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| Number | Title | Issue Date |
| 8035404 | Method for influencing soot deposits on sensors A method is described for controlling the soot deposition on sensors. A sensor element is provided, which includes a first electrode and a second electrode. Different measuring voltages U1 and U2 can be applied to the sensor element. During a f... | 10/11/2011 |
| 8004295 | Electrical specific resistivity probing robot An electrical specific resistivity probing robot is directed to automatically measuring a three-dimensional electrical specific resistivity structure of an underground shallow region by installing a plurality of probing electrodes at regular intervals along a robot-... | 08/23/2011 |
| 7948250 | Probe with a changing device The invention concerns a probe with at least two test prods, which are provided on a changing device connected to the probe and which can be alternately connected to an electric waveguide running inside the probe. ... | 05/24/2011 |
| 7671608 | Electrical junction box An electrical junction box is adapted to be set in a conductivity inspection device. The conductivity inspection device includes a sensing pin assembly and guide pins, the guide pins extending beyond the sensing pin assembly. The electrical junction box includes a c... | 03/02/2010 |
| 7504837 | Electrical characteristics measurement method and electrical characteristics measurement device The characteristics of an object are measured using an electrical characteristics measurement device in which a probe includes a signal terminal, a ground terminal, and a variable resistance element is connected via a coaxial cable to a measuring instrument. The cal... | 03/17/2009 |
| 7385382 | Quick reference test light probe with digital voltage meter The present invention relates to a quick reference electrical voltage testing tool utilizing a variable voltage range light bulb and digital read out voltage meter both incorporated in the testing tool's handle. The variable voltage range light bulb indicates to the... | 06/10/2008 |
| 7365280 | Switch and manufacturing method thereof A switch provided with a fixed contact and a movable contact coming into contact with each other and separating from each other. The surface of at least one of the fixed contact and the movable contact is provided with a plurality of recesses whose edges are overlap... | 04/29/2008 |
| 7362110 | Measurement cell for liquids A cell for the measurement of resistivity and/or permittivity of a liquid, under variable ac frequency energizing, preferably includes a first set of n+1 metal plates interleaved with a second set of n places, both sets of plates preferably being of the same size an... | 04/22/2008 |
| 7355415 | Method for on-line monitoring of condition of non-aqueous fluids A method for determining a condition of a highly resistive fluid in transportation and industrial equipment. The method is suitable for determining the condition of a non-aqueous fluid including applying a high-frequency voltage signal between electrodes immersed in... | 04/08/2008 |
| 7323887 | Conductivity sensor and manufacturing method therefor A contacting-type conductivity sensor includes a plurality of electrodes disposed on a distal surface of a substrate. The substrate includes a plurality of vias through which electrical interconnection to the electrodes is accomplished. The conductivity sensor can e... | 01/29/2008 |
| 7321234 | Resistive test probe tips and applications therefor A test probe tip constructed substantially from resistive material. The resistive material is made of resistive conducting material substantially enclosed in and dispersed throughout encapsulating material. The test probe tip has a probing end for probing electronic... | 01/22/2008 |
| 7304394 | Semiconductor device and method for manufacturing same A wiring pattern is provided on an insulating tape. Part of the wiring pattern is a connection section. An insulating resin is provided so that the connection section is coated with the insulating resin. A protrusion electrode of a semiconductor element is so positi... | 12/04/2007 |
| 7295654 | Digital kick meter and graphical user interface (GUI) A digital kick meter measures capacitive kick between two conductors and ground of a cable. The digital kick meter includes a resistance measuring circuit connectable to two of the conductors to provide a signal indicative of a capacitance between the two conductors... | 11/13/2007 |
| 7288941 | Method and apparatus for measuring conductivity of powder materials using eddy currents A method and related apparatus for non-contact measurement of electrical conductivity of powder-like materials using eddy currents includes the steps of placing a powder to be measured in a hollow dielectric sampling container, the sampling container disposed and fr... | 10/30/2007 |
| 7279915 | Test method for electronic modules using movable test contactors A pass through test system for testing an electronic module includes an interface board, and test contactors movably mounted to the interface board for electrically engaging terminal contacts on the module with a zero insertion force on the modules. The interface bo... | 10/09/2007 |
| 7268563 | Measurement of point contact Andreev-reflection characteristics of half-metallic thin films An apparatus for measuring spin polarization via Point Contact Andreev Reflection (PCAR) at a magnet-superconductor junction, with variable magnetic fields and temperature control. A cryostat probe investigates superconducting energy gap and Andreev reflection in su... | 09/11/2007 |
| 7259575 | Method for on-line fuel-dilution monitoring of engine lubricant A method for determining a fuel-dilution condition of a lubricant used in transportation and industrial equipment. The method uses apparatus that applies a high frequency and optionally a low frequency oscillating signal to electrodes immersed in the fluid and quant... | 08/21/2007 |
| 7242020 | Real-time monitoring of particles in semiconductor vacuum environment An apparatus includes semiconductor processing equipment. A particle detecting integrated circuit is positioned in a vacuum environment, the particle detecting integrated circuit containing a device having a pair of conductive lines exposed to the vacuum environment... | 07/10/2007 |
| 7226789 | Method of applying non-linear dynamics to control a gas-phase polyethylene reactor operability The present invention describes a method for determining reactor continuity of a polymerization reactor by non-linear dynamics. Specifically, the invention relates to a method of analyzing system variables to indicate gas phase reactor continuity in real-time and co... | 06/05/2007 |
| 7218125 | Apparatus and method for performing a four-point voltage measurement for an integrated circuit A method and apparatus for determining a voltage, such as a bias voltage, supplied by an integrated circuit. A nominal terminating resistor is connected across a first and a second input/output pads from which the voltage is supplied. The voltage is measured across ... | 05/15/2007 |
| 7212016 | Apparatus and methods for measuring resistance of conductive layers Apparatus and methods for measuring the electrical resistance of conductive materials are disclosed. In one embodiment, an apparatus includes a housing, and first, second, third, and fourth conductive members projecting outwardly from the housing. The conductive mem... | 05/01/2007 |
| 7200348 | Volatile organic compound detector A printer system using inks, toners or developers with solvents therein is provided with a detector for volatile organic compounds assists in reducing potential accidents in the printer. The detector may be able to identify at least a threshold level of volatile org... | 04/03/2007 |
| 7162796 | Method of making an interposer with contact structures A method of making an interposer having an array of contact structures for making temporary electrical contact with the leads of a chip package. The contact structures may make contact with the leads substantially as close as desired to the body of the chip package.... | 01/16/2007 |
| 7161370 | Semiconductor testing device A semiconductor testing device is used for testing a semiconductor device which has at least one spherical connection terminal. The testing device includes an insulating substrate having an opening formed therein at a position corresponding to the position of the sp... | 01/09/2007 |
| 7161250 | Projected contact structures for engaging bumped semiconductor devices and methods of making the same A bumped semiconductor device contact structure is disclosed including at least one non-planar contact pad having a plurality of projections extending therefrom for contacting at least one solder ball of a bumped integrated circuit (IC) device, such as a bumped die ... | 01/09/2007 |
| 7155964 | Method and apparatus for measuring electrical properties in torsional resonance mode The preferred embodiments are directed to a method and apparatus of operating a scanning probe microscope (SPM) including oscillating a probe of the SPM at a torsional resonance of the probe, and generally simultaneously measuring an electrical property, e.g., a cur... | 01/02/2007 |
| 7151383 | Oil condition sensor An oil condition sensor is proposed which can accurately determine the degree to which oil is contaminated with metallic powder. It includes a permanent magnet and a sensor head provided around the permanent magnet. The sensor head includes a cup-shaped electrode an... | 12/19/2006 |
| 7148708 | Probe assembly for minimizing excitation pick-up voltages A probe assembly for use with a battery impedance meter which minimizes excitation pick-up voltages by routing the wires from the meter to the battery cell terminals without forming a loop within a changing magnetic field caused by current drawn from the battery cel... | 12/12/2006 |
| 7129717 | Systems and methods for measuring tear film osmolarity An osmolarity measuring system is configured to receive a contact lens in a measurement chamber. The measurement chamber includes a volume of fluid, and a series of electrodes are configured to measure the electrical properties of the fluid. A processing device corr... | 10/31/2006 |
| 7119556 | Probe for surface-resistivity measurement and method for measuring surface resistivity A probe for surface-resistivity measurement is provided in a surface-resistivity measuring apparatus for measuring a surface resistivity of a target. The probe includes an electrode and a contact portion. The contact portion has a specific resistance larger than the... | 10/10/2006 |
| 7114371 | Integration of atmospheric intrusion sensors in electronic component packages An apparatus for detecting an intrusion of an environmental substance into an environmentally sealed electronic components package. The electronic components package generally includes a plastic coated or plastic enclosed electronic component, that includes a printe... | 10/03/2006 |
| 7112973 | Oil condition sensor An oil condition sensor includes rod-shaped electrodes and an opposed cup-shaped electrode. The rod-shaped electrodes are connected to a first power supply through first fixed resistors having a predetermined threshold. The voltage from the first power supply is app... | 09/26/2006 |
| 7087927 | Semiconductor die with an editing structure Resistance and capacitance are added to a prototype die to fix or identify performance issues with the integrated circuit formed in the die by forming a thin piece of silicon on the top surface of the die. For resistance, vias are formed to regions on the metal trac... | 08/08/2006 |
| 7084639 | Impedance standard substrate and method for calibrating vector network analyzer An impedance standard substrate for calibrating a vector network analyzer includes a first surface and a second surface opposite to the first surface. A thru-circuit has two contacts electrically connected to each other. The two contacts are disposed on the first su... | 08/01/2006 |
| 7071031 | Three-dimensional integrated CMOS-MEMS device and process for making the same A vertically integrated structure includes a micro-electromechanical system (MEMS) and a chip for delivering signals to the MEMS. The structure includes a metal stud connecting a surface of the chip and the MEMS; the MEMS has an anchor portion having a conducting pa... | 07/04/2006 |
| 7045711 | Module for a data carrier with improved bump counterparts In a data carrier (1), or a module (3) for such a data carrier (1), the module (3) has an integrated component (4) with at least two projecting connection contacts (5, 6) and, for each connection contact (5, 6), a con... | 05/16/2006 |
| 7042558 | Eddy-optic sensor for object inspection A sensor enables simultaneous or sequential eddy current and optical reflectance measurements of conducting film by providing an eddy current inspection coil and a first and a second optical fiber extending axially through the coil. The eddy current inspection coil ... | 05/09/2006 |
| 7042207 | Inductive measurement system and method A system and method measures parameters associated with an inductor such as in a switching converter. The inductance value can be determined by monitoring voltages and currents associated with the inductor when a measurement mode is activated. In one example, the me... | 05/09/2006 |
| 7038460 | Electrostatic dust detector An apparatus for detecting dust in a variety of environments which can include radioactive and other hostile environments both in a vacuum and in a pressurized system. The apparatus consists of a grid coupled to a selected bias voltage. The signal generated when dus... | 05/02/2006 |
| 6995575 | Apparatus and methods for measuring resistance of conductive layers Apparatus and methods of measuring the electrical resistance of electrically-conductive materials are disclosed. In one aspect, an apparatus includes a substrate, and first, second, third, and fourth elongated conductive members. Each conductive member includes a fi... | 02/07/2006 |
