Bizarre Patents
Behavior Modification Wristwatch
A wristwatch including a watch band and a watch body having an octagon shaped perimeter and being red in color and having the word STOP thereon to resemble a stop sign.
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| Number | Title | Issue Date |
| 8134383 | LSI test apparatus, LSI test method, and computer product An LSI test apparatus includes a test circuit synthesizing unit that synthesizes a test circuit and inserts the test circuit in a pre-test-synthesis net list; a test pattern generating unit that, based on a post-test-synthesis net list acquired by the test circuit s... | 03/13/2012 |
| 8072232 | Test apparatus that tests a device under test having a test function for sequentially outputting signals Provided is a test apparatus that tests a device under test having a test function for sequentially outputting, from a single test terminal, signals that would be output from a plurality of terminals, the test apparatus comprising: a test section that supplies the d... | 12/06/2011 |
| 8063626 | Method for the precise measurement of dependency on amplitude and phase of plurality of high frequency signals and device for carrying out said method The present invention refers to a method for the precise measurement of dependency on amplitude and phase of a plurality of high frequency signals, preferably in the synchrotron accelerator of elementary particles. The essence of the solution according to the invent... | 11/22/2011 |
| 7969168 | Integrated circuit with built-in self test circuit An embodiment of the invention provides an integrated circuit. The integrated circuit has an analog device-under-test (DUT), a memory receiving and storing a test program and a processor. The processor tests the analog DUT and outputs a test result in digital format... | 06/28/2011 |
| 7944226 | Test apparatus and transmission apparatus A test apparatus for testing a device under test includes a test signal generating section that generates a test signal to be supplied to the device under test, a main driving section that outputs an output voltage determined in accordance with the test signal, to a... | 05/17/2011 |
| 7888960 | Method of testing a power supply controller and structure therefor In one embodiment, a power supply controller is configured to operate in a test mode that facilitates measuring the value of an output signal of an error amplifier of the power supply controller. ... | 02/15/2011 |
| 7839135 | System for and method of analyzing printed board carrying chassis, printed board carrying chassis structure, program, and recording medium A structure has a printed board carried by a metal chassis. A printed board carrying chassis analyzing system, a printed board carrying chassis analyzing method, a printed board carrying chassis structure, and a printed board carrying chassis analyzing program are p... | 11/23/2010 |
| 7710100 | Motherboard testing apparatus A motherboard testing apparatus for automatically turning on or off a motherboard includes a pulse signal generating circuit for outputting a pulse signal, a first control circuit for outputting a first control signal to an I/O controller on the motherboard accordin... | 05/04/2010 |
| 7423442 | System and method for early qualification of semiconductor devices According to one embodiment of the invention, a method for early qualification of semiconductor device includes performing initial testing on a semiconductor device, receiving fail data on the semiconductor device, determining a solution model for the semiconductor ... | 09/09/2008 |
| 7421365 | Automated circuit board test actuator system An apparatus for automatically inserting connectors and coupling test probes to circuit boards, such as computer system boards and the like. The apparatus enables connectors to be automatically inserted into mating connectors on a circuit board device under test (DU... | 09/02/2008 |
| 7415377 | Relay testing system and method A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relay... | 08/19/2008 |
| 7412344 | System for synchronously controlling the testing of pluralities of devices and the method of the same The present invention discloses a system for synchronously controlling the testing of pluralities of devices, comprising a server, a switch coupled to the server, and a testing instrument coupled to the server. Pluralities of computers are coupled to the server resp... | 08/12/2008 |
| 7408336 | Importation of virtual signals into electronic test equipment to facilitate testing of an electronic component Electronic component validation testing is facilitated by a method, system and program product which allows the importation of virtual signals derived from simulation verification testing of the electronic component design into electronic test equipment employed dur... | 08/05/2008 |
| 7408337 | Compensating for loss in a transmission path An apparatus to compensate for loss in a transmission path includes a circuit block that incorporates time constants into a signal transmitted via the transmission path. The time constants counteract at least part of inherent time constants that contribute to loss i... | 08/05/2008 |
| 7403031 | Measurement apparatus for FET characteristics A measurement apparatus for FET characteristics comprises a divider connected to a pulse generator for dividing pulses from the pulse generator into first and second pulses; a first SMU; a first switch for selecting pulses from the divider or voltage from the first ... | 07/22/2008 |
| 7402992 | Circuit component tester A circuit component tester includes a portable casing and a circuit provided within the casing. A plurality of leads are provided to electrically connect the circuit to a gate and two terminals of a circuit component under test. A test switch provided on the casing ... | 07/22/2008 |
| 7399990 | Wafer-level package having test terminal A wafer-level package includes a semiconductor wafer having at least one semiconductor chip circuit forming region each including a semiconductor chip circuit each provided with test chip terminals and non test chip terminals, at least one external connection termin... | 07/15/2008 |
| 7386086 | Printed circuit card A nuclear reactor plant protection system printed circuit card comprises a first logic device having a number of basic logic circuits, and a second logic device operatively connected with the first logic device for testing the number of basic logic circuits without ... | 06/10/2008 |
| 7382141 | Testing a batch of electrical components The invention relates a method for testing a batch of electrical components like Integrated Circuits, the method involving applying a first test (6) on each electrical component from the batch; and applying a second test (12) on electrical components t... | 06/03/2008 |
| 7378864 | Test apparatus having multiple test sites at one handler and its test method A test apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. Since only the sites on the test board (or test boards) need be duplicated, rather than the loading lanes or sorters of the hand... | 05/27/2008 |
| 7380184 | Sequential scan technique providing enhanced fault coverage in an integrated circuit According to an aspect of the present invention, multiple scan enable signals (controlling corresponding scan chains) are used in an integrated circuit, and the scan chains are placed in evaluation mode in non-overlapping durations between scan-in and scan-out opera... | 05/27/2008 |
| 7372248 | Electronic circuit, system with an electronic circuit and method for testing an electronic circuit An electronic circuit having an input, an output with an input filter for delaying a change of an input signal and a control component for supplying an output signal and evaluating the input signal. The delay is a time constant. An industrial automation system is pr... | 05/13/2008 |
| 7373574 | Semiconductor testing apparatus and method of testing semiconductor A semiconductor testing apparatus, includes a test signal generating unit that generates a test signal corresponding to a test pattern to output the generated test signal to a device under test (DUT); a comparison signal generating unit that generates a comparison s... | 05/13/2008 |
| 7368901 | Sequential control circuit A sequential control circuit operates according to an input signal. When the input signal is determined at a first state, the sequential control circuit asserts a plurality of control signals in a predetermined sequence. When the input signal is determined at a seco... | 05/06/2008 |
| 7368932 | Testing device for printed circuit board A testing device for testing a printed circuit board includes a testing signal converting module for receiving testing signals from the printed circuit board and outputting the testing signals and a plurality of I/O control signals to a plurality of testing circuits... | 05/06/2008 |
| 7365557 | Integrated circuit testing module including data generator Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between an automated testing equipment and an integrated circuit to be tested. The testing interface is configured to test the integrated circui... | 04/29/2008 |
| 7366161 | Full duplex voice path capture buffer with time stamp For diagnostic and trouble-shooting purposes, an audio/voice signal capture mechanism is adapted to be interfaced with a time division multiplexed (TDM) transport path-cascaded echo canceler and compression arrangement for an integrated access device (IAD). The audi... | 04/29/2008 |
| 7362092 | Isolation buffers with controlled equal time delays A system is provided for controlling the delay in an isolation buffer. Multiple such isolation buffers are used to connect a single signal channel to multiple lines and controlled to provide an equal delay. Isolation buffer delay is controlled to be uniform by varyi... | 04/22/2008 |
| 7358714 | Testing method and testing apparatus A testing method of a semiconductor integrated circuit device includes a testing step of conducting a functional test by supplying test pattern data to a semiconductor integrated circuit device mounted upon a testing apparatus, and a post processing step conducted a... | 04/15/2008 |
| 7359822 | Testing device A testing device that tests an electronic device includes a test pattern outputting unit operable to output a test pattern to the electronic device, a deciding unit operable to decide whether an output signal from the electronic device satisfies a predetermined cond... | 04/15/2008 |
| 7358715 | Semiconductor integrated circuit By mounting, on a semiconductor integrated circuit, a clock stability waiting circuit 4 for deciding whether a clock signal generated by a high speed clock generating circuit 2 is stable or not, a scan pass control circuit 7 capable of switching... | 04/15/2008 |
| 7348790 | AC testing of leakage current in integrated circuits using RC time constant Some embodiments of the invention include apparatus and systems having integrated circuits. Terminals or pins of the integrated circuits are configured to be driven to a state, to be floated for a time interval, and to be measured to determine the state of the termi... | 03/25/2008 |
| 7350108 | Test system for integrated circuits A test board includes a plurality of sockets for connection to a plurality of integrated circuit chips to be tested. A test control device on the board turns on at least one test engine for testing the plurality of chips simultaneously. A checking circuit verifies t... | 03/25/2008 |
| 7345500 | Method and system for device characterization with array and decoder A system and method for testing devices. The system includes a plurality of pads and a decoder coupled to a plurality of devices. The decoder is configured to receive a plurality of selection signals from the plurality of pads and select a device from the plurality ... | 03/18/2008 |
| 7342404 | Device for measurement and analysis of electrical signals of an integrated circuit component According to the invention, one or more external test connection contact points (pads; pins; balls), are provided in an integrated circuit component (chip) (1), through which signals (4, 5, 6) that are to be measured or analyzed are selectively fed, e.... | 03/11/2008 |
| 7342523 | Testing apparatus To provide a testing apparatus having a function of testing a D/A converter and so forth with a reduced testing time. The testing apparatus tests a converter having functionality of converting an input signal and outputting the signal thus converted. The testing app... | 03/11/2008 |
| 7343256 | Configurable voltage regulator A configurable semiconductor has a device characteristic that is controllable as a function of at least one external impedance. A measurement circuit measures an electrical characteristic of the at least one external impedance and determines a select value correspon... | 03/11/2008 |
| 7339389 | Semiconductor device incorporating characteristic evaluating circuit operated by high frequency clock signal In a semiconductor device, a main circuit is operated by a first clock signal, and at least one characteristic evaluating circuit is operated by a second clock signal whose frequency is higher than a frequency of the first clock signal. Also, at least one deteriorat... | 03/04/2008 |
| 7337672 | Method for inspecting grinding wheels This invention discloses a method of evaluating the internal structure of a grinding wheel through ultrasonic inspection. ... | 03/04/2008 |
| 7337088 | Intelligent measurement modular semiconductor parametric test system An intelligent measurement modular semiconductor parametric test system comprises an engine control module. The engine control module is operable to communicate with a user via a user interface, and is further operable to communicate with and to control the state of... | 02/26/2008 |
