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| Number | Title | Issue Date |
| 7872481 | Low glitch multiple form C summing node switcher A measurement system with selectable feedback paths includes a DUT interface including a first and a second DUT sensor, the first sensor being connected to a first feedback path for providing a measure of a first DUT characteristic, the second sensor being connected... | 01/18/2011 |
| 7863912 | Circuit board testing system using free space optical communications System including backplane, and first and second circuit boards. First circuit board is attached to backplane and has first optical signal transmitter. Second circuit board is attached to backplane and has first optical signal receiver. First optical signal transmit... | 01/04/2011 |
| 7859274 | System for testing a flat panel display device and method thereof A system for testing a flat panel display having a flat display panel assembly includes a testing stage for arranging the flat display panel assembly, a measuring apparatus being disposed on the testing stage and for measuring a spectrum of a transmitted light passi... | 12/28/2010 |
| 7825673 | Failure analysis method and failure analysis apparatus Failure analysis method includes performing fixed radiation of semiconductor chip (wafer) by photocurrent generation laser beam, scanning and radiating a region to be observed on semiconductor chip by heating laser beam, detecting, by a SQUID fluxmeter, current chan... | 11/02/2010 |
| 7812623 | Transparent conductive film roll and production method thereof, touch panel using the same, and non-contact surface resistance measuring device A transparent conductive film roll which has a transparent conductive layer on at least one surface thereof and has an excellent distribution uniformity of surface resistance in longitudinal and lateral directions thereof wherein the distribution uniformity D of sur... | 10/12/2010 |
| 7812624 | Testing method for LED module A testing method for a LED module and its associated elements includes the steps of: providing a LED module on which a plurality of light-emitting diodes is arranged; providing an integration detector, and mounting it above the LED module; providing an electrically ... | 10/12/2010 |
| 7808257 | Ionization test for electrical verification A method and apparatus for the non-contact electrical test of both opens and shorts in electronic substrates. Top surface electrical test features are exposed to an ionization source under ambient conditions and the subsequent charge build up is measured as a drain ... | 10/05/2010 |
| 7795885 | Optically isolated current monitoring for ionization systems Current is measured in an ionization device that includes a high voltage supply, and an emitter electrically coupled to the HV supply. An opto-isolator is provided that includes a light source and a light detector. The light source has a current flowing through it. ... | 09/14/2010 |
| 7755372 | Method for automated stress testing of flip-chip packages Methods for testing flip-chip packages includes aligning a microscope and a test engine. The package under test is placed between the microscope and the test engine, and an acoustic transducer is attached to the package under test. The test engine delivers an impact... | 07/13/2010 |
| 7746088 | In-line electron beam test system A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension o... | 06/29/2010 |
| 7719295 | Method and apparatus for implementing IC device testing with improved SPQL, reliability and yield performance A method for testing an integrated circuit device includes subjecting the integrated circuit device to an applied magnetic field during the application of one or more test signals, the applied magnetic field inducing magnetostriction effects in one or more materials... | 05/18/2010 |
| 7719294 | Systems configured to perform a non-contact method for determining a property of a specimen Systems configured to perform a non-contact method for determining a property of a specimen are provided. One system configured to perform a non-contact method for determining a property of a specimen includes a focused biasing device configured to provide a stimulu... | 05/18/2010 |
| 7710131 | Non-contact circuit analyzer A non-contact circuit analyzer includes a computer system having a memory with circuit parameters stored therein wherein the circuit parameters specify acceptable operating characteristics for a circuit. The analyzer further includes a magnetic field detector couple... | 05/04/2010 |
| 7688084 | Testing apparatus and method for detecting a contact deficiency of an electrically conductive connection A testing apparatus and a method for detecting a contact deficiency of an electrically conductive connection. The testing apparatus comprises a measuring chamber, in which several system elements of the connection that are connected in an electrically conductive fas... | 03/30/2010 |
| 7583094 | Method for fabricating light-emitting device through inspection A light-emitting device is produced at a decreased cost by inspecting defects in the pixels in the step of fabrication. TFTs possessed by the pixels on the element substrate and TFTs possessed by the peripheral drive circuits are inspected by using the inspection de... | 09/01/2009 |
| 7554346 | Test equipment for automated quality control of thin film solar modules Provided is a method and test system for identifying a defective region of a photovoltaic cell from among a plurality of photovoltaic cells collectively forming a thin film solar module. A probe includes a plurality of test fingers arranged to be substantially simul... | 06/30/2009 |
| 7541818 | Method and apparatus of electromagnetic measurement In order to direct a probe having directivity that a received band is widened in accordance with a measurement distance, toward a DUT, shift the received band of the probe in sequence, receive electromagnetic, and measure electromagnetic interference, a plurality of... | 06/02/2009 |
| 7535238 | In-line electron beam test system A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension o... | 05/19/2009 |
| 7532018 | Inspection method and inspection apparatus There is established an easier inspection method with which it is not required to set up probes on wires. Also, there is provided an inspection apparatus using this inspection method. With the inspection apparatus or inspection method, primary coils of an inspection... | 05/12/2009 |
| 7521946 | Electrical measurements on semiconductors using corona and microwave techniques A corona-microwave system can generate accurate capacitance-voltage (C-V) and resistance-voltage (R-V) curves, thereby allowing the accurate determination of gate film capacitance, sheet resistance of implanted regions, and mobility of a substrate under a gate. The ... | 04/21/2009 |
| 7504838 | Methods of determining characteristics of doped regions on device wafers, and system for accomplishing same Disclosed herein are various methods of determining characteristics of doped regions on device wafers, and a system for accomplishing same. In one illustrative embodiment, the method includes providing a device substrate comprising a plurality of masked areas, a plu... | 03/17/2009 |
| 7501837 | Test structure and method for detecting charge effects during semiconductor processing using a delayed inversion point technique A semiconductor process test structure comprises a gate electrode, a charge-trapping layer, and a diffusion region. The test structure is a capacitor-like structure in which the charge-trapping layer will trap charges during various processing steps. A CV measuremen... | 03/10/2009 |
| 7453273 | Method and apparatus for analyzing current in an integrated circuit under test Method and apparatus for analyzing current in an integrated circuit under test is described. In one example, an image from detected photon emissions from the integrated circuit is generated. A first intensity of the photon emissions at a first region in the image in... | 11/18/2008 |
| 7446542 | Apparatus and method for automated stress testing of flip-chip packages An apparatus for testing flip-chip packages has a programmed computer, a test-engine stage for applying an impact to at least one package under test, and a monitoring stage. The test-engine stage causes an impact on the package on the side opposite its ball-grid arr... | 11/04/2008 |
| 7446543 | Non-contact electrical connections test device A non-contact testing of electrical characteristics of substrates carrying dense electrical connections is non-contact in that an injection or an extraction of electrons in the conductors to be tested, is obtained by an electron tearing effect under the effect of an... | 11/04/2008 |
| 7439730 | Apparatus and method for detecting photon emissions from transistors A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the... | 10/21/2008 |
| 7436190 | Transparent conductive film roll and production method thereof, touch panel using it, and non-contact surface resistance measuring device A transparent conductive film roll which has a transparent conductive layer on at least one surface thereof and has an excellent distribution uniformity of surface resistance in longitudinal and lateral directions thereof wherein the distribution uniformity D of sur... | 10/14/2008 |
| 7425704 | Inspection method and apparatus using an electron beam An inspection method and apparatus irradiates a sample on which a pattern is formed with an electron beam, so that an inspection image and a reference image can be generated on the basis of a secondary electron or a reflected electron emitted by the sample. An abnor... | 09/16/2008 |
| 7425820 | High current measurement with temperature compensation A non-contact device for measuring current in a conductor. The device includes an interferometer with an optical fiber that extends around the conductor and through which light beams pass. The magnetic field around the conductor, caused by the current conducted thro... | 09/16/2008 |
| 7417424 | Magnetic-field-measuring device A device (16) used to measure at least one component of a magnetic field, includes a magnetoresistive sensor (102) and a measuring chain (28). The input of the measuring chain is connected to the magnetoresistive sensor (102), while the o... | 08/26/2008 |
| 7408342 | Device for measuring a component of current based on magnetic fields A magnetic-field-measuring probe includes at least two magnetoresistive sensors which are sensitive to respective magnetic fields along a determined measurement axis. The at least two magnetoresistive sensors are rigidly connected to one another in a position such t... | 08/05/2008 |
| 7405580 | Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration The surface photovoltage dopant concentration measurement of a semiconductor wafer is calibrated by biasing the semiconductor wafer into an avalanche breakdown condition in a surface depletion region; determining a contact potential difference value corresponding to... | 07/29/2008 |
| 7397254 | Methods for imperfect insulating film electrical thickness/capacitance measurement Methods for determining an electrical parameter of an insulating film are provided. One method includes measuring a surface potential of a leaky insulating film without inducing leakage across the insulating film and determining the electrical parameter from the sur... | 07/08/2008 |
| 7372051 | Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system Magnification errors are reduced in the required range of magnification in electric charged particle beam application apparatuses and critical dimension measurement instruments. To achieve this, a first image, whose magnification for the specimen is actually measure... | 05/13/2008 |
| 7372283 | Probe navigation method and device and defect inspection device A probe navigation method, a navigation device, and a defect inspection device wherein in a charged particle beam system provided with probes for electrical characteristics evaluation, probing can be easily carried out regardless of the equipment user's level of ski... | 05/13/2008 |
| 7368925 | Probe station with two platens A probe station for testing a device under test. A first platen supporting an electrical probe. A chuck supporting the device under test. A second platen supporting an optical probe. The first platen and the second platen positioned above the device under test. A pe... | 05/06/2008 |
| 7362889 | Elastomeric actuator devices for magnetic resonance imaging The present invention is directed to devices and systems used in magnetic imaging environments that include an actuator device having an elastomeric dielectric film with at least two electrodes, and a frame attached to the actuator device. The frame can have a plura... | 04/22/2008 |
| 7362088 | Non contact method and apparatus for measurement of sheet resistance of P-N junctions A contactless sheet resistance measurement apparatus and method for measuring the sheet resistance of upper layer of ultra shallow p-n junction is disclosed. The apparatus comprises alternating light source optically coupled with first transparent and conducting ele... | 04/22/2008 |
| 7362106 | Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes A method and apparatus for detecting open defects on non-probed node under test of an electrical device using capacitive lead frame technology is presented. In accordance with the method of the invention, a probed node neighboring the non-probed node under test is s... | 04/22/2008 |
| 7359823 | RFID device variable test systems and methods Systems and methods are disclosed herein to provide variable test techniques for RFID devices. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) test system includes an RFID reader adapted to provide an R... | 04/15/2008 |
