Bizarre Patents
Behavior Modification Wristwatch
A wristwatch including a watch band and a watch body having an octagon shaped perimeter and being red in color and having the word STOP thereon to resemble a stop sign.
PatentStorm News
Make the Most of Our Site
See this month's Top Inventors and Most Cited Patents.
Stay on top of the latest innovations by subscribing to an RSS feed.
Registered users: Manage your profile.
| Number | Title | Issue Date |
| 7602198 | Accuracy enhancing mechanism and method for current measuring apparatus An optical interferometer used to measure the current in a conductor, where the gap between the mirror and the quarter wave plate is minimized, and the gap is shielded magnetically. Additionally, at least the modulator is shielded, and preferably the case containing... | 10/13/2009 |
| 7598755 | Probe navigation method and device and defect inspection device A probe navigation method, a navigation device, and a defect inspection device wherein in a charged particle beam system provided with probes for electrical characteristics evaluation, probing can be easily carried out regardless of the equipment user's level of ski... | 10/06/2009 |
| 7548077 | Measuring apparatus and a measuring method for measuring a polarization characteristic of an optical system A measuring apparatus is disclosed which includes an interferometer for measuring a wavefront of light transmitted through a test object by interference between light under test passed through the test object and reference light, and measures a polarization characte... | 06/16/2009 |
| 7532019 | Measuring apparatus and measuring method A measuring apparatus includes an interferometer for measuring a wavefront of light transmitted through a test object by interference between light under test passed through the test object and reference light, and measures a polarization characteristic of the test ... | 05/12/2009 |
| 7395518 | Back end of line clone test vehicle A test vehicle comprises at least one product layer having a east one product circuit pattern on the product layer, and one or more clone layers formed over the product layer (1902). The one or more clone layers include a plurality of structures, which may in... | 07/01/2008 |
| 7385412 | Systems and methods for testing microfeature devices Systems and methods for testing microelectronic imagers and microfeature devices are disclosed herein. In one embodiment, a method includes providing a microfeature workpiece including a substrate having a front side, a backside, and a plurality of microelectronic d... | 06/10/2008 |
| 7372283 | Probe navigation method and device and defect inspection device A probe navigation method, a navigation device, and a defect inspection device wherein in a charged particle beam system provided with probes for electrical characteristics evaluation, probing can be easily carried out regardless of the equipment user's level of ski... | 05/13/2008 |
| 7368925 | Probe station with two platens A probe station for testing a device under test. A first platen supporting an electrical probe. A chuck supporting the device under test. A second platen supporting an optical probe. The first platen and the second platen positioned above the device under test. A pe... | 05/06/2008 |
| 7365369 | Nitride semiconductor device A nitride semiconductor device used chiefly as an LD and an LED element. In order to improve the output and to decrease Vf, the device is given either a three-layer structure in which a nitride semiconductor layer doped with n-type impurities serving as an n-type co... | 04/29/2008 |
| 7355419 | Enhanced signal observability for circuit analysis Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of ... | 04/08/2008 |
| 7348786 | Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication Probe modules, methods of use of probe modules, and methods of preparing probe modules, are disclosed. A representative embodiment of a probe module, among others, includes a redistribution substrate and a probe substrate interfaced with the redistribution substrate... | 03/25/2008 |
| 7339392 | Apparatus measuring substrate leakage current and surface voltage and related method An apparatus and related method for testing a semiconductor device are provided. The apparatus includes a unit depositing charge on an insulating layer formed on a semiconductor substrate, a unit measuring leakage current from the bottom surface of the semiconductor... | 03/04/2008 |
| 7339153 | Photon counting methods and devices with electrical pulse duration and intensity measurement Photon counting electronics and method that allow for counting single photons with sensitivity, linearity, and accuracy. The method for accurately counting photon numbers entering a photon multiplier tube comprising the steps of counting the number of the electrical... | 03/04/2008 |
| 7336062 | Optically measuring electric field intensities An apparatus includes an optical resonator and a passive optical device. The optical resonator has first and second optical reflectors and an optical cavity interposed between the reflectors. The optical resonator includes an electro-optically responsive material. O... | 02/26/2008 |
| 7337088 | Intelligent measurement modular semiconductor parametric test system An intelligent measurement modular semiconductor parametric test system comprises an engine control module. The engine control module is operable to communicate with a user via a user interface, and is further operable to communicate with and to control the state of... | 02/26/2008 |
| 7336885 | Test apparatus, optical coupler and method of manufacturing same A test apparatus including an optical coupler for optically coupling a main frame and a test head is provided. The optical coupler has a plurality of optical fiber cables, a cable storage chain for bundling a stored portion except for a non-stored portion in a part ... | 02/26/2008 |
| 7336066 | Reduced pin count test method and apparatus Testing of an electronic device is carried out by combining power and signal delivery on a single pair of wires. The power delivery is decoupled from the signal delivery, using inductors, so the device power supplied does not interfere with the test signals delivere... | 02/26/2008 |
| 7323888 | System and method for use in functional failure analysis by induced stimulus A scanning/imaging system wherein an external stimulus is used for exciting a device under test (DUT). A stimulus source is included for providing a stationary stimulus with a controllable spot size to a device under test (DUT), the controllable spot size covering a... | 01/29/2008 |
| 7323278 | Method of adding fabrication monitors to integrated circuit chips An integrated circuit, a method and a system for designing and a method fabricating the integrated circuit. The method including: (a) generating a photomask level design of an integrated circuit design of the integrated circuit, the photomask level design comprising... | 01/29/2008 |
| 7319623 | Method for isolating a failure site in a wordline in a memory array According to one exemplary embodiment, a method for isolating a failure site in a leaky wordline in a memory array includes dividing said leaky wordline into an initial leaky wordline portion and an initial non-leaky wordline portion, where the initial leaky wordlin... | 01/15/2008 |
| 7317324 | Semiconductor integrated circuit testing device and method A plurality of resistors is connected to a plurality of output terminals of a semiconductor integrated circuit, respectively, and a predetermined voltage is applied to the plurality of resistors. Also, a predetermined operation pattern signal used to test functions ... | 01/08/2008 |
| 7312784 | Apparatus for displaying drawings A first apparatus for displaying drawings comprises a housing having an aperture, a drawing sheet comprising electro-optic material movable through the aperture between closed and open positions, and a writing device for writing on the sheet as it moved between its ... | 12/25/2007 |
| 7301619 | Evaluating a multi-layered structure for voids A method and apparatus measure properties of two layers of a damascene structure (e.g. a silicon wafer during fabrication), and use the two measurements to identify a location as having voids. The two measurements may be used in any manner, e.g. compared to one anot... | 11/27/2007 |
| 7291508 | Laser probe points A P-type diffusion diode is used as a probe point for an infrared laser probing system. The P-type diffusion diode probe point may be formed on a semiconductor substrate and connected to an integrated circuit thereon. The P-type diffusion diode probe point may resul... | 11/06/2007 |
| 7280208 | Optical characteristic analysis method, sample measuring apparatus and spectroscopic ellipsometer The spectroscopic ellipsometer, by a computer program incorporated therein, applies voltage to a sample placed on a stage, with a power supply device and conducting probe stands, polarizes multi-wavelength light, with a light polarizer, generated by a xenon lamp and... | 10/09/2007 |
| 7280078 | Sensor for detecting high frequency signals A sensor that senses incident RF signals is provided. The sensor is capable of sensing signals in the Gigahertz (GHz) and Terahertz (THz) range. The sensor may utilize one or more cantilevers, an interferometer, or may be formed in a box-type configuration. ... | 10/09/2007 |
| 7277803 | Efficient calculation of a number of transitions and estimation of power dissipation in sequential scan tests Determining the transition counts at various scan elements of a scan chain (for sequential scan tests) by merely examining the bits of an input vector and the expected results of evaluation. In an embodiment, assuming there are N bits of input vector (with the Nth b... | 10/02/2007 |
| 7253645 | Detection of defects in patterned substrates A method of detecting defects in a patterned substrate includes positioning a charged-particle-beam optical column relative to a patterned substrate, the charged-particle-beam optical column having a field of view (FOV) with a substantially uniform resolution over t... | 08/07/2007 |
| 7239127 | Apparatus and method for inspecting electronic circuits The present invention provides an apparatus and a method for used in a board inspection capable of an inspection of defect in a circuit board with high resolution over a wide range. The method is used for manufacturing a sensor probe comprising layers which include ... | 07/03/2007 |
| 7239157 | Optical trigger for PICA technique Optical triggering system and method for synchronizing a test of an integrated circuit chip with its operation. An optical triggering system includes a testing mechanism, such as a PICA testing mechanism, for testing an integrated circuit chip. An optical trigger me... | 07/03/2007 |
| 7240322 | Method of adding fabrication monitors to integrated circuit chips An integrated circuit, a method and a system for designing and a method fabricating the integrated circuit. The method including: (a) generating a photomask level design of an integrated circuit design of the integrated circuit, the photomask level design comprising... | 07/03/2007 |
| 7240264 | Scan test expansion module An external scan test module that is adapted to act as an interface between an automated tester and a device under test. The external scan test module includes a scan pattern memory to hold scan patterns for at least one configuration of the device under test. A fai... | 07/03/2007 |
| 7235988 | Method for generating high-contrast images of semiconductor sites via one-photon optical beam-induced current imaging and confocal reflectance microscopy A method is disclosed that permits the generation of exclusive high-contrast images of semiconductor sites in an integrated circuit sample (19). It utilizes the one-photon optical beam-induced current (1P-OBIC) image and confocal reflectance image of the samp... | 06/26/2007 |
| 7233155 | Electrooptic device, electronic apparatus, and method for making the electrooptic device The invention provides an electrooptic device and an electronic apparatus, in which the electrical characteristics of many thin-film switching elements formed in a substrate to support an electrooptic material can be accurately inspected. The invention also provides... | 06/19/2007 |
| 7221177 | Probe apparatus with optical length-measuring unit and probe testing method A probe apparatus with control-position detection means is provided for testing an electrical characteristic of a to-be-tested object formed on a substrate W. The probe apparatus includes a prober chamber, a susceptor provided in the prober chamber for placing there... | 05/22/2007 |
| 7221813 | Signal acquisition probing and voltage measurement systems using an electro-optical cavity A signal acquisition probing system uses an optical cavity to acquire a signal under test. The probing system has an optical transmitter and receiver that are coupled to the optical cavity via an optical transmission system. The optical cavity has an electrode struc... | 05/22/2007 |
| 7218130 | Bottom side stiffener probe card A probe card for production testing of semiconductor imaging die includes a stiffener supported on a bottom side of the probe card. The top of the stiffener is substantially flush with a top surface of the probe card. A light passage through the stiffener features n... | 05/15/2007 |
| 7215133 | Contactless circuit testing for adaptive wafer processing A system and method for measuring circuits on an integrated circuit substrate includes a measurement circuit formed on the integrated circuit substrate that measures at least one characteristic of an integrated circuit. The measurement circuit has a power transfer d... | 05/08/2007 |
| 7212024 | Inspection apparatus for liquid crystal drive substrates The object of the present invention is to provide an inspection apparatus for liquid crystal drive substrates that improves the inspection accuracy of liquid crystal drive substrates, judges defect type more accurately, and does not cause a decrease in throughput. I... | 05/01/2007 |
| 7206078 | Non-destructive testing system using a laser beam A noninvasive testing system using a method of testing a device under test by providing a beam of light from a light source having a first wavelength, and in a first beam instance imposing the beam of light on a test device when the test device has a first state of ... | 04/17/2007 |
