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| Number | Title | Issue Date |
| 7733114 | Test handler including gripper-type test contactor A test handler is provided for testing electronic devices having light-emitting elements. Electronic devices are mounted at a loading position, optical measurements are conducted at a test contact position where a testing device is located for optical communication ... | 06/08/2010 |
| 7663394 | Start signal detector circuit A variation of a threshold of diode-connected transistors is compensated for to maintain a constant rectification efficiency of a rectifier circuit, thereby enabling stable detection of a start signal. A constant voltage is applied to DC bias terminal 103 of ... | 02/16/2010 |
| 7579858 | Semiconductor device and inspection method thereof A semiconductor device is disclosed. The device has a photodiode isolated by element isolating regions (Ia, 14a, 14b) characterized by the following facts: on the principal surface of first semiconductor layer 11 of the first elect... | 08/25/2009 |
| 7474115 | Organic electronic device display defect detection Defects are detected in organic electronic device displays such as organic light emitting diode (OLED) displays. An infrared camera may be used to screen displays for defects and to identify the locations of the defects. Relative hot or cold areas in a display corre... | 01/06/2009 |
| 7463050 | System and method for controlling temperature during burn-in Systems and methods for reducing temperature dissipation during burn-in testing are described. Devices under test are each subject to a body bias voltage. The body bias voltage can be used to control junction temperature (e.g., temperature measured at the device und... | 12/09/2008 |
| 7439753 | Inverter test device and a method thereof The present invention discloses an inverter test device and a method thereof, which provides a single-load environment or a multi-load test environment to test electrical performance of an inverter or inverters, including: unbalanced current comparison, phase compar... | 10/21/2008 |
| 7414386 | Methods for testing optical transmitter components Methods for testing optical components, such as laser diodes or light emitting diodes, that are manufactured for use in optical transmitters or transceivers. The testing methods are performed using a true RMS conversion circuit in a test apparatus. The testing metho... | 08/19/2008 |
| 7382148 | System and method for testing an LED and a connector thereof A system for testing a light emitting diode (LED) (20) and connectors thereof. The system includes: a chip (10) having general purpose input output (GPIO) function and a plurality of pins (101), a test fixture (30), a parallel interface (... | 06/03/2008 |
| 7362088 | Non contact method and apparatus for measurement of sheet resistance of P-N junctions A contactless sheet resistance measurement apparatus and method for measuring the sheet resistance of upper layer of ultra shallow p-n junction is disclosed. The apparatus comprises alternating light source optically coupled with first transparent and conducting ele... | 04/22/2008 |
| 7363175 | Query based electronic battery tester An electronic battery tester for testing a storage battery provides a test output indicative of a condition of the battery. Electronic measurement circuitry provides a measurement output related to a condition of the battery. The battery condition is determined base... | 04/22/2008 |
| 7358757 | Display apparatus and inspection method The test circuit of a display apparatus according to the invention detect short-circuiting in each of the data lines Dn by inputting the electric potential Vd of the data line Dn connected to the corresponding one of high resistance first short-circuiting detecting ... | 04/15/2008 |
| 7348786 | Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication Probe modules, methods of use of probe modules, and methods of preparing probe modules, are disclosed. A representative embodiment of a probe module, among others, includes a redistribution substrate and a probe substrate interfaced with the redistribution substrate... | 03/25/2008 |
| 7339388 | Intra-clip power and test signal generation for use with test structures on wafers The fabrication of the wafer may be analyzed starting from when the wafer is in a partially fabricated state. The value of a specified performance parameter may be determined at a plurality of locations on an active area of a die of the wafer. The specified performa... | 03/04/2008 |
| 7332917 | Method for calculating frequency-dependent impedance in an integrated circuit A method for calculating frequency-dependent impedance in an integrated circuit (IC) having transistors coupled together by a line follows. First, partition the line into a plurality of rectangles of constant material. Then, solve for the minimum dissipated power in... | 02/19/2008 |
| 7319530 | System and method for measuring germanium concentration for manufacturing control of BiCMOS films A system and method is disclosed for measuring a germanium concentration in a semiconductor wafer for manufacturing control of BiCMOS films. Germanium is deposited over a silicon substrate layer to form a silicon germanium film. Then a rapid thermal oxidation (RTO) ... | 01/15/2008 |
| 7309995 | Noncontact conductivity measuring instrument The present invention relates to measurement of conductivity. A microwave oscillated by an oscillator using a Gunn diode is applied through an isolator, a circulator, and a horn antenna to a silicon wafer. The isolator is used for reducing the standing wave influenc... | 12/18/2007 |
| 7309850 | Measurement of current-voltage characteristic curves of solar cells and solar modules A solar cell or solar module is measured during a short pulse of light in such a way that the resulting data for current and voltage at each light intensity is the same as would be measured under steady-state illumination conditions and therefore predictive of the a... | 12/18/2007 |
| 7301346 | Hand lamp, especially for magnetic crack detection The invention relates to a manual lamp, especially for optical crack testing according to the magnetic powder testing and dye penetration method. Said manual lamp comprises at least one LED having an emission wavelength located in the UVA range as an illuminating me... | 11/27/2007 |
| 7298167 | Power supply system A system for detecting a fault in a power supply having at least one power supply unit and a redundant power supply unit. The system includes a printed circuit board and a common voltage bus disposed on the printed circuit board. A plurality of diodes is disposed on... | 11/20/2007 |
| 7295023 | Probe card The present probe card comprises a circuit board, a platform fixed on the circuit board, a tunable stage positioned on the platform, a probe carrier positioned on the tunable stage and at least one probe positioned on the probe carrier. The tunable stage comprises a... | 11/13/2007 |
| 7285969 | Probe for combined signals A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resi... | 10/23/2007 |
| 7260509 | Method for estimating changes in product life resulting from HALT using quadratic acceleration model A method provides early estimation of product life using accelerated stress testing data. In an embodiment, data measured from a product operating in a first, high-stress environment is used to predict how long the product will operate in a second, normal operating ... | 08/21/2007 |
| 7250750 | System and method for testing and orientation of components for assembly There is disclosed a system and method for testing and orientation of components for assembly, including a component selection tester for testing, prior to assembly, the correct selection of a desired component. The component selection tester includes at least one s... | 07/31/2007 |
| 7248062 | Contactless charge measurement of product wafers and control of corona generation and deposition Systems and methods for determining a property of a specimen are provided. The specimen may be a product wafer. The method may include biasing a focused spot on the specimen. The method may also include measuring a parameter of a measurement spot on the specimen. Th... | 07/24/2007 |
| 7236506 | Method and apparatus for compensating for temperature characteristics of laser diode in optical communication system A method and apparatus for compensating for temperature characteristics of a laser diode are disclosed. The laser diode may be used in a transmitter unit of a transceiver for optical signal transmission. The transceiver includes the laser diode and a monitor photodi... | 06/26/2007 |
| 7214289 | Method and apparatus for wall film monitoring A wall film monitoring system includes first and second microwave mirrors in a plasma processing chamber each having a concave surface. The concave surface of the second mirror is oriented opposite the concave surface of the first mirror. A power source is coupled t... | 05/08/2007 |
| 7205784 | Probe for combined signals A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resi... | 04/17/2007 |
| 7202691 | Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers A non-contact method is described for acquiring the accurate charge-voltage data on miniature test sites of semiconductor wafer wherein the test sites are smaller than 100 μm times 100 μm. The method includes recognizing the designated test site, properly aligning... | 04/10/2007 |
| 7199576 | Apparatus for testing processing electronics An apparatus is disclosed for testing the processing electronics of a detector module for an X-ray computer tomograph. To provide a measurement environment which is as noise-free as possible, the processing electronics to be tested are tested when they are DC decoup... | 04/03/2007 |
| 7200825 | Methodology of quantification of transmission probability for minority carrier collection in a semiconductor chip A method for computer aided design of semiconductor chips which minimizes sensitivity to latchup is provided. The method evaluates electron transmission, reflection and absorption at geometric shapes that represent components of the semiconductor. ... | 04/03/2007 |
| 7186280 | Method of inspecting a leakage current characteristic of a dielectric layer and apparatus for performing the method A method of inspecting a leakage current of a dielectric layer on a substrate including a cell array region having a plurality of cell blocks including a patterned structure, the dielectric layer formed on the patterned structure, and a peripheral circuit region inc... | 03/06/2007 |
| 7180314 | Self-calibrating electrical test probe calibratable while connected to an electrical component under test A self-calibrating test probe system that does not require probing head removal and replacement for calibration or may self-calibration is described. Using this system, the test probe and/or the entire system (including a testing instrument) may be calibrated or may... | 02/20/2007 |
| 7181352 | Method of determining current-voltage characteristics of a device A method and system for evaluating the current-voltage characteristics of devices where negative resistance behavior is observed. More particularly the present invention relates to a method and system for evaluating accurately the electrical overstress or ESD perfor... | 02/20/2007 |
| 7171665 | Display and acquisition of data, exchanged by interprocess, for the physical properties of a solar battery When a measuring system for a solar battery is operated and controlled by one execution program, the execution program is roughly divided into a program portion corresponding to measurement of a sunshine time in one day and a program portion corresponding to measure... | 01/30/2007 |
| 7145353 | Double side probing of semiconductor devices A probe head for testing the properties of a semiconducting device (10) under test including a dielectric film (24) supporting at least one semiconducting device (10) under test with a support frame (26) tautly supporting the dielectric f... | 12/05/2006 |
| 7145330 | Scanning magnetic microscope having improved magnetic sensor A scanning magnetic microscope SMM (20) includes a sensor (10) for sensing a magnetic field generated by a specimen (78), the sensor including one of a MTJ, a GMR, or an EHE sensor; translation apparatus (22A–C, 52) for translati... | 12/05/2006 |
| 7137052 | Methods and apparatus for minimizing current surges during integrated circuit testing Structural testing can lead to high and abnormal current surges. Disclosed herein are methods for designing and testing an IC so that current surges therein may be minimized while the IC is being tested. One disclosed way to minimize current surges is by gating out ... | 11/14/2006 |
| 7135704 | VCSEL settling fixture A VCSEL settling fixture provides for a plurality of VCSEL chip packages to be selectively tested within a burn-in or environmental chamber having a remote pendant controller. The settling fixture includes a mounting frame including a plurality of recesses and throu... | 11/14/2006 |
| 7127371 | Customized medical equipment preventative maintenance method and system A technique is provided for determining service intervals for devices, such as medical equipment. Data related to a device is collected and compared to data from a population of like devices. A service interval may be calculated based on the comparison. The data reg... | 10/24/2006 |
| 7116689 | Method for estimating age rate of a laser A method of evaluating a laser comprises providing a current into the laser and measuring a voltage output of an electroabsorptive modulator (EAM) coupled to the laser. A device under test includes a laser, and an electroabsorptive modulator (EAM), wherein sa... | 10/03/2006 |
