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Class 356/367 - Including polarimeters


Subclass of Class 356 - Optics: measuring and testing
Definition: Subject matter including either a null type or directly
No. of patents: 261
Last issue date: 11/01/2011


1              
NumberTitleIssue Date
8049889Switchable imaging polarimeter and method
A polarimeter and method of polarizing incoming light includes an optical assembly, a first adjustable circular retarder that rotates the polarization content of incoming light, a polarization beam splitter that receives light from the adjustable circular retarder a...
11/01/2011
7839505Optical rotating power measurement method and optical rotating power measurement apparatus
An optical rotating power measurement method comprising: an optical rotating power data acquisition step of starting measurement of the optical rotating power of the sample in a measurement apparatus during a temperature changing process where a controller controls ...
11/23/2010
7821637System for controlling intensity of a beam of electromagnetic radiation and method for investigating materials with low specular reflectance and/or are depolarizing
Disclosed is a system for controlling focus, angle of incidence and intensity of an electromagnetic beam over a spectrum of wavelengths, and methodology for optimizing investigation of samples which demonstrate low specular reflectance and/or are depolarizing of a p...
10/26/2010
7808637Method and apparatus for determining liquid crystal cell parameters from full mueller matrix measurements
Method and apparatus for testing of LCD cells is disclosed. An LCD cell under test (14, 30) may be mounted to translatable table (40) between polarization state generator (10) and polarization state analyzer (16). For each location on cel...
10/05/2010
7800755High-speed polarimeter having a multi-wavelength source
A polarimeter includes a multi-wavelength source for generating electromagnetic waves having at least two different wavelengths, means for separating electromagnetic waves, the electromagnetic waves including electromagnetic waves generated by the multi-wavelength s...
09/21/2010
7719684Method for enhancing polarimeter systems that use micro-polarizers
This invention solves a problem of registration and improves signal-to-noise ratio (SNR) when using division-by-focal-plane array to produce multiple polarization images. This is achieved by processing a sequence of angular-position-dithered frames to generate a hig...
05/18/2010
7705985Method and apparatus for testing fibres
The present disclosure relates to a method for measuring the maturity or cell wall thickening of a sample of cellulosic fiber. The method at least includes exposing the sample of fiber to polarized light, capturing one or more images of the sample through crossed po...
04/27/2010
7599062Local non-perturbative remote sensing devices and method for conducting diagnostic measurements of magnetic and electric fields of optically active mediums
Embodiments of the present invention are directed to pulsed polarimeters for conducting remote, non-perturbative diagnostic measurements of inducing fields of a medium demonstrating induced optical activity. In one aspect, a pulse polarimeter includes a light source...
10/06/2009
7456962Conical refraction polarimeter
A polarimeter for receiving input electromagnetic radiation characterized by a polarization state and for determining the polarization state. The polarimeter includes a refractive arrangement for refracting the input electromagnetic radiation so as to provide a spat...
11/25/2008
7426030Reduced gas flow purging system in reflectometer, ellipsometer, polarimeter and the like systems
Reflectometer, ellipsometer, polarimeter or the like system, which functionally comprise means for providing gas confined in a mini-chamber near the surface of a sample, at a location at which a beam having UV, VUV, IR and NIR wavelengths of electromagnetic radiatio...
09/16/2008
7420675Multi-wavelength imaging system
The present invention relates to a multi-energy system that generates and/or forms images of targets/structures by applying Mueller matrix imaging principles and/or Stokes polarimetric parameter imaging principles to data obtained by the multi-energy system. In one ...
09/02/2008
7414733Azimuthal scanning of a structure formed on a semiconductor wafer
A structure formed on a semiconductor wafer is examined by obtaining measurements of cross polarization components of diffraction beams, which were obtained from scanning an incident beam over a range of azimuth angles to obtain an azimuthal scan. A zero azimuth pos...
08/19/2008
7385695Polarimetry
The present invention relates to an assembly and method for measuring the optical activity of a stimulus of interest. The assembly comprises a source of incident electromagnetic radiation (1), a lens arrangement (2), an input polariser (3), a pl...
06/10/2008
7372565Spectrometer measurement of diffracting structures
A normal incidence reflectometer includes a rotatable analyzer/polarizer for measurement of a diffracting structure. Relative rotation of the analyzer/polarizer with respect to the diffracting structure permits analysis of the diffracted radiation at multiple polari...
05/13/2008
7372567Retardance measurement system and method
In an apparatus and method for measuring parameters related to retardance and slow axis azimuth in sample specimens, a sample is illuminated by circularly polarized monochromatic light which is then analyzed by an elliptical analyzer at different settings. In anothe...
05/13/2008
7372941System and method for matching diffraction patterns
A method of analyzing patterns. The method comprises: receiving a first diffraction pattern; receiving a second diffraction pattern; receiving a third diffraction pattern; determining a similarity between the first and second diffraction patterns; determining a simi...
05/13/2008
7369234Method of performing optical measurement on a sample
The invention relates to a method of performing an optical measurement on a sample, such as an ellipticity measurement. The sample is irradiated with a polarized irradiation beam and a return beam is linearly polarized. The irradiation or return beam is modulated wi...
05/06/2008
7369334Optical device with alignment compensation
An optical device is provided which includes a plurality of optical modules and an alignment compensation module. Each optical module includes an optical component fixedly coupled to a relative reference mount. The relative reference mount is configured to attach to...
05/06/2008
7360897Fundus examination apparatus
A fundus examination apparatus includes an illumination optical system (20), which illuminates a fundus by fundus illumination light, an imaging optical system (21), which photographs a fundus image based on a polarization property of reflected illumin...
04/22/2008
7359582Method based on stokes parameters for the adaptive adjustment of PMD compensators in optical fiber communication systems and compensator in accordance with said method
A method for the adaptive adjustment of a PMD compensator in optical fiber communication systems with the compensator comprising a cascade of adjustable optical devices through which passes an optical signal to be compensated and comprising the steps of computing th...
04/15/2008
7355140Method of and apparatus for multi-stage sorting of glass cullets
A method and system for sorting different colored objects, preferably glass cullets, into separate groups of same colored objects comprising a plurality of sorting devices for receiving an input feed of different colored objects and sorting the different colored obj...
04/08/2008
7351929Method of and apparatus for high speed, high quality, contaminant removal and color sorting of glass cullet
A system for sorting a mixed stream of different colored cullet into separate groups of same colored cullet comprises a light emitting source for transmitting light, such as white light, through a cullet, and a camera having a plurality of pixels for receiving light...
04/01/2008
7349087Method for determining stokes parameters
A method of determining polarization profiles of points in a scene from video frames using Stokes parameters. The method includes emitting scene light rays from points in a region in a scene, and emitting a correlator light ray from a correlator. The correlator incl...
03/25/2008
7336360Imaging polarimetry
To effectively reduce a measurement error in a parameter indicating two-dimensional spatial distribution of a state of polarization generated by variations in retardation of a birefringent prism pair due to a temperature change or other factors, while holding a vari...
02/26/2008
7336361Spectroscopic ellipsometer and polarimeter systems
A spectroscopic ellipsometer or polarimeter system having a source of a polychromatic beam of electromagnetic radiation, a polarizer, a stage for supporting a material system, an analyzer, a dispersive optics and a detector system which comprises a multiplicity of d...
02/26/2008
7333189Spectroscopic diagnostic methods and system
The present invention provides systems and methods for the determination of the physical characteristics of a structured superficial layer of material using light scattering spectroscopy. The light scattering spectroscopy system comprises optical probes that can be ...
02/19/2008
7326871Sorting system using narrow-band electromagnetic radiation
A system for sorting articles includes a detector system having a plurality of narrow bandwidth sources of electromagnetic energy sequentially illuminating articles passing through the detector system, the detector system further including a collector for collecting...
02/05/2008
7304719Patterned grid element polarizer
The invention relates to a patterned grid polarizer for use in lithography, comprising a substrate that is transparent to ultraviolet (UV) light; and an array of elements patterned on the substrate, wherein the elements polarize UV light. The array of elements can b...
12/04/2007
7304736Method and apparatus for measuring polarization
A method of nonlinear polarimetry for measuring higher order moments of the E field of an optical signal is provided. The method includes imposing a phase delay on a first polarization of a received optical signal with respect to a second polarization of the optical...
12/04/2007
7301632Polarization state conversion in optically active spectroscopy
The invention describes a method to eliminate instrumental offset in measurement of optically active scattering and circular dichroism. The method uses the time-average measurement of the light that is systematically transformed by a series of optical devices. The o...
11/27/2007
7301633High-throughput chiral detector and methods for using same
A new generation polarimetry apparatus and methodology is disclosed, which involve passing polarized light through a sample including a chiral analyte, where the analyte is under the influence of a periodically varying magnetic field. The apparatus also utilizes opt...
11/27/2007
7287855Method and system for removing the effects of corneal birefringence from a polarimetric image of the retina
A scanning laser polarimetry (SLP) system that measures retinal nerve fiber layer (RNFL) retardance in a single scan image with improved sensitivity. An external bias retarder in combination with the anterior segment retardance forms a nonzero joint retardance adapt...
10/30/2007
7286227Method and system for removing the effects of corneal birefringence from a polarimetric image of the retina
A scanning laser polarimetry (SLP) system that measures in vivo retinal nerve fiber layer (RNFL) retardance (δN, θN) in a single measurement without a variable corneal compensator (VCC). The diagnostic signal is biased so that the detected RN...
10/23/2007
7283234Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface
Improved methodology for monitoring deposition or removal of material to or from a process and/or wittness substrate which demonstrates a negative e1 at some wavelength. The method involves detection of changes in P-polarized electromagnetism ellipsometric DE...
10/16/2007
7277171Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems
A substantially self-contained “on-board” material system investigation system functionally mounted on a three dimensional locational system to enable positioning at desired locations on, and distances from, the surface of a large sample, including the capabilit...
10/02/2007
7274440Systems and methods for measuring stress in a specimen
Systems and methods for measuring stress in a specimen are provided. One system includes an optical subsystem configured to measure stress-induced birefringence in patterned structures formed on the specimen. In some embodiments, the optical subsystem may be configu...
09/25/2007
7274449System for determining stokes parameters
A system for determining polarization profiles of points in a scene from video frames using Stokes parameters includes a scene having a region that emits scene light rays that correspond to the points in the scene, a color filter, a Stokes filter that includes a rot...
09/25/2007
7272091Birefringence characteristic measuring method, optical recording medium and optical information recording/reproducing apparatus
Four types of optical systems, a polarization optical system including an objective lens having a high numerical aperture, a polarization optical system including an objective lens having a low numerical aperture, a non-polarization optical system including an objec...
09/18/2007
7265836In-line optical polarimeter using free-space polarization sampling elements
This application teaches various implementations of methods and in-line polarimeters with free-space sampling elements to sample four sample beams for determining the polarization state of input light. In one exemplary implementation, a device in this application in...
09/04/2007
7265837Sensitive polarization monitoring and controlling
Techniques and devices for monitoring polarization of light using at least two polarization elements where the difference between the outputs of the two polarization elements are used to monitor a change in polarization. ...
09/04/2007
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