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| Number | Title | Issue Date |
| 7960987 | Operation voltage supply method for semiconductor device The voltage application probe and the voltage measurement probe are connected to the voltage application pad and the voltage measurement pad of the semiconductor device. The voltage application pad and the voltage measurement pad are connected by the conductor, meas... | 06/14/2011 |
| 7948227 | Electrical circuit diagnostic tool Diagnosing electrical circuit faults can be accomplished with a variety of tools. Voltmeters are frequently used to measure voltage to determine whether a short is present, but are not well-suited for finding intermittent faults caused by corroded connectors or exce... | 05/24/2011 |
| 7855544 | AC low current probe card A probe system for connecting a measurement apparatus to a DUT includes an AC probe having an AC shield conductor and an AC probe conductor shielded by the AC shield; a first DC probe having a first DC probe conductor and a first guard conductor for guarding the fir... | 12/21/2010 |
| 7764062 | Method and structure for variable pitch microwave probe assembly A coplanar waveguide (CPW) probe includes at least one center probe element, each having a respective center probe contact point and at least one peripheral probe element, each having a respective peripheral contact point. The pitch between the at least one center c... | 07/27/2010 |
| 7755345 | Measuring device with a plunge-in electrode Described is a measuring device, in particular for measuring the pH value in foodstuffs. The measuring device comprises an extended first electrode for plunging into a material to be measured and a sheath which at least partially surrounds the first electrode. The f... | 07/13/2010 |
| 7746051 | Voltmeter with dual displays A voltmeter/phaser includes dual hot-stick probes, each carrying a housing including a digital display, one of the housings also having a measurement circuit for measuring the sensed voltage. A plural-conductor cable interconnects the housings and carries, in two se... | 06/29/2010 |
| 7733078 | Self-test probe design & method for non-contact voltage detectors A non-contact voltage detector having a self-test feature is provided. The non-contact voltage detector may include an antenna, a detection circuit and a self-test circuit. The self-test circuit may be configured to send a test signal through a portion of the antenn... | 06/08/2010 |
| 7615985 | Probe for measuring characteristics of an excitation current of a plasma, and associated plasma reactor A probe for measuring electrical characteristics of an excitation current of a plasma is provided. The probe is mounted on a conductive line that includes an inner conductor and an outer conductor. The probe includes a current sensor and a voltage sensor. The curren... | 11/10/2009 |
| 7609048 | Probe microscope and measuring method using probe microscope Provided is a probe microscope for measuring a surface potential of a sample, including a contact electrification mechanism (circuit (C)) for bringing an electroconductive probe device into contact with a surface of the sample and applying a voltage in the contact s... | 10/27/2009 |
| 7595628 | Probing apparatus for illuminating an electrical device under test A probe for probing an electrical device under test is provided. The probe comprises a selectively positionable door defining a recessed compartment and a light source positioned within the recessed compartment. When the door is in a first position, the compartment ... | 09/29/2009 |
| 7570043 | Switches bidirectionally connecting external lead to PLL voltage tune line An integrated circuit, a phase locked loop, a voltage tune probe and a method of screening an integrated circuit employing a phase locked loop thereof. In one embodiment, the integrated circuit includes: (1) an input/output port configured to provide an external int... | 08/04/2009 |
| 7554318 | Transient reversing voltage detecting circuit A current balancing circuit includes a voltage detecting circuit having a detecting diode, and a control switch having an input part and an output part, the input part is coupled in series to the detecting diode and disposed opposite to the detecting diode for detec... | 06/30/2009 |
| 7550960 | Method and apparatus for measuring voltage in a power switching device A method and apparatus for determining a voltage potential in a power switching device. The method and apparatus uses a conductive shield surrounding a coil positioned around a connector in a power switching device. The coil is used to provide a current measuring de... | 06/23/2009 |
| 7525299 | Apparatus for accessing and probing the connections between a chip package and a printed circuit board A device to access and/or verify connections between a chip package and a printed circuit board (“PCB”), specifically within packages lacking back-side measurement access, includes a housing for insertion between the chip package and PCB. A passageway in the hou... | 04/28/2009 |
| 7492143 | Method and structure for variable pitch microwave probe assembly A coplanar waveguide (CPW) probe includes at least one center probe element, each having a respective center probe contact point and at least one peripheral probe element, each having a respective peripheral contact point. The pitch between the at least one center c... | 02/17/2009 |
| 7436314 | Monitor and circuit arrangement for voltage regulator A circuit arrangement having a voltage regulator, which is designed to generate a regulated operating voltage, and a voltage monitoring unit, which is designed to monitor the regulated operating voltage for deviations from desired values. The voltage monitoring unit... | 10/14/2008 |
| 7432698 | Modular active test probe and removable tip module therefor A modular active test probe and removable tip module therefor. Within the scope of the invention, there is a probe tip module comprising a first probe tip adapted for probing a circuit under test to receive a signal therefrom. The probe tip module includes an amplif... | 10/07/2008 |
| 7385382 | Quick reference test light probe with digital voltage meter The present invention relates to a quick reference electrical voltage testing tool utilizing a variable voltage range light bulb and digital read out voltage meter both incorporated in the testing tool's handle. The variable voltage range light bulb indicates to the... | 06/10/2008 |
| 7372284 | Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket A probe for an array of interconnecting leads between a PCA and an IC has one or more contacts extending laterally from or plated upon one or more arms formed of a flexible printed circuit, and connected by traces along the arm(s) to a header that itself affords con... | 05/13/2008 |
| 7371128 | Cable terminal with air-enhanced contact pins An electrical connector has a body with a number of probes. Each probe has a spring biased pin with a contact tip, and includes a sleeve receiving the pin. Each sleeve has a first end connected to an incoming conductor, a second end connected to the body and from wh... | 05/13/2008 |
| 7364474 | Cable terminal with contact pins including electrical component A cable terminal or connector has several electrical probes. Each probe has a conductive sleeve defining a bore, with a probe pin received in the bore. The probe pin has a free end contact tip extending in a first direction beyond the periphery of a circuit board su... | 04/29/2008 |
| 7365552 | Surface mount package fault detection apparatus A fault detection apparatus for surface mount packages is provided. The apparatus can include a retainer for releasably securing a circuit board such as a printed circuit board having an electrical component mounted thereon via a ball grid array surface mount packag... | 04/29/2008 |
| 7362112 | Signal acquisition probe having a retractable double cushioned probing tip assembly A signal acquisition probe has a double cushioned spring loaded probing tip assembly disposed in a housing. A first compressive element produces a first pre-loaded compressive force and an increasing compressive force on the probing tip assembly and a second compres... | 04/22/2008 |
| 7362111 | Device for evaluating at least one electrical conducting structure of an electronic component An apparatus and method for evaluating the integrity of each contact pin of an electronic component having multiple contact pins. In one embodiment, the apparatus includes a test device and a measuring instrument. The test device comprises a component fixture config... | 04/22/2008 |
| 7358458 | Methods and apparatus for tactile communication in an arc processing system Systems and methods are presented for tactile communication with an operator in an arc processing system, in which a tactile device is mechanically coupled with a handheld torch to provide tactile messages to the operator according to information related to the syst... | 04/15/2008 |
| 7355418 | Configurable prober for TFT LCD array test An improved prober for an electronic devices test system is provided. The prober is “configurable,” meaning that it can be adapted for different device layouts and substrate sizes. The prober generally includes a frame, at least one prober bar having a first end... | 04/08/2008 |
| 7355377 | Telescoping electrical tester A probe-type electrical tester having a lamp, a first pointed electrode connected to the lamp, and a second electrode comprising an alligator clip connected to the lamp. The pointed electrode occupies a sleeve which is telescopingly stored within the tester. ... | 04/08/2008 |
| 7352164 | Device for measuring an electric current The present invention relates to a device 1 for measuring an electric current and is particularly well adapted to electricity counters. This device 1 comprises a primary conductor 2 having a general U-shape, said primary conductor comprising a c... | 04/01/2008 |
| 7351231 | Illumination assembly for a cannula/hub assembly An illumination assembly for use with a cannula/hub assembly that withdraws fluids from and/or injects fluids into a body. In the preferred embodiment, the illumination assembly comprises a housing and a light-emitting element mounted in and/or on the housing, for e... | 04/01/2008 |
| 7348785 | Method and apparatus for magnetically achieving electrical continuity A method and apparatus for achieving electrical conductivity that can, for instance, obviate the need for the use of two hands to make a measurement of electrical properties across two contacts that do not lend themselves to the acceptance of clip-on leads, or acros... | 03/25/2008 |
| 7347697 | Active connector Interconnection assemblies which adjust their alignment and performance through the use of control feedback from the data transferred through the assemblies. ... | 03/25/2008 |
| 7339367 | Interface for detection and control of multiple test probes An interface module. The interface module includes a probe identification module configured for connection to an identification bus, a probe detect module configured for connection to a detect-control bus, a power control module configured for connection to the dete... | 03/04/2008 |
| 7337685 | Adjustable device An adjustable device is disclosed comprising two relatively re-orientatable members each having a lockable universal joint, and a connecting member for connecting the two relatively re-orientatable members whereby when the two relatively re-orientatable members are ... | 03/04/2008 |
| 7335611 | Copper conductor annealing process employing high speed optical annealing with a low temperature-deposited optical absorber layer A method of forming a conductor in a thin film structure on a semiconductor substrate includes forming high aspect ratio openings in a base layer having vertical side walls, depositing a dielectric barrier layer comprising a dielectric compound of a barrier metal on... | 02/26/2008 |
| 7336063 | Voltage detector A voltage detector that more accurately measures AC voltage of a voltage conductor by correcting the voltage detected directly by the detector's contact probe to account for the conductor's size and shape. The housing of the detector has plural non-contact electrode... | 02/26/2008 |
| 7332923 | Test probe for high-frequency measurement A test probe for executing high-frequency measurements comprises: a coaxial high-frequency wave guide containing an inner conductor and an outer conductor for delivering a primary electrical potential and a secondary electrical potential, respectively, a supporting ... | 02/19/2008 |
| 7323892 | Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making same In one embodiment, a probe for probing test points on a target board includes a printed circuit board, a frame, and a plurality of spring pins. The printed circuit board (PCB) has a first side with a plurality of solder pads thereon, and a plurality of signal routes... | 01/29/2008 |
| 7323401 | Semiconductor substrate process using a low temperature deposited carbon-containing hard mask A method of processing a thin film structure on a semiconductor substrate using an optically writable mask includes placing the substrate in a reactor chamber, the substrate having on its surface a target layer to be etched in accordance with a predetermined pattern... | 01/29/2008 |
| 7320734 | Plasma immersion ion implantation system including a plasma source having low dissociation and low minimum plasma voltage A system for processing a workpiece includes a plasma immersion ion implantation reactor with an enclosure having a side wall and a ceiling and defining a chamber, and a workpiece support pedestal within the chamber having a workpiece support surface facing the ceil... | 01/22/2008 |
| 7319315 | Voltage verification unit A voltage verification unit and method for determining the absence of potentially dangerous potentials within a power supply enclosure without Mode 2 work is disclosed. With this device and method, a qualified worker, following a relatively simple protocol th... | 01/15/2008 |
