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Class 33/547 - Optical comparison


Subclass of Class 33 - Geometrical instruments
Definition: Subject matter which includes a projection screen having
No. of patents: 13
Last issue date: 02/13/2007


NumberTitleIssue Date
7174619Methods of making microstructured lamina and apparatus
The present invention relates to methods of making microstructured laminae for replication and apparatus. In a preferred embodiment, the invention relates to machining V-shaped grooves on individual lamina forming cube-corner microstructures. ...
02/13/2007
7130034Metrology system and method for measuring five degrees-of-freedom for a point target
A metrology system includes a laser, a position sensitive detector array, a first collimator, a second collimator, and a mirror. The position sensitive detector array and the first collimator are positioned at a reference point. The second collimator and the mirror ...
10/31/2006
7024787Template for evaluating parts and method of using same
A template for evaluating a part, comprising: a surface having a shape corresponding to the part; and at least one element on the surface corresponding to a desired location of a feature on the part. A method of evaluating a part, comprising the steps of: providing ...
04/11/2006
6425188Optoelectric apparatus for the dimension and/or shape checking of pieces with complex tridimensional shape
An optoelectronic apparatus for the dimension and/or shape checking of pieces, more specifically pieces with complex tridimensional shape, as the supports for magnetic read/write heads (33, 47, 63) for hard disk storage units, comprises a base (1) with tw...
07/30/2002
6418604Method of fabricating die coater parts
A method of preparing a surface on a die coater to improve the uniformity of the coating layer on the substrate. A surface of the die block is machined. The die block is then positioned on a measuring surface in a free state so that the machined surface b...
07/16/2002
6332275Margin inspector for IC wafers
A margin inspector for IC wafers includes an upper plate and a supporting portion. The upper plate, which is formed as a transparent plate, has a plurality of concentric circular segments thereon for establishing a set of reference lines to examine the pe...
12/25/2001
6293027Distortion measurement and adjustment system and related method for its use
A technique for measuring distortion in a structure of interest, such as a spacecraft antenna reflector (18), and optionally compensating for the distortion. A first set of targets (22) on the structure (18) is scanned by an attitude transfer system (24) ...
09/25/2001
5283630Error correcting method for measuring object surface using three-dimension measuring apparatus
A three-dimension measuring apparatus having a probe, such as non-contact optical probe, is used to measure the surface of an object, such as an aspherical lens. Initially, the apparatus is used to obtain reference probe measured values of a reference sph...
02/01/1994
5065518Food product measuring device
A measuring device for allowing a user to rapidly determine that an article such as a tortilla is properly sized and shaped. The measuring device consists of a transparent disc that is supported by a handle. The transparent disc includes a minimum size li...
11/19/1991
4956764Assembly data model tool system
A tool system for an integrated manufacturing and assembly system includes a plurality of profile boards which are connected together with connector boards. The profile board include a profile edge which define a mold line surface. Each of the profile boa...
09/11/1990
4625412Apparatus and method for measuring the wear of railroad rail
An apparatus and method is provided for measuring the wear in the cross-sectional profile of a railroad rail. A carriage is adapted for travel along the length of the rail and includes means for moving transversely with respect to its direction of travel ...
12/02/1986
4601110Fixture device
An invention is disclosed for positioning an object wherein three point supports provide three contact points which define a first plane. Three additional point supports provide three additional contact points which are not coplanar with the first plane a...
07/22/1986
4566192Critical dimension measurement structure
A pattern for determining dimensions of projected or printed figures is provided having individual scaling figures therein on a mask or template. Dimensional measurement may be indicated by alignment of opposing edges of scaling figures offset from each o...
01/28/1986
 
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