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Class 33/559 - Movable contact probe, per se


Subclass of Class 33 - Geometrical instruments
Definition: Subject matter which includes only the contact member with
No. of patents: 314
Last issue date: 03/20/2012


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NumberTitleIssue Date
RE43250Articulating device
Disclosed is a method of moving an articulating mechanism (22,410) for a measuring device, comprising the steps of: releasing two bodies (14,16, 410a,410b) which form the articulating mechanism allowing relative movement thereof; moving one of t...
03/20/2012
8051576Metrological apparatus for measuring surface characteristics
An attitude arm mounted to a support arm is rotatable about a pivot. The attitude arm holds a stylus gauge, which generates a signal representing deflection of the stylus in a measurement direction as the stylus follows a surface of a workpiece rotated on a turntabl...
11/08/2011
7934323Method and a device for the positioning of a displaceable component in an examining system
The invention relates to a method and a device for the positioning of a displaceable component in an examining system, particularly a measuring or an analytic system wherein, during the process, the displaceable component is displaced with the support of an actuatin...
05/03/2011
7918036Surface shape measuring apparatus and surface shape measuring method
In a surface shape measurement device that measures the surface shape of a sample (W1, W2) by moving a probe (16, 26) in a sliding fashion along the surface of the sample (W1, W2) and thereby detecting the amount of displacement of...
04/05/2011
7913412Contour measuring probe
A contour measuring probe includes an air guide, a sliding member and a probe tip. The air guide defines a guide hole. The sliding member is slidably received in the guide hole. The probe tip is fixed on an end of the sliding member. A cross-section of the sliding m...
03/29/2011
7797850Contact type measuring instrument
There is provided a contact type measuring instrument in which the contact force of a probe is adjusted by a force created by compressed air and an attraction force between a permanent magnet and a magnetic body. This measuring instrument gives a pulling-in force or...
09/21/2010
7685733Micro force measurement device, micro force measurement method, and micro surface shape measurement probe
There is disclosed a micro surface shape measurement probe including a probe shaft 4 having at a distant end thereof a probe member 2 for contacting an object 1 to be measured, a probe body 21 provided with support means for movably suppo...
03/30/2010
7676945Modular measurement probe
A measurement probe, such as a touch trigger probe, is described that comprises a stylus module attachable to a base module. The stylus module comprising a housing and a stylus holder moveably attached to the housing. The base module comprises a measurement portion ...
03/16/2010
7594339Sensor module for a probe of a tactile coordinate measuring machine
A sensor module for a probe of a tactile coordinate measuring machine has a stationary module base which defines a first measurement plane. The sensor module has a support, which is moveable relative to the module base, for holding a stylus. At least one deformable ...
09/29/2009
7571550Stylus for key duplicating machine with replaceable segmented stylus
A stylus for key duplicating machine with replaceable segmented stylus comprising a cylindrical body; a spring-loaded tracer having a slide spindle movably engaged in one end of the cylindrical body, and a replaceable segmented stylus releasably secured on the front...
08/11/2009
7500319Measurement probe for use in coordinate measuring machines
A measurement probe for use in coordinate measuring machines, which probe comprises a base (1) connected to a coordinate measuring machine, a measurement tip (4) and a ball (5) arranged at the first end of the measurement tip (4). The mea...
03/10/2009
7426022Liquid crystal module brightness measurement apparatus and brightness measurement apparatus
A brightness measurement apparatus which includes a placement unit on which an object to be measured is placed, a measurement unit for measuring brightness or chromaticity from an upper surface of the object placed on the placement unit, a placement unit moving mech...
09/16/2008
7415775Orientable probe
Orientable probe (10) comprising a probe feeler (6) capable of being oriented along a plurality of indexed directions around a rotation center (O), thanks to two mobile elements (4, 5) that can turn: the first around a first axis (B) and relativ...
08/26/2008
7412779Measuring tool
In a measuring tool, following operations are carried out. In a preset operation, a displacement is detected in response to an instruction from an operating section, and the detected displacement is stored in a storage as a measurement reference value (Xc...
08/19/2008
7398603Distance measuring probe with air discharge system
An exemplary distance measuring probe (100) includes a tube track (12), a tip extension (16), a pair of hollow tubes (14), a pair of air discharge systems (115), a linear measuring scale (18), and a displacement sensor (1...
07/15/2008
7395727Strain detection for automated nano-manipulation
A strain detector for in-situ lift-out, comprises a nano-manipulator probe shaft; a strain gauge mounted on the probe shaft; and a first cut-out on the probe shaft. The first cut-out has a rectangular cross-section. There is a second cut-out on the probe shaft; the ...
07/08/2008
7395606CMM arm with exoskeleton
Apparatus for a CMM Arm with Exoskeleton is provided comprising an Internal CMM Arm with a base end and a probe end, and an Exoskeleton driving the Internal CMM Arm through a plurality of transmissions. One or more contact probes, optical probes and tools are mounte...
07/08/2008
7392692Surface scan measuring device, surface scan measuring method, surface scan measuring program and recording medium
A surface scan measuring device, a surface scan measuring method, a surface scan measuring program and a recording medium storing such a program which can appropriately adjust the scanning speed, the sampling pitch and other measurement parameters according to the s...
07/01/2008
7392596Probe head
A probe head includes sensors having, in each instance, a pressure-sensitive surface, electrical signal being producible by the sensors when pressure forces are acting. Furthermore, the probe head has mechanical transmission elements and a holding element for positi...
07/01/2008
7371609Stacked module systems and methods
The present invention stacks chip scale-packaged integrated circuits (CSPs) into modules that conserve PWB or other board surface area. In a preferred embodiment in accordance with the invention, a form standard associated with one or more CSPs provides a physical f...
05/13/2008
7367132Contact-type displacement measuring apparatus
A contact-type displacement measuring apparatus includes a first movable body that reciprocates in a first linear direction; a driving unit that drives the first movable body; a second movable body that reciprocates in a second linear direction parallel to the first...
05/06/2008
7367133Device and method for coordinate measurement
In a device and a method for coordinate measurement, a probe head generates a switching signal in response to contact with a workpiece. The device includes position-measuring units for each coordinate axis to be measured, with the aid of which the relative position ...
05/06/2008
7363721Countersink gauge having self-centering probe
A feature of a countersink in a hole, such as the diameter, is measured by a gauge having a self centering, spherically shaped probe which shifts laterally upon engagement with the countersink side walls to as to align itself with the central axis of the hole. The g...
04/29/2008
7353616Shape measuring instrument
A shape measuring instrument is provided as being capable of measuring a surface shape of a target with a small contact force while changing the contact force. A measuring probe 32 is supported while a tilt θ is provided. A retracting force of the measuring ...
04/08/2008
7350310Articulating device
Disclosed is a method of moving an articulating mechanism (22,410) for a measuring device, comprising the steps of: releasing two bodies (14,16, 410a,410b) which form the articulating mechanism allowing relative movement thereof; m...
04/01/2008
7352271Probe and contour measuring instrument
A probe body (200) includes a middle closing portion (250) formed upright on a connector front portion (261A) and a female thread (261D) into which a male screw (110) is screwed. A sensor module (300) includes a slidable-con...
04/01/2008
7347000Touch probe
Touch probe for a machine for measuring coordinates, including a contact feeler (12), relatively mobile relatively to a fixed organ (1) and held in a defined and repeatable resting position by a spring (21). The probe comprises an electric circu...
03/25/2008
7337551Probe head for a coordinate measuring machine
A probe head for a coordinate measuring machine has a replaceable, miniaturized probe system with a stylus. The stylus is rigid and forms a structural unit together with a membrane-type sensor system that is deformed in a predetermined way when a force acts on the s...
03/04/2008
7328630End effector inspection apparatus and method
A method for using an end effector for inspecting a structure is provided. An end effector includes a magnetically coupled attachment member for connecting the end effector to a control system bridge. An end effector also includes a telescoping arm at least partiall...
02/12/2008
7328518Surface roughness/contour shape measuring apparatus
The present invention provides a surface roughness/contour shape measuring apparatus that can move a probe relative to a workpiece within an orthogonal X-Y plane while employing a relatively inexpensive construction. In the surface roughness/contour shape measuring ...
02/12/2008
7328519Machine adaptation
Transmission of power and/or signal across a machine tool spindle shank is disclosed. Contacts (340) on the shank are connectable to tracks (24/22) on the spindle (210). A circuit (e.g. FIG. 15) is used to determine the orientation of the...
02/12/2008
7318285Surface profile measuring instrument
Provided are a measuring section (210) including a vibrating contact-type probe having a measuring force detection circuit (219) which detects a measuring force acting to the contact portion (212); a moving unit (a three-dimensional drive mechan...
01/15/2008
7316075Coordinate measuring machine for metrological determination of a coordinate on a test object
A coordinate measuring machine for the metrological determination of a measurement coordinate on a test object comprises a table for mounting the test object. A first and a second bearing support are arranged on the table. A first and a second carriage, each moveabl...
01/08/2008
7316077Probe for sensing the position of an object
A probe (10) for a machine tool has a switch (32) or other sensor for connecting its battery power supply in response to movement of the probe. In a preferred embodiment, the switch responds to rotation of the probe in the machine tool spindle. The swi...
01/08/2008
7316076Coordinate measuring device and a method for measuring the position of an object
A coordinate measuring device having a probe for contacting the object (15) to be measured. The probe comprises a sensing member (18) for contacting the object (15), a support unit (13), a supporting element (25) connecting said se...
01/08/2008
7310891Head for the linear dimension checking of mechanical pieces
A gauging head includes a substantially closed casing, a movable arm with a first portion, partly located inside the casing and associated with a position transducer, and a second portion, outside the casing, carrying a feeler for contacting a piece to be checked, a...
12/25/2007
7296364Sensor module for a probe head of a tactile coordinated measuring machine
A sensor module for a probe head of a tactile coordinate measuring machine has a frame forming a stationary module base, thereby defining a first measurement plane. A moving part is connected to the frame via webs. Each web has a thick-material web portion arranged ...
11/20/2007
7293365Probe or stylus orientation
Re-orientation of a stylus 30 or measurement probe 12 can be accomplished by engaging a part of the stylus or probe with a fixed part 50 and moving the probe in a spherical path centred at the engagement. The engagement 50 is spaced from ...
11/13/2007
7292354Apparatus for photoelectric measurement of an original
An apparatus for the photoelectric measurement of an essentially planar measurement original includes a photoelectric scanner and a positioning arrangement for the two dimensional movement of the scanner over the measurement original positioned on a supporting surfa...
11/06/2007
7281336Touch probe
A touch probe (10,50) is disclosed comprising a probe body (12,52) housing first locating elements (23,58), a stylus holder (16,54) having second locating elements (24,57) which co-operate with the first locating elements to locate...
10/16/2007
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