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| Number | Title | Issue Date |
| 8149416 | Apparatus and method for dynamic cellular probing and diagnostics using holographic optical forcing array The present invention utilizes a holographic optical forcing array for dynamic cellular probing and diagnostics. A holographic optical trapping system generates optical forces on objects so that deformations thereof may be quantified. In one embodiment, digital holo... | 04/03/2012 |
| 8115933 | Interferometer for optically measuring an object An interferometer for optically measuring an object (10), including a light source (1), at least one beam splitter (2) and at least one detector (12a, 12b), with the beam splitter being arranged in the beam path of th... | 02/14/2012 |
| 8107083 | System aspects for a probe system that utilizes structured-light A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light so... | 01/31/2012 |
| 8040521 | Holographic condition assessment system for a structure including a semiconductor material An improved condition testing system and method integrated into microelectronic circuits includes a structure including a semiconductor material with a target portion and a second portion for determining the presence and nature of various external (e.g. magnetic fie... | 10/18/2011 |
| 7978333 | Holographic sensor having heterogeneous properties A sensor which comprises a support medium and a hologram disposed therein, wherein an optical characteristic of the medium varies as a result of a change of a property of the medium, and wherein the medium is heterogeneous such that the change of property is heterog... | 07/12/2011 |
| 7911618 | Holographic interferometry for non-destructive testing of power sources The present invention is connected with the holographic interferometry method and device that provides, to a very high precision, the reconstructing the original waveform of light emitted or reflected by an object. This method allows image resolution close to that o... | 03/22/2011 |
| 7880891 | Total internal reflection holographic microscope The present invention provides for a digital holographic microscope using a holographic interferometer and incorporating a TIR sample mount and microscopic imaging optics. The microscope uses phase shifting from frustrated internal reflection within a prism to measu... | 02/01/2011 |
| 7817283 | Determining electric field characteristics of laser pulses Various systems and methods for analysis of optical pulses are provided. In one embodiment, an optical system is provided having an optical axis. The optical system includes a two-dimensional diffraction grating positioned along the optical axis, and a spectral filt... | 10/19/2010 |
| 7808646 | Interferometer for optically measuring an object An interferometer for optically measuring an object (10), including a light source (1), at least one beam splitter (2) and at least one detector (12a, 12b), with the beam splitter being arranged in the beam path of th... | 10/05/2010 |
| 7796271 | Ear canal hologram for hearing apparatuses The aim is to be able to determine the spatial structure of an ear canal in a simple and reliable fashion. To this end, it is proposed to produce a hologram of the ear canal, by inserting a holography unit at least partially into the ear canal. The data for the shap... | 09/14/2010 |
| 7773230 | Interferometric condition assessment system for a microelectronic structure including a semiconductor or free-metal material An improved condition testing system and method includes a structure including a semiconductor material with a target portion and a second portion. The target portion has a first feature when at least one of the following occurs: an external force is received by the... | 08/10/2010 |
| 7616320 | Method and apparatus for recognition of microorganisms using holographic microscopy Disclosed herein is a method that relates to identifying a microorganism. The method comprising, diffracting laser light through a microorganism, combining a reference beam with the diffracted light on a single axis, and recording the combined light holographically ... | 11/10/2009 |
| 7609384 | Device for generating a carrier in an interferogram A process for generating a carrier in an interferogram in interferometry device either of the “real-time holographic interferometry” type or of the “double-exposure holographic interferometry” type, including recording a first wave front on a hologram, the f... | 10/27/2009 |
| 7505138 | Holographically compensated, self-referenced interferometer A holographically, self-referenced interferometer may include a detector to detect interference fringes in a reference leg optical signal. The interferometer may also include a holographic correction device to holographically compensate the reference leg optical sig... | 03/17/2009 |
| 7460240 | Apparatus and method for detecting deformability of cells using spatially modulated optical force microscopy The present invention utilizes spatially modulated optical force microscopy (SMOFM) with single beam optical force probing capability or with a holographic optical trapping system capable of multi-beam optical force probing coupled to a microscope objective, to gene... | 12/02/2008 |
| 7456973 | Method and device for the contour and/or deformation measurement, particularly the interference measurement, of an object The invention serves for the contour measurement and/or deformation measurement of an object, particularly a tire or a structural component of a composite material. The object is irradiated with light, particularly structured light, that is emitted by a radiation so... | 11/25/2008 |
| 7420687 | Condition assessment system for a structure including a semiconductor material An improved condition testing system and method includes a structure including a semiconductor material with a target portion and a second portion. The target portion has a first feature when at least one of the following occurs: an external force is received by the... | 09/02/2008 |
| 7400411 | Method for optically testing semiconductor devices A method for optically testing semiconductor devices or wafers using a holographic optical interference system with a light source providing a light beam of coherent wavelength with a wavelength to which the semiconductor material is transparent, splitting the light... | 07/15/2008 |
| 7379186 | Chirp indicator of ultrashort optical pulse There is provided a chirp indicator of ultrashort optical pulse in which a target ultrashort optical pulse is introduced into a spatial filter formed of a hologram in which is recorded information of chirp quantity of an ultrashort optical pulse used as a reference.... | 05/27/2008 |
| 7365858 | Systems and methods for phase measurements Preferred embodiments of the present invention are directed to systems for phase measurement which address the problem of phase noise using combinations of a number of strategies including, but not limited to, common-path interferometry, phase referencing, active st... | 04/29/2008 |
| 7359065 | Method of combining holograms A method of combining holograms or phase images of an object is disclosed, where attributes of the data used to record two phase images of overlapping portions of the surface of an object are compared and used to match pixels of the two recordings. A relative tilt a... | 04/15/2008 |
| 7330250 | Nondestructive evaluation of subsurface damage in optical elements A non-destructive process for evaluating subsurface damage in an optical element focuses a microscope at points within the optical element and measures the intensity of reflected light. In one embodiment, a microscope focus a laser beam at a measurement point with t... | 02/12/2008 |
| 7310130 | Lithographic apparatus and position measuring method In a lithographic apparatus, a measurement of the position of an object in an ambient space by an object position measuring system which is influenced by pressure variations in the ambient space, is corrected by an accurate measurement of the pressure in the ambient... | 12/18/2007 |
| 7289253 | System and methods for shearless hologram acquisition Systems and methods for shearless digital hologram acquisition, including an apparatus incorporating an illumination source configured to produce a first beam of light, which is then split by a beamsplitter into a reference beam and an object illumination beam. The ... | 10/30/2007 |
| 7283231 | Compressive sampling and signal inference A transmission mask or cooled aperture is used in spectroscopy to compressively sample an optical signal. The locations of transmissive and opaque elements of the mask are determined by a transmission function. The optical signal transmitted by the mask is detected ... | 10/16/2007 |
| 7272976 | Pressure sensor A pressure gauge includes a diaphragm having a substantially rigid outer portion and a displaceable inner portion that displaces in response to a pressure difference between first and second sides of the diaphragm. The pressure gauge further includes a sensor locate... | 09/25/2007 |
| 7259899 | Narrow angle hologram device and method of manufacturing same A method of manufacturing a master for producing a hologram device. A first master is produced with a compensating angle. The second master is produced from the first master with an index matching material to reduce the interference pattern caused by internal reflec... | 08/21/2007 |
| 7257248 | Non-contact measurement system and method A system and method for non-contact measurement of a complex part is provided. The method comprises acquiring an image of the complex part including imposed laser lines on the complex part using at least one imaging device, determining a span of interest of the comp... | 08/14/2007 |
| 7209239 | System and method for coherent optical inspection A system and method for coherent optical inspection are described. In one embodiment, an illuminating beam illuminates a sample, such as a semiconductor wafer, to generate a reflected beam. A reference beam then interferes with the reflected beam to generate an inte... | 04/24/2007 |
| 7193720 | Optical vibration imager A remote sensor capable of imaging vibrations at many simultaneous points using high-speed imaging cameras is disclosed. The preferred embodiment operates in heterodyne detection mode using a single camera to capture signals to recover multi-pixel vibrations. One al... | 03/20/2007 |
| 7148969 | Apparatus for direct-to-digital spatially-heterodyned holography An apparatus operable to record a spatially low-frequency heterodyne hologram including spatially heterodyne fringes for Fourier analysis includes: a laser; a beamsplitter optically coupled to the laser; an object optically coupled to the beamsplitter; a focusing le... | 12/12/2006 |
| 7145710 | Optical processing To operate an optical device comprising an SLM with a two-dimensional array of controllable phase-modulating elements groups of individual phase-modulating elements are delineated, and control data selected from a store for each delineated group of phase-modulating ... | 12/05/2006 |
| 7119905 | Spatial-heterodyne interferometry for transmission (SHIFT) measurements Systems and methods are described for spatial-heterodyne interferometry for transmission (SHIFT) measurements. A method includes digitally recording a spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis using a reference beam, an... | 10/10/2006 |
| 7116425 | Faster processing of multiple spatially-heterodyned direct to digital holograms Systems and methods are described for faster processing of multiple spatially-heterodyned direct to digital holograms. A method includes of obtaining multiple spatially-heterodyned holograms, includes: digitally recording a first spatially-heterodyned hologram inclu... | 10/03/2006 |
| 7095507 | Method and apparatus using microscopic and interferometric based detection An integrated interferometric and intensity based microscopic inspection system inspects semiconductor samples. A switchable illumination module provides illumination switchable between interferometric inspection and intensity based microscopic inspection modes. Com... | 08/22/2006 |
| 7079474 | Optical pickup apparatus It is an object of the present invention to provide an optical pickup apparatus which is capable of supporting multiple wavelengths in a reduced size without using a combined prism. An apparatus includes light emitting means having a plurality of integrated l... | 07/18/2006 |
| 7068375 | Direct-to-digital holography reduction of reference hologram noise and fourier space smearing Systems and methods are described for reduction of reference hologram noise and reduction of Fourier space smearing, especially in the context of direct-to-digital holography (off-axis interferometry). A method of reducing reference hologram noise includes: recordin... | 06/27/2006 |
| 7061626 | Method of manufacturing an optical element using a hologram A method of manufacturing an optical element having an optical surface of a target shape includes performing an interferometric test using an interferometer optics, wherein the interferometer optics includes a hologram that deflects a beam of measuring light by a su... | 06/13/2006 |
| 7038787 | Content-based fused off-axis object illumination direct-to-digital holography Systems and methods are described for content-based fused off-axis illumination direct-to-digital holography. A method includes calculating an illumination angle with respect to an optical axis defined by a focusing lens as a function of data representing a Fourier ... | 05/02/2006 |
| 7035196 | Optical head device and optical recording and reproducing apparatus having lasers aligned in a tangential direction A semiconductor laser element has the following configuration: a dual-wavelength monolithic laser where semiconductor lasers with emission wavelengths of 650 nm and 780 nm are integrated on one chip is soldered on a heat sink which then is soldered on a can package.... | 04/25/2006 |
