Bizarre Patents
A self defense weapon formed as a memo pad and which is easily held by a person's fingers, therefore making it possible to provide protection from a mugger and also to quickly and easily write a record or a message without failure of missing or forgetting significant information under a stressful situation.
PatentStorm News
Make the Most of Our Site
See this month's Top Inventors and Most Cited Patents.
Stay on top of the latest innovations by subscribing to an RSS feed.
Registered users: Manage your profile.
| Number | Title | Issue Date |
| 7286220 | Test piece for optoelectronic image analysis systems A test piece for an optoelectronic image analysis systems is disclosed. One embodiment has a planar substrate, on which a plurality of geometrical patterns of differing shapes and/or sizes are arranged in a durable, predetermined surface coverage. The geometrical pa... | 10/23/2007 |
| 7224450 | Method and apparatus for position-dependent optical metrology calibration A calibration method suitable for highly precise and highly accurate surface metrology measurements is described. In preferred embodiments, an optical inspection tool including a movable optics system is characterized in terms of position and wavelength dependent qu... | 05/29/2007 |
| 7215419 | Method and apparatus for position-dependent optical metrology calibration A calibration method suitable for highly precise and highly accurate surface metrology measurements is described. In preferred embodiments, an optical inspection tool including a movable optics system is characterized in terms of position and wavelength dependent qu... | 05/08/2007 |
| 7162326 | Mask identification database server The physical movement of reticles and solder bump masks within a wafer processing plant are continually tracked and documented in a historical database for the useful life of the reticles or masks. In an example embodiment of the mask tracking method, the method inc... | 01/09/2007 |
| 7095496 | Method and apparatus for position-dependent optical metrology calibration A calibration method suitable for highly precise and highly accurate surface metrology measurements is described. In preferred embodiments, an optical inspection tool including a movable optics system is characterized in terms of position and wavelength dependent qu... | 08/22/2006 |
| 7027146 | Methods for forming a calibration standard and calibration standards for inspection systems Methods for forming calibration standards for an inspection system and calibration standards are provided. One method includes scanning a first and a second specimen with an optical system. Master standard particles having a lateral dimension traceable to a national... | 04/11/2006 |
| 6274396 | Method of manufacturing calibration wafers for determining in-line defect scan tool sensitivity Methods of manufacturing calibration wafers by forming a first layer of a material on a layer of a substrate material. In a first embodiment, calibration spheres are deposited on the first layer of material followed by an etch process that removes exposed... | 08/14/2001 |
| 6225136 | Method of producing a contaminated wafer A method of controllably adding at least one contaminant to a surface of a silicon wafer. The method includes providing a solution containing a known concentration of one or more contaminants and having a known pH. The solution is applied to a surface of ... | 05/01/2001 |
| 6038019 | Method for monitoring defects of semiconductor device A method for precisely monitoring defects on a semiconductor device includes inserting, into a predetermined region of a photomask used for manufacturing a semiconductor device on a semiconductor wafer, a reference defect pattern with a predetermined dist... | 03/14/2000 |
| 5875027 | Sensitivity calibration disk for surface defect tester A calibration disk for calibrating a sensitivity of a surface defect tester, according to the present invention, comprises n (n is an integer equal to or larger than 2) false defect rows each including 3 or more false defects each formed in a radial or pe... | 02/23/1999 |
| 5534309 | Method and apparatus for depositing particles on surfaces A method of providing particle deposition on a semiconductor wafer or other surface first provides a flow of clean gas into a deposition chamber that purges the chamber prior to introduction of the wafer, and after introduction, continues the flow of clea... | 07/09/1996 |
| 5258974 | Optical read-out audio check disc with semitransparent defects or with single recorded tone A check disc on which a single frequency signal is recorded on a check point next to an information signal of each track number and simulated defects such that the reproduction signal obtained by reproducing the disc becomes a defect signal in the case wh... | 11/02/1993 |
| 5214486 | Monitor plate for automatic particle detection system The present invention provides a verification plate to verify the accuracy and precision of a mask inspection system in detecting contaminated particles. The verification plate is developed on a substrate having a plurality of predefined glass, i.e., tran... | 05/25/1993 |
| 5004340 | Calibration target for surface analysis scanner systems A surface analysis scanner system includes calibration targets, which include a target substrate and a film covering the surface of the target substrate which is scanned by the surface scanner. The film is antireflective to the particular scanned light. P... | 04/02/1991 |
