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A forehead support apparatus for resting a standing users forehead against a wall above a bathroom commode or urinal or beneath a showerhead.
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| Number | Title | Issue Date |
| 8189205 | Surface inspection tool and surface inspection method An object of the present invention is to provide a surface inspection tool in which a flat inspection range capable of measuring surface roughness of a wafer with patterns with high accuracy and in a nondestructive manner can be searched without visual search. In or... | 05/29/2012 |
| 8159679 | Apparatus for measuring carriageway surface properties An apparatus for measuring surface properties of a carriageway or road, comprising a platform arranged to move over the carriageway, the platform carrying a light source arranged to illuminate the carriageway, and a detector arranged to receive light returning from ... | 04/17/2012 |
| 8144337 | Inspecting method and inspecting apparatus for substrate surface To inspect a substrate such as a semiconductor substrate for surface roughness at high precision. The surface roughness of the substrate is measured in each frequency band of the surface roughness by applying a light to the substrate surface and detecting a s... | 03/27/2012 |
| 8111405 | Automatic scan and mark apparatus An automatic scan and mark apparatus has a machine tool, a location detection module, a laser detector, an ink jet and a control computer. The machine tool has a movable module and a stage. The stage mounts and holds a specimen having a scraped surface. The control ... | 02/07/2012 |
| 8045179 | Bright and dark field scatterometry systems for line roughness metrology Line edge roughness or line width roughness of a feature on a sample may be determined from incident radiation scattered from the feature. An amount of ordered scattered radiation characterized by a discrete diffraction order is determined and a diffuse scattered ra... | 10/25/2011 |
| 8018603 | Paper type determination device A paper type determination device of the invention drives plural light emitting points different from one another and having sequentially increasing distances from a reference point to emit light in such a manner that each is identified for irradiating one surface o... | 09/13/2011 |
| 7884948 | Surface inspection tool and surface inspection method An object of the present invention is to provide a surface inspection tool in which a flat inspection range capable of measuring surface roughness of a wafer with patterns with high accuracy and in a nondestructive manner can be searched without visual search. In or... | 02/08/2011 |
| 7733502 | Roughness evaluation method and system A roughness evaluation method for evaluating a roughness of lines formed on a substrate includes a measuring step of irradiating light onto a plurality of locations of the substrate and measuring a state of reflected light by a scatterometry; and an analyzing step o... | 06/08/2010 |
| 7710582 | Laser processing apparatus and laser processing method for cutting and removing a part of a surface region of a substrate Before applying a processing laser beam to a surface of a substrate through a film of liquid, distance M2 between a reference point on an axis of a first laser displacement meter and the surface of the substrate is measured to correct distance M1 betwe... | 05/04/2010 |
| 7679756 | Device for a goniometric examination of optical properties of surfaces A device for examining the optical properties of surfaces includes at least one first radiation device emitting radiation to a surface to be examined at least at a first predetermined spatial angle, at least one first detector for capturing the radiation emitted to ... | 03/16/2010 |
| 7659994 | Apparatus for the determination of surface properties A device for determining properties of surfaces having at least one first radiation device having at least one radiation source emitting radiation, having at least one first radiation detector having a first radiation detector element which captures at least a porti... | 02/09/2010 |
| 7630086 | Surface finish roughness measurement A method comprises generating a data set comprising first surface roughness data from a first orientation and second surface roughness data from a second orientation and determining a roughness bias parameter from the first surface roughness data and the second surf... | 12/08/2009 |
| 7626709 | Device for examining the optical properties of surfaces A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle, at least one first detector device for capturing the radiation emitted to... | 12/01/2009 |
| 7593115 | Determining a length of a carrier line deployed into a well based on an optical signal A component is deployed into a well on a carrier line having an optical cable. An optical signal is transmitted into the optical cable, and a travel time of the optical signal in the optical cable is determined. A profile of a characteristic along the optical cable ... | 09/22/2009 |
| 7557933 | Measuring probe, sample surface measuring apparatus and sample surface measuring method A measurement probe 1 for measuring a surface of sample S comprises a base section 10, a head section 30 having a probe tip 31, and a support structure section 15 which supports the head section 30 with the base section 1... | 07/07/2009 |
| 7548323 | Displacement and flatness measurements by use of a laser with diffractive optic beam shaping and a multiple point sensor array using the back reflection of an illuminating laser beam A laser beam system for measuring an aspect of a surface wherein a laser beam is reshaped into a corrected shaped laser beam having a corrected energy profile and subsequently reshaped into a measurement shaped laser beam having an measurement energy profile shaped ... | 06/16/2009 |
| 7538892 | Method and apparatus for examining end faces of light guides In order to provide light guides, in particular in the form of glass rod portions, with improved end faces, the invention provides a method for examining glass rods, in particular light guides, in which the glass rods are arranged in front of two cameras, the camera... | 05/26/2009 |
| 7528964 | Method and apparatus for examining surfaces containing effect pigments The present invention describes a method for an apparatus for examining surface properties. Properties of effect pigments are to be examined in particular. A surface (9) to be examined is examined at different emission and reception angles and any curvature o... | 05/05/2009 |
| 7440118 | Apparatus and method for color filter inspection The present invention provides an apparatus and method for detecting flatness and/or unevenness of a surface of an overcoat layer on a colored pixel layer of a color filter with a high degree of accuracy. The apparatus includes: a light source 34, placed almo... | 10/21/2008 |
| 7433055 | Device for the examination of optical properties of surfaces A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle; at least one first detector device for capturing the radiation emitted to... | 10/07/2008 |
| 7430052 | Method for correlating the line width roughness of gratings and method for measurement A method for correlating line width roughness of gratings first performs a step (a) generating a characteristic curve of a predetermined grating having a known line width, and a step (b) performing a comparing process to select a matching spectrum from a plurality o... | 09/30/2008 |
| 7428060 | Optimization of diffraction order selection for two-dimensional structures The number of diffraction orders to use in generating simulated diffraction signals for a two-dimensional structure in optical metrology is selected by generating a first simulated diffraction signal using a first number of diffraction orders and a hypothetical prof... | 09/23/2008 |
| 7427747 | Optical image pickup apparatus for imaging living body tissue A control portion of an optical image pickup apparatus includes a scan driver, a lock-in amplifier, and an A/D converter. The scan driver outputs a predetermined drive signal to a Y-scanning mirror and an X-scanning mirror and scans the Y-scanning mirror and the X-s... | 09/23/2008 |
| 7417722 | System and method for controlling light scattered from a workpiece surface in a surface inspection system A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a proc... | 08/26/2008 |
| 7405835 | High-accuracy pattern shape evaluating method and apparatus A quantity (or dispersion value) of a distribution of edge position due to random noise is expected to be reduced statistically to 1/N when N edge position data items are averaged. Using this property, the single page image is averaged in a vertical direction with v... | 07/29/2008 |
| 7397565 | Device and method for obtaining appearance information A device has first and second units that lights an object at first or second incident angles; a unit that generates image signals according to the intensity of the received light; units that guides diffusely and specularly reflected light from the object to the imag... | 07/08/2008 |
| 7394531 | Apparatus and method for automatic optical inspection An automated optical inspection system, comprising at least one camera having a field of view; and at least one image scanning module comprising a plurality of objective modules arranged to have fields of view covering a portion of an article during inspection, and ... | 07/01/2008 |
| 7391518 | Device and method for the determination of the quality of surfaces The present invention relates to a device and method for making quantified determinations of the quality of surfaces and wherein the device comprises an optical system with a first optical means and a second optical means as well as a control and evaluation means an... | 06/24/2008 |
| 7369253 | Systems and methods for measuring sample surface flatness of continuously moving samples Measurement of sample surface flatness of a continuously moving sample. A conveyor continuously conveys a sample beneath a grating disposed at a non-zero angle with respect to the plane of conveyance. The relative distance between the sample and the angled grating c... | 05/06/2008 |
| 7365889 | System and method for transparency optimization One embodiment pertains to analyzing a document that is to be printed on a transparency, determining whether the document formatting is optimized for transparency printing, and alerting a user if the document formatting is not optimized for transparency printing. An... | 04/29/2008 |
| 7366637 | Form measuring instrument A form measuring instrument comprising: a roughness sensor placed on the table, and for outputting measurement data that includes information on the cross-sectional shape; a relative movement mechanism for relatively moving the table and the roughness sensor such th... | 04/29/2008 |
| 7363181 | Straightness correcting method for surface texture measuring instrument, and surface texture measuring instrument A surface texture measuring instrument is provided that is capable of performing a correction operation depending on the rotation angle position of a detector even when the detector is rotated for measurement. ... | 04/22/2008 |
| 7362450 | Specular surface flaw detection An apparatus and a method for detecting low frequency specular surface flaws on coated substrates is disclosed. A method for detecting low frequency specular surface flaws may comprise: impinging visible electromagnetic radiation or light from an electromagnetic rad... | 04/22/2008 |
| 7355711 | Method for detecting an end-point for polishing a material An optical surface analysis system for scanning the surface of a (silicon) wafer and detect if any residual material is still on the wafer surface in order to determine an appropriate end-point in a polishing process. An Optical Surface Analyzer (OSA), of the presen... | 04/08/2008 |
| 7349082 | Particle detection device, lithographic apparatus and device manufacturing method To enable differentiation between a particle and a ghost particle, a detector system is presented. The detector system is configured to output at least two detector signals corresponding to an intensity of radiation being incident on the detector system. If radiatio... | 03/25/2008 |
| 7349096 | Scatterometer and a method for observing a surface A scatterometer comprising light source means (11) for providing an incident light beam (8) at different angles in the direction of a sample (5) to be analyzed, and a concave screen (1,2) for receiving the reflection (19) of the in... | 03/25/2008 |
| 7341502 | Methods and systems for planarizing workpieces, e.g., microelectronic workpieces Planarizing workpieces, e.g., microelectronic workpieces, can employ a process indicator which is adapted to change an optical property in response to a planarizing condition. This process indicator may, for example, change color in response to reaching a particular... | 03/11/2008 |
| 7336376 | Measuring pyramid size on a textured surface A method for measuring pyramid size of pyramids outwardly extending on a textured surface of an object, which method involves emitting from a light source a light beam along a first direction onto a region of the textured surface, measuring an intensity of light rec... | 02/26/2008 |
| 7336810 | Skin evaluation method and image simulation method A skin beauty evaluation method for imaging an object such as human face to obtain digital image data, extracting data on a mirror reflection light component of each pixel from the digital image data and evaluating the skin sheen and skin beauty by using this. A sim... | 02/26/2008 |
| 7335280 | Method and equipment in the measurement of the flatness of the flow surface of the headbox of a paper machine A method in the measurement of the flatness of the flow surface of a headbox of a paper machine is disclosed. The flatness is determined by placing a measuring tool on the flat surface formed by the flow surface and measuring the position of the measuring tool at ea... | 02/26/2008 |
