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Class 356/448 - By comparison


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter including visual or photoelectric apparatus
No. of patents: 253
Last issue date: 02/14/2012


1              
NumberTitleIssue Date
8115932Methods and apparatus for measuring ion implant dose
Methods and apparatus for measuring ion implant dose in a material provide for: measuring a reflection spectrum through an implantation surface of the material, the implantation surface having been subjected to an ion implantation process to create a material layer ...
02/14/2012
8031342Sensor and sensing utilizing a laser
Embodiments are generally described that include lasers having two mirrors, at least one of which has a reflectivity related to a presence or concentration of a target analyte. Output radiation generated by the laser may be related to the presence of the target anal...
10/04/2011
7999944Multi-channel swept wavelength optical interrogation system and method for using same
A multi-channel swept wavelength optical interrogation system and a method are described herein that enable the interrogation of one or more biosensors which for example could be located within the wells of a microplate. In one embodiment, the optical interrogation ...
08/16/2011
7903251Representation of spatial-frequency data as a map
A method for representing the structural information in a biological or physical sample is disclosed. In this method, a time-frequency representation of the spatial distribution within a sample is transformed into a color representation of the data. Furthermore, due...
03/08/2011
7768648Method for aberration evaluation in a projection system
Aberrations in an optical system can be detected and measured using a method comprised of a test target in the object plane of a projection system and imaging onto the image plane with the system. The test target comprises at least one open figure which comprises a ...
08/03/2010
7742171Reflectivity/emissivity measurement probe insensitive to variations in probe-to-target distance
Apparatuses and methods for accurately measuring the reflectivity of a target surface, under conditions where the distance between a measuring probe and the target surface is not fixed. At least two measurements of the target reflectivity are taken under different c...
06/22/2010
7719687Apparatus for measuring reflection characteristics of object surfaces
A reflection characteristic measuring apparatus for measuring a characteristic, such as a gloss, of a sample surface. The apparatus includes at least one illuminator for illuminating a sample surface to be measured with light and a plurality of light receiving secti...
05/18/2010
7715013Optical system for plant characterization
A system is provided to monitor targeted pest populations, disease, presence of transgenic and non-transgenic plants, or targeted pest population in a transgenic crop using remote imagery to discern differences in crops along with pest infestation in all crop variet...
05/11/2010
7710572Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
A fault detection and classification method is disclosed that uses raw back-focal-plane image data of radiation from a substrate surface, detected by a scatterometer detector, to determine a variation in the raw data and correlate the variation in the raw data with ...
05/04/2010
7522281Apparatus and method for detecting moisture in a printing plate exposer
In temperature-controlled printing plate exposers, it is possible for condensation of dampening solution or moisture to occur in a region of printing plates or laser apparatus. In this way, imaging of printing plates can be impaired and/or the laser apparatus can su...
04/21/2009
7499172Multi-grade object sorting system and method
A paper sorting system allows the high speed determination of color, glossiness and the presence of printed matter for individual sheets of paper in a stream of waste paper. Sorting criteria may be selected from a plurality of predefined options to sort the paper st...
03/03/2009
7439534Reflected light intensity ratio measuring device, device for measuring light energy absorption ratio and heat treatment apparatus
A measuring optical system for emitting and receiving light is fixedly installed in a ceiling portion of a measuring device, and a wafer holding part for supporting a semiconductor wafer is provided in a bottom portion of the measuring device. A support table is hor...
10/21/2008
7423758Gloss sensor for a paper machine
A gloss sensor for optically measuring the gloss of a moving surface includes a housing having an exterior surface which is generally parallel with the moving surface. A light source is carried by the housing and configured for emitting a source beam of light. At le...
09/09/2008
7420682Sensor device for interference and plasmon-waveguide/interference spectroscopy
Methods for measuring a property of a sample material present at an interface of an emerging medium in a spectroscopic device include a sensor (10) featuring at least one dielectric member (14) disposed upon a entrant medium (12), with the diele...
09/02/2008
7411665Method for wavelength calibration of an optical measurement system
An optical measurement system having a spectrophotometer and a ellipsometer is calibrated, the spectrophotometer and the ellipsometer first being calibrated independently of one another. A spectrophotometer layer thickness (dphoto) of a specimen is then d...
08/12/2008
7397565Device and method for obtaining appearance information
A device has first and second units that lights an object at first or second incident angles; a unit that generates image signals according to the intensity of the received light; units that guides diffusely and specularly reflected light from the object to the imag...
07/08/2008
7365854Apparatus and methods for high speed RGB color discrimination
Device and method for inspecting a polychromatic region, such as a polychromatic pattern, on a moving workpiece. The method includes device includes a solid-state light source, preferably a light emitting diode, adapted to emit light in a range of wavelengths for il...
04/29/2008
7315379Evaluating method and apparatus thereof
A measurement apparatus measures the spatial distributed characteristic of reflection of an object. Evaluate parameters used to evaluate the gloss character of the object are extracted based on the measurement result. An evaluate value indicating the gloss character...
01/01/2008
7289219Polarimetric scatterometry methods for critical dimension measurements of periodic structures
An optical measurement system for evaluating a sample has a motor-driven rotating mechanism coupled to an azimuthally rotatable measurement head, allowing the optics to rotate with respect to the sample. A polarimetric scatterometer, having optics directing a polari...
10/30/2007
7286229Detecting multi-domain states in perpendicular magnetic media
In one embodiment a system to detect multi-domain regions in the soft under layer of a perpendicular magnetic media comprises a radiation targeting assembly to target a polarized radiation beam onto a surface of a substrate covered by the soft under layer of a perpe...
10/23/2007
7276027System, for monitoring the concentration of analytes in body fluids
The invention concerns a system for monitoring the concentration of analytes in body fluids, in particular in interstitial fluid and comprises a catheter having an implantable region and an outlet opening for withdrawing fluid in particular body fluid. A first and a...
10/02/2007
7254503Light source wavelength correction
A wavelength correction function provides corrected reflectance values from actual reflectance values taken in a reflectance-base instrument. The correction is provided as a function of measured reflectance values and a predefined set of high resolution reflectance ...
08/07/2007
7223503Method for repairing opaque defects on semiconductor mask reticles
A method is disclosed for repairing an opaque defect on a mask substrate. After examining one or more opaque patterns in a predetermined area of the mask substrate, at least one opaque defect in the opaque patterns is identified based on a difference between its lig...
05/29/2007
7199352Measuring method and device for measuring distribution of sensitivity
A measuring device measures sensitivity distribution of a photo sensor including a light projector element for projecting detection light externally, and a photoreceptor element for receiving the detection light reflected externally, and photoelectrically detects an...
04/03/2007
7193710Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses
Disclosed are spectroscopic ellipsometer systems which include polarizer and analyzer elements which remain fixed in position during data acquisition, and at least one continuously rotating or step-wise rotatable compensator which ...
03/20/2007
7190460Focusing optics for small spot optical metrology
A system for focusing broadband light within a reflectometer includes a concave spherical mirror for gathering light from the surface of a sample under inspection. The concave spherical mirror projects the received light to a convex spherical mirror. The combination...
03/13/2007
7167375Populated printed wiring board and method of manufacture
A populated printed wiring board (PWB) (100) and method of manufacturing the populated PWB are taught. The populated PWB is manufactured by fabricating a PWB (102, 402) with exposed copper pads (302), coating the copper pads with an organic sold...
01/23/2007
7152007Imaging apparatus and method
A system for investigating a sample, the system including a detector having non-linear current voltage characteristics and being configured to mix two radiation signals having frequencies in the range from 25 GHz to 100 THz, one of the signals being a local oscillat...
12/19/2006
7132254Method and apparatus for detecting phycocyanin-pigmented algae and bacteria from reflected light
The present invention relates to a method of detecting phycocyanin algae or bacteria in water from reflected light, and also includes devices for the measurement, calculation and transmission of data relating to that method. ...
11/07/2006
7102754Measuring method and apparatus using attenuation in total internal reflection
A state of attenuation in total internal reflection is detected by the use of a measuring apparatus having a measuring unit and a reference unit and a measuring system which corrects result of detection by the measuring unit on the basis of result of detection by th...
09/05/2006
7084990Method and its apparatus for measuring size and shape of fine patterns
In size measurement of a semiconductor device, profiles of a pattern formed in a resist process are determined through an exposure/development simulation in respect of individual different combinations of exposure values and focus values to form a profile matrix and...
08/01/2006
7081956Method and device for determining reflection lens pupil transmission distribution and illumination intensity distribution in reflective imaging system
A method and device for determining reflection lens pupil transmission distribution in a photolithographic reflective imaging system, the device including an illumination source; a reticle supporting a reflective mask layer having a plurality of light-reflecting are...
07/25/2006
7075649Discrete polarization state rotatable compensator spectroscopic ellipsometer system, and method of calibration
Disclosed are spectroscopic ellipsometer and combined spectroscopic reflectometer/ellipsometer systems. The spectroscopic ellipsometer system portion includes polarizer and analyzer elements which remain fixed in position during data acquisition, and a step-wise rot...
07/11/2006
7075643System for distributing and controlling color reproduction at multiple sites
In the color imaging system, multiple rendering devices are provided at different nodes along a network. Each rendering device has a color measurement instrument for calibrating the color presented by the rendering device. A rendering device may represent a color di...
07/11/2006
7075657Surface plasmon resonance measuring apparatus
A measuring apparatus comprising a measuring chip, an optical incidence system, a photodiode array, a differentiation part, and a computation part. The differentiation part differentiates an optical detection signal output from each light-receiving element, in a dir...
07/11/2006
7072041System and method for optical spectrum fast peak reporting
A system and method for fast peak finding in an optical spectrum prioritizes the information it first generates and how the information is then forwarded from the system to a host computer, for example. A spectrum detection subsystem generates a spectrum of an optic...
07/04/2006
7072035Verification device for optical clinical assay systems
A device and method for verifying correct performance of an optical clinical assay system is provided. ...
07/04/2006
7060487Enchanced sensitivity coupled fiber-optic biosensor configurations
Coupled fiber-optic, evanescent-wave biosensors are improved through the use of configurations which adjust certain optical characteristics for enhanced sensitivity. In the preferred embodiment, this is carried out by inputting light into the coupler at either a dif...
06/13/2006
7046363Optical measurement system and method
An apparatus and method for measuring feature sizes having form birefringence. The method includes providing a surface having surface features thereon; radiating the surface features with light having a first wavelength and a first polarization; measuring a reflecte...
05/16/2006
6998628Method of media type differentiation in an imaging apparatus
A method of media type differentiation includes the steps of providing a media sensor including a specular detector that provides a specular signal output having a signal level related to an amount of the reflected specular light received; providing a highly reflect...
02/14/2006
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