than the semiconductor bandgap energy is introduced. The reflection coefficient for the light of wavelength λ i... | 03/10/1998 |
| 5690430 | Apparatus and method for measuring temperature and/or emissivity of steel strip during a coating process Method and apparatus for measuring the surface temperature/emissivity of coated steel strip during a coating (e.g., galvannealing) process. The apparatus includes first and second radiation sensors each having a response exponentially related to the recip... | 11/25/1997 |
| 5601366 | Method for temperature measurement in rapid thermal process systems A method for obtaining real-time emissivity and temperature values of a semiconductor wafer in a processing system having at least one lamp (preferably a plurality of lamps arranged in a plurality of zones so as to provide multizone temperature and emissi... | 02/11/1997 |
| 5597237 | Apparatus for measuring the emissivity of a semiconductor wafer Apparatus adapted for use in measuring emissivity of a semiconductor wafer having a radiant energy reflecting surface includes a hollow integrating sphere having first and second spaced apart openings and having an inner surface upon which radiant energy ... | 01/28/1997 |
| 5564830 | Method and arrangement for determining the layer-thickness and the substrate temperature during coating The invention describes a procedure and an arrangement for measurement of temperature and thickness of layer during a deposition or coating process. As coating or depositing processes known technologies of semi-conductor manufacturing arrangements, plasma... | 10/15/1996 |
| 5505543 | Emissivity measurement apparatus and method Method and apparatus for measuring thermal radiation emitted by a sample, and for determining emissivity. The apparatus comprises a chamber in which the sample may be positioned, the chamber comprising a plurality of walls including a first wall containin... | 04/09/1996 |
