Bizarre Patents
A helium-filled sun shade for protecting individuals engaged in outdoor activities.
PatentStorm News
Make the Most of Our Site
See this month's Top Inventors and Most Cited Patents.
Stay on top of the latest innovations by subscribing to an RSS feed.
Registered users: Manage your profile.
| Number | Title | Issue Date |
| 7329859 | Photoelectric encoder A photoelectric encoder that has a lens optical system including a lens inserted between a main scale and a light receiving element. In the photoelectric encoder, three planes extended from a surface of the main scale, a principal plane of the lens, and an image pla... | 02/12/2008 |
| 7294935 | Integrated circuits protected against reverse engineering and method for fabricating the same using an apparent metal contact line terminating on field oxide Semiconducting devices, including integrated circuits, protected from reverse engineering comprising metal traces leading to field oxide. Metallization usually leads to the gate, source or drain areas of the circuit, but not to the insulating field oxide, thus misle... | 11/13/2007 |
| 7271891 | Apparatus and methods for providing selective defect sensitivity Disclosed are techniques and apparatus for accounting for differing levels of defect susceptibility in different pattern areas of a reticle in an inspection of such reticle or in inspection of a semiconductor device fabricated from such reticle. In general terms, tw... | 09/18/2007 |
| 7242063 | Symmetric non-intrusive and covert technique to render a transistor permanently non-operable A technique for and structures for camouflaging an integrated circuit structure. The technique including forming active areas of a first conductivity type and LDD regions of a second conductivity type resulting in a transistor that is always non-operational when sta... | 07/10/2007 |
| 7217977 | Covert transformation of transistor properties as a circuit protection method A technique for and structures for camouflaging an integrated circuit structure. The technique includes the use of a light density dopant (LDD) region of opposite type from the active regions resulting in a transistor that is always off when standard voltages are ap... | 05/15/2007 |
| 7166515 | Implanted hidden interconnections in a semiconductor device for preventing reverse engineering A camouflaged interconnection for interconnecting two spaced-apart regions of a common conductivity type in an integrated circuit or device and a method of forming same. The camouflaged interconnection comprises a first region forming a conducting channel between th... | 01/23/2007 |
| 7079235 | Reticle design inspection system A method of reticle inspection, comprising generating a test reticle comprising a plurality of test pattern-features thereon; manufacturing a wafer using the reticle; and determining a transfer of at least one of said plurality of pattern features from said reticle ... | 07/18/2006 |
| 7049667 | Conductive channel pseudo block process and circuit to inhibit reverse engineering A technique for and structures for camouflaging an integrated circuit structure. The integrated circuit structure is formed by a plurality of layers of material having a controlled outline. A layer of conductive material having a controlled outline is disposed among... | 05/23/2006 |
| 7020853 | Design analysis workstation for analyzing integrated circuits A design analysis workstation for performing design analysis of integrated circuits provides facilities for extracting design and layout information from digital image-mosaics captured during deconstruction of an integrated circuit. Each image-mosaic is displayed in... | 03/28/2006 |
| 7008873 | Integrated circuit with reverse engineering protection Technique and structures for camouflaging an integrated circuit structure. The integrated circuit structure is formed by a plurality of layers of material having controlled outlines and controlled thicknesses. A layer of dielectric material of a controlled thickness... | 03/07/2006 |
| 6979606 | Use of silicon block process step to camouflage a false transistor A technique for and structures for camouflaging an integrated circuit structure. A layer of conductive material having a controlled outline is disposed to provide artifact edges of the conductive material that resemble an operable device when in fact the device is n... | 12/27/2005 |
| 6919600 | Permanently on transistor implemented using a double polysilicon layer CMOS process with buried contact A permanently-ON MOS transistor comprises silicon source and drain regions of a first conductivity type in a silicon well region of a second conductivity type. A silicon contact region of the first conductivity types is buried in the well region, said contact region... | 07/19/2005 |
| 6864878 | Tactile overlays for screens An overlay for use with a video screen having a display thereon, comprising at least one first tactilely readable area corresponding to a feature of a first graphical display on the screen. ... | 03/08/2005 |
| 6704107 | Method and apparatus for automated, in situ material detection using filtered fluoresced, reflected, or absorbed light A method and apparatus for detection of a particular material, such as photoresist material, on a sample surface. A narrow beam of light is projected onto the sample surface and the fluoresced and/or reflected light intensity at a particular wavelength ba... | 03/09/2004 |
| 6422097 | Assembly line mounted assemblies with means for verification An assembly line for mounting tires on wheels, for inflating the tire mounted on a wheel, for placement of the bead heels of the tire and for balancing which also includes apparatus for checking the conformity of the diameter of the tire to be mounted and... | 07/23/2002 |
| 6373576 | Method for measuring concentrations of dopants in a liquid carrier on a wafer surface A method for non-destructively testing for the concentration of a component of a film that is used for doping a region of a semiconductor wafer uses an image histogram of the light reflected from an array of points on the film and the underlying substrate... | 04/16/2002 |
| 6208418 | Apparatus and method for measurement of the mechanical properties and electromigration of thin films A method for characterizing a sample comprising the steps of depositing the sample on a substrate, measuring a first change in optical response of the sample, changing the lateral strain of the sample, measuring a second change in optical response of the ... | 03/27/2001 |
| 6100970 | Apparatus for inspecting slight defects on a photomask pattern A photomask defect inspection method is provided by which defects of pin holes with the diameter equal to or less than 0.35 μm can be detected with certainty. According to the inspection method, a pattern whose image is projected onto an imaging position... | 08/08/2000 |
| 6042995 | Lithographic process for device fabrication using a multilayer mask which has been previously inspected A lithographic process for semiconductor device fabrication is disclosed. In the process a patterned mask having a multilayer film formed on a substrate is illuminated by extreme ultraviolet (EUV) radiation and the radiation reflected from the pattern mas... | 03/28/2000 |
| 6025918 | Apparatus and method for measurement of the mechanical properties and electromigration of thin films A method for characterizing a sample comprising the steps of depositing the sample on a substrate, measuring a first change in optical response of the sample, changing the lateral strain of the sample, measuring a second change in optical response of the ... | 02/15/2000 |
| 5781657 | Apparatus for inspecting pattern of photomask and method therefor Graphic data for forming a light-shielding pattern and graphic data for forming a semitransparent pattern are stored in first and second memories, respectively. A synthesis circuit converts the graphic data stored in the first and second memories into bit... | 07/14/1998 |
| 5772656 | Calibration apparatus for laser ablative systems A calibration apparatus is disclosed for measuring the properties of a laser beam. The apparatus includes a photoreactive element having a composition which reacts with laser radiation in a manner proportional to the intensity or intensity profile of the ... | 06/30/1998 |
| 5576833 | Wafer pattern defect detection method and apparatus therefor A scanning electron beam is formed as a rectangular electron beam. The electro-optical system which forms this rectangular beam has a rectangular-cathode light source and a quadrupole lens system. This rectangular beam is scanned in its short-axis (X-axis... | 11/19/1996 |
| 4938591 | Method and apparatus for electronic and visual image comparing The invention relates to a method and apparatus for acquiring, recording and storing information in photographic and electronic media. In particular, the invention relates to low flare image recording and specifically to recording two-dimensional images, ... | 07/03/1990 |
| 4929972 | Method and apparatus for electronic and photographic image recording The invention relates to a method and apparatus for acquiring, recording and storing information in photographic and electronic media. In particular, the invention relates to low flare image recording and specifically to recording two-dimensional images, ... | 05/29/1990 |
| 4879097 | Dispensing device and recording apparatus A recording apparatus has a holder for a plurality of reaction vessels including a support plate (11) having an array of holes (15) therein for receiving an array of reaction vessels (16), a housing (10) for receiving the holder and being sealed to preven... | 11/07/1989 |
| 4843329 | Method for contactless testing for electrical opens and short circuits in conducting paths in a substrate A method for contactlessly testing for opens and shorts in conducting paths within or on a nonconducting substrate. There are a plurality of conducting pads on the surface of the substrate. Charges are contactlessly generated, e.g., by an optical beam, in... | 06/27/1989 |
| 4765743 | Method of inspecting a master member A method of inspecting a pattern of elements on a working plate includes producing a negative copy of the working plate and aligning the negative copy with a positive inspection plate having elements slightly larger than the elements of the working plate ... | 08/23/1988 |
| 4741622 | Method and apparatus for detecting diversion A method of detecting a registration diversion between a mask and a wafer prior to a main exposure. This method detects relative diversions between marks on the wafer and latent images of marks on the mask formed on a photosensitive layer of the wafer. Th... | 05/03/1988 |
| 4718767 | Method of inspecting the pattern on a photographic mask A method whereby the circuit pattern on a photographic mask or a reticle used in the manufacture of semiconductor devices is inspected for defects by an image processing technique. In this inspection method, the pattern of the mask is printed on a photose... | 01/12/1988 |
| 4623255 | Method of examining microcircuit patterns Examination of microstructures of LSI and VLSI devices is facilitated by employing a method in which the device is photographed through a darkfield illumination optical microscope and the resulting negative subjected to inverse processing to form a positi... | 11/18/1986 |
| 4586822 | Inspecting method for mask for producing semiconductor device A method for inspecting the presence of foreign particles on a mask comprising the steps of forming alignment marks on a wafer onto which the pattern is trially replicated, aligning projected images by means of the alignment marks to form overlapped image... | 05/06/1986 |
| 4545678 | Method and apparatus for testing lenses The invention concerns a method and apparatus for testing aspherical lenses, particularly continuous-focus eyeglass lenses. The negative picture (7) of a test pattern (1) is produced by means of a master lens (4) which is placed in the ray path of the opt... | 10/08/1985 |
| 4521074 | Binocular presentation of visual information Pairs of images are presented to an observer under conditions such that they are perceived as a single image and provide information about their mutual relationship. The pair are derived from non-equivalent image means, e.g. from (a) a photograph of a sce... | 06/04/1985 |
| 4508452 | Arrangement for sensing the characteristics of a surface and determining the position of points thereon The surface to be sensed or scanned is placed in the path of a projector which is moved along an axis of the surface. The path of motion of the projector is subdivided into predetermined sections which are illuminated by the projector in accordance with a... | 04/02/1985 |
| 4461570 | Method for dynamically recording distortion in a transparency A method for dynamically recording distortion in a transparency includes a support fixture for mounting the transparency for movement about a predetermined horizontal or vertical axis, with a camera disposed in back of the transparency while a test target... | 07/24/1984 |
| 4131472 | Method for increasing the yield of batch processed microcircuit semiconductor devices An improvement in the process of manufacturing integrated circuits to enhance the yield, including the steps of tracking which of the individual dies on a photomask or related series of photomasks has produced a predominance of defective chips on the semi... | 12/26/1978 |
| 4126395 | Method for determining the spatial location of points on a specular surface The spatial locations of points defining a specular surface are determined by disposing the specular surface in the field of view of a lens and by using the specular surface to view by reflection an irradiated reference surface disposed successively in di... | 11/21/1978 |
| 4075011 | Electrostatic powder coating method In an electrostatic powder coating method for coating a plate with electrostatic coating powder after or before the plate is provided with marking lines by electrophotographic print marking process, areas which are preferred to be free from the coating ar... | 02/21/1978 |
| 4023036 | Apparatus and method for transverse tomography An apparatus and method for generating a two-dimensional back-projected image of a slice of an object. In accordance with the invention there is provided a carrier means having a plurality of substantially parallel elongated projections thereon, each proj... | 05/10/1977 |
