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Class 356/613 - Silhouette


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter wherein the shape of the object is determined
No. of patents: 346
Last issue date: 06/22/2010


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NumberTitleIssue Date
7742175Method of analyzing a presence in a space
A method of analyzing a presence in a space (5), the method comprising the steps of: projecting at least one light beam (10) into the space towards a screen in such a manner that at least a portion of a body, if prese...
06/22/2010
7719695Sensor device with a radiation directing surface
A sensor device includes a source of radiation and a reflective surface having a contour that directs radiation reflected from the surface along a field having at least two parallel sides. In a disclosed example, the reflective surface contour is at least partially ...
05/18/2010
7436498Apparatus for determining the shape of a gemstone
An apparatus for determining the shape of a gemstone, including irregularities on its surface, is provided, The apparatus comprises a platform adapted to support the gemstone, a scanning system adapted to provide geometrical information concerning the three-dimensio...
10/14/2008
7433027Apparatus and method for detecting lens thickness
The present invention relates to a non-contact/non-destructive method and apparatus for measuring the thickness of an ophthalmic lens. The present invention also provides a method for inspecting or measuring the base curve of a lens. ...
10/07/2008
7372565Spectrometer measurement of diffracting structures
A normal incidence reflectometer includes a rotatable analyzer/polarizer for measurement of a diffracting structure. Relative rotation of the analyzer/polarizer with respect to the diffracting structure permits analysis of the diffracted radiation at multiple polari...
05/13/2008
7372986Method and apparatus for determining if an optical disk originated from a valid source
A method and apparatus for determining if an optical disk originated from a valid source, the method and apparatus scanning one major surface of the optical disk for mechanical surface imperfections, storing the locations of the surface imperfections relative to a d...
05/13/2008
7365891Method and apparatus for directing energy based range detection sensors
A directing apparatus includes a mechanism for producing steerable energy. The apparatus includes a mechanism for steering energy from the producing mechanism while the producing mechanism is stationary. The steering mechanism is in communication with the producing ...
04/29/2008
7362882Method and device for compensating for shadows in digital images
The invention relates to a method for generating a computed digital image of a scene, which can be illuminated with different luminous intensities at a first illumination angle by a first light source. An image sensor records a number of individual images of the sce...
04/22/2008
7362450Specular surface flaw detection
An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic rad...
04/22/2008
7359068Laser triangulation method for measurement of highly reflective solder balls
A system and method of determining a height and/or position of at least one element on an area array device. A laser beam scans the area array device using at least two different laser light intensities. Reflected light is sampled, and the height and/or position of ...
04/15/2008
7347085Nanoscale displacement detector
A nanoscale displacement detector includes a cantilever integrated with an optical resonator, referred to herein as a “microresonator.” The microresonator and cantilever are configured such that displacement of the cantilever relative to the microresonator cause...
03/25/2008
7342672Detection system for nanometer scale topographic measurements of reflective surfaces
A linear position array detector system is provided which imparts light energy to a surface of a specimen, such as a semiconductor wafer, receives light energy from the specimen surface and monitors deviation of the retro or reflected beam from that expected to map ...
03/11/2008
7340107Shadow-free 3D and 2D measurement system and method
A shadow-free 3D and 2D measurement system combining, in one FMI set-up, a Moiré 3D lighting with other simultaneous external illuminations (for example a coaxial one or another). The reconstructed image combines the advantages of these different illuminations. The...
03/04/2008
7337680System and method for measuring plantar foot pressure
A measuring device (10) is used for generating an imprint of a patient's foot. The imprint includes a first set of at least two differentiable color density markings. The first set of differentiable density markings each correspond to a different pressure exe...
03/04/2008
7336376Measuring pyramid size on a textured surface
A method for measuring pyramid size of pyramids outwardly extending on a textured surface of an object, which method involves emitting from a light source a light beam along a first direction onto a region of the textured surface, measuring an intensity of light rec...
02/26/2008
7330279Model and parameter selection for optical metrology
A profile model for use in optical metrology of structures in a wafer is selected, the profile model having a set of geometric parameters associated with the dimensions of the structure. A set of optimization parameters is selected for the profile model using one or...
02/12/2008
7330256Spectrophotometric system with reduced angle of incidence
A system uses reflectance spectrophotometry to characterize a sample having any number of structures. The system uses toroidal mirrors that are shaped in such a way that the angle of reflectance off of the target is small. The small angle of reflectance may allow fo...
02/12/2008
7327473Flatness tester for optical components
Disclosed herein is a method comprising capturing an image of a grating formed on a surface of a brightness enhancing display film; measuring a displacement Δd of a fringe from the image of the grating; and determining a slope of a deviation from flatness of the br...
02/05/2008
7317542Method and device for optically measuring the surface shape and for the optical surface inspection of moving strips in rolling and processing installations
The invention relates to a method and a device for optically measuring the surface shape and for the optical surface inspection of moving elongated bodies, according to which surface shape measurement and surface inspection are integrated. A projector applies a line...
01/08/2008
7312881Parametric profiling using optical spectroscopic systems to adjust processing parameter
A gallery of seed profiles is constructed and the initial parameter values associated with the profiles are selected using manufacturing process knowledge of semiconductor devices. Manufacturing process knowledge may also be used to select the best seed profile and ...
12/25/2007
7310564Arrangement and method for producing therapeutic insoles
The present invention relates to an arrangement for producing therapeutic insoles, consisting of a platform with a scanner for scanning the undersides of the patient's feet, a data processing connection for transmitting the scanned image to a computer, a data proces...
12/18/2007
7304735Broadband wavelength selective filter
An optical filter for the selective attenuation of specific wavelengths of light includes at least one spectrally dispersive element, such as a diffraction grating or prism, in combination with an optical filter. A dispersive element separates broadband light into a...
12/04/2007
7295330Film mapping system
A materials properties measuring system for using electromagnetic radiation interactions with selected materials positioned at a measuring location to determine selected properties thereof having an electromagnetic radiation source along with a plurality of radiatio...
11/13/2007
7295698Three-dimensional image photographing apparatus and method capable of acquiring more natural pasted three-dimensional image including texture image
A three-dimensional image photographing apparatus acquires an image that includes shape information and texture information of an object, and acquires a three-dimensional image of the object by utilizing the image that includes the shape information and the texture ...
11/13/2007
7295293Apparatus and method for testing a reflector coating
A method of testing a coating on a reflector having a first focal point includes placing a mirror at the first focal point of the reflector and angled to orient with an area on the coating. Electromagnetic (EM) radiation is directed to the mirror which then directs ...
11/13/2007
7289219Polarimetric scatterometry methods for critical dimension measurements of periodic structures
An optical measurement system for evaluating a sample has a motor-driven rotating mechanism coupled to an azimuthally rotatable measurement head, allowing the optics to rotate with respect to the sample. A polarimetric scatterometer, having optics directing a polari...
10/30/2007
7289232Dimension measurement method, method of manufacturing semiconductor device, dimension measurement apparatus and measurement mark
A dimension measurement method includes irradiating a measurement mark on a sample on which a pattern to be measured is formed with light from a measurement direction, detecting reflected diffracted light from the measurement mark to measure intensity thereof, and c...
10/30/2007
7280226Method and device for enlarging the measurement volume of an optical measurement system
The invention concerns a method for enlarging the measuring volume of an optical measuring system and, on such a measuring system, at least one camera (2, 3, 4) to determine the position of at least one object (1) in relation to a base co-ordinate syst...
10/09/2007
7277164Process and station for inspecting the painting of motor vehicle bodywork parts
A method for inspecting the painting of bodywork parts using an optical measurement instrument that is moved parallel to the parts being inspected. An inspection station for implementing the method. ...
10/02/2007
7268865Method of detecting foreign objects for display panel fabrication
A method of detecting foreign objects in display manufacturing process, wherein the method comprising steps as flows: First a laser source and a laser detector are provided on a first side of a target to be measured, wherein the laser detector is supported by an adj...
09/11/2007
7262864Method and apparatus for determining grid dimensions using scatterometry
A test structure includes a first plurality of lines and a second plurality of lines intersecting the first plurality of lines. The first and second pluralities of lines defining a grid having openings. A method for determining grid dimensions includes providing a w...
08/28/2007
7263418Method and device for visualizing a vehicle repairing
A method is provided for providing image data for visualizing a defective part and/or a repair process and/or a maintenance service of a road-bound vehicle, in particular a car or motorcycle. The aim is to reduce the translation costs for repair manuals. The method ...
08/28/2007
7253898System for detecting droplets on a translucent surface
A system which detects droplets on a translucent surface having a camera which, upon activation, acquires an image of a portion of the surface. A radiation source, upon activation, illuminates the portion of the translucent surface while a control circuit selectivel...
08/07/2007
7253889Shaft cone metrology system and method
Aspects include metrology methods and systems for determining characteristics of conical shaft portions, such as angle of taper. In an example, a metrology system includes a fixture for supporting a workpiece. The fixture provides for translation in a longitudinal d...
08/07/2007
7245795Optical device incorporating a tilted bragg grating
The invention relates to an optical waveguide device for monitoring a characteristics of light, e.g. a wavelength. The device incorporates a waveguide, such as an optical fiber, with an embedded tilted Bragg grating operating in a regime of wavelength detuning. The ...
07/17/2007
7245387Three-dimensional measuring instrument
For measuring the three-dimensional shape of an object of measurement using a phase shift method, a three-dimensional shortening the measurement time. A printed state inspection device 1 includes a printed circuit board K printed with cream solder H, an illum...
07/17/2007
7222972Projection apparatus, projection method and recording medium having recorded projection method
A projection apparatus has a projection system including a spatial optical modulator (SOM), which projects an image according to an input image signal, and a projection lens, two retardation sensors and a ranging section, which measure distances corresponding to plu...
05/29/2007
7221445Methods and apparatus for detecting and quantifying surface characteristics and material conditions using light scattering
A system for quantifying surface characteristics detects and quantifies characteristics of a surface of an object. For example, the system may quantify changes in surface roughness without contacting the specimen and without requiring precise temporal or spatial sta...
05/22/2007
7218391Material independent optical profilometer
A material independent optical profilometer system and method for measuring at least one of either a height or a slope of an object such as a thin film disk, a silicon wafer, or a glass substrate is disclosed. ...
05/15/2007
7218771Cam reference for inspection of contour images
This invention discloses an electrical circuit inspection system including an optical subsystem for optically inspecting an electrical circuit and providing an inspection output identifying more than two different types of regions and an analysis subsystem for analy...
05/15/2007
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