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Class 356/606 - Line of light projected


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter wherein a single line of light is projected
No. of patents: 141
Last issue date: 12/20/2011


1        
NumberTitleIssue Date
8081320Tilt correction system and method for rail seat abrasion
A system and method for determining rail seat abrasion of a rail road track is disclosed. An inspection system comprises lasers, cameras, and processors adapted to determine whether rail seat abrasion is present along the track. The processor employs a mathematics b...
12/20/2011
8035823Hand-held surface profiler
A light-emitting hand-held surface profiler for scanning and profiling the surfaces of objects has a transparent housing, a focusable light source, a conical mirror aligned to redirect light emitted by the light source onto a surface to be profiled, an imaging senso...
10/11/2011
7821649Fringe projection system and method for a probe suitable for phase-shift analysis
A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project ...
10/26/2010
7751065Optical displacement meter, optical displacement measuring method, optical displacement measuring program, computer-readable recording medium, and device that records the program
The present invention provides an optical displacement meter in which light receiving elements are disposed two-dimensionally, capable of stably obtaining a reception light amount in accordance with a work. The optical displacement meter includes: a two-dimensional ...
07/06/2010
7715020Three-dimensional shape measuring system
A three-dimensional shape measuring system is provided with a measuring unit having a three-dimensional measurement range and adapted to measure the three-dimensional shape of a measurement object in a noncontact manner, a measurement range shifting unit for shiftin...
05/11/2010
7474416System and method for measuring an object and monitoring the surface of an object
A system for measuring an object and for monitoring the surface of the object. The system comprises at least a first subsystem for determining one or more dimensions of the object and a position of the object within the first subsystem, and at least a second subsyst...
01/06/2009
7440119Three-dimensional shape detecting device, image capturing device, and three-dimensional shape detecting method
There is provided a three-dimensional shape detecting device comprising: pattern beam projection means which projects a plurality of pattern beams including two pattern beams having different angular widths; image capturing means which captures an image of a subject...
10/21/2008
7375826High speed three-dimensional laser scanner with real time processing
A laser scanner computes a range from a laser line to an imaging sensor. The laser line illuminates a detail within an area covered by the imaging sensor, the area having a first dimension and a second dimension. The detail has a dimension perpendicular to the area....
05/20/2008
7355724Three-dimensional measurement system
The invention relates to a three-dimensional measurement system comprising a hardware part and a software part, in which the hardware part includes a mobile two-axis assembly (12) associated with a remote measurement device (13) installed on a fixed pa...
04/08/2008
7342669Three-dimensional shape measuring method and its device
A three-dimensional shape is measured by a simple system structure. A three-dimensional shape measuring instrument comprises a device (1-1) in which a light-emitting diode (1-1b) is installed as a marker in a line laser light sourc...
03/11/2008
7333677Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections
The present invention provides a high-precision alignment method, device and code for inspections that compare an inspection image with a reference image and detect defects from their differences. In one embodiment an inspection image and a reference image are divid...
02/19/2008
7324917Method, system, and software for evaluating characteristics of a surface with reference to its edge
A method and software is disclosed for evaluating characteristics, such as flatness, of a surface of a sample having an edge, comprising selecting an evaluation area having an area surface and a boundary, at least one portion of which is definable with reference to ...
01/29/2008
7324217Device and method for measuring components
A method is disclosed for measuring components (1) using a measurement system (20) guided by a manipulator (10). In this process, reference features (9, 9a, . . . , 9i) are decentrally located at various positions nea...
01/29/2008
7312859Optical fiber inspection device
The present invention provides an inspection system for inspecting a surface of an optical specimen. The inspection system includes an optical testing device having a main body and an optical axis. The optical testing device includes an optical imaging system housed...
12/25/2007
7310431Optical methods for remotely measuring objects
A class of measurement devices can be made available using a family of projection patterns and image processing and computer vision algorithms. The proposed system involves a camera system, one or more structured light source, or a special pattern that is already dr...
12/18/2007
7274469Method and apparatus for calibrating laser 3D digitizing sensor
A method for calibrating a laser three-dimensional digitizing sensor. First, a three-dimensional coordinator X-Y-Z is defined and a calibrating surface is provided. Second, a first mapping table of a two-dimensional digital image to the Z axis is established by tran...
09/25/2007
7253891Method and apparatus for simultaneous 2-D and topographical inspection
Apparatus for sensing information regarding a surface including a first plurality of optical elements arranged to acquire two dimensional information about a surface, a second plurality of optical elements arranged to acquire topographical information about the surf...
08/07/2007
7248405Re-focusing mechanism for imaging system
Two reflective surfaces disposed in a predetermined angular orientation inside the optical tube assembly of a telescope intercept the optical beam and deliver it from the objective to the eye-piece. By translating these surfaces simultaneously along the axis bisecti...
07/24/2007
7245982System and process for measuring, compensating and testing numerically controlled machine tool heads and/or tables
A system and a process are disclosed, that are automated and integrated with numerically controlled systems, for measuring, compensating and testing numerically controlled machine tool heads (1) and/or tables. The system comprises: at least one support base (...
07/17/2007
7245386Object measuring device and associated methods
A device for measuring one or more dimensions of an object. One or more light emitters direct light towards the object. At least one light blocking element, arranged between the light emitters and the object, blocks all but a bundle of light to form a light edge on ...
07/17/2007
7227925Gantry mounted stereoscopic imaging system
A radiation therapy treatment machine that has a stereoscopic imaging system, which includes a rotatable open gantry on which is placed a first diagnostic radiation source, a first diagnostic imager, and a therapeutic radiation source. ...
06/05/2007
7227165System and method for classification of timber
The present invention provides a system and a method to grade a piece of wood and simultaneously to classify this piece of wood by allowing an examination of four longitudinal faces thereof, so as to determine optimal specifications for a subsequent use thereof such...
06/05/2007
7206063Optical range finder with directed attention
An optical range finder for determining the distance comprises a focusing optical member that focuses emitted electromagnetic radiation upon a micro-mirror array. A processor controls the micro-mirror array to direct the focused electromagnetic radiation into a defi...
04/17/2007
7199881Apparatus for and method of measurements of components
An arrangement for measuring components has a manipulator, at least one measuring system in operative connection with the manipulator, the at least one measuring system including at least one contour measuring device associated with the manipulator and generating an...
04/03/2007
7196801Patterned substrate surface mapping
A method for measuring a characteristic of a substrate, including directing an incident beam at an inspection grid of points on the substrate, receiving the reflected beam with a position sensitive detector, measuring the displacement of the reflected beam from its ...
03/27/2007
7193731Optical displacement sensor
Optical displacement sensor may possess light-emitting element(s) for projecting light onto distance measurement target(s), and light-receiving element(s) capable of receiving light reflected from distance measurement target(s) and disposed such that light-receiving...
03/20/2007
7193727Apparatus and method for mounting or wiring semiconductor chips
An apparatus for mounting semiconductor chips onto a substrate contains a measuring station for the contactless measurement of the height of the surface of the mounted semiconductor chip facing away from the substrate at a minimum of three locations. From this, at l...
03/20/2007
7190402Visual sensor for capturing images with different exposure periods
A visual sensor capable of expanding a dynamic range with a little load of processing for arithmetic operations and performing a stable detection not affected by change of conditions such as ON/OFF state of projection of reference light. A multiplying parameter A (A...
03/13/2007
7180606Machine vision system for measuring heights of items
A machine vision system (1) has two laser sources (2, 3) to illuminate a solder deposit from both sides for comprehensive coverage without occlusion. The camera (4) has an FGPA (32) programmed to define a subset of the sensor array (20...
02/20/2007
7164785Apparatus and methods of generation of textures with depth buffers
A three dimensional (3-D) image is generated from a plurality of portions of an image of an object, each captured portion of the image is based on a scan width of an image capture device. A range finding device obtains at least one range data value for each captured...
01/16/2007
7161669Wafer edge inspection
In one embodiment, a system to inspect an edge region of a wafer, comprises a surface analyzer assembly comprising a radiation targeting assembly that targets a radiation beam onto a surface of the wafer; a reflected radiation collection assembly to collect radiatio...
01/09/2007
7155030Camera calibration system using planar concentric circles and method thereof
The invention relates to a camera calibration system and method thereof which is capable of easily performing camera calibration using a concentric circle pattern. According to the invention, a method of calibrating a camera calibrates the intrinsic parameters of th...
12/26/2006
7154613Color coded light for automated shape measurement using photogrammetry
A method and apparatus for using a plurality of regions of colored light to index and locate discrete targets in photogrammetry systems. The colored regions of light are used to determine a unique location on the surface of a three-dimensional object. Multiple proje...
12/26/2006
7133574Method for recognizing position of honeycomb structure
A position of a honeycomb structure, which is comprised of an outer shell, separation walls arranged in the form of a honeycomb within the outer shell, and a number of axially extending cells which are defined by the separation walls, is recognized. When the positio...
11/07/2006
7130058System and method for determining coordinates on three-dimensional space using beam phase interference
Disclosed are a system and a method for determining coordinates of a three-dimensional measurer probe using a beam phase interference method. Two optical fibers are mounted inside the probe, and detecting means obtains an interference pattern generated by beam emitt...
10/31/2006
7119842Image capturing device including a spectrally-selectively transmissive diaphragm
An image-capturing device includes a photographing lens, a first imaging device, a second imaging device and a diaphragm. The photographing lens forms subject images on the first and second imaging devices. The first imaging device receives light rays of the infrare...
10/10/2006
7092106System for determining the configuration of obscured structure by employing phase profilometry and method of use therefor
An application of phase profilometry to determine the 3-D configuration of normally obscured structure. In one application, the undercarriage of a vehicle is captured in a 3-D profile while the vehicle is operating normally. The system may use a digital camera; a co...
08/15/2006
7075662Method for three-dimensional inspection using patterned light projection
A three-dimensional inspection system and method is used to obtain information about three-dimensional articles with specular surfaces having a shape and positive or negative height by projecting a pattern of light onto the articles at an oblique angle. The system i...
07/11/2006
7066611Alignment with linear array of receptors
A beam projector is aligned with a linear array of receptors. An alignment receptor is at each end of the linear array of receptors. A beam is projected from the projector. The beam is swept until the alignment receptors sense the beam. A signal is transmitted upon ...
06/27/2006
7069124Robotic modeling of voids
Robotic systems for modeling, mapping and exploring subterranean void spaces such as mines, caves, tunnels, bunkers, and conduits. Robotic modeling of subterranean voids is generally enabled by a procedural system consisting of preprocessing, ingress, void modeling,...
06/27/2006
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