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Neuroimaging as a Marketing Tool
Neuroimaging as a means for validating whether a stimulus such as advertisement, communication, or product evokes a certain mental response such as emotion, preference, or memory, or to predict the consequences of the stimulus on later behavior such as consumption or purchasing.
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| Number | Title | Issue Date |
| 8115927 | Production method of compound semiconductor member A method of evaluating damage of a compound semiconductor member, comprising: a step of performing spectroscopic ellipsometry measurement on a surface of the compound semiconductor member; and a step of evaluating damage on the surface of the compound semiconductor ... | 02/14/2012 |
| 8107077 | Terahertz spectroscopic apparatus A terahertz spectroscopic apparatus includes a polarization beam splitter transmitting or reflecting a linearly polarized terahertz wave, a quarter wave plate imparting a phase difference of 90° to a terahertz wave impinging thereon, and an optical member guiding a... | 01/31/2012 |
| 8059276 | Ellipsometric investigation and analysis of textured samples System for, and method of ellipsometric investigation of and analysis of samples which have, for instance, a non-random effectively “regular” textured surface, and/or a surface characterized by an irregular array of faceted structures. ... | 11/15/2011 |
| 8040511 | Azimuth angle measurement Methods and apparatus for measuring an optical azimuth angle φO of a substrate relative to a plane of detection in scatterometry tools are disclosed. A grating target on a stage of a scatterometry tool may be illuminated and positions of the resulting di... | 10/18/2011 |
| 8040512 | Inspection device, inspection method, and program An illuminating optical system of an inspection device selects an arbitrary wavelength region from the light source, and epi-illuminates the sample via the polarizer and the objective lens. A detecting optical system includes an analyzer having a polarization plane ... | 10/18/2011 |
| 8013997 | Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium Light is irradiated onto a glass substrate of an organic EL element, and the characteristics of an organic film are analyzed. In the sample analyzing apparatus, in such a way that the glass substrate is located on the upper side, the organic EL element is placed on ... | 09/06/2011 |
| 8013996 | Spatial filter in sample investigation system Systems which utilize electromagnetic radiation to investigate samples and include at least one spatial filter which has an aperture having an opening therethrough of an arbitrary shape, including methodology for fabracting the aperture on an end of an optical fiber... | 09/06/2011 |
| 8009292 | Single polarizer focused-beam ellipsometer The present invention relates to a single-polarizer focused-beam ellipsometer. An ellipsometer according to the present invention includes a light source (210); a beam splitting part (220) for splitting a light generated in the light source (210... | 08/30/2011 |
| 8004677 | Focused-beam ellipsometer The present invention relates to an ellipsometer, and more particularly, to an ellipsometer to find out the optical properties of the sample by analyzing the variation of the polarization of a light which has specific polarisation then reflected on a surface of the ... | 08/23/2011 |
| 8004676 | Method for detecting analytes using surface plasmon resonance A method is provided for detection of analytes using the Surface Plasmon Resonance effect. The method comprises providing a metal film on a transparent substrate. The free surface of the metal film is exposed to a test sample. An anlyte in the sample can interact di... | 08/23/2011 |
| 7999938 | Measurements of optical inhomogeneity and other properties in substances using propagation modes of light This application describes designs, implementations, and techniques for controlling propagation mode or modes of light in a common optical path, which may include one or more waveguides, to sense a sample. ... | 08/16/2011 |
| 7990535 | Surface state detecting apparatus A surface inspection apparatus includes units illuminating repetitive patterns formed on a surface of a suspected substance and measuring a variation in an intensity of regular reflection light caused by a change in shapes of the repetitive patterns, units illuminat... | 08/02/2011 |
| 7986408 | Apparatus and method for in-flight detection of airborne water droplets and ice crystals A device for optically detecting and distinguishing airborne liquid water droplets and ice crystals includes an illumination portion and a detection portion. The illumination portion outputs a circularly polarized illuminating beam. The detection portion receives ci... | 07/26/2011 |
| 7982877 | Method for measuring the anisotropy in an element comprising at least one fissile material and a corresponding installation This method comprises the steps of: transmitting a beam of light onto a surface (17) of an element (1) comprising a fissile material, passing the beam of light reflected by the surface into a polarisation analyser (27) having a modifiable analys... | 07/19/2011 |
| 7973930 | Spectroscopic ellipsometer A spectroscopic ellipsometer can compare data different in a measurement condition and facilitate setting an initial value of fitting data even for an inexperienced operator such as a beginner. The spectroscopic ellipsometer includes a reference data storage part st... | 07/05/2011 |
| 7969573 | Method and system for obtaining n and k map for measuring fly-height A method for obtaining a refractive index (n) and extinction coefficient (k) map of a slider surface, the method comprising the steps of processing an image of the slider surface to obtain spatially resolved normalized intensity data of the slider surface; measuring... | 06/28/2011 |
| 7956999 | Resistivity testing method and device therefor An object is to efficiently measure the resistivity of a transparent conductive film with high accuracy in a non-destructive and non-contact manner. Provided is a resistivity testing device that includes a light emitting device that emits p-polarized emission light ... | 06/07/2011 |
| 7929139 | Spectroscopic ellipsometer, film thickness measuring apparatus, and method of focusing in spectroscopic ellipsometer In a spectroscopic ellipsometer, light emitted from a light source enters a measurement surface of a substrate through an optical system in a lighting part so as to incline to the measurement surface to be directed to a light receiving device, and ellipsometry is pe... | 04/19/2011 |
| 7920264 | Horizontal attenuated total reflection system Horizontally oriented attenuated total reflection (HATR) system applied in spectroscopic ellipsometer or polarimeter systems, and methodology of use. ... | 04/05/2011 |
| 7898661 | Spectroscopic scatterometer system Before the diffraction from a diffracting structure on a semiconductor wafer is measured, where necessary, the film thickness and index of refraction of the films underneath the structure are first measured using spectroscopic reflectometry or spectroscopic ellipsom... | 03/01/2011 |
| 7894061 | Polarization based fiber optic downhole flowmeter A flow monitoring system includes a pipe for transporting a fluid therethrough. An optical fiber generally spirals about the pipe along a longitudinal portion having a predetermined length to serve as a single transducer for detecting flow information from the longi... | 02/22/2011 |
| 7889339 | Complementary waveplate rotating compensator ellipsometer Ellipsometry using two waveplates of complementary retardation in a dual rotating compensator configuration is disclosed. Two waveplates of complementary retardation may be used to increase the useful spectral range of a rotating compensator ellipsometer, in particu... | 02/15/2011 |
| 7889340 | Normal incidence ellipsometer with complementary waveplate rotating compensators In embodiments of the present invention a second, different waveplate is introduced into a single rotating compensator normal incidence ellipsometer. The second waveplate provides a quarter wavelength retardation that is different from and complementary to that of t... | 02/15/2011 |
| 7869040 | Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system An illumination subsystem configured to provide illumination for a measurement system includes first and second light sources configured to generate light for measurements in different wavelength regimes. The illumination subsystem also includes a TIR prism configur... | 01/11/2011 |
| 7864318 | Spectroscopic ellipsometer and ellipsometry A spectroscopic ellipsometer has a polarized light generating part for generating elliptically polarized lights of a plurality of wavelengths included in a predetermined measurement wavelength band from white light and directing the elliptically polarized lights to ... | 01/04/2011 |
| 7847937 | Optical measurment systems and methods An optical measurement system includes a rotating element ellipsometer comprising a radiant source and a rotating optical element coupled to the radian source, an optical system to provide a modulated pump beam, a detection system optically coupled to the ellipsomet... | 12/07/2010 |
| 7839506 | Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method The simultaneous measurement of four separately polarized beams upon diffraction from a substrate is used to determine properties of the substrate. Circularly or elliptically polarized light sources are passed via up to three polarizing elements. This polarizes the ... | 11/23/2010 |
| 7800756 | Method and apparatus for analyzing coatings on curved surfaces An ellipsometer is used to analyze each of a plurality of sample portions that each include a substrate portion with a coating portion thereon, the substrate portions corresponding to respective spaced portions of a part with a curved surface. For each sample portio... | 09/21/2010 |
| 7796260 | System and method of controlling intensity of an electromagnetic beam A system and method of substantially achromatically controlling the intensity of a spectroscopic beam with application in spectrophotometers, reflectometers, ellipsometers, polarimeters or the like systems. ... | 09/14/2010 |
| 7791725 | Method and equipment for detecting pattern defect An inspection apparatus and method includes a light source which emits an ultraviolet laser beam, an illuminating unit having a polarization controller and an object lens for illuminating a specimen with light emitted from the light source and passed through the pol... | 09/07/2010 |
| 7791724 | Characterization of transmission losses in an optical system The illumination profile of a radiation beam is initially measured using a CCD detector. A reference mirror is then placed in the focal plane of the high aperture lens and the reflected radiation measured. By comparing the illumination profile and the detected radia... | 09/07/2010 |
| 7777882 | Method for the in-situ and real-time determination of the thickness, optical properties and quality of transparent coatings during their growth onto polymeric substrates and determination of the modification, activation and the modification depth of polymeric materials surfaces This invention concerns the in-situ and real-time determination of thickness, optical properties and quality of transparent inorganic thin films (oxides, nitrides) and organic materials during their growth and during modification of transparent polymeric materials, ... | 08/17/2010 |
| 7777883 | Ellipsometric investigation of anisotropic samples A system for reducing reflections of a beam of electromagnetic radiation from the opposite, back, surface of an anisotropic sample, including methodology for investigating the incident, front, surface thereof with electromagnetic radiation, and analyzing the data as... | 08/17/2010 |
| 7768643 | Apparatus and method for classifying and sorting articles An apparatus for classifying articles may include a frame connected to (1) transport means for directing articles to create a product stream, (2) an emitter section having a radiation source and (3) a detection section for detecting a portion of radiation reflected ... | 08/03/2010 |
| 7760358 | Film measurement The above and other needs are met by a method of determining actual properties of a film stack by directing an incident beam of light towards the film stack, such that the incident beam of light is reflected from the film stack as a reflected beam of light. The actu... | 07/20/2010 |
| 7746472 | Automated ellipsometer and the like systems Systems and methodology for orienting the tip/tilt and vertical height of samples, preferably automated, as applied in ellipsometer and the like systems. ... | 06/29/2010 |
| 7746471 | Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems A substantially self-contained “on-board” material system investigation system for effecting relative translational and rotational motion between a source and detector of electromagnetic radiation and a sample, which system is functionally mounted on a three dim... | 06/29/2010 |
| 7742168 | Measuring a surface characteristic At least one surface characteristic of a sample, e.g. gloss, refractive index, micro-roughness, macroroughness, colour shift, is determined by illuminating a surface of the sample with a collimated beam of light at an angle to the plane of the surface and using an i... | 06/22/2010 |
| 7742169 | High-speed polarizing device and high-speed birefringence measuring apparatus and stereoscopic image display apparatus utilizing the polarizing device A polarizing device including a plurality of polarized light radiating units for radiating polarized light rays each of which is polarized in a particular direction, a rotary reflector for receiving light rays emitted by the plurality of polarized light radiating un... | 06/22/2010 |
| 7710564 | Polarized broadband wafer inspection In one embodiment, a surface inspection system comprises a radiation directing assembly to target radiation onto a surface of an object, the radiation directing assembly comprising a radiation source that emits a broadband radiation beam, a polarization control asse... | 05/04/2010 |
