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Class 374/57 - Of susceptibility to thermally induced deteriouration, flaw, or failure


Subclass of Class 374 - Thermal measuring and testing
Definition: Subject matter for determining the properties of a specimen
No. of patents: 234
Last issue date: 04/03/2012


1            
NumberTitleIssue Date
8147135Methods and systems for verifying sensor bond integrity
Methods and systems are disclosed for determining an amount of bond between a structure and sensor. A method may include heating a sensor that is operably coupled to a measuring circuit and then measuring an output signal over time. The method may further include de...
04/03/2012
8075180Rapid and easy bottle test
A method for predicting the drop impact resistance of a stretch-blow molded polypropylene container which comprises the steps of measuring the initial size of the container, placing it in an oven, remeasuring its size after removing it from the oven, calculating the...
12/13/2011
7780344Method for evaluating the deterioration of magneto-resistive effect device
The estimation method of the invention for estimating the deteriorations of a magneto-resistive effect device by heat shocks involves applying heat shocks by laser irradiation to a structure including a thin-film magnetic head comprising a magneto-resistive effect d...
08/24/2010
7690839Thermal testing apparatus
A thermal testing apparatuses for a server system (22) includes a heating module (16), at least one temperature sensor (191), a micro control unit (MCU) (192), a trigger controlling circuit (193) and a display module (20). T...
04/06/2010
7670047Exhaust gas temperature sensor inspecting apparatus
A temperature sensor disposed in an exhaust system of an engine is inspected. Determination is made that conditions for inspecting the temperature sensor are satisfied in the current engine load range. The time for the temperature in the exhaust system to reach a va...
03/02/2010
7425093Thermography test method and apparatus for bonding evaluation in sputtering targets
A method and apparatus for thermographically evaluating the bond integrity of a sputtering target assembly is described. The method includes applying a heating or cooling medium or energy to one surface of the assembly and acquiring a graphic recording of a correspo...
09/16/2008
7410291Temperature-measuring device with function indicator
A function indicator for a dual temperature sensor, which indicates the falling off of the sensor from the skin surface (4) of a patient. An evaluating device (2) determines the body temperature from a first measured temperature value (TA) a...
08/12/2008
7401976Detection of defects by thermographic analysis
A mechanism is provided for detecting a defect in a populated sample having a thickness dimension substantially smaller than the length and width dimensions thereof, the populated sample having a first side and an opposite second side, at least said first side of sa...
07/22/2008
7397260Structure and method for monitoring stress-induced degradation of conductive interconnects
A microelectronic element such as a chip or microelectronic wiring substrate is provided which includes a plurality of conductive interconnects for improved resistance to thermal stress. At least some of the conductive interconnects include a metallic plate, a metal...
07/08/2008
7374843Polyolefin microporous membrane and method of evaluating the same
The invention relates to a microporous membrane, which is provided with high safety even under a condition that the interior temperature of a battery becomes high, and which has high permeability and high mechanical strength at the same time. The polyolefin m...
05/20/2008
7374334Performance testing apparatus for heat pipes
A performance testing apparatus for a heat pipe includes an immovable portion having a cooling structure defined therein for cooling a heat pipe needing to be tested. A movable portion is capable of moving relative to the immovable portion. A receiving structure is ...
05/20/2008
7368730Weathering apparatus with UV radiation sources and radiation sensors containing a double-calibrated UV sensor
Weathering apparatus with UV radiation sources and radiation sensors containing a double-calibrated UV sensor A weathering apparatus has one or more UV radiation sources (2) and one or more first sensors (3), which are calibrated for a first spectral s...
05/06/2008
7363831Environmental chamber for electronic systems testing and methods of use
An environmental chamber for use with an environmental contamination testing system provides airborne contaminants effects for electronic systems. The environmental chamber includes a platform for supporting the plurality of electronic systems and receiving the sett...
04/29/2008
7357571Infrared inspection and reporting process
An infrared inspection and reporting process and system obtains inspection data on site via a portable computer. An actual temperature of a component derived from an infrared image and a temperature delta between the temperature of the component and the maximum temp...
04/15/2008
7353722Contactless measurement of the surface temperature of naturally or artificially weathered samples
A holding frame (2) is mounted in a weathering chamber (1) of a weathering tester so that it can be rotated around a xenon radiation source (3), which is located on the cylinder or rotation axis, and an infrared filter (5) placed around i...
04/08/2008
7339676Optical method and system for the characterization of laterally-patterned samples in integrated circuits
Disclosed is a method for characterizing a sample having a structure disposed on or within the sample, comprising the steps of applying a first pulse of light to a surface of the sample for creating a propagating strain pulse in the sample, applying a second pulse o...
03/04/2008
7334938Mold and fungus growth warning apparatus and method
An apparatus for monitoring environmental conditions favorable for mold, mildew and fungus growth includes a microprocessor having a data map, a temperature sensor attached to the microprocessor, a relative humidity sensor attached to the microprocessor, an indicato...
02/26/2008
7329043Thermal properties testing apparatus and methods
An apparatus for testing properties of a product comprising a thermal barrier layer comprises an ignition source, a test stand that extends a sample of the product over the ignition source, and a means for measuring thermal transfer across the sample. The apparatus ...
02/12/2008
7319531Method for measuring a thickness of a coating
A method for measuring a thickness of a coating of a constructional unit, in particular a heat-compatible coating on a component of a gas turbine, includes measuring coordinates of the constructional unit three-dimensionally with a measuring device, in particular an...
01/15/2008
7318672Specimen heater and control system for accelerated weathering test apparatus
An accelerated weathering test apparatus of the type used to concentrate solar radiation upon test specimens including a heating element that transfers energy to the test specimens. A temperature sensor is operatively coupled to one of the test specimens for generat...
01/15/2008
7301619Evaluating a multi-layered structure for voids
A method and apparatus measure properties of two layers of a damascene structure (e.g. a silicon wafer during fabrication), and use the two measurements to identify a location as having voids. The two measurements may be used in any manner, e.g. compared to one anot...
11/27/2007
7287902Systems and methods for thermographic inspection of composite structures
Systems and methods for thermographically inspecting a composite material or honeycombed type structures are disclosed. In one embodiment, a system includes a thermal heat source configured to be either removably coupled to or positioned proximate to the composite m...
10/30/2007
7287903Method and apparatus for rapid thermal testing
An apparatus for rapid thermal testing of samples consisting of a single sample chamber in which the samples are preferably arranged circularly around the opening through which a fluid of varying temperature, preferably air, is introduced to provide for rapid, unifo...
10/30/2007
7275019System and method for information handling system thermal diagnostics
Thermal subsystems of manufactured information handling systems are tested for compliance with desired parameters by running a thermal diagnostics module in firmware during one or more manufacturing activities performed on the information handling system. The therma...
09/25/2007
7269997Non-contact method and system for tire analysis
A non-contact method and system for analyzing tire conditions. The system includes an emitter source for emitting radiation signals towards a tire having a treaded surface between two sidewalls. A detector is provided to receive signals reflected by the tire in resp...
09/18/2007
7248367Characterization of ultra shallow junctions in semiconductor wafers
To measure USJ profile abruptness, a PMR-type optical metrology tool is to perform a series of two or more measurements, each with different pump/probe beam separations. Quadrature (Q) and in-phase (I) measurements are obtained for each measurement and used to deriv...
07/24/2007
7239390Modulated scatterometry
An apparatus for scatterometry measurements is disclosed. The apparatus includes a modulated pump source for exciting the sample. A separate probe beam is directed to interact with the sample and the modulated optical response is measured. The measured data is subje...
07/03/2007
7238382Method and system for characterizing porous materials
A method and system for diagnosing the effectiveness of a treatment on a porous material. For example, the porous material can include a porous low dielectric constant material. In particular, the method can utilize FTIR spectroscopy to characterize the porosity of ...
07/03/2007
7213477Quick disconnect interface for environmental testing
An apparatus (10) tests different products (15). The apparatus (10) includes an environmental chamber (20) for providing thermal shock to the products (15), a conveyor (40) for transporting the products (15) through t...
05/08/2007
7197950System for temperature-controlled testing of hydraulically actuated devices
A temperature controlled hydraulic fluid supply circuit (12) includes a first hydraulic fluid reservoir (18), that has an initial hydraulic fluid (20), and a temperature controlled housing (45). A second hydraulic fluid reservoir (26
04/03/2007
7192185Method of and equipment for checking support means
A method and equipment for checking a support device such as used in an elevator installation. The method and equipment detects reductions in cross-section of the tensile supports in the support device by heating the tensile supports with electrical current flow and...
03/20/2007
7183623Trimmed integrated circuits with fuse circuits
A wafer containing integrated circuits having fuses which are selectively blown to trim circuit perimeters. The fuses are located adjacent scribe lanes, and fuse pads are located in the scribe lanes. The integrated circuits are trimmed by selectively energizing the ...
02/27/2007
7174781Temperature reduction fixture for accelerated weathering test apparatus
An accelerated weathering test apparatus of the type used to concentrate solar radiation upon test specimens including a fixture connected to a target board including a frame spaced from the target board a predetermined distance by a plurality of stand-offs and havi...
02/13/2007
7167806Method and system for measuring temperature and power distribution of a device
A present invention provides real-time temperature and power mapping of fully operating electronic devices. The method utilizes infrared (IR) temperature imaging, while an IR-transparent coolant flows through a specially designed cell directly over the electronic de...
01/23/2007
7141990Device for detecting degradation of a component
An apparatus for monitoring the structural integrity of a component. A monitoring structure is applied to a component that is subject to structural degradation. The monitoring structure includes an electrical conductor that becomes cracked if the component becomes s...
11/28/2006
7141440Apparatus and method for measuring a property of a layer in a multilayered structure
A property of a layer is measured by: (1) focusing a heating beam on a region (also called “heated region”) of a conductive layer (2) modulating the power of the heating beam at a predetermined frequency that is selected to be sufficiently low to ensure that at ...
11/28/2006
7137309High precision gas bearing split-axis stage for transport and constraint of large flat flexible media during processing
A modular split-axis stage is used to inspect and/or repair large flat glass media suitable for LCD/TFT applications. Low-precision air table sections are detachably mounted to a centrally located, high-precision granite inspection/repair section. Glass media held b...
11/21/2006
7130055Use of coefficient of a power curve to evaluate a semiconductor wafer
A coefficient of a function that relates a measurement from a wafer to a parameter used in making the measurement (such as the power of a beam used in the measurement) is determined. The coefficient is used to evaluate the wafer (e.g. to accept or reject the wafer f...
10/31/2006
7124629Prediction of internal rib irregular wear via rib edge lateral slip
The present invention relates to a method for predicting the propensity for a RMT steer tire to have irregular tire tread wear. The method comprises the steps of: providing a RMT steer tire to be tested; placing measurement points upon a ground engaging surface of s...
10/24/2006
7111981Instrument for non-contact infrared temperature measurement combined with tachometer functions
A handheld instrument that accomplishes non-contact infrared (IR) temperature measurement, and the measurement of movement of an object. The instrument has a case, and a movement-sensing device coupled to the case and operable to be directed toward or placed against...
09/26/2006
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