Bizarre Patents
Dining Table Having Integral Dishwasher
A space-saving dishwasher, which may be installed within a counter top or table, having a dish-carrying rack that is vertically shiftable through the open top of the dishwasher for facilitating loading and unloading of the dishes.
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| Number | Title | Issue Date |
| 8174276 | Coaxial four-point probe for low resistance measurements Various exemplary embodiments provide probes, systems and methods for measuring an effective electrical resistance/resistivity with high sensitivity. In one embodiment, the measuring system can include an upper probe set and a similar lower probe set having a sample... | 05/08/2012 |
| 8111079 | Conductivity measuring apparatus and conductivity measuring method A conductivity measuring apparatus includes a probe base having a pair of electrodes disposed on respective opposite surfaces of a portion of the probe base. Observing and grasping probes are supported by the probe base in a cantilever state and are arranged adjance... | 02/07/2012 |
| 7944222 | Eliminating inline positional errors for four-point resistance measurement Calculating resistance correction factors includes contacting the arms of a four-arm probe with a test sample; selecting a first set of first and second arms and a second set of third and fourth arms; applying a first current from the first arm to the second arm of ... | 05/17/2011 |
| 7863911 | Test device and method for measurement of tunneling magnetoresistance properties of a manufacturable wafer by the current-in-plane-tunneling technique A combined manufacturable wafer and test device for measuring a tunneling-magnetoresistance property of a tunneling-magnetoresistance, sensor-layer structure. The combined manufacturable wafer and test device comprises a tunneling-magnetoresistance, sensor-layer str... | 01/04/2011 |
| 7852093 | Eliminating inline positional errors for four-point resistance measurement Calculating resistance correction factors includes contacting the arms of a four-arm probe with a test sample; selecting a first set of first and second arms and a second set of third and fourth arms; applying a first current from the first arm to the second arm of ... | 12/14/2010 |
| 7786739 | Identification of board connections for differential receivers Embodiments of the invention include testing arrangements for detecting proper DC-coupled board connections on the input legs of a differential receiver. The testing implementation includes a first test receiver AC-coupled to the connection between the first input/o... | 08/31/2010 |
| 7714596 | System and methods of measuring semiconductor sheet resistivity and junction leakage current Sheet resistance, junction leakage and contact conductivity of a semiconductor layer, associated with an ultra-shallow junction layer or metal film are measured by contacting the surface with a plurality of probes. The probes can be used, in conjunction with a four-... | 05/11/2010 |
| 7710130 | Volume resistivity measurement apparatus for dielectric layer of electrostatic chuck and measurement method using the apparatus A pair of conductive rubber electrodes including measurement surfaces opposite to a surface of a dielectric layer of an electrostatic chuck as an objective of measurement, in which the measurement surfaces are arranged at an interval individually on the same plane, ... | 05/04/2010 |
| 7675299 | Method and apparatus for making a determination relating to resistance of probes According to some embodiments, a method of determining a resistance of probes on a contactor device is disclosed. The contactor device can include a plurality of probes disposed to contact an electronic device to be tested. The method can include electrically connec... | 03/09/2010 |
| 7659732 | Four-wire ohmmeter connector and ohmmeter using same A four-wire ohmmeter connector includes a pair of elongated members spaced apart from each other by an interconnecting web. A pair of elongated contacts are mounted on forwardly projecting portions of each of the elongated members. An insulative housing surrounds th... | 02/09/2010 |
| 7498824 | Method and apparatus for making a determination relating to resistance of probes According to some embodiments, a method of determining a resistance of probes on a contactor device is disclosed. The contactor device can include a plurality of probes disposed to contact an electronic device to be tested. The method can include electrically connec... | 03/03/2009 |
| 7459920 | Method of and apparatus for non-destructively measuring moisture content of dried objects Methods and apparatuses for obtaining electrical characteristics and moisture content of dried objects having different shapes and sizes through impedance and electrostatic capacity measurements are provided. Measuring the moisture content of dried objects comprises... | 12/02/2008 |
| 7443177 | Characterization of conductor by alternating current potential-drop method with a four-point probe A method of determining material parameters associated with a conductor using four points includes injecting and extracting alternating current into the plate using current-carrying wires operatively connected to two of the four points, measuring potential drop betw... | 10/28/2008 |
| 7423438 | Method and apparatus for measuring body fat by using bioelectrical impedance Provided are a method and apparatus for measuring body fat using current electrodes and voltage electrodes. The method includes continually detecting a voltage drop across the voltage electrodes by smoothly raising a contact pressure applied to the electrodes; deter... | 09/09/2008 |
| 7385382 | Quick reference test light probe with digital voltage meter The present invention relates to a quick reference electrical voltage testing tool utilizing a variable voltage range light bulb and digital read out voltage meter both incorporated in the testing tool's handle. The variable voltage range light bulb indicates to the... | 06/10/2008 |
| 7365482 | Field emission display including electron emission source formed in multi-layer structure A field emission display includes first and second substrates provided opposing one another with a predetermined gap therebetween; electron emission sources provided on one of the first and second substrates; an electron emission inducing assembly for inducing the e... | 04/29/2008 |
| 7357018 | Method for performing a measurement inside a specimen using an insertable nanoscale FET probe A measurement inside a specimen is performed by providing a nanoscale FET probe comprising a cantilever element and a nanowire extending from the cantilever element. The nanowire is electrically connected to the cantilever element at at least one of the ends of the ... | 04/15/2008 |
| 7358717 | Input by-pass circuit for a current probe An input by-pass circuit for a current probe has first and second switches coupled between current probe inputs and current sensing circuit inputs. A switch control is coupled to the switching circuit for selectively coupling and decoupling the current probe inputs ... | 04/15/2008 |
| 7335518 | Method for manufacturing semiconductor device In a manufacturing method for a semiconductor device, a main body wafer is formed, and a monitor wafer on which a monitor element is formed is provided. Characteristics of the main body wafer are copied onto the monitor element by simultaneously processing the main ... | 02/26/2008 |
| 7332923 | Test probe for high-frequency measurement A test probe for executing high-frequency measurements comprises: a coaxial high-frequency wave guide containing an inner conductor and an outer conductor for delivering a primary electrical potential and a secondary electrical potential, respectively, a supporting ... | 02/19/2008 |
| 7317321 | Methods and systems for automated pipeline testing A method for testing effectiveness of a cathodic protection device configured to apply at least one voltage across an underground structure and a reference point is described. The method includes providing a sample of the material from which the underground structur... | 01/08/2008 |
| 7317320 | Method and apparatus for measuring body fat by using bioelectrical impedance A method and apparatus for measuring body fat using bioelectrical impedance, that reduces measurement errors and improves repeatability by compensating for variation of a contact voltage caused by variation of an electrode contact area. The method includes: detectin... | 01/08/2008 |
| 7309991 | Scanning probe inspection apparatus A pair of pads is formed on an insulating layer formed on a top surface of a substrate, and a plurality of through-holes is laid out at equal intervals between the pads. Adjoining through holes are connected alternately by upper-layer wire interconnect lines exposed... | 12/18/2007 |
| 7271606 | Spring-based probe pin that allows kelvin testing The voltage at a node of an integrated circuit can be measured or controlled using a two-wire kelvin contact with spring-based probe pins by offsetting and tapering the lower end section of the spring-based probe pin. As a result, multiple spring-based probe pins ca... | 09/18/2007 |
| 7271574 | Evanescent microwave probe with enhanced resolution and sensitivity Novel systems of an evanescent microwave probe (EWP) are disclosed, which enable measurements of physical properties of a sample with enhanced sensitivity and resolution, simultaneously. In one embodiment, new shielding features are added to the probe (which may be ... | 09/18/2007 |
| 7269770 | AC coupled line testing using boundary scan test methodology An AC boundary scan cell is disclosed. For one embodiment the AC boundary scan cell includes a first multiplexer, a second multiplexer, a first data shift register, a second data register, an XOR logic gate, and a third multiplexer. For one such embodiment the AC bo... | 09/11/2007 |
| 7268571 | Method for validating and monitoring automatic test equipment contactor A method and apparatus is provided for characterizing a contactor for automated semiconductor device testing, the method first comprising placing the contactor on a contactor test board positioned within an automated test apparatus. A first probe of the automated te... | 09/11/2007 |
| 7250602 | Probe device A probe device comprises a cantilever comprising a probe allocated to be opposed to a surface of a sample, means for feeding back a vibration amplitude value of the cantilever, thereby self-exciting and vibrating the cantilever at a predetermined frequency, means fo... | 07/31/2007 |
| 7235978 | Device for measuring impedance of electronic component A device measures an impedance of an electronic component with using an impedance measuring apparatus. The impedance measuring device includes first and second probes to be connected to measuring terminals of the impedance measuring apparatus, an anisotropic conduct... | 06/26/2007 |
| 7230432 | Nanotube sensor A sensor having a nanotube grown on and supported by thermal bimorph structures. The nanotube rests on a heat sink during sensing gas or a liquid and is moved from the heat sink when the nanotube is heated to desorb gas or liquid from it. The heatsink may function a... | 06/12/2007 |
| 7220550 | Molecular wire injection sensors Disclosed is a sensor for sensing the presence of an analyte component without relying on redox mediators. This sensor includes (a) a plurality of conductive polymer strands each having at least a first end and a second end and each aligned in a substantially common... | 05/22/2007 |
| 7218125 | Apparatus and method for performing a four-point voltage measurement for an integrated circuit A method and apparatus for determining a voltage, such as a bias voltage, supplied by an integrated circuit. A nominal terminating resistor is connected across a first and a second input/output pads from which the voltage is supplied. The voltage is measured across ... | 05/15/2007 |
| 7215130 | Testing and display of electrical system impedance An automated method is provided for testing an electrical circuit using a system tester. Load leads and sense leads of the tester are connectable to any two points of an electrical circuit, such as in a vehicle system, for displaying in real time the impedance betwe... | 05/08/2007 |
| 7212016 | Apparatus and methods for measuring resistance of conductive layers Apparatus and methods for measuring the electrical resistance of conductive materials are disclosed. In one embodiment, an apparatus includes a housing, and first, second, third, and fourth conductive members projecting outwardly from the housing. The conductive mem... | 05/01/2007 |
| 7205773 | Method for calibrating a pulsed measurement system A method for calibrating a pulsed measurement system, the system having a pulse generator unit, a measurement unit and a probe unit having a first and a second probe tip. The first tip, the pulse generator unit and the measurement unit are all interconnected by resp... | 04/17/2007 |
| 7185545 | Instrumentation and method for monitoring change in electric potential to detect crack growth Instrumentation for monitoring crack growth using a change in electric potential across a starter crack as the crack propagates is disclosed. The instrumentation includes a specimen of a material to be analyzed for crack growth propagation having a surface with a st... | 03/06/2007 |
| 7160654 | Method of the adjustable matching map system in lithography A method is provided for improving layer to layer overlay of a second layer pattern on a first layer pattern formed in a substrate. A plurality of first reference marks is placed inside a pattern area on a first layer mask which is used to form the first layer patte... | 01/09/2007 |
| 7158048 | Identically programmed intelligent electrodes for use in geoelectrical surveys Apparatus for conducting geophysical surveys comprising a multiplicity of intelligent electrodes provided on a multi-conductor cable, for receiving a command signal in response to which predetermined electrodes are connected to selected conductors in the cable. Each... | 01/02/2007 |
| 7157920 | Non-destructive monitoring of material integrity A component which is known to have particular degradation characteristics is instrumented to provide an electrical potential across a section in which a degradation is likely to occur. The potential drop across the component is then monitored to determine when, and ... | 01/02/2007 |
| 7154276 | Method and apparatus for measuring a parameter of a vehicle electrical system An apparatus for measuring electrical parameters for an electrical system measures a first and second parameters of the electrical system between connections to the electrical system. A processor determines a third electrical parameter of the electrical system as a ... | 12/26/2006 |
