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Class 356/603 - Projection of structured light pattern


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter wherein the projected light pattern has
No. of patents: 224
Last issue date: 11/22/2011


1            
NumberTitleIssue Date
8064068Multi-source sensor for three-dimensional imaging using phased structured light
A system for sensing a three-dimensional topology of a test surface is provided. A first illumination source generates first patterned illumination from a first point of view. A second illumination source generates second patterned illumination from a second point o...
11/22/2011
8040527Refractive production of a concentrically fanned structured bundle of light beams, optical, measuring device with refractive defection element
The invention describes an optical deflection element for the refractive production of a spatially structured bundle of light beams fanned concentrically to an optical axis of the deflection element. The optical deflection element has a base body made of optically t...
10/18/2011
7957007Apparatus and method for illuminating a scene with multiplexed illumination for motion capture
A projector that illuminates a scene with multiplexed light patterns includes a passive physical mask, and a set of spatially dispersed optical emitters arranged behind the physical mask. The optical emitters are modulated to project a set of unique optical light pa...
06/07/2011
7768656System and method for three-dimensional measurement of the shape of material objects
A system and method are provided for the 3D measurement of the shape of material objects using non-contact structured light triangulation. The system includes a light projector for projecting a structured light pattern onto the surface of any object and a camera for...
08/03/2010
77243793-Dimensional shape measuring method and device thereof
It is possible to measure a 3-dimensional shape by using a projector and an imaging device without requiring calibration in advance. A pattern light is applied from a projector to an object and this is imaged by an imaging device to capture an image as an input. An ...
05/25/2010
7570370Method and an apparatus for the determination of the 3D coordinates of an object
A method serves for the determination of the 3D coordinates of an object (2). A fringe pattern is projected onto the object (2) in the method. The light reflected by the object (2) is recorded and evaluated. To improve such a method, the fringe ...
08/04/2009
7545516Full-field three-dimensional measurement method
A method and system for full-field fringe-projection for 3-D surface-geometry measurement, referred to as “triangular-pattern phase-shifting” is disclosed. A triangular grey-scale-level-coded fringe pattern is computer generated, projected along a first directio...
06/09/2009
7525669High-speed, scanning phase-shifting profilometry using 2D CMOS sensor
A high speed, phase shifting scanning profilometry system is disclosed. A high speed CMOS sensor having more than 3 rows of pixels, in one embodiment having 1024, each row of which being randomly accessible, is positioned above a workpiece movable below the camera. ...
04/28/2009
7508529Multi-range non-contact probe
A multi-range non-contact probe is provided which performs approximate range-finding measurement functions in addition to more precise structured light measurement functions. The probe is compatible with a probe control interface which allows advanced measuring capa...
03/24/2009
7489408Optical edge break gage
A projector (20) projects a structured light pattern (46) along a first optical axis (44) onto a surface (80). A viewer (50) attached to the projector (20) receives a reflection of the structured light pattern (46) fr...
02/10/2009
74800613D shape measurement apparatus and method using stereo moiré technique
Disclosed herein is a 3D shape measurement method and apparatus using a stereo moiré technique. The 3D shape measurement method measures the 3D shape of an object to be measured using a digital pattern projector and first and second cameras. The method includes a f...
01/20/2009
7436498Apparatus for determining the shape of a gemstone
An apparatus for determining the shape of a gemstone, including irregularities on its surface, is provided, The apparatus comprises a platform adapted to support the gemstone, a scanning system adapted to provide geometrical information concerning the three-dimensio...
10/14/2008
7436525Three-dimensional shape measuring method, three-dimensional shape measuring apparatus, and focus adjusting method
An operation of projecting slit light onto an object to be measured and receiving light reflected thereon, and an operation of acquiring a two-dimensional image concerning the object to be measured are repeated a certain number of times by changing a focal length. A...
10/14/2008
7436524Apparatus and method for three-dimensional measurement and program for allowing computer to execute method for three-dimensional measurement
The present invention has a three-dimensional apparatus including a lattice pattern placed in an optical path and having a slit-like light transmitting portion formed of pitches set at fixed intervals, and a projecting optical system that projects a lattice pattern ...
10/14/2008
7428061Optical probe for scanning the features of an object and methods thereof
An optical probe for measuring features of an object comprises two or more viewing directions and two or more projection directions. A method of measuring the features of an object comprises configuring an optical probe into two or more optical groups, wherein an op...
09/23/2008
7394552Method for measuring the separation of extended objects in conjunction with an optical observation system and microscope for carrying out the same
Method and device for determining one or more Z distances from an object surface to a reference plane, for example the primary plane of the primary objective of a microscope. By projecting an optical pattern onto an object, and subsequently detecting and computation...
07/01/2008
7391522Three-dimensional shape detecting device, image capturing device, and three-dimensional shape detecting program
A three-dimensional shape detecting means includes a projecting device which projects pattern light; an image capturing device which captures a pattern light projection image; a pattern light position extracting device which extracts a position of the pattern light ...
06/24/2008
7388678Method and device for three-dimensionally detecting objects and the use of this device and method
In order to determine three-dimensional coordinates of a surface (2) of an object (3) to be detected, the changes in color of a color pattern (5), which is projected by a projector (4) onto the surface (2), are to be encoded by usi...
06/17/2008
7388679Pattern light irradiation device, three dimensional shape measuring device, and method pattern light irradiation
A light irradiation device for irradiating light having a pattern onto a physical object, includes a pattern forming plate provided with a plurality of opening portions; a light irradiation unit for irradiating light towards the pattern forming plate; and a projecti...
06/17/2008
7385709Microscopy imaging apparatus and method for generating an image
A method and a microscopy imaging apparatus for generating an optically sectioned image of a specimen are provided. The method comprises the steps of: illuminating the specimen with a modulating, spatially periodic illumination pattern; imaging said specimen on a co...
06/10/2008
7385708Methods and systems for laser based real-time structured light depth extraction
Laser-based methods and systems for real-time structured light depth extraction are disclosed. A laser light source (100) produces a collimated beam of laser light. A pattern generator (102) generates structured light patterns including a plurality of ...
06/10/2008
7379193Sensing device for measuring the three-dimension shape and its measuring method
The present invention discloses a sensing device for measuring the three dimension shape and its measuring method. The said sensing device includes a projecting device, an observing device, a projecting localizer, an observing localizer and a computer for data proce...
05/27/2008
7372581Three-dimensional coordinate measuring device
An optical camera three-dimensional coordinate measuring system for use with objects to be measured is described. The system may include a compact, easily moveable, and rotatable, target of known dimensions comprising a spherical surface to be placed in contact with...
05/13/2008
7372580Three-dimensional shape detecting device, three-dimensional shape detecting system, and three-dimensional shape detecting program
In a three-dimensional shape detecting system comprising a three-dimensional shape detecting device and an external calculating device, the three-dimensional shape detecting device includes: projection means which projects pattern light onto a subject; image data ob...
05/13/2008
7369253Systems and methods for measuring sample surface flatness of continuously moving samples
Measurement of sample surface flatness of a continuously moving sample. A conveyor continuously conveys a sample beneath a grating disposed at a non-zero angle with respect to the plane of conveyance. The relative distance between the sample and the angled grating c...
05/06/2008
7361941Calibration standards and methods
Parameters of a metrology tool may be determined by measuring a dimension of a feature on a calibration standard with the tool and using the measured dimension and a known traceable value of the dimension to determine a value for the parameter. If the dimension of t...
04/22/2008
7359828Process for plotting the shape of a contour of a previously machined ophthalmic lens
Process for plotting the shape of a contour (5, 6) of a previously machined ophthalmic lens (1), which comprises the steps of: illuminating an optical face (2, 3) of the lens (1) with a flat light beam (...
04/15/2008
7355682Remote center range finder
A system for measuring the distance from a first point spaced away from a surface of an object to a second point on a surface of the object along an axis extending through the first and second points includes one or more light projection assemblies for projecting li...
04/08/2008
7353954Tray flipper and method for parts inspection
Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconduc...
04/08/2008
7356580Plug and play sensor integration for a process module
A process chamber with a computer system that controls the process chamber is connected to one or more sensors, which are used to monitor the process in the process chamber. The sensors are connected to the computer system in a client/server relationship, in a way t...
04/08/2008
7349104System and a method for three-dimensional imaging systems
A method for acquiring a surface profile 3D data set of an object includes illuminating a surface of the object with a sequence of multiple rainbow projection (MRP) structural light patterns, capturing light reflected from the object, and calculating 3D data (X, Y, ...
03/25/2008
7349102Methods and apparatus for reducing error in interferometric imaging measurements
Described is a fringe generator for an interferometric measurement system having improved fringe stability and reproducibility. The fringe generator includes a light source at a characteristic wavelength and a diffractive element to generate a pair of diffracted bea...
03/25/2008
7342668High speed multiple line three-dimensional digitalization
A system provides high-speed multiple line digitization for three-dimensional imaging of a physical object. A full frame of three-dimensional data may be acquired in the same order as the frame rate of a digital camera. ...
03/11/2008
7333182Range finder and method of reducing signal noise therefrom
A range finder includes an optical sensor circuit including optical sensors and an integrator circuit disposed for the optical sensors. It further includes selection switches (MOSFETs), which selectively connect optical sensors to the integrator circuit, non-selecti...
02/19/2008
7330274Compensation for geometric effects of beam misalignments in plane mirror interferometers
Techniques for compensating for geometric effects of beam misalignment in plane mirror interferometers are disclosed. ...
02/12/2008
7330577Three-dimensional modeling of the oral cavity by projecting a two-dimensional array of random patterns
A method for creating three-dimensional models of intra-oral scenes and features. The intra-oral scene is illuminated by a two-dimensional array of structured illumination points, with anti-aliasing achieved by using stored two-dimensional patterns of pixels for ant...
02/12/2008
7327857Non-contact measurement method and apparatus
A non-contact imaging apparatus for examining an object having complex surfaces or shape deformations. The imaging apparatus includes at least one imaging device for obtaining a scanned image of the exterior surfaces of the object being examined. A predetermined ref...
02/05/2008
7324712Quality factor
The present invention concerns the discrimination of good measurement results measured by a computer vision system from bad results. By the method of the invention, values calculated from the observation vectors of several measuring devices can be discriminated into...
01/29/2008
7321680Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system
A graphic contour extracting method includes: acquiring an image of a graphic form to be inspected; defining an inspection region for the image of the graphic form to be inspected by an inspection graphic form including at least one of a circle, an ellipse, a rectan...
01/22/2008
7317542Method and device for optically measuring the surface shape and for the optical surface inspection of moving strips in rolling and processing installations
The invention relates to a method and a device for optically measuring the surface shape and for the optical surface inspection of moving elongated bodies, according to which surface shape measurement and surface inspection are integrated. A projector applies a line...
01/08/2008
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