Bizarre Patents
Crispy Chip Sandwich and Process of Producing a Sandwich Product
A food product comprising a multilayer cookie or snack having outer layers formed from a crispy type edible food product such as a potato chip or corn chip, etc. with an intermediate marshmallow layer being in contact with the inner surface of each crispy chip and one or more filler substances.
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| Number | Title | Issue Date |
| 7986414 | Measurement of multiple surface test objects with frequency scanning interferometer A frequency scanning interferometer is arranged for simultaneously measuring multiple surfaces of a test object through a wide range of expected offsets. Knowledge of the expected locations of the test surfaces is compared with a sequence of ambiguity intervals base... | 07/26/2011 |
| 7961332 | Fiber-optic heterodyne imaging vibrometer A method and system for performing two-dimensional laser Doppler vibrometry (LDV) are disclosed. A high speed fiber optic heterodyne imaging vibrometer can be used for the imaging of high speed surface deformation and/or vibration. Images provided by the high speed ... | 06/14/2011 |
| 7924430 | Optical heterodyne fourier transform interferometer An interferometer and method for interferometric analysis are provided. The methodology includes generating first and second light beams from a light source, interacting the first light beam with an object under inspection, forming, from light emanating from the obj... | 04/12/2011 |
| 7830527 | Multiple frequency optical mixer and demultiplexer and apparatus for remote sensing A pulsed laser system includes a modulator module configured to provide pulsed electrical signals and a plurality of solid-state seed sources coupled to the modulator module and configured to operate, responsive to the pulsed electrical signals, in a pulse mode. Eac... | 11/09/2010 |
| 7808647 | Shape measuring method A method for detecting shapes based on interferometric observation of an object surface subjected to narrow-band lighting. Movement of the interferometer (1) relative to the object surface (2) generates a measuring signal on a photo receiver, e.g., cam... | 10/05/2010 |
| 7719691 | Wavefront measuring apparatus for optical pickup A wavefront measuring apparatus for optical pickup includes: a beam splitting section; a wavefront shaping section; a beam combining section that generate interference light; an interference fringe image-acquiring section that acquires an interference fringe image i... | 05/18/2010 |
| 7692796 | Optical characteristic measuring apparatus An optical characteristic measuring apparatus includes: a light source section which sweeps wavelengths of a first input light and a second input light respectively, frequencies of the first and second input lights being different from each other and polarized state... | 04/06/2010 |
| 7599068 | Shape measurement method A method for detecting shapes based on interferometric observation of an object surface subjected to narrow-band lighting. Movement of the interferometer (1) relative to the object surface (2) generates a measuring signal on a photo receiver, e.g., cam... | 10/06/2009 |
| 7538884 | Optical tomographic imaging apparatus An optical tomographic imaging apparatus capable of obtaining a high resolution tomographic image rapidly. Light beams swept in wavelength intermittently and repeatedly within first and second wavelength ranges respectively are outputted simultaneously from a light ... | 05/26/2009 |
| 7495769 | Apparatus and method for joint measurements of conjugated quadratures of fields of reflected/scattered and transmitted beams by an object in interferometry An interferometery system for making interferometric measurements of an object, the system including: a beam generation module which during operation delivers an output beam that includes a first beam at a first frequency and a second beam at a second frequency that... | 02/24/2009 |
| 7423763 | Faster processing of multiple spatially-heterodyned direct to digital holograms Systems and methods are described for faster processing of multiple spatially-heterodyned direct to digital holograms. A method includes of obtaining multiple spatially-heterodyned holograms, includes: digitally recording a first spatially-heterodyned hologram inclu... | 09/09/2008 |
| 7365858 | Systems and methods for phase measurements Preferred embodiments of the present invention are directed to systems for phase measurement which address the problem of phase noise using combinations of a number of strategies including, but not limited to, common-path interferometry, phase referencing, active st... | 04/29/2008 |
| 7359065 | Method of combining holograms A method of combining holograms or phase images of an object is disclosed, where attributes of the data used to record two phase images of overlapping portions of the surface of an object are compared and used to match pixels of the two recordings. A relative tilt a... | 04/15/2008 |
| 7349102 | Methods and apparatus for reducing error in interferometric imaging measurements Described is a fringe generator for an interferometric measurement system having improved fringe stability and reproducibility. The fringe generator includes a light source at a characteristic wavelength and a diffractive element to generate a pair of diffracted bea... | 03/25/2008 |
| 7349100 | Recording multiple spatially-heterodyned direct to digital holograms in one digital image Systems and methods are described for recording multiple spatially-heterodyned direct to digital holograms in one digital image. A method includes digitally recording, at a first reference beam-object beam angle, a first spatially-heterodyned hologram including spat... | 03/25/2008 |
| 7345770 | Optical image measuring apparatus and optical image measuring method for forming a velocity distribution image expressing a moving velocity distribution of the moving matter An optical image measuring apparatus capable of speedily measuring a velocity distribution image of a moving matter. Including a broad-band light source, lenses for increasing a beam diameter, a polarizing plate converting the light beam to linearly porlarized light... | 03/18/2008 |
| 7342717 | Wave field microscope with detection point spread function The present invention relates to two new wave field microscopes, type I and type II, which are distinguished by the fact that they each have an illumination and excitation system, which include at least one real and one virtual illumination source, and at least one ... | 03/11/2008 |
| 7333213 | Confocal microscopy An improved confocal microscope system is provided which images sections of tissue utilizing heterodyne detection. The system has a synthesized light source for producing a single beam of light of multiple, different wavelengths using multiple laser sources. The bea... | 02/19/2008 |
| 7319528 | Surface texture measuring instrument A surface texture measuring instrument provided with a near-field measuring unit (30) including a near-field probe (33) that forms a near-field light at a tip end thereof when a laser beam is irradiated, a laser source (35) that generates the la... | 01/15/2008 |
| 7317541 | Interferometry method based on the wavelength drift of an illumination source An interferometry method using a laser of nominally fixed—but unknown and changing—frequency and phase angle, for example, attributable to laser drift. The interference pattern is periodically sampled at a frequency considerably higher than the phase shift of th... | 01/08/2008 |
| 7315384 | Inspection apparatus and method of inspection An inspection apparatus, comprising; an illumination system configured to provide an illumination beam for irradiating a target; a first detection system configured to detect radiation scattered from the target in a non-zero order diffraction direction; and the dete... | 01/01/2008 |
| 7307733 | Optical image measuring apparatus and optical image measuring method An apparatus, which includes a light source, a polarizing plate for converting the light beam to linearly polarized light, a half mirror for dividing the light beam into signal light and reference light and superimposing the signal light and the reference light on e... | 12/11/2007 |
| 7304745 | Phase measuring method and apparatus for multi-frequency interferometry The invention provides a novel method for absolute fringe order identification in multi-wavelength interferometry based on optimum selection of the wavelengths to be used. A theoretical model of the process is described which allows the process reliability to be qua... | 12/04/2007 |
| 7295293 | Apparatus and method for testing a reflector coating A method of testing a coating on a reflector having a first focal point includes placing a mirror at the first focal point of the reflector and angled to orient with an area on the coating. Electromagnetic (EM) radiation is directed to the mirror which then directs ... | 11/13/2007 |
| 7295324 | System and method for improving accuracy in a speckle-based image correlation displacement sensor A system and method for improving the accuracy of a speckle-based image correlation displacement sensor provides ultra-high accuracy by ensuring that, in the absence of motion, the speckle image does not vary over time. In one embodiment, the speckle image is stabil... | 11/13/2007 |
| 7289253 | System and methods for shearless hologram acquisition Systems and methods for shearless digital hologram acquisition, including an apparatus incorporating an illumination source configured to produce a first beam of light, which is then split by a beamsplitter into a reference beam and an object illumination beam. The ... | 10/30/2007 |
| 7286234 | Copper foil inspection device copper foil inspection method defect inspection device and defeat inspection method A surface of copper foil wound onto a guide roller 26 is irradiated with light. Specular light from the copper foil surface is received by CCD cameras 14a, and scattered light from the copper foil surface is received by CCD cameras 14b... | 10/23/2007 |
| 7286238 | Feature isolation for frequency-shifting interferometry Frequency-scanning interferometry is used for measuring test objects having multiple surface regions. The regions are distinguished and can be measured based on different measuring criteria. Interference data is gathered for the imageable portion of the test object ... | 10/23/2007 |
| 7280221 | High efficiency low coherence interferometry In accordance with the present invention, embodiments of interferometers are presented that improves both the polarization dependency problem and helps prevents light from being reflected back into the light source, among other things. Interferometer embodiments can... | 10/09/2007 |
| 7280186 | High resolution chirped/AM optical FM laser radar Optical techniques are disclosed for improving the range resolution of a radar system. An optical source produces chirped optical pulses whose frequency changes linearly with time, wherein the pulse duration is close to the repetition period (quasi cw radiation). Th... | 10/09/2007 |
| 7277181 | Interferometric apparatus and method for surface profile detection An apparatus for detecting the surface profile of a test object includes a light source, a beam splitter, a reflective component, a sensor, and a computing device. The light source emits a light beam. The beam splitter divides the light beam into reference and probi... | 10/02/2007 |
| 7268885 | Optical image measuring apparatus for forming an image of an object to be measured based on interference light An optical image measuring apparatus capable of effectively obtaining a direct current component of a heterodyne signal which is composed of background light of interference light is provided. The optical image measuring apparatus includes: an optical interference s... | 09/11/2007 |
| 7268889 | Phase-resolved measurement for frequency-shifting interferometry A frequency-shifting interferometer gathers intensity data from a set of interference patterns produced at different measuring beam frequencies. A periodic function is matched to the intensity data gathered from the set of interference patterns over a corresponding ... | 09/11/2007 |
| 7256894 | Method and apparatus for performing second harmonic optical coherence tomography The invention is an apparatus and method for second harmonic optical coherence tomography of a sample comprising a laser coupled to an interferometer which has a reference arm and in a sample arm. A nonlinear crystal in the reference arm generates a second harmonic ... | 08/14/2007 |
| 7248371 | Optical image measuring apparatus Provided is an optical image measuring apparatus capable of easily changing a scanning interval of an object to be measured in a depth direction with high precision. The apparatus includes an interference optical system for superimposing signal light propagating thr... | 07/24/2007 |
| 7242484 | Apparatus and methods for surface contour measurement Apparatus and methods of measuring three-dimensional position information of a onto a surface of an object including two sources of radiation separated by a distance, each source having a spectral distribution, and being coherent with respect to the other of the sou... | 07/10/2007 |
| 7242464 | Method for characterizing optical systems using holographic reticles Characterization of an optical system is quickly and easily obtained in a single acquisition step by obtaining image data within a volume of image space. A reticle and image plane are positioned obliquely with respect to each other such that a reticle having a plura... | 07/10/2007 |
| 7239398 | Profiling complex surface structures using height scanning interferometry A method including comparing information derivable from a scanning interferometry signal for a first surface location of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of cha... | 07/03/2007 |
| 7232485 | Method of determining crystallization The present invention relates to a method for determining crystallization in a very small amount of a material of interest (eg a chemical or biological material of interest). ... | 06/19/2007 |
| 7209239 | System and method for coherent optical inspection A system and method for coherent optical inspection are described. In one embodiment, an illuminating beam illuminates a sample, such as a semiconductor wafer, to generate a reflected beam. A reference beam then interferes with the reflected beam to generate an inte... | 04/24/2007 |
