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Class 356/602 - Triangulation


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter wherein the measurement is performed by
No. of patents: 330
Last issue date: 01/10/2012


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NumberTitleIssue Date
8094321Photogrammetric target and related method
A multi-target photogrammetric target assembly and related method of evaluating curvilinear surface character. The target assembly includes a first photogrammetric target disposed at a first support and a second photogrammetric target disposed at a second support. T...
01/10/2012
8094322Method and apparatus for the determination of the 3D coordinates of an object
In a method for the determination of the 3D coordinates of an object (2), a pattern is projected (1) onto the object (2) and the pattern reflected by the object (2) is taken (3) and evaluated. To improve such a method, a pattern is...
01/10/2012
7884949Three-dimensional image measuring apparatus
The present invention relates to a three-dimensional image measuring apparatus comprising: an XYZ shaft transfer means mounted onto a base member; a work stage mounted to the base member, for moving a measuring object to a measuring position and thereafter supportin...
02/08/2011
7872764Machine vision for predictive suspension
A predictive suspension system for a vehicle includes an imaging sensor, and energy source and a control. The imaging sensor is disposed at a vehicle and has a generally downward field of view, with the field of view encompassing an area forward of a tire of the veh...
01/18/2011
7812970Method and system for inspecting parts utilizing triangulation
A method and system for inspecting parts utilizing triangulation are provided. The system includes a part support subsystem including a fixture for supporting a part to be inspected and a head apparatus. The head apparatus includes at least one radiation source for ...
10/12/2010
7733503Method and system for optical measurement of the shape of an article
The present invention relates to a method and system for measuring articles made of a material that is difficult to measure, such as glass. In the system, an elastic film (19) is arranged on top of an article (110). A number of measurement points have ...
06/08/2010
7684053Optical displacement sensor and distance measuring apparatus
An optical displacement sensor for measuring distance or surface displacement of an object by surface profile scanning includes an optical source, a first optical detector and a second optical detector. The optical source is located intermediate the first and second...
03/23/2010
7679757Non-contact profile measurement system
A non contact measurement system for in-process measurement of a work piece to is described. There is provided a sensor chassis that includes one or more contour sensors for capturing the profile of a work piece and outputting coordinate values describing one or mor...
03/16/2010
7671999Device for measuring parts by triangulation sensors and an evaluation unit for determining
A device for measuring components by a laser triangulation measuring device includes at least two triangulation sensors for determining the height profiles of components. The component is arranged on a movable support plane in a horizontal moving direction relative ...
03/02/2010
7643159Three-dimensional shape measuring system, and three-dimensional shape measuring method
A three-dimensional shape measuring system includes: a light projecting/receiving apparatus which causes a light receiver to receive light reflected on a surface of a measurement object onto a light receiving surface thereof at a predetermined cycle multiple times, ...
01/05/2010
7602506Method for contactlessly and dynamically detecting the profile of a solid body
The invention relates to a method for contactlessly and dynamically detecting the profile of a solid body. At least one light beam is generated by a laser device and expanded to form a linear light band projected onto the moving surface of the solid body. Light refl...
10/13/2009
7586623Optical metrology of single features
The profile of a single feature formed on a wafer can be determined by obtaining an optical signature of the single feature using a beam of light focused on the single feature. The obtained optical signature can then be compared to a set of simulated optical signatu...
09/08/2009
7573583Laser digitizer system for dental applications
An intra-oral laser digitizer system provides a three-dimensional visual image of a real-world object such as a dental item through a laser digitization. The laser digitizer captures an image of the object by scanning multiple portions of the object in an exposure p...
08/11/2009
7483151Active 3D triangulation-based imaging method and device
Active 3D triangulation-based imaging comprises steps of: temporally modulating a radiant flux of a lighting unit beam by a binary modulation signal (ms); illuminating a scene (S), which is illuminated by an ambient lighting (AL), by said modulated lighting unit bea...
01/27/2009
7453580Three-dimensional image measuring apparatus
The present invention relates to a three-dimensional image measuring apparatus comprising: an XYZ shaft transfer means mounted onto a base member; a work stage mounted to the base member, for moving a measuring object to a measuring position and thereafter supportin...
11/18/2008
7440119Three-dimensional shape detecting device, image capturing device, and three-dimensional shape detecting method
There is provided a three-dimensional shape detecting device comprising: pattern beam projection means which projects a plurality of pattern beams including two pattern beams having different angular widths; image capturing means which captures an image of a subject...
10/21/2008
7420196Multiple axis multipoint non-contact measurement system
Apparatus for optically measuring a remote object comprises at least one source for projecting a plurality of discrete zones of electromagnetic radiation (for example laser spots) along a projection plane. Imaging apparatus images a plurality of reflections from the...
09/02/2008
7379192Optical metrology of single features
The profile of a single feature formed on a wafer can be determined by obtaining an optical signature of the single feature using a beam of light focused on the single feature. The obtained optical signature can then be compared to a set of simulated optical signatu...
05/27/2008
7372985Systems and methods for volumetric tissue scanning microscopy
In accordance with preferred embodiments of the present invention, a method for imaging tissue, for example, includes the steps of mounting the tissue on a computer controlled stage of a microscope, determining volumetric imaging parameters, directing at least two p...
05/13/2008
7372642Three-channel camera systems with non-collinear apertures
A three-dimensional imaging system uses a single primary optical lens along with three non-collinear apertures to obtain three offset optical channels each of which can be separately captured with an optical sensor. ...
05/13/2008
7372555Method of fabrication of semiconductor integrated circuit device
In the fabrication of a semiconductor integrated circuit device, a 2D-3D inspection technique for solder printed on a substrate is provided which permits easy preparation of data and easy visual confirmation of a defective portion. In a substrate inspecting step, fi...
05/13/2008
7369243Optical measuring apparatus and optical measuring method
An optical measuring apparatus comprises: an illuminating section that illuminates a first object with a first light; a light changing section that changes an intensity of the first light illuminating the first object; a light receiving device that receives a second...
05/06/2008
7369142Image-displaying apparatus and method for obtaining pixel data therefor
A receiver measures strength of magnetic field generated by a transmitter and supplies it to a computer. The computer detects a viewpoint of a viewer based on the strength. The computer sets each pixel-displaying element arranged on the display portion of image disp...
05/06/2008
7366344Edge normal process
An edge inspection method for detecting defects on a wafer edge normal surface includes acquiring a set of digital images which captures a circumference of the wafer. An edge of the wafer about the circumference is determined. Each digital image is segmented into a ...
04/29/2008
7360410Procedure and device for testing tires
A procedure serves for the testing of tires by means of a testing system. The testing system includes a memory in which geometric data (1, 2, 3, 4, 5, 6) of the tire (7) are stored, and at least one probe (8) for testing the tire (7) surf...
04/22/2008
7359042Inspection system for limited access spaces
A limited access space inspection system comprising: an imaging device for imaging a region in the limited access space, a mounting for mounting the imaging device to scan about the limited access space and a scanning control unit, associated with the imaging device...
04/15/2008
7359817Method of and device for re-calibrating three-dimensional visual sensor in robot system
A re-calibration method and device for a three-dimensional visual sensor of a robot system, whereby the work load required for re-calibration is mitigated. While the visual sensor is normal, the visual sensor and a measurement target are arranged in one or more rela...
04/15/2008
7359068Laser triangulation method for measurement of highly reflective solder balls
A system and method of determining a height and/or position of at least one element on an area array device. A laser beam scans the area array device using at least two different laser light intensities. Reflected light is sampled, and the height and/or position of ...
04/15/2008
7355687Method and apparatus for vehicle service system with imaging components
An improved vehicle wheel service system for servicing a vehicle wheel assembly, configured with one or more imaging sensors to accurately measure distances, dimensions, and characteristics of features associated with a vehicle wheel assembly undergoing a service.
04/08/2008
7349104System and a method for three-dimensional imaging systems
A method for acquiring a surface profile 3D data set of an object includes illuminating a surface of the object with a sequence of multiple rainbow projection (MRP) structural light patterns, capturing light reflected from the object, and calculating 3D data (X, Y, ...
03/25/2008
7349152Three-dimensional confocal microscope system
This invention is characterized by the following feature. A three-dimensional confocal microscope system for performing image processing based on image pickup data of sliced images of a sample outputted from a confocal scanner and thus acquiring a three-dimensional ...
03/25/2008
7342669Three-dimensional shape measuring method and its device
A three-dimensional shape is measured by a simple system structure. A three-dimensional shape measuring instrument comprises a device (1-1) in which a light-emitting diode (1-1b) is installed as a marker in a line laser light sourc...
03/11/2008
7336816Method and apparatus for measuring shape of bumps
The present invention provides a bump shape measuring apparatus comprising an illumination optical system which illuminates bumps arranged on a board with illumination light of a low tilt angle to a surface of the board; a detection optical system where reflected li...
02/26/2008
7336373Surface shape measuring apparatus and surface shape measuring method
In order to provide a surface shape measuring apparatus and a surface shape measuring method capable of detecting a distortion on the curved surface of a work precisely, a laser displacement meter 17 disposed to the outside surface of a door panel 51 o...
02/26/2008
7335876Scanning device for carrying out a 3D scan of a dental model, sliding panel therefore, and method therefor
A scanning system for carrying out a 3D scan of a tooth model includes an imaging device and a positioning system in the form of a sliding panel which can be positioned and has first locking means. On the locking panel there are provided second locking means which i...
02/26/2008
7323670Laser operation for survey instruments
The performance of a laser scanner is optimized in the field by automatically determining appropriate laser parameters for the scan location. A laser control system uses information such as the environmental temperature to select an appropriate range of start points...
01/29/2008
7321394Automatic gain control for a confocal imaging system
Automatic gain control is provided for a confocal imaging system to improve the quality of images produced by the system. The confocal imaging system utilizes an illumination source, such as a laser, to produce illumination which enables imaging of an object. The au...
01/22/2008
7317830Background estimation and segmentation based on range and color
Segmentation of background and foreground objects in an image is based upon the joint use of range and color data. Range-based data is largely independent of color image data, and hence not adversely affected by the limitations associated with color-based segmentati...
01/08/2008
7315644Investigation of destroyed assemblies and identification of components thereof
A method is disclosed for providing a means for identifying recovered component parts of a destroyed assembly quickly and relatively easily using digital or electronic scanning techniques and comparison to virtual components that are presumed to have constituted the...
01/01/2008
7312879Distance determination in a scanned beam image capture device
Methods, systems, and devices can determine spatial relationships between a probe and a target surface. Specular reflections from the target surface vary dramatically with small changes in angle between the scanning beam and the target surface, and as the geometry o...
12/25/2007
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