Combination Beverage Container and Spittoon
A combination beverage container and spittoon includes a bottom portion including outer wall and a first inner wall defining a spittoon space.
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| Number | Title | Issue Date |
| 7969583 | System and method to determine an object distance from a reference point to a point on the object surface A system for determining an object distance z includes a plurality of light emitters. A group of at least one of the plurality of light emitters includes an emitter group, and the pattern projected when one emitter group is emitting includes a fringe set. The light ... | 06/28/2011 |
| 7701593 | Optical position measuring arrangement An optical position measuring arrangement including a source of illumination that generates one or several bundles of illuminating beams, a measuring graduation that is illuminated by the source of illumination so as to generate a periodic fringe pattern of a define... | 04/20/2010 |
| 7433256 | Information carrier, and system for positioning such an information carrier in a reading and/or writing apparatus The invention relates to an information carrier (101) intended to be read and/or written by a periodic array of light spots, said information carrier (101) comprising a data area (105) defined by a set of elementary data areas, a first periodic ... | 10/07/2008 |
| 7433255 | Information carrier, and system for positioning such an information carrier in an apparatus The invention relates to an information carrier, and a system for positioning such an information carrier in an apparatus. This system comprises an optical element (102) for generating a periodic array of light spots (103) intended to be applied to an ... | 10/07/2008 |
| 7414713 | Method of measuring focal point, instrument used therefor, and method of fabricating semiconductor device A shape value of a pattern having a pivotal characteristic is measured (step S1), an exposure energy variation is detected from the measured value, a first data base is accessed using a result of the measurement of the shape value (Step S2), an exposur... | 08/19/2008 |
| 7400413 | Three-dimensional shape measuring apparatus using shadow moire A 3D shape measuring apparatus using a shadow moire, which can measure a 3D shape of a test object by selectively switching on/off a plurality of illuminating parts irrespective of a form of the test object is provided. The 3D shape measuring apparatus using the sha... | 07/15/2008 |
| 7369227 | Imaging fluorescence signals using telecentricity The present invention relates to the field of DNA analysis. In particular, the present invention is directed to a device for the parallel imaging of fluorescence intensities at a plurality of sites as a measure for DNA hybridization. More particular, the present inv... | 05/06/2008 |
| 7336921 | Sheet finisher with sheet folding capability and image forming system using the same A sheet folding device for folding a sheet or a sheet stack conveyed thereto of the present invention includes a path along which the sheet or the sheet stack to be folded is conveyed. A fold plate is movable in a direction perpendicular to the above path for formin... | 02/26/2008 |
| 7307707 | Method and system for measuring the imaging quality of an optical imaging system An object pattern is imaged by an imaging system onto the image plane of the imaging system at a location where a reference pattern suited to the object pattern is situated in order to measure the imaging fidelity of an optical imaging system, for example, an eyegla... | 12/11/2007 |
| 7289229 | Optical displacement-measuring instrument An optical displacement-measuring instrument of a reflection type includes a sensor head movable above a scale in a direction of measurement. This instrument is of a three-grating type that comprises a first optical grating arranged close to a light source, a second... | 10/30/2007 |
| 7280265 | Interferometric modulation of radiation An Interferometric Modulator (IMod) is a microelectromechanical device for modulating light using interference. The colors of these devices may be determined in a spatial fashion, and their inherent color shift may be compensated for using several optical compensati... | 10/09/2007 |
| 7248351 | Optimizing light path uniformity in inspection systems An inspection system includes an illumination source configured to illuminate a blazed phase grating sample, image collection pathways and an imaging system configured to capture an image of a sample point of the blazed phase grating sample, and a controller configu... | 07/24/2007 |
| 7230722 | Shadow moire using non-zero talbot distance A method for measuring deformation in specimens is provided. The method includes providing a shadow moiré system, the shadow moiré system including an illumination source, a reference grating and an image capture device and providing a specimen. The method further... | 06/12/2007 |
| 7154609 | Interferential position measuring arrangement An interferential position measuring arrangement including a light source, which emits a beam of rays and an optical element, which converts the beam of rays emitted by the light source into an incoming beam of rays. A scale grating which splits the incoming beam of... | 12/26/2006 |
| 7155364 | Measuring instrument A measuring instrument (1) has an arm (4) having a detector at a distal end thereof, and an arm guide (53) supporting the arm (4) in a manner movable in the axial direction thereof, the measuring instrument measuring a dimension of a work... | 12/26/2006 |
| 7082693 | Adjusting apparatus for devices and for setting adjustments An apparatus for adjusting devices and for setting adjustments, in particular in a μm range, nm range and below, in particular of optical elements in semiconductor lithography, comprising a base part and a head part spaced apart therefrom, the two parts being conne... | 08/01/2006 |
| 7059063 | Flexible coupling to accommodate thermal expansion and contraction in a coordinate measuring machine carriage A machine, such as a coordinate measuring machine, having an element and a structure movable with respect to each other along rails, wherein the rails have a different coefficient of thermal expansion than the structure to which they are attached. In one embodiment,... | 06/13/2006 |
| 6940608 | Method and apparatus for surface configuration measurement A method and an apparatus for surface configuration measurement of the present invention use stereoscopic lattice type of moiré optics as testing optics. The moiré optics accurately shifts moiré fringes of particular fringe order by a preselected phase without an... | 09/06/2005 |
| 6836319 | Optical system adjusting method for energy beam apparatus A method for adjusting an optical system of an energy beam apparatus by using a mark signal that is obtained by one-dimensionally or two-dimensionally scanning a mark on a sample with an energy beam. The mark has a one-dimensional or two-dimensional periodic structu... | 12/28/2004 |
| 6817528 | Reflective apparatus and method for optically sensing relative torque employing Moirè fringes Systems and methods analyze the performance of a mechanical system having two identical rotating members therein. Light is directed from two identical light sources to intercept encoded portions of the rotating members. A portion of the light is reflected from the e... | 11/16/2004 |
| 6813440 | Body scanner A compact moiré effect body scanner provides 3-D images of a human body for use in making up suitable garments. The scanner includes an elongate projection module with a photographic grid that illuminates the body. An elongate imaging module having a second photogr... | 11/02/2004 |
| 6809803 | Surface topology inspection Apparatus and a method for inspecting a topology of a surface (2) of a structural member (1) are provided. The degree to which a known type of stress has been applied to the member may be ascertained using a Moiré grid (8). The method involves ... | 10/26/2004 |
| 6763133 | Moire image capturing apparatus and method therefor The present invention relates a moiré image capturing apparatus and the related method, the apparatus comprising: an optical projection unit arranged in perpendicular to a reference surface with a light source for illuminating light to the reference surface, where ... | 07/13/2004 |
| 6717661 | Fourier moire wavefront sensor An apparatus and method for wavefront sensing that includes: employing two moiré gratings in an optical path; optically Fourier transforming a moiré deflectogram produced by the gratings; variably transmitting the transformed moiré deflectogram; and receiving an ... | 04/06/2004 |
| 6636255 | Three-dimensional image scanner and heat-insulating device for optical apparatus In a three-dimensional image scanner, a grating projection type moire topography is used, so as to capture three-dimensional form information of an object to be measured easily in a short time with a high degree of freedom in measurement. Also, a heat-ins... | 10/21/2003 |
| 6526190 | Position measuring system A position measuring system that includes a graduation support having a measuring graduation, a planar waveguide and a light source that generates light that is conducted to the measuring graduation, wherein the light is reflected at surfaces of the plana... | 02/25/2003 |
| 6456384 | Moire interferometer with overlapping illumination and imaging systems A moire interferometer has an illumination system and an imaging system that share a common focusing optic, which preferably takes the form of a concave mirror. Within the illumination system, the common focusing optic collimates light en route to a test ... | 09/24/2002 |
| 6441367 | Control systems and methods for diffuse illumination A light pattern generator generates a pattern of continuous wave, modulated and/or pulsed light onto a face of a collimator. The light pattern is collimated by an optical element and directed to a focusing element which focuses the collimated light patter... | 08/27/2002 |
| 6285023 | Apparatus for generating origin signal of optical linear scale In a linear scale, a reference point signal is outputted as a signal which is synchronized with an absolute value. 8 is a a/b phase signal generator forming a two-phase a/b signal of a moving signal by an absolute value which divided the inside of pitch w... | 09/04/2001 |
| 6088105 | Measuring unit for determining dimensions of test pieces, preferably of hollow bodies, in particular, of bores of workpieces, and method for measuring such dimensions A measuring unit for determining dimensions of workpieces has an endoscope unit with two apertures through which identical linear light patterns are projected onto a surface of the workpiece. The identical linear light patterns create a moire pattern on t... | 07/11/2000 |
| 6084712 | Three dimensional imaging using a refractive optic design A method and apparatus for gathering full-field three dimensional data for a surface by directing light through a master grating and a projection lens onto a surface, viewing the light from the surface though an imaging lens, a plurality of splitting lens... | 07/04/2000 |
| 5960107 | Method for verifying an average topography height function of a photostepper A method for verifying the accuracy of an average topography height function of a photostepper is provided, which includes the steps of placing a wafer on the photostepper for subjecting at least one layout disposed thereon to the average topography heigh... | 09/28/1999 |
| 5917182 | Rotation detector and controller for detecting rotation information using a grating interference system In an apparatus for detecting information on the rotation of an object using a grating interference system, the present invention provides a rotation detecting apparatus, which can be sufficiently miniaturized even when using another rotation information ... | 06/29/1999 |
| 5886352 | Readhead for an opto-electronic rotary encoder A readhead for an opto-electronic encoder includes a light source, an analyser grating and a detector. The light source illuminates a scale of the opto-electronic encoder such that the light passed on by the scale forms a periodic light pattern. The analy... | 03/23/1999 |
| 5841134 | Photo-electric distance- and angle-measurement system for measuring the displacement of two objects with respect to each other A photoelectric path- and angle-measurement system for measuring the displacement of two objects relative to one another comprises a quantity N=n.multidot.4 of photoreceivers which are arranged in a photoreceiver matrix in such a way that the diagonals of... | 11/24/1998 |
| 5834767 | Surface position detecting system and projection exposure apparatus using the same A detecting system for detecting a surface position of an object, includes a light source, a first grating having a light collecting function, wherein the first grating is illuminated with light from the light source, a second grating having a light colle... | 11/10/1998 |
| 5757507 | Method of measuring bias and edge overlay error for sub-0.5 micron ground rules A method of determining bias or overlay error in a substrate formed by a lithographic process uses a pair of straight vernier arrays of parallel elements, a staggered vernier array of parallel elements, and optionally at least one image shortening array o... | 05/26/1998 |
| 5689107 | Displacement-based opto-electronic accelerometer and pressure sensor An opto-electronic accelerometer and pressure sensor formed on a substrate are disclosed. The sensor includes a light source and a plurality of light detectors exposed on a semiconductor substrate. A cantilever beam extends over the substrate. The cantile... | 11/18/1997 |
| 5678319 | Index grating having partial fields that are geometrically offset in the measuring direction A linear or angular measuring system in which diffracted partial light beams are generated by way of partial fields which are offset with respect to each other, of which only the partial light beams of the resultant zero diffraction order are employed for... | 10/21/1997 |
| 5610719 | Displacement detection system A system for detecting displacement of a surface in a direction normal to the surface, the system including a first grating; a second grating; an optical subsystem for projecting an image of the first grating onto the surface and for directing a secondary... | 03/11/1997 |