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An aircraft having vertical takeoff and landing capability provided with at least first and second laterally extending paddle wheels rotatable on a central axis perpendicular to the longitudinal axis of the aircraft fuselage and between its nose and tail.
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| Number | Title | Issue Date |
| 8144338 | Pattern measurement apparatus and pattern measurement method A pattern measurement method includes: acquiring sectional shapes of a first pattern corresponding to process parameters, respectively; using the acquired sectional shapes to calculate predicted spectral waveforms which would be obtained when light is applied to the... | 03/27/2012 |
| 7623250 | Enhanced shape characterization device and method The shape and orientation of rigid or nearly rigid moveable bodies are determined using a shape characterization. Sensors capture a plurality of representations of different perspectives of the body that are analyzed to determine a bounding volume of the body. The s... | 11/24/2009 |
| 7602507 | Sensor for measuring the surface of an object The invention relates to a sensor for measuring the surface of an object, having a contrasting unit (3) for projecting a pattern onto the surface of the object, and having a camera (4) for recording of the pattern projected onto the surface of the obje... | 10/13/2009 |
| 7595894 | Profilometry apparatus and method of operation A profilometry apparatus is provided. The profilometry apparatus includes a fringe projection device configured to project a fringe pattern on an object and an optical unit configured to capture an image of a distorted fringe pattern modulated by the object. The pro... | 09/29/2009 |
| 7502125 | Measuring technology and computer numerical control technology A measuring apparatus of this invention comprises: a projector; a camera; a generator that generates, from a photographed image of a fringe pattern projected by the projector at a time of calibration onto each of surfaces, first tuples, each including coordinates of... | 03/10/2009 |
| 7474415 | Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display The present invention is a measurement method of three-dimensional profiles and a reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on a single display, wherein the measurement method includes: 1. Preparat... | 01/06/2009 |
| 7463367 | Estimating overlay error and optical aberrations Aberration marks, which may be used in conjunction with lenses in optical photolithography systems, may assist in estimating overlay errors and optical aberrations. Aberration marks may include an inner polygon pattern and an outer polygon pattern, wherein each of t... | 12/09/2008 |
| 7436525 | Three-dimensional shape measuring method, three-dimensional shape measuring apparatus, and focus adjusting method An operation of projecting slit light onto an object to be measured and receiving light reflected thereon, and an operation of acquiring a two-dimensional image concerning the object to be measured are repeated a certain number of times by changing a focal length. A... | 10/14/2008 |
| 7388678 | Method and device for three-dimensionally detecting objects and the use of this device and method In order to determine three-dimensional coordinates of a surface (2) of an object (3) to be detected, the changes in color of a color pattern (5), which is projected by a projector (4) onto the surface (2), are to be encoded by usi... | 06/17/2008 |
| 7388677 | Optical metrology optimization for repetitive structures The top-view profiles of repeating structures in a wafer are characterized and parameters to represent variations in the top-view profile of the repeating structures are selected. An optical metrology model is developed that includes the selected top-view profile pa... | 06/17/2008 |
| 7385709 | Microscopy imaging apparatus and method for generating an image A method and a microscopy imaging apparatus for generating an optically sectioned image of a specimen are provided. The method comprises the steps of: illuminating the specimen with a modulating, spatially periodic illumination pattern; imaging said specimen on a co... | 06/10/2008 |
| 7382471 | Non-contact apparatus and method for measuring surface profile Embodiments of the invention provide a non-contact method for measuring the surface profile of an object that can include generating a point-type optical signal and projecting it on a rotatable precision optical grating, generating a rotating pattern of light and da... | 06/03/2008 |
| 7372580 | Three-dimensional shape detecting device, three-dimensional shape detecting system, and three-dimensional shape detecting program In a three-dimensional shape detecting system comprising a three-dimensional shape detecting device and an external calculating device, the three-dimensional shape detecting device includes: projection means which projects pattern light onto a subject; image data ob... | 05/13/2008 |
| 7369253 | Systems and methods for measuring sample surface flatness of continuously moving samples Measurement of sample surface flatness of a continuously moving sample. A conveyor continuously conveys a sample beneath a grating disposed at a non-zero angle with respect to the plane of conveyance. The relative distance between the sample and the angled grating c... | 05/06/2008 |
| 7340107 | Shadow-free 3D and 2D measurement system and method A shadow-free 3D and 2D measurement system combining, in one FMI set-up, a Moiré 3D lighting with other simultaneous external illuminations (for example a coaxial one or another). The reconstructed image combines the advantages of these different illuminations. The... | 03/04/2008 |
| 7336374 | Methods and apparatus for generating a mask A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto a surface of an object, and an imaging system for receiving light reflected from the surface of the object. The method includes determining ... | 02/26/2008 |
| 7336816 | Method and apparatus for measuring shape of bumps The present invention provides a bump shape measuring apparatus comprising an illumination optical system which illuminates bumps arranged on a board with illumination light of a low tilt angle to a surface of the board; a detection optical system where reflected li... | 02/26/2008 |
| 7336375 | Wireless methods and systems for three-dimensional non-contact shape sensing Systems for acquiring an approximation of the surface geometry of a 3-dimensional object include a self-powered wireless, non-contact optical scanner, the location and orientation of which may be tracked with respect to an object coordinate system, and a processor c... | 02/26/2008 |
| 7336814 | Method and apparatus for machine-vision A system and method facilitate machine-vision, for example three-dimensional pose estimation for target objects, using one or more images sensors to acquire images of the target object at one or more positions, and to identify features of the target object in the re... | 02/26/2008 |
| 7326292 | Quality evaluation method for single crystal ingot The inventive quality evaluation method for a single crystal ingot generally includes a step of determining cropping and sampling positions and a step of evaluating a sample. The step of determining cropping and sampling positions includes: (a) inputting basic infor... | 02/05/2008 |
| 7316869 | Mounting a pellicle to a frame A pellicle membrane is mounted between an outer frame and an inner frame. At least one of the frames is attached to the reticle without using conventional adhesives. The pellicle and reticle may be used in a lithography system. The pellicle allows radiation to pass ... | 01/08/2008 |
| 7317464 | Pulse width modulated spatial light modulators with offset pulses In some embodiments, a display system includes a spatial light modulator including at least one pixel, a pixel source including pixel data corresponding to the pixel, a memory circuit connected to the pixel source and configured to store a pixel value corresponding ... | 01/08/2008 |
| 7317542 | Method and device for optically measuring the surface shape and for the optical surface inspection of moving strips in rolling and processing installations The invention relates to a method and a device for optically measuring the surface shape and for the optical surface inspection of moving elongated bodies, according to which surface shape measurement and surface inspection are integrated. A projector applies a line... | 01/08/2008 |
| RE39978 | Scanning phase measuring method and system for an object at a vision station A method and system are provided including an optical head which moves relative to an object at a vision station to scan a projected pattern of imagable electromagnetic radiation across the surface of an object to be inspected at a relatively constant linear rate to... | 01/01/2008 |
| 7315383 | Scanning 3D measurement technique using structured lighting and high-speed CMOS imager A method for 3 dimensional scanning using a light source for projecting a source of illumination configured to be non-uniform or having a predetermined pattern is disclosed. A CMOS sensor having randomly accessible rows of pixels, and an associated lens system, is m... | 01/01/2008 |
| 7310154 | Shape measurement system An image capturing apparatus for capturing an image of an object. The image capturing apparatus includes a correspondence detector which detects a correspondence of characteristic points of an object based upon captured images of the object. A motion detector detect... | 12/18/2007 |
| 7303111 | Lightweight bondhead assembly A bondhead assembly having a bond body for mounting a bonding tool, a support structure that is configured to be drivable for moving the bondhead assembly to different locations and flexural elements arranged substantially along at least one plane which couple the b... | 12/04/2007 |
| 7289230 | Wireless substrate-like sensor A wireless substrate-like sensor is provided to facilitate alignment and calibration of semiconductor processing systems. The wireless substrate-like sensor includes an optical image acquisition system that acquires one or more images of targets placed within the se... | 10/30/2007 |
| 7286246 | Method and apparatus for non-contact three-dimensional surface measurement A non-contact three-dimensional surface measurement method is provided in which a grating pattern projected onto an object being measured, while the phase of the pattern is being shifted, is observed in a different direction from a projection direction to analyze th... | 10/23/2007 |
| 7283255 | Wireless substrate-like sensor A wireless substrate-like sensor is provided to facilitate alignment and calibration of semiconductor processing systems. The wireless substrate-like sensor includes an optical image acquisition system that acquires one or more images of targets placed within the se... | 10/16/2007 |
| 7274470 | Optical 3D digitizer with enlarged no-ambiguity zone An optical 3D digitizer with an enlarged non-ambiguity zone, comprising a structured light projector for projecting a fringe pattern over a target area, the fringe pattern having a shiftable position over the target area is disclosed. First and second cameras having... | 09/25/2007 |
| 7268893 | Optical projection system There is provided an optical projection system for projecting an image onto an object that is being manufactured and/or inspected. The system includes an image-projecting device, a target-locating device for determining the orientation of the image-projecting device... | 09/11/2007 |
| 7256897 | Three-dimensional measurement apparatus and three-dimensional measurement method There is provided an apparatus and method for three-dimensional measurements by shining an object to be measured with plural laser beams while scanning. Even if the optical intensity of laser beams is weak, light disturbance is accurately separated to perform real-t... | 08/14/2007 |
| 7256884 | Particle detecting system and method of detecting particles using the same There is provided a particle detector system and to detect particles on target including reticle and pellicle. The system includes a light transmitting device adapted to transmit light beam to a target through an electrowetting microlens, a light receiving device ad... | 08/14/2007 |
| 7245387 | Three-dimensional measuring instrument For measuring the three-dimensional shape of an object of measurement using a phase shift method, a three-dimensional shortening the measurement time. A printed state inspection device 1 includes a printed circuit board K printed with cream solder H, an illum... | 07/17/2007 |
| 7242484 | Apparatus and methods for surface contour measurement Apparatus and methods of measuring three-dimensional position information of a onto a surface of an object including two sources of radiation separated by a distance, each source having a spectral distribution, and being coherent with respect to the other of the sou... | 07/10/2007 |
| 7236256 | Range finder and method A linearly polarized light projector system projects linearly polarized light onto a subject. While polarizing filters are used for removing light specular-reflected on the subject, a reflected image after removal of the specular-reflected light is captured by image... | 06/26/2007 |
| 7230701 | Compact spectroscopic ellipsometer The invention concerns an ellipsometer comprising: a source (2) capable of emitting a broadband ray (4), a polarizer (10) for producing a polarised incident beam (12) adapted to illuminate a sample (16) according to at least a sele... | 06/12/2007 |
| 7227165 | System and method for classification of timber The present invention provides a system and a method to grade a piece of wood and simultaneously to classify this piece of wood by allowing an examination of four longitudinal faces thereof, so as to determine optimal specifications for a subsequent use thereof such... | 06/05/2007 |
| 7224472 | Operation lamp with camera system for 3D referencing The invention relates to a system for the combined shadow-free illumination of a pre-definable area and for referencing three-dimensional spatial co-ordinates, and to an active or passive referencing system, each in particular for referencing surgical or medical ins... | 05/29/2007 |
