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| Number | Title | Issue Date |
| 8115917 | Drying nozzle A drying nozzle (1) for drying a peripheral portion of an ophthalmic lens (CL), in particular a contact lens, comprises an inlet (30) for the supply of a pressurized gas and a continuous annular outlet gap (11) having a predetermined width (W) t... | 02/14/2012 |
| 8049879 | Method and apparatus for measuring transmitted optical distortion in glass sheets An apparatus and associated method for measuring transmitted optical distortion in a glass sheet includes a glass stand which receives a glass sheet for mounting between a background screen which includes a matrix of spaced apart dots, and a digital camera which cap... | 11/01/2011 |
| 8045151 | Laminated film defect inspection method and laminated film defect inspection device A first inspection process of inspecting presence of a defect on a front surface of a film body with a protective film separated therefrom; a separator removing process of separating a separator from the inspected laminated film; a second inspection process of inspe... | 10/25/2011 |
| 8035809 | Bubble removal system A bubble removal system includes an inspection cell configured to receive an ophthalmic device and a volume of working fluid. The system also includes a vacuum device configured to form a substantially fluid-tight seal with the inspection cell and to direct a negati... | 10/11/2011 |
| 7990531 | Multi-imaging automated inspection methods and systems for wet ophthalmic lenses A method for inspecting lenses, especially wet contact lenses provided in a volume of liquid inside a container is described. A first image of the lens at a first position in the container is obtained, the lens then being moved to a second position within the contai... | 08/02/2011 |
| 7952702 | Device and system for evaluating a lens for an electronic device The disclosure relates to a system and device for evaluating imperfections in a lens for a display for an electronic device. The evaluation device comprises: a substrate; and a pattern imposed on the substrate. The pattern comprises a series of lines in a grid impos... | 05/31/2011 |
| 7697131 | Automated display quality measurement device A method and apparatus for automating a quality assurance test conducted on display devices used for diagnostic imaging. In one embodiment, the apparatus includes an automated mechanical system for scanning a light meter over a test pattern displayed on a display de... | 04/13/2010 |
| 7663747 | Contamination monitoring and control techniques for use with an optical metrology instrument A technique is provided for monitoring and controlling surface contaminants on optical elements contained within the optical path (or sub-path) of an optical metrology instrument. The technique may be utilized in one embodiment in such a manner as to not require tha... | 02/16/2010 |
| 7659976 | Devices and methods for inspecting optical elements with a view to contamination Described is an examination system (1) for locating contamination (2) on an optical element (4) installed in an optical system (5), which examination system (1) comprises: a spatially resolving detector (6); imaging optics (... | 02/09/2010 |
| 7643141 | Method and apparatus for inspecting color filter A method for inspecting a color filter includes a first step of disposing the color filter so that the color filter is opposed to a light source, a second step of outputting, from the light source, monochromatic light of a color corresponding to one of the colors of... | 01/05/2010 |
| 7639353 | Method, device and system for evaluating a lens for an electronic device The invention relates to a system, method and device for evaluating imperfections in a lens for a display for an electronic device. For the device, it comprises: a substrate; and a pattern imposed on the substrate. For the pattern, when the pattern is viewed through... | 12/29/2009 |
| 7633613 | Method for determining spherical aberration The present invention relates to a method and a device for determining spherical aberration occurring during reading from and/or writing to optical recording media. According to the invention, a method for determining spherical aberration includes the steps o... | 12/15/2009 |
| 7605914 | Optical system and method for improving imaging properties thereof An optical system has at least two optical elements whose spatial relation with respect to each other can be changed. At least one of the optical elements comprises a plurality of optical components. The optical system comprises first measuring means for individuall... | 10/20/2009 |
| 7602485 | Optical window contamination detecting device for optical apparatus An optical window contamination detecting device capable of detecting even microscopic contamination on an optical window with a limited number of contamination detecting sensors. The optical window contamination detecting device is used for a scanning type distance... | 10/13/2009 |
| 7443500 | Apparatus for scattered light inspection of optical elements An apparatus for scattered light inspection of optical elements, having a light-generating unit (2) for generating light that is irradiated onto the optical element (9) respectively to be inspected, and a detector (4) for detecting scattered lig... | 10/28/2008 |
| 7440118 | Apparatus and method for color filter inspection The present invention provides an apparatus and method for detecting flatness and/or unevenness of a surface of an overcoat layer on a colored pixel layer of a color filter with a high degree of accuracy. The apparatus includes: a light source 34, placed almo... | 10/21/2008 |
| 7394536 | Method and apparatus for inspecting front surface shape The present invention provides an inspection method and an inspection apparatus which can remove influence of rear surface reflection image and inspect characteristic of a front surface shape with good accuracy by an inexpensive apparatus construction. First of all,... | 07/01/2008 |
| 7385690 | Inspecting system for color filters An inspecting system (100) includes a stage (10), a white light source (20), a CCD camera (40), a laser diode assembly (60), at least one beam splitter (36, 34), a photo diode (50), and an oscilloscope (52). Th... | 06/10/2008 |
| 7370659 | Photolithographic stepper and/or scanner machines including cleaning devices and methods of cleaning photolithographic stepper and/or scanner machines Stepper and/or scanner machines including cleaning devices and methods for cleaning stepper and/or scanner machines are disclosed herein. In one embodiment, a stepper and/or scanner machine includes a housing, an illuminator, a lens, a workpiece support, a cleaning ... | 05/13/2008 |
| 7365329 | Method for determining location of infrared-cut filter on substrate A method for determining a location of IR-cut filter film on a substrate, the filter film and the substrate cooperatively functioning as an IR-cut filter, includes the steps of: providing an infrared laser device, an IR-cut filter and an infrared laser sensor; emitt... | 04/29/2008 |
| 7361234 | Photolithographic stepper and/or scanner machines including cleaning devices and methods of cleaning photolithographic stepper and/or scanner machines Stepper and/or scanner machines including cleaning devices and methods for cleaning stepper and/or scanner machines are disclosed herein. In one embodiment, a stepper and/or scanner machine includes a housing, an illuminator, a lens, a workpiece support, a cleaning ... | 04/22/2008 |
| 7359046 | Method and apparatus for wafer-level measurement of volume holographic gratings The invention describes a system for the measurement of volume holograms on a wafer scale that permits high-resolution and high throughput measurement of grating parameters. The invention uses a collimated beam of a fixed wavelength light source that is transmitted ... | 04/15/2008 |
| 7358517 | Method and apparatus for imager quality testing An apparatus and method of detecting a defect in an imager die package. The method comprises the steps of exposing the imager die package to light at a first angle, exposing the imager die package to light at a second angle, outputting electrical signals based on th... | 04/15/2008 |
| 7349082 | Particle detection device, lithographic apparatus and device manufacturing method To enable differentiation between a particle and a ghost particle, a detector system is presented. The detector system is configured to output at least two detector signals corresponding to an intensity of radiation being incident on the detector system. If radiatio... | 03/25/2008 |
| 7348786 | Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication Probe modules, methods of use of probe modules, and methods of preparing probe modules, are disclosed. A representative embodiment of a probe module, among others, includes a redistribution substrate and a probe substrate interfaced with the redistribution substrate... | 03/25/2008 |
| 7349081 | Method and device for checking the integrity of a glass protecting tube for the spiral-wound filament of an infrared radiator heat source In order to be able to check reliably glass protecting tubes for spiral-wound filaments of an infrared radiator heat source with respect to damages due to breaking, a device and method are provided for checking the integrity of a glass protecting tube, in particular... | 03/25/2008 |
| 7339664 | System and method for inspecting a light-management film and method of making the light-management film A method of inspecting a light-management film comprises reflecting light from an overhead light source off a first side of the light-management film and examining the light-management film for defects; directing transmission light from a backlight source through a ... | 03/04/2008 |
| 7330248 | Method and apparatus for inspecting defects In a defect inspecting apparatus, having contrast, brightness and appearance of a target for inspection and detection sensitivity of a defect changed depending on optical system conditions, and adapted to perform inspection by selecting an optimal test condition, ev... | 02/12/2008 |
| 7330250 | Nondestructive evaluation of subsurface damage in optical elements A non-destructive process for evaluating subsurface damage in an optical element focuses a microscope at points within the optical element and measures the intensity of reflected light. In one embodiment, a microscope focus a laser beam at a measurement point with t... | 02/12/2008 |
| 7315367 | Defining a pattern on a substrate The invention provides methods and apparatus for defining a pattern on a substrate. An example apparatus includes: an emission source for directing an emission to the substrate, defining a working position between the emission source and the substrate, at least one ... | 01/01/2008 |
| 7315033 | Method and apparatus for reducing biological contamination in an immersion lithography system Disclosed are a method of reducing biological contamination in an immersion lithography system and an immersion lithography system configured to reduce biological contamination. A reflecting element and/or an irradiating element is used to direct radiation to kill b... | 01/01/2008 |
| 7310136 | Method and apparatus for measuring prism characteristics Disclosed herein is a method comprising illuminating a microstructured prism, or linear array of prisms of a prism sheet with an incident beam. The method further comprises making measurements of the refracted image of the beam on a measuring device to measure the d... | 12/18/2007 |
| 7304716 | Method for purging an optical lens By a unit for determining fractions of a substance in a gas or gas mixture, measurements are carried out on the gas or gas mixture for purging a lens in a projection apparatus for projecting patterns onto a substrate. The results of a first measurement on the gas fe... | 12/04/2007 |
| 7301622 | Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements In order to optimize the image properties of several optical elements of which at least one is moved relative to at least one stationary optical element, the overall image defect resulting from the interaction of all optical elements is first of all measured. This i... | 11/27/2007 |
| 7289202 | Methods for testing durable optical elements A method includes providing a polymerized optical film structure having a microstructured surface, forming a scratch having a length on the microstructured surface to form a scratched optical film, illuminating the scratched optical film to form an illuminated scrat... | 10/30/2007 |
| 7289655 | Device for inspecting illumination optical device and method for inspecting illumination optical device The invention provides a device to inspect an illumination optical device and a method to inspect an illumination optical device that make it possible to efficiently inspect illumination optical devices and to control manufacturing cost. A lens array inspecting devi... | 10/30/2007 |
| 7289219 | Polarimetric scatterometry methods for critical dimension measurements of periodic structures An optical measurement system for evaluating a sample has a motor-driven rotating mechanism coupled to an azimuthally rotatable measurement head, allowing the optics to rotate with respect to the sample. A polarimetric scatterometer, having optics directing a polari... | 10/30/2007 |
| 7266800 | Method and system for designing manufacturable patterns that account for the pattern- and position-dependent nature of patterning processes Computational models of a patterning process are described. Any one of these computational models can be implemented as computer-readable program code embodied in computer-readable media. The embodiments described herein explain techniques that can be used to adjust... | 09/04/2007 |
| 7260446 | Temperature protection method for machine tool A method of protecting a rotating device, loaded by temperature of a machine tool with one temperature sensor on that device and a temperature bloc, comprising the steps of inputting specific parameters in the temperature bloc, estimating a value for the device temp... | 08/21/2007 |
| 7248348 | Detection method and device for detecting quality of optical element A detection method for detecting quality of an optical element includes the following steps. Firstly, a point light source is provided. Then, the point light source is allowed to penetrate through the optical element, thereby forming a first optical image on an opti... | 07/24/2007 |
