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| Number | Title | Issue Date |
| 8184291 | Method for detecting edge on transparent substrate, apparatus for detecting edge on transparent substrate, and processing apparatus An apparatus for detecting an edge of a transparent substrate includes a light source provided on a rear side of the edge of the transparent substrate, a first polarizer provided between the transparent substrate and the light source and arranged to convert light fr... | 05/22/2012 |
| 8169611 | Terahertz-infrared ellipsometer system, and method of use The present invention relates to ellipsometer and polarimeter systems, and more particularly is an ellipsometer or polarimeter or the like system which operates in a frequency range between 300 GHz or lower and extending to higher than at least 1 Tera-hertz (THz), a... | 05/01/2012 |
| 8164751 | Optical system, method, and computer readable medium for determining thickness of a medium An optical system includes a light sending section that sends light to an object having a scattering medium and a lower medium positioned below the scattering medium, where the scattering medium scatters light and the lower medium feeds back polarized light in respo... | 04/24/2012 |
| 8154725 | Line scanning measurement system A line scanning measurement system includes an illumination apparatus, a support, a telecentric optical element and a processor. The illumination apparatus is utilized for providing an extended polarized light beam. The support is utilized for mounting a sample, and... | 04/10/2012 |
| 8149403 | Optical equipment having wavelength-independent optical path division element Optical equipment for detecting beams emitted from a sample by irradiating the sample with linear polarization according to an aspect of the present invention includes a wavelength-independent optical path division element arranged at a position of coupling of a ill... | 04/03/2012 |
| 8139215 | Method for measuring polarization characteristics and measurement apparatus In a measurement method for measuring polarization characteristics in which an image of a mask pattern is projected onto an image plane, a first and second slit having a width less than or equal to the wavelength of a light source are displaced on the image plane an... | 03/20/2012 |
| 8134707 | On-chip polarimetry for high-throughput screening of nanoliter and smaller sample volumes A polarimetry technique for measuring optical activity that is particularly suited for high throughput screening employs a chip or substrate (22) having one or more microfluidic channels (26) formed therein. A polarized laser beam (14) is direct... | 03/13/2012 |
| 8130378 | Phase retardance inspection instrument A phase retardance inspection instrument, comprising: a light source module for generating a single-wavelength light beam; a circularly polarized light generating module, comprising a polarizer and a first phase retarder, for receiving the single-wavelength light be... | 03/06/2012 |
| 8125640 | Automated analysis system for detection and quantification of biomolecules by measurement of changes in liquid crystal orientation The present invention provides systems and methods for data acquisition and image analysis that utilize twisted nematic liquid crystals (“TNLCs”) to create maps of bio/chemical functionality patterned on surfaces. The method involves the acquisition of a series ... | 02/28/2012 |
| 8115926 | Inspection method and apparatus, lithographic apparatus, lithographic processing cell, and device manufacturing method to measure a property of a substrate A system is configured to measure two separately polarized beams upon diffraction from a substrate in order to determine properties of the substrate. Circularly or elliptically polarized light sources are passed via a fixed phase retarder in order to change the phas... | 02/14/2012 |
| 8111397 | Plate inspection system and plate inspection method A plate inspection system and a plate inspection method with which irregularities in phase difference caused in a retardation layer can be efficiently detected. The inspection system is for inspecting a plate to be inspected having a retardation layer. The plate ins... | 02/07/2012 |
| 8107075 | Optical characteristic measuring apparatus and optical characteristics measuring method An optical characteristic measuring apparatus includes an optical system 10 including first and second carrier retarders 24 and 32 having the retardations being known and differing from each other. The optical characteristic measuring apparatus ... | 01/31/2012 |
| 8094308 | Spectrometric analyzing device and spectrometric analyzing method A spectrometric analyzing device is capable of analyzing a thin film with high accuracy by using light having an arbitrary wavelength, such as not only infrared light but also visible light, ultraviolet light and X-ray, and using whatever refractive index of a suppo... | 01/10/2012 |
| 8094307 | Method and apparatus for measuring the presence and concentration of pharmaceutical substances in a medical fluid administered by a medication delivery system Test equipment determines the contents of medical fluids to be delivered to a patient by a medication delivery system by measuring optical properties of the fluids. One system provides a non-invasive test that uses optical rotation caused by optically active pharmac... | 01/10/2012 |
| 8072599 | Real-time, hybrid amplitude-time division polarimetric imaging camera This disclosure relates to a real-time, hybrid amplitude-time division polarimetric imaging camera used to derive and calculate Stokes parameters of input light. ... | 12/06/2011 |
| 8064055 | System and method of aligning a sample A system and method of use thereof that enables determining and setting sample alignment based on the location of, and geometric attributes of a monitored image formed by reflection of an electromagnetic beam from a sample and into an image monitor, which beam is di... | 11/22/2011 |
| 8059275 | Auto polarized light removal A system and method for automatically removing polarized light in an environment having polarized light and unpolarized light. Light is processed by a polarizer and measured by a sensor. Multiple measurements of a light characteristic are taken, each measurement cor... | 11/15/2011 |
| 8059274 | Low-loss polarized light diversion An optical sensor that provides lateral viewing while maintaining light polarization is disclosed according to one embodiment of the invention. The sensor includes a sensor body, at least one waveguide and at least one refractive optical element. The sensor body may... | 11/15/2011 |
| 8045163 | Method for producing polarisation filters and use of polarisation-sensitive photo-sensors and polarisation-generating reproduction devices The present invention relates to methods for manufacturing polarization sensitive respectively polarizing filters and to their application to polarizing photosensors used to measure the polarization of incident light, further to designs of polarization sensors measu... | 10/25/2011 |
| 8004675 | Method and system for stokes polarization imaging A device and a method for high-speed linear polarization imaging of a scene are disclosed. The device comprises a polarization modulator for modulating the polarization of light emitted from the scene in order to obtain at least three linear polarization states of t... | 08/23/2011 |
| 7995205 | Visualizing birefringent structures in samples Apparatus and methods are disclosed for viewing low-birefringence structures within samples directly, with the eye, in real-time. The sample is placed between an entrance polarizer and analyzer polarizer, the transmission state of one of which is changed dynamically... | 08/09/2011 |
| 7990534 | System and method for azimuth angle calibration An improved procedure for calibrating the azimuth angle in a metrology module for use in a metrology system that is used for measuring a target on a wafer, and the metrology modules can include oblique Spectroscopic Ellipsometry (SE) and unpolarized or polarized spe... | 08/02/2011 |
| 7961318 | Circular birefringence refractometer: method and apparatus for measuring optical activity A system and method for detection and measurement of circular birefringences in materials that exhibit the Faraday effect. The method and apparatus permit detection of optical activities via the difference in the directions of propagation the left- and the right-cir... | 06/14/2011 |
| 7956998 | Method and system for the polarmetric analysis of scattering media utilising polarization difference sensing (PDS) A method for polarmetric analysis of scattering media. A first step involves directing stimulus from a linearly polarized stimulus source at a sample. A second step involves directing the stimulus coming from the sample through a collimating system into a polarizati... | 06/07/2011 |
| 7948622 | System, method and apparatus for image processing and image format According to the present invention, a polarized image is captured, a variation in its light intensity is approximated with a sinusoidal function, and then the object is spatially divided into a specular reflection area (S-area) and a diffuse reflection area (D-area)... | 05/24/2011 |
| 7936458 | Polariscope toy and ornament with accompanying photoelastic and/or photoplastic devices A variety of toy polariscopes are simpler in design and less costly than precision instruments used in scientific research and stress analysis of materials and structures. The toy polariscopes are designed for a variety of objects that may exhibit photoelastic prope... | 05/03/2011 |
| 7889338 | Coordinate measuring machine and method for structured illumination of substrates A coordinate measuring machine for the structured illumination of substrates is disclosed. The incident light illumination means and/or the transmitted light illumination means have a pupil access via which at least one optical element is positionable in the optical... | 02/15/2011 |
| 7876437 | Glass container wall thickness measurement using fluorescence An apparatus and method for measurement of the stress in and thickness of the walls of glass containers is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress c... | 01/25/2011 |
| 7872751 | Fast sample height, AOI and POI alignment in mapping ellipsometer or the like A sample investigation system (ES) in functional combination with an alignment system (AS), and methodology of enabling very fast, (eg. seconds), sample height, angle-of-incidence and plane-of-incidence adjustments, with application in mapping ellipsometer or the li... | 01/18/2011 |
| 7859665 | Polarization analyzing system, exposure method, and method for manufacturing semiconductor device A polarization analyzing system includes a data collector collecting information on resist patterns formed over step patterns by first and second lights, the first and second lights being polarized parallel and perpendicular to the step patterns, a residual resist a... | 12/28/2010 |
| 7843564 | Apparatus and method of non-sampling-based Q-factor measuring A non-sampling-based Q-factor measuring apparatus and method use a power conversion module to transform the power variation of inputted optical signals in time domain into the variation in other domains, such as optical wavelength, optical polarization and different... | 11/30/2010 |
| 7830511 | Apparatus and method for measuring polarization direction of polarizing plate A polarization direction measuring apparatus includes: a first polarizing plate having an unknown polarization direction about a reference axis; a sample whose polarization direction is to be measured; a rotatable sample holder on which the sample is mounted in a fi... | 11/09/2010 |
| 7823215 | Molecular imaging and nanophotonics imaging and detection principles and systems, and contrast agents, media makers and biomarkers, and mechanisms for such contrast agents The present invention relates to near-field scanning optical microscopy (NSOM) and near-field/far-field scanning microscopy methods, systems and devices that permit the imaging of biological samples, including biological samples or structures that are smaller than t... | 10/26/2010 |
| 7796258 | Apparatus and method of non-sampling-based Q-factor measuring A non-sampling-based Q-factor measuring apparatus and method use a power conversion module to transform the power variation of inputted optical signals in time domain into the variation in other domains, such as optical wavelength, optical polarization and different... | 09/14/2010 |
| 7796257 | Measuring apparatus, measuring method, and characteristic measurement unit A measuring apparatus includes a light intensity information acquisition section 40 that acquires light intensity information relating to a measurement light containing a given band component, the measurement light having been modulated by optical elements in... | 09/14/2010 |
| 7791723 | Optical measurement using fixed polarizer Optical measurement method and systems employing a fixed polarizer are disclosed. In one embodiment, the method includes providing at least one optical detection system having a fixed polarizer having a first type polarization; providing a first target on a substrat... | 09/07/2010 |
| 7777880 | Metrological characterisation of microelectronic circuits Method and a polarimetric measurement device of a planar object carrying patterns repeated regularly and forming the lines of a grid. A first measurement is carried out at zero order, under an angle of incidence θ1 and for a first azimuthal angle φ... | 08/17/2010 |
| 7777879 | Rotary encoders An optical rotary encoder uses polarization difference imaging techniques to calculate an angle of orientation of a rotatable member. The optical rotary encoder includes a light source, a polarization sensor that has a polarizer and image sensing structure, and a po... | 08/17/2010 |
| 7777881 | Laser device and microscope A laser device is equipped with an exciting optical system having a GaN semiconductor laser and a condensing lens; and a resonator having of a dichroic mirror and an output mirror, and a solid laser medium is disposed within the resonator. The solid laser medium is ... | 08/17/2010 |
| 7773219 | Process and apparatus for measurements of Mueller matrix parameters of polarized light scattering A method and apparatus for measuring Mueller matrix parameters from scattered light. The apparatus is advantageous for use in countering bioterrorism by detecting information concerning airborne pathogens, particularly microorganism in aerosol form. The system provi... | 08/10/2010 |
