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Class 356/491 - Having polarization


Subclass of Class 356 - Optics: measuring and testing
Definition: Measuring and testing by light interference wherein an
No. of patents: 297
Last issue date: 02/07/2012


1                
NumberTitleIssue Date
8111402Optical sensing based on overlapping optical modes in optical resonator sensors and interferometric sensors
Techniques and devices based on transverse magnetic (TM) and transverse electric (TE) modes in an optical resonator or interferometer to provide sensitive optical detection with insensitivity to a change in temperature. A shift in a difference between a first resona...
02/07/2012
7889352Integrated polarization beam splitter with quarter-wave plate for polarimeter and PMD compensation applications
An optical device for changing polarization comprises a waveguide having a waveguide end facet coupled to a quarter-wave plate/reflector combination to rotate the polarization of incident light to the waveguide by 90 degrees. In one embodiment, a polarization beam s...
02/15/2011
7876450Common-path interferometer rendering amplitude and phase of scattered light
A beam of coherent laser light with linear polarization oriented at 45 degrees to vertical is expanded, and passes through a quarter-wave plate with the fast axis oriented vertically, creating circularly polarized light. The light then passes through a non-polarizin...
01/25/2011
7869054Polarization insensitive multiple probe
An apparatus for determining a polarization-insensitive interferometric signal and a birefringence for a sample and methods for using such an apparatus to characterize the sample are proved herein. Such apparatuses may generally be designed to eliminate birefringenc...
01/11/2011
7864333Polarization modulated image conjugate piston sensing and phase retrieval system
A system for detecting piston diversity between mirror segments. The system includes a pupil plane mask, a transform optical element, and an image detector. The pupil plane mask includes two or more open mask areas and two or more polarizers. Each polarizer is dispo...
01/04/2011
7847952Delayed interferometer enabling a reduction of polarization-dependent frequency shift and demodulator
An interferometer of the present invention includes: a splitting element which splits an incident light beam into a first split beam and a second split beam; and a first phase compensator which is positioned in an optical path of the first split beam, and which comp...
12/07/2010
7821644Apparatus for visual inspection
An apparatus is provided which reduces the dependency of the direction of polarization on channels of an image sensor so as to improve the sensitivity of inspection. In the apparatus, the direction of an illumination beam incident on a polarizing beam splitter is ma...
10/26/2010
7768650Optoelectronic biochip
The present invention provides a biochip for testing biological substances comprising a plurality of binding sites, optical means for determining a specific binding event at each binding site, wherein the plurality of binding sites and the means for determining a sp...
08/03/2010
7760363Method and apparatus for simultaneously acquiring interferograms and method for solving the phase information
A method and apparatus for simultaneously acquiring interferograms created with a plurality of different interference conditions are provided in the present invention. In the present invention, an object beam and a reference beam are used to interfere with each othe...
07/20/2010
7652770Optical nonliner evaluation device and optical switching element
An optical nonlinear evaluation device (1) capable of accurately evaluating the optical nonlinearity of a Kerr medium in accordance with a phase difference caused by cross-phase modulation generated in the Kerr medium includes: a polarization Sagnac interfere...
01/26/2010
7602499Measuring polarization mode dispersion
A device for measuring polarization mode dispersion (PMD) in a device under test (DUT) includes a polarized light source for launching a test beam through the DUT, and a PMD analyzer, which uses one of a plurality of known techniques, e.g. fixed analyzer-Fourier tra...
10/13/2009
7599069Vector beam generator using a passively phase stable optical interferometer
Provided are techniques for generating optical vector beams (e.g., radially and azimuthally polarized light) using passive or active phase stable optical interferometry. Techniques may split an input optical beam into at least two output beams, and then couple those...
10/06/2009
7573579Coded aperture imaging photopolarimetry
An imaging polarimeter includes a polarization dispersing element, a spatial light modulator, a complementary polarization dispersing element, a polarization analyzer, an electronic detection plane, and a processor. The polarization dispersing element polarimetrical...
08/11/2009
7508526Defect inspecting apparatus
In a defect inspecting apparatus, a differential interference optical system forms a differential interference image which is produced from an optical interference of images in a predetermined direction, the images corresponding to inspecting parts of a pattern form...
03/24/2009
7483146Systems configured to provide illumination of a specimen or to inspect a specimen
Systems configured to provide illumination of a specimen or to inspect a specimen are provided. One system includes a light source configured to generate pulses of light at a repetition rate. The system also includes optical elements arranged in a first interferomet...
01/27/2009
7483145Simultaneous phase shifting module for use in interferometry
A back-end assembly for use with a front-end assembly in acquiring phase-shifted interferograms having a plurality of imaging modules (Ma, Mb, Mc). Each module (Ma, Mb, Mc) has a quarter wave plate (30a, 30b, 30c), a polariz...
01/27/2009
7466425Elementary matrix based optical signal/network analyzer
A method for characterizing a device under test includes propagating multiple optical signals through the device under test and combining the multiple optical signals with a reference optical signal. The multiple optical signals are mixed with the reference optical ...
12/16/2008
7463361Optical apparatus having a polarization splitter and multiple interferometers
A passive optical system substantially simultaneously separates light received at an optical input into three or more output light beams on optical outputs. The output light beams may have intensities that are proportional to intensities of optical projections of th...
12/09/2008
7440108Imaging spectrometer including a plurality of polarizing beam splitters
The present invention relates to an imaging apparatus and comprises input and output polarisers, a first polarising beam splitter and at least one additional polarising beam splitter, a light sensitive detector and focussing means arranged on an axis. The input pola...
10/21/2008
7426021Interferometric optical analyzer and method for measuring the linear response of an optical component
An interferometric optical analyzer apparatus comprises a light source, an interferometer and a detection system for determining the linear response, and subsequently any optical parameter, of one or more optical elements using substantially unpolarized light. In on...
09/16/2008
7422891Label-free high-throughput optical technique for detecting biomolecular interactions
Methods and compositions are provided for detecting biomolecular interactions. The use of labels is not required and the methods can be performed in a high-throughput manner. The invention also provides optical devices useful as narrow band filters. ...
09/09/2008
7407817Surface plasmon resonance sensors and method for detecting samples using the same
Disclosed is an optical sensing device including a source unit providing a beam of light with continuously modulated phase retardation between p- and s-polarization components of the light by employing a LCM; a reference unit receiving a first part of the light to p...
08/05/2008
7388673Heterodyne optical spectrum analyzer
A heterodyne optical signal analyzer (HOSA) permits accurate reconstruction of an optical input signal (Es) in the time domain. In one embodiment, a vector representation of the light is used to account for two polarization states of the optical signal. The componen...
06/17/2008
7372578Optical image measuring apparatus
Provided is an optical image measuring apparatus capable of effectively receiving interference light, particularly an alternating current component thereof using a smaller number of photo sensors. The optical image measuring apparatus includes a polarizing plate for...
05/13/2008
7373038Optical switch having a reflective component
A reflective optical switch for use in optical systems, such as fiber optic communications networks, is disclosed. The optical switch includes not only signal transmission characteristics, but also signal reflection capability. The optical switch includes a semicond...
05/13/2008
7370314Method and program for generating layout data of a semiconductor integrated circuit and method for manufacturing a semiconductor integrated circuit with optical proximity correction
A method for generating layout data of a semiconductor integrated circuit includes applying optical proximity correction conditions to cells so as to generate cell patterns, selecting cell patterns to correspond cells, based on layout information of cells along a sp...
05/06/2008
7362444Interferometers for optical coherence domain reflectometry
An interferometer system includes an optical radiation source, an optical circulator connected between the optical radiation source and a sample location for transmitting optical radiation from the optical radiation source to the sample location, an output of the op...
04/22/2008
7362445Active control and detection of two nearly orthogonal polarizations in a fiber for heterodyne interferometry
A polarization control system includes a light source that generates two light beams with different polarization states and optical frequencies. A polarization state modulator changes the polarization states of the two light beams. A first detector path generates a ...
04/22/2008
7357570Method and device for contactless temperature monitoring and temperature adjustment
A method and device for determining the temperature of a sample, wherein a probing light beam is directed onto the sample whereby at least two partial beams of the probing light pass through paths of different lengths inside the sample by backscattering or reflectin...
04/15/2008
7358516System and method for determining a position or/and orientation of two objects relative to each other as well as beam guiding arrangement, interferometer arrangement and device for changing an optical path length for use in such a system and method
A system and a method for determining a position of two objects relative to each other is suggested, comprising: a source 43 of coherent radiation, a beam guidance for providing a measuring branch 49 for a measuring beam, which has an optical path leng...
04/15/2008
7359061Method and apparatus for providing polarization insensitive signal processing for interferometric sensors
A method and apparatus that uses specific source modulation and detectors to detect a response that carries information about a system response matrix associated with each sensor in a interferometric sensor array and extracting a sensor response in a manner that eli...
04/15/2008
7352469Quantum resonance analytical instrument
Quantum resonance fluorescent microscope systems for detecting component substances in a specimen are described. The systems are based on exciting the sample containing the material with a femtosecond to nanosecond probe pulse of collimated light, which is tailored ...
04/01/2008
7349077Method and apparatus for measuring the polarization mode dispersion of an optical fiber
The present invention relates to a new model for interpreting interferometric measurements, able to lead to a new method, system (10) and device (27) for measuring the PMD (Polarisation Mode Dispersion) of an optical fibre (11). The model, which...
03/25/2008
7345769Load dependent analyzing optical components
The present invention relates to an apparatus and to a method of load dependent analyzing an optical component (114), comprising the steps of: splitting an initial signal (115) into the reference signal (115b) into and into a measurement ...
03/18/2008
7339682Heterodyne reflectometer for film thickness monitoring and method for implementing
The present invention is directed to a heterodyne reflectometer system and method for obtaining highly accurate phase shift information from heterodyned optical signals, from which extremely accurate film depths can be calculated. A linearly polarized light comprise...
03/04/2008
7339681Surface plasmon resonance microscope using common-path phase-shift interferometry
The present invention integrates the surface plasmon resonance and common-path phase-shift interferometry techniques to develop a microscope for measuring the two-dimensional spatial phase variation caused by biomolecular interactions on a sensing chip without the n...
03/04/2008
7336371Apparatus and method for measuring the wavefront of an optical system
A device and a method for wavefront measurement of an optical system (7), in particular by an interferometric measurement technique. A dynamic range correction element (12, 12a) is arranged in the beam path upstream of the detector arrangement (...
02/26/2008
7333212Method and apparatus for measuring the absorption coefficient and the reduced scattering coefficient of a multiple scattering medium
In a method for measuring an absorption coefficient and a reduced scattering coefficient of a multiple scattering medium, a source light beam is outputted, and is transformed into a transformed light beam that includes a mutually parallel circularly polarized photon...
02/19/2008
7330259Optical measurements of patterned articles
A method and system are presented for use in measuring/inspecting a patterned article. Optical measurements are applied to a measurement site on the article by illuminating the measurement site with a plurality of wavelengths at substantially normal incidence of the...
02/12/2008
7327464System and method for coherent optical inspection
A system and method for coherent optical inspection are described. In one embodiment, an illuminating beam illuminates a sample, such as a semiconductor wafer, to generate a reflected beam. A reference beam then interferes with the reflected beam to generate an inte...
02/05/2008
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