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"I watched his countenance closely, to see if he was not deranged ... and I was assured by other senators after he left the room that they had no confidence in it."
U.S. Senator Smith of Indiana ; After seeing Samuel Morse demonstrate the telegraph.
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| Number | Title | Issue Date |
| 8171051 | Quantum-based oblivious transfer and private data sampling protocols and systems for performing the same Various embodiments of the present invention relate to oblivious transfer protocols and to system for performing oblivious transfer. Embodiments of the present invention include a private data sampling protocol that is designed to balance the competing privacy inter... | 05/01/2012 |
| 7973939 | Differential-phase polarization-sensitive optical coherence tomography system A differential-phase polarization-sensitive optical coherence tomography system includes a polarized heterodyne interferometer for generating a reference beam to be reflected by a movable mirror unit, and a signal beam to be reflected by an imaging plane in a specim... | 07/05/2011 |
| 7864332 | Differential-phase interferometric system A differential-phase interferometric system includes a polarized heterodyne interferometer for generating reference and signal beam that travel along reference and signal channels, respectively. The signal beam is directed to a specimen and contains measured informa... | 01/04/2011 |
| 7705994 | Monolithic displacement measuring interferometer with spatially separated but substantially equivalent optical pathways and optional dual beam outputs An interferometer and corresponding system are provided having several aspects. In a first aspect, there is provided an interferometer adapted to receive separate first and second beams f1 and f2 therein, the interferometer comprising substanti... | 04/27/2010 |
| 7554670 | Surface inspection by double pass laser doppler vibrometry A double pass apparatus for detecting defects on a disk surface includes a light source that generates a light beam and a beamsplitter that splits the light beam into a first light beam portion and a second light beam portion. A modulator is provided that modulates ... | 06/30/2009 |
| 7542147 | Data age compensation with avalanche photodiode A method is disclosed including conditioning a measurement signal from an interferometer, said conditioning characterized by one or more conditioning parameters; measuring a plurality of values for the conditioned measurement signal; providing one or more values ind... | 06/02/2009 |
| 7394548 | Heterodyne laser interferometer using heterogenous mode helium-neon laser and super heterodyne phase measuring method In the method and a device for detecting the phase of a moving object using a heterodyne interferometer, a heterogeneous mode helium-neon laser is used as a direct light source to increase a measuring speed, a measuring resolution, and minimize the loss of the light... | 07/01/2008 |
| 7375819 | System and method for generating beams of light using an anisotropic acousto-optic modulator A light source system includes a beam source generating a first input beam of light. An anisotropic acousto-optic modulator (AOM) is positioned to receive the first input beam. The AOM includes a plurality of transducers for receiving control signals and generating ... | 05/20/2008 |
| 7372576 | System and method for generating beams of light using an anisotropic acousto-optic modulator A light source system includes a beam source generating a first input beam of light with first and second beam components. The first component has a first linear polarization and a first frequency. The second component has a second linear polarization and a second f... | 05/13/2008 |
| 7370532 | RF communications method and system for laser ultrasonic testing A system including a processor, a high-energy density system linked to the processor, and a communicator linked to the processor. The communicator comprehensively integrates a plurality of hardware and software functions associated with operating the high-energy den... | 05/13/2008 |
| 7372577 | Monolithic, spatially-separated, common path interferometer Spatially-separated heterodyne interferometer architecture is combined with monolithic glass construction techniques to provide a monolithic, spatially-separated, common-path interferometer. The monolithic interferometer includes multiple optical components bonded t... | 05/13/2008 |
| 7365857 | Precompensation of polarization errors in heterodyne interferometry Apparatus and methods for adjusting the polarizations of the components of an input beam to reduce leakage caused by imperfections in an interferometer are disclosed. The apparatus includes an interferometer positioned to receive an input beam that includes two comp... | 04/29/2008 |
| 7362446 | Position measurement unit, measurement system and lithographic apparatus comprising such position measurement unit A measurement unit to determine a position in a first and second dimension includes a diffraction type encoder and an interferometer. The diffraction type encoder determines by means of a diffraction on a first and a second diffraction grating the position in the fi... | 04/22/2008 |
| 7349069 | Lithographic apparatus and positioning apparatus A lithographic apparatus comprises a substrate table to hold a substrate, a reference structure and a measurement system to measure a position of the substrate table with respect to the reference structure. The measurement system comprises a first measurement system... | 03/25/2008 |
| 7339682 | Heterodyne reflectometer for film thickness monitoring and method for implementing The present invention is directed to a heterodyne reflectometer system and method for obtaining highly accurate phase shift information from heterodyned optical signals, from which extremely accurate film depths can be calculated. A linearly polarized light comprise... | 03/04/2008 |
| 7330272 | Discrete quarter wave plates for displacement measuring interferometers At least two discrete quarter wave plates are provided for use as plane mirrors or reflectors in a displacement measuring interferometer, where the plates share common or substantially common reflecting surface geometries. A plurality of geometrically matched discre... | 02/12/2008 |
| 7330237 | Exposure apparatus equipped with interferometer and method of using same An exposure apparatus includes a projection optical system for projecting an exposure pattern, onto an object to be exposed, and a measuring apparatus for measuring, as an interference fringe, optical performance of the projection optical system, wherein the measuri... | 02/12/2008 |
| 7330250 | Nondestructive evaluation of subsurface damage in optical elements A non-destructive process for evaluating subsurface damage in an optical element focuses a microscope at points within the optical element and measures the intensity of reflected light. In one embodiment, a microscope focus a laser beam at a measurement point with t... | 02/12/2008 |
| 7327466 | Multi-corner retroreflector A two-corner retroreflector that includes a common face positioned to receive two beams and two corners each positioned to receive one of the beams and retro-reflect it back through the common face. ... | 02/05/2008 |
| 7327465 | Compensation for effects of beam misalignments in interferometer metrology systems In general, in a first aspect, the invention features methods that include deriving a first beam and a second beam from an input beam and directing the first and second beams along different paths, where the path of the first beam contacts a measurement object, prod... | 02/05/2008 |
| 7327448 | Laser-ultrasonic detection of flip chip attachment defects Underfill voids and solder ball defects are detected via laser generation and laser detection of an ultrasonic wave at the top surface of flip chips. High resolution is provided by using small laser spot sizes and closely-spaced laser beams of wavelengths that are a... | 02/05/2008 |
| 7321432 | Measurement and compensation of errors in interferometers In general, in one aspect, the invention features a method for determining the location of an alignment mark on a stage including measuring a location, x1, of a stage along a first measurement axis using an interferometer, measuring a location, x2 | 01/22/2008 |
| 7317194 | Microscope for performing multiple frequency fluorometric measurements An optical imager, such as a microscope for performing multiple frequency fluorometric measurements comprising a light source, such as a laser source is disclosed. The system is used to excite a sample into the fluorescent state. Light from the excited sample is col... | 01/08/2008 |
| 7312876 | Optical image measuring apparatus An optical image measuring apparatus capable of measuring an object to be measured which includes a birefringent layer in a short time is provided. The optical image measuring apparatus includes a broad-band light source, lenses for increasing a diameter of the ligh... | 12/25/2007 |
| 7310152 | Interferometer assemblies having reduced cyclic errors and system using the interferometer assemblies In general, in one aspect, the invention features apparatus that include an interferometer including a main assembly having two laterally displaced polarizing beam splitter interfaces, wherein the interfaces are positioned to receive two spatially separated beams an... | 12/18/2007 |
| 7298492 | Method and system for on-line measurement of thickness and birefringence of thin plastic films A system and method for analyzing the characteristics of a thin film is provided whereby the in-plane birefringence of thin films is determined by measuring the interference fringes in the transmission or reflection spectra using unpolarized light and light linearly... | 11/20/2007 |
| 7292347 | Dual laser high precision interferometer An absolute distance measuring device based on laser interferometry may combine coarse, intermediate, and highest resolution measurement techniques to find the absolute distance to a sample surface with high resolution. The device may provide at least two laser wave... | 11/06/2007 |
| 7286238 | Feature isolation for frequency-shifting interferometry Frequency-scanning interferometry is used for measuring test objects having multiple surface regions. The regions are distinguished and can be measured based on different measuring criteria. Interference data is gathered for the imageable portion of the test object ... | 10/23/2007 |
| 7278315 | Laser-ultrasonic detection of subsurface defects in processed metals Subsurface defects in a processed metal are detected by a laser-ultrasonic method involving generation of a surface acoustic wave at one location on the processed metal surface, and detection of a scattered acoustic wave at another location on the processed metal su... | 10/09/2007 |
| 7277180 | Optical connection for interferometry A method including: (i) directing a beam to an interferometer head using an optical connection, the beam including a first beam component having a first polarization and a first frequency and a second beam component having a second polarization different from the fi... | 10/02/2007 |
| 7274468 | Optical beam shearing apparatus Beam shearing apparatus for introducing a lateral shear between the components of a light beam. The apparatus is an optical assembly having a polarizing interface and input and output facets and two reflecting surfaces one of which is arranged at an angle generally ... | 09/25/2007 |
| 7274510 | Circulator and polarization beam combiner System and techniques for reducing the polarization dependency of an optical component by combining the actions of a circulator and a polarization beam combiner to separate an optical signal into a plurality of orthogonally oriented polarization components; rotate a... | 09/25/2007 |
| 7268886 | Method and apparatus for simultaneously measuring displacement and angular variations Disclosed herein is a method and apparatus for simultaneously measuring a displacement and angular variations. The method and apparatus of the present invention allows light radiated from a single light source to be placed along a light axis so as to simultaneously ... | 09/11/2007 |
| 7268888 | Compensation of refractivity perturbations in an interferometer path In general, in one aspect, the invention features a method that includes directing a first measurement beam along a first path contacting a measurement object to determine a first interferometric phase related to a position of a measurement object, directing a secon... | 09/11/2007 |
| 7265837 | Sensitive polarization monitoring and controlling Techniques and devices for monitoring polarization of light using at least two polarization elements where the difference between the outputs of the two polarization elements are used to monitor a change in polarization. ... | 09/04/2007 |
| 7254290 | Enhanced waveguide metrology gauge collimator A free-space optically-coupled collimator for the efficient bidirectional transmission of an optical metrology beam emanating from a waveguide aperture of a waveguide optical transmission element, all contained in an isothermal nested enclosure, with the waveguide e... | 08/07/2007 |
| 7251042 | Lithographic apparatus, interferometer and device manufacturing method A lithographic apparatus includes an interferometer configured to measure a position of a mirror of the lithographic apparatus. For measuring unflatness of the mirror the interferometer includes a modulator configured to modulate a position of an input beam of the i... | 07/31/2007 |
| 7251039 | Low non-linear error displacement measuring interferometer An interferometer is provided that minimizes the introduction of non-linear errors into displacement measurements. In one embodiment, non-linear errors are reduced by isolating reference and measurement beams over most of their respective optical paths leading to th... | 07/31/2007 |
| 7242481 | Laser vibrometry with coherent detection An optical system provides information about tangential vibration components of a surface at remote location. The optical system includes a light source assembly that emits first and second beams, each having one or more wavelengths and one or two polarizations. The... | 07/10/2007 |
| 7239397 | Device for high-accuracy measurement of dimensional changes Thermal expansion characteristics of test materials of ultra-low thermal expansion material are measured with a test beam that is split into a test material-measuring portion and an instrument-measuring portion. Both measuring portions propagate through common porti... | 07/03/2007 |
