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"Flight by machines heavier than air is unpractical and insignificant, if not utterly impossible."
Simon Newcomb, astronomer ; Said in 1902, less than two years before the first flight at Kitty Hawk
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| Number | Title | Issue Date |
| 8149276 | Pressure-bonded ball diameter detecting apparatus and pressure-bonded ball diameter detecting method Improving detectability of a diameter of a pressure-bonded ball bonded by a bonding apparatus by calculating the diameter of the pressure-bonded ball by obtaining a first tentative radius by subtracting a distance between a line representing an outline of a pad shor... | 04/03/2012 |
| 8094187 | Method of placing a component by means of a placement device at a desired position on a substrate holder, and device suitable for performing such a method A method places a component at a desired position on a substrate by means of a placement device. The component is transported to an intermediate position above the desired position and a position difference between the intermediate position and the desired position ... | 01/10/2012 |
| 7990413 | Camera sensor job selection method Systems and methods are disclosed that facilitate permitting a user to select one of a plurality of job setups stored in a camera sensor. The plurality of job setups can be pre-programmed into the sensor utilizing conventional methods. During sensor operation, a use... | 08/02/2011 |
| 7969465 | Method and apparatus for substrate imaging The invention provides a substrate surface imaging method and apparatus that compensates for non-linear movement of the substrate surface during an imaging sequence. In one aspect of the invention, the imaging method and apparatus compensate for the non-linear subst... | 06/28/2011 |
| 7742071 | Methods and apparatus for inspecting centerplane connectors The present invention relates to apparatus and methods that reliably detect defects on centerplane connectors. The apparatus and methods include a visual inspection system. The visual inspection system includes a control box, an inspection cart, a camera jig, and a ... | 06/22/2010 |
| 7388979 | Method and apparatus for inspecting pattern defects The present invention relates to a pattern defect inspection method and apparatus that reveal ultramicroscopic defects on an inspection target in which ultramicroscopic circuit patterns are formed, and inspect the defects with high sensitivity and at a high speed. T... | 06/17/2008 |
| 7366343 | Pattern inspection method and apparatus A pattern inspection method and a pattern inspection apparatus, which has an improved precision in detecting and correcting the positional deviation of images for a die comparison, have been disclosed. The quantity of correction of positional deviation of the images... | 04/29/2008 |
| 7366321 | System and method for performing automated optical inspection of objects A system and method for performing optical inspection are provided. At least one “invariant feature” of an object design is determined, and such invariant feature is used in inspecting objects having the corresponding design. An “invariant feature” is a feat... | 04/29/2008 |
| 7356918 | Component mounting method An X-Y robot having a structure that linearly deforms along an X-axis direction and a Y-axis direction, a camera reference mark, and a control unit are provided. The X-Y robot causes no displacement of warp or the like and linearly deforms along only the X-axis dire... | 04/15/2008 |
| 7359577 | Differential method for layer-to-layer registration A system for precisely measuring layer-to-layer mis-registration is provided. The system includes a new type of mark and a comparison system, which compare the right and left signals from the mark to eliminate non-alignment noise, to enlarge the alignment informatio... | 04/15/2008 |
| 7355422 | Optically enhanced probe alignment A novel probe card that comprises a set of fiducials and a method for using the same are disclosed. The set of fiducials comprises a first fiducial and a second fiducial fixed relative to the probe card substrate. Comparing the relative positions of the fiducials de... | 04/08/2008 |
| 7342402 | Method of probing a device using captured image of probe structure in which probe tips comprise alignment features An image of an array of probes is searched for alignment features. The alignment features are then used to bring contact targets and the probes into contact with one another. The alignment features may be a feature of one or more of the tips of the probes. For examp... | 03/11/2008 |
| 7342608 | Focus detecting method, focus detecting mechanism and image measuring device having focus detecting mechanism Focus detecting methods and focus detecting mechanisms of an image measuring device able to execute focus detection at high speed with high accuracy, and image measuring device having the focus detecting mechanisms are provided. A rotation driving device rotates and... | 03/11/2008 |
| 7336431 | Image reading device and image forming device A device includes a light source; a first guiding unit that guides the light from the light source to an object at prescribed incident angles including a first incident angle and a second incident angle; a signal generating unit that receives light and that generate... | 02/26/2008 |
| 7331105 | Method for placing components by means of at least one component placement unit Provided is a method and system for placing components by means of at least one component placement unit wherein the component placement unit is moved over a distance between a component pickup position and a component placement position located on a substrate. In a... | 02/19/2008 |
| 7328974 | Inkjet printer ink cartridge The present invention relates to an inkjet printer ink cartridge, which configures a sponge-free ink-filling device into a combined structure of a case and an ink outlet base body, which is then attached onto a printed circuit by PECVD. A stand having a recess on th... | 02/12/2008 |
| 7293352 | Origin detection method for component placement head An origin detection method for a component placement head includes setting an axial origin for each elevation nut section, of the component placement head, by detecting a rotational angle of a drive section corresponding to the elevation nut section. The elevation n... | 11/13/2007 |
| 7289876 | Container crane, and method of determining and correcting a misalignment between a load-carrying frame and a transport vehicle A container crane includes a movable trolley and a load-carrying frame pendantly connected to the trolley and comprised of a spreader and a head block, for transfer of a container from or to a transport vehicle. Plural optical detectors are mounted on the trolley fo... | 10/30/2007 |
| 7289167 | Television tuner including distribution connectors A metal frame body has first to fourth side plates and is divided, by a shield plate provided in the metal frame body, into a first compartment area near the first side plate and a second compartment area near the second side plate. A distributor is arranged in the ... | 10/30/2007 |
| 7289199 | Electronic imaging apparatus and microscope apparatus using the same An electronic imaging apparatus includes a connecting section connected to an optical apparatus; an optical element having a preset transmittance with respect to light in a preset wavelength region, incident from the optical apparatus; and an electronic image sensor... | 10/30/2007 |
| 7274813 | Defect inspection method and apparatus A method of inspecting defects of a plurality of patterns that are formed on a substrate to have naturally the same shape. According to this method, in order to detect very small defects of the patterns with high sensitivity without being affected by irregular brigh... | 09/25/2007 |
| 7268836 | Television tuner device generating intermediate-frequency signal free from harmonic interference of reference signal A television tuner device includes a metal frame, including a shielding plate which separates the space defined by the metal frame into a first chamber at a first side plate and a second chamber at a second side plate opposite to the first side plate; a distribution... | 09/11/2007 |
| 7266235 | Pattern inspection method and apparatus A pattern inspection method in which an image can be detected without an image detection error caused by an adverse effect to be given by such factors as ions implanted in a wafer, pattern connection/non-connection, and pattern edge formation. A digital image of an ... | 09/04/2007 |
| 7255719 | Wafer rotation device and edge flaw inspection apparataus having the device A wafer rotating device 1 is provided with at least three rollers 2 rotatably provided about axes arranged at parallel intervals and which rotate over the circumferential surface of a disk-shaped wafer 5, a rotation drive mechanism 3 that... | 08/14/2007 |
| 7257247 | Mask defect analysis system An automated system for analyzing mask defects in a semiconductor manufacturing process is presented. This system combines results from an inspection tool and design layout data from a design data repository corresponding to each mask layer being inspected with a co... | 08/14/2007 |
| 7246429 | Electronic component mounting apparatus The invention is directed to performing of an effective checking and aligning operation of component pick-up positions at component feeding units used for manufacturing by performing the operation sequentially at a time. A board recognition camera takes an image of ... | 07/24/2007 |
| 7243421 | Electrical connection of components A contact of a component is electrically connected to an associated contact of an electrical circuit, typically formed on a substrate, by depositing material between the contacts, the material forming or being processed to form an electrical connection between the c... | 07/17/2007 |
| 7239399 | Pick and place machine with component placement inspection Improved component placement inspection and verification is performed by a pick and place machine. Improvements include stereovision imaging of the intended placement location; enhanced illumination to facilitate the provision of relatively high-power illumination i... | 07/03/2007 |
| 7233841 | Vision system A vision system and method for calibrating motion of a robot disposed in a processing system is provided. In one embodiment, a vision system for a processing system includes a camera and a calibration wafer that are positioned in a processing system. The camera is p... | 06/19/2007 |
| 7231080 | Multiple optical input inspection system A system and method of inspecting electrical circuits with multiple optical inputs, including: obtaining first and second image data that are generally spatially coincidental but which each include some image data that is different, modifying one of the images by em... | 06/12/2007 |
| 7225734 | Device and method for positioning a substrate to be printed The disclosure relates to a device and a method for positioning a substrate to be printed in accordance with a screen printing method, lying on a print table, with respect to a template of a screen of the screen printing device. After placement and fixing of the sub... | 06/05/2007 |
| 7222774 | Electronic component mounting apparatus and electronic component mounting method In an electronic component mounting method in which electronic components are sucked/held by plural respective nozzles provided on a mounting head so as to be mounted on electronic component mounting portions of a board, such a mounting operation is sequentially car... | 05/29/2007 |
| 7218793 | Reducing differential resolution of separations Certain disclosed implementations use digital image processing to reduce the differential resolution among separations or images in film frames, such as, for example, red flare. A location in the red image may be selected using information from another image. The se... | 05/15/2007 |
| 7215808 | High throughout image for processing inspection images Disclosed is an image processing system for analyzing images of a specimen to determine whether the specimen contains defects. The system includes a plurality of processors for receiving image data from a specimen and for analyzing one or more selected patch(es) of ... | 05/08/2007 |
| 7199816 | Device and method for picking up image of component, and component mounting apparatus An image pickup camera is arranged, so that a plurality of components are adapted to be sequentially imaged by corresponding image pickup device with a timing whereby light for imaging is prevented from affecting the other image pickup operation while the components... | 04/03/2007 |
| 7186981 | Method and apparatus for thermographic imaging using flash pulse truncation A pulse controller device for controlling the excitation of a heat source used in thermographic imaging is disclosed. The pulse controller device comprises a power supply, a heat source coupled to the power supply, a device coupled to the power supply signaling the ... | 03/06/2007 |
| 7173648 | System and method for visually monitoring a semiconductor processing system The present invention relates to visually monitoring an interior portion of a processing chamber in a semiconductor processing system. An image collector collects images of the interior of the chamber and provides an image signal indicative of a visual representatio... | 02/06/2007 |
| 7170307 | System and method of mitigating effects of component deflection in a probe card analyzer A system and method of mitigating the effects of component deflections in a probe card analyzer system may implement three-dimensional comparative optical metrology techniques to model deflection characteristics. An exemplary system and method combine non-bussed ele... | 01/30/2007 |
| 7155052 | Method for pattern inspection A method for inspecting a patterned surface employs reference data related to the pattern to provide a map for identifying regions which are expected to generate equivalent images. These regions are then compared in an image-to-image comparison to identify possible ... | 12/26/2006 |
| 7154537 | Camera system, control method thereof, device manufacturing apparatus, exposure apparatus, and device manufacturing method An exposure apparatus for exposing a substrate to a pattern. The apparatus includes a stage configured to hold the substrate and to move, a driving unit configured to drive the stage, a plurality of cameras, each of the plurality of cameras being configured to sense... | 12/26/2006 |
