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A mouse device for use as an input device of a computer is provided that includes a housing in which recording paper is loadable, and a printer unit provided within the housing for printing on the recording paper print information received from the computer.

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Class 324/768 - Bipolar transistor


Subclass of Class 324 - Electricity: measuring and testing
Definition: Subject matter including a semiconductor device of the type
No. of patents: 83
Last issue date: 11/16/2010


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NumberTitleIssue Date
7834649Method and apparatus for statistical CMOS device characterization
A unified test structure having a large number of electronic devices under test is used to characterize both capacitance-voltage parameters (C-V) and current-voltage parameters (I-V) of the devices. The devices are arranged in an array of columns and rows, and selec...
11/16/2010
7782076Method and apparatus for statistical CMOS device characterization
A unified test structure having a large number of electronic devices under test is used to characterize both capacitance-voltage parameters (C-V) and current-voltage parameters (I-V) of the devices. The devices are arranged in an array of columns and rows, and selec...
08/24/2010
7759962Methodology for bias temperature instability test
A method for performing a bias temperature instability test on a device includes performing a first stress on the device. After the first stress, a first measurement is performed to determine a first parameter of the device. After the first measurement, a second str...
07/20/2010
7755379Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests
This invention discloses a circuit for performing an unclamped inductive test on a metal oxide semiconductor field effect transistor (MOSFET) device driven by a gate driver. The circuit includes a current sense circuit for measuring an unclamped inductive testing (U...
07/13/2010
7486099System and method for testing power transistors
A method for testing a power converter having at least one power transistor is disclosed. The method may include receiving a power transistor test request, and resetting a fault flag for each power transistor, wherein the fault flag indicates a fault status associat...
02/03/2009
7436169Mechanical stress characterization in semiconductor device
Methods of characterizing a mechanical stress level in a stressed layer of a transistor and a mechanical stress characterizing test structure are disclosed. In one embodiment, the test structure includes a first test transistor including a first stress level; and at...
10/14/2008
7365559Current sensing for power MOSFETs
A power MOSFET, comprising main and current mirror MOSFETs, has a current sense resistance coupled between its mirror and source terminals and a monitoring circuit responsive to a first voltage dependent upon current through the current sense resistance. The circuit...
04/29/2008
7345500Method and system for device characterization with array and decoder
A system and method for testing devices. The system includes a plurality of pads and a decoder coupled to a plurality of devices. The decoder is configured to receive a plurality of selection signals from the plurality of pads and select a device from the plurality ...
03/18/2008
7332924Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failure
Reliability testing circuitry is built into the wafer or IC package in the form of one or more individual testers that use small-area transistors as DUTs. Stress can be applied to the DUTs in parallel and information about breakdown, wearout or failure can be obtain...
02/19/2008
7327149Bi-directional MOS current sense circuit
A current sensing circuit comprises a power device adapted to conduct a bidirectional current between first and second terminals thereof, first and second sensing devices operatively coupled to the power device, a sense amplifier providing first and second voltages ...
02/05/2008
7327157Switch device
A switch device includes a switch to be tested with a first terminal and a second terminal as well as a control terminal for controlling a resistance between the first terminal and the second terminal. Furthermore, the switch device includes a resistor as well as me...
02/05/2008
7315483Circuit for selecting a power supply voltage and semiconductor device having the same
A semiconductor memory device capable of reducing the number of pads is provided. The semiconductor memory device may include a pad, a power supply voltage generating circuit and a voltage selection circuit. The power supply voltage generating circuit may generate o...
01/01/2008
7274206Output power detection circuit
A detection circuit for detecting the output power of a power amplifier comprises a first current minor transistor (Ti 1) having a base, which is connectable to a power transistor (T10), and a collector, a RF detection means (RF-det) for detecting the ...
09/25/2007
7212407Electrical power converter method and system employing multiple output converters
A support may receive one or more power electronic circuits. The support may aid in removing heat from the circuits through fluid circulating through the support. The support, in conjunction with other packaging features may form a shield from both external EMI/RFI ...
05/01/2007
7193427Method and apparatus for measuring relative, within-die leakage current and/or providing a temperature variation profile using a leakage inverter and ring oscillator
A leakage inverter has a switching delay in one direction that is directly proportional to the drain or gate leakage current of either an n-type or p-type device. For one aspect, a leakage ring oscillator includes an odd number of inverters including at least one le...
03/20/2007
7187568Power converter having improved terminal structure
A terminal structure for power electronics circuits reduces the need for a DC bus and thereby the incidence of parasitic inductance. The structure is secured to a support that may receive one or more power electronic circuits. The support may aid in removing heat fr...
03/06/2007
7187548Power converter having improved fluid cooling
A thermal support may receive one or more power electronic circuits. The support may aid in removing heat from the circuits through fluid circulating through the support, which may be controlled in a closed-loop manner. Interfacing between circuits, circuit mounting...
03/06/2007
7176695Method and apparatus for measuring transfer characteristics of a semiconductor device
A method and apparatus is provided for measuring alternating current (AC) and direct current (DC) characteristics of a plurality of semiconductor devices. A ring oscillator generates pulses to drive the plurality of semiconductor devices under test. Current/Voltage ...
02/13/2007
7177153Vehicle drive module having improved cooling configuration
An electric vehicle drive includes a thermal support may receive one or more power electronic circuits. The support may aid in removing heat from the circuits through fluid circulating through the support. Power electronic circuits are thermally matched, such as bet...
02/13/2007
7161776Method for monitoring a power output stage
A method for monitoring a power output stage including at least one half bridge with upper and lower semiconductor switches connected in series, wherein the semiconductor switches are controllable alternately to a switched-on state and a switched-off state by pulse-...
01/09/2007
7142434Vehicle drive module having improved EMI shielding
EMI shielding in an electric vehicle drive is provided for power electronics circuits and the like via a direct-mount reference plane support and shielding structure. The thermal support may receive one or more power electronic circuits. The support may aid in remov...
11/28/2006
7138804Automatic transmission line pulse system
A system for measuring electrostatic discharge (ESD) characteristics of a semiconductor device that comprises at least one pulse generator generating ESD-scale pulses, a first point of the semiconductor device receiving a first ESD-scale pulse from the at least one ...
11/21/2006
7095612Cooled electrical terminal assembly and device incorporating same
A terminal structure provides interfacing with power electronics circuitry and external circuitry. The thermal support may receive one or more power electronic circuits. The support may aid in removing heat from the terminal structure and the circuits through fluid ...
08/22/2006
7061775Power converter having improved EMI shielding
EMI shielding is provided for power electronics circuits and the like via a direct-mount reference plane support and shielding structure. The thermal support may receive one or more power electronic circuits. The support may aid in removing heat from the circuits th...
06/13/2006
7032695Vehicle drive module having improved terminal design
A terminal structure for vehicle drive power electronics circuits reduces the need for a DC bus and thereby the incidence of parasitic inductance. The structure is secured to a support that may receive one or more power electronic circuits. The support may aid in re...
04/25/2006
7016192Electrical power converter method and system employing multiple-output converters
A support may receive one or more power electronic circuits. The support may aid in removing heat from the circuits through fluid circulating through the support. The support, in conjunction with other packaging features may form a shield from both external EMI/RFI ...
03/21/2006
7005881Current sensing for power MOSFET operable in linear and saturated regions
A circuit for sensing the current through a power MOSFET in both the linear and saturated regions of operation of the power MOSFET comprising a first circuit coupled to the power MOSFET for sensing the current through the power MOSFET in the saturated region of oper...
02/28/2006
7005843Position indicator and position detector
A position indicator includes a time-constant circuit having an element whose characteristic continuously varies in response to operation represented as a continuous quantity such as writing force, and capable of switching the variation range of time constant in res...
02/28/2006
6975312Computer system having network connector and method of checking connection state of network cable therefor
A computer system having a network connector to which a network cable is connected, including a displaying part displaying a connection state of the network cable; a signal processing part processing a signal inputted through the network connector; and a control par...
12/13/2005
6972957Modular power converter having fluid cooled support
A support may receive one or more power electronic circuits. The support may aid in removing heat from the circuits through fluid circulating through the support. The support, in conjunction with other packaging features may form a shield from both external EMI/RFI ...
12/06/2005
6965514Fluid cooled vehicle drive module
An electric vehicle drive includes a support may receive one or more power electronic circuits. The support may aid in removing heat from the circuits through fluid circulating through the support. The support, in conjunction with other packaging features may form a...
11/15/2005
6940715Modular power converter having fluid cooled support
A support may receive one or more power electronic circuits. The support may aid in removing heat from the circuits through fluid circulating through the support. The support, in conjunction with other packaging features may form a shield from both external EMI/RFI ...
09/06/2005
6927988Method and apparatus for measuring fault diagnostics on insulated gate bipolar transistor converter circuits
A method for diagnosing faults using a load. In the method IGBTs are controlled such that certain currents are expected. If the currents are not as expected, a fault may be diagnosed. ...
08/09/2005
6909607Thermally matched fluid cooled power converter
A thermal support may receive one or more power electronic circuits. The support may aid in removing heat from the circuits through fluid circulating through the support. Power electronic circuits are thermally matched, such as between component layers and between t...
06/21/2005
6903559Method and apparatus to determine integrated circuit temperature
A system may include a first diode and a device coupled to the first diode. The device may be adapted to transmit a first current through the first diode, to determine a first voltage across the first diode, the first voltage associated with the first current, to tr...
06/07/2005
6888469Method and apparatus for estimating semiconductor junction temperature
An apparatus is disclosed that provides an estimate of the semiconductor junction temperature of a semiconductor device as a function of the electrical current flowing across the corresponding semiconductor junction. The apparatus includes a current sensor that samp...
05/03/2005
6836125Method and a device for testing a power module
A method of testing a power module including a control gate, an emitter, a collector, at least one power component on a dielectric substrate and a diode connected in antiparallel with the power component measures partial discharges occurring between the emitter and ...
12/28/2004
6690178On-board microelectromechanical system (MEMS) sensing device for power semiconductors
An on-board micro-electromechanical (MEMS) isolator is provided on board a power semiconductor device for measuring voltage, current, or both. In particular, the power semiconductor may comprise a plurality of transistors connected in parallel, such that ...
02/10/2004
6656809Method to fabricate SiGe HBTs with controlled current gain and improved breakdown voltage characteristics
A method of fabricating a SiGe heterojunction bipolar transistor (HBT) is provided which results in a SiGe HBT that has a controllable current gain and improved breakdown voltage. The SiGe HBT having these characteristics is fabricated by forming an in-si...
12/02/2003
6650137Circuit for monitoring an open collector output circuit with a significant offset
A monitoring circuit interfacing an open collector output circuit with a voltage offset, wherein the voltage offset exhibited between the monitoring circuit and the open collector output circuit prevents direct interfacing with a digital input of an adjac...
11/18/2003
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