U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Icon_funbox Bizarre Patents

Patent No. 6718554

Hands free towel carrying system

A hands free towel carrying system for coupling a towel to a user to prevent loss, theft or contamination.

Newsletter  PatentStorm News

Make the Most of Our Site

See this month's Top Inventors and Most Cited Patents.

Stay on top of the latest innovations by subscribing to an RSS feed.

Registered users: Manage your profile.

 

Class 324/71.5 - Semiconductors for nonelectrical property


Subclass of Class 324 - Electricity: measuring and testing
Definition: Subject matter including semiconductive means for sensing
No. of patents: 208
Last issue date: 03/06/2012


1            
NumberTitleIssue Date
8129978Material detector
To realize a small size and high detection accuracy in a substance detection apparatus. A charge detection field effect transistor and a control circuit therefor are provided in each cell, and the control circuit controls the charge detection field effect transistor...
03/06/2012
7598722Method and apparatus for sensing temperature
Method and system for periodically measuring the junction temperature of a semiconductor device. The junction exited by at least two sequential predetermined currents of different magnitudes. The voltage response of the junction to the at least two currents is measu...
10/06/2009
7538538Method of using a four terminal hybrid silicon/organic field effect sensor device
A four terminal field effect device comprises a silicon field effect device with a silicon N-type semiconductor channel and an N+ source and drain region. An insulator is deposited over the N-type semiconductor channel. An organic semiconductor material is deposited...
05/26/2009
7353723Use of an electrified pin to detect load transfer to a secondary nut in a screw actuator
The invention relates to an actuator for actuating a moving member, said actuator essentially comprising a screw and at least two nuts engaged on the screw, relative movement between the screw and the nuts generating said actuation, said actuator further comprising ...
04/08/2008
7342506Wireless remote monitoring system
A remote monitoring system is described which enables monitoring of flow meters or other scientific instruments from a remote location using the GSM cellular phone network. The system includes a wireless modem utilizing the GSM cellular phone network, a central proc...
03/11/2008
7341374Temperature measurement circuit calibrated through shifting a conversion reference level
A temperature measurement circuit has a current excitation circuit, a temperature calculation circuit, a calibration factor generator, and an analog-to-digital conversion circuit. The current excitation circuit supplies in sequence at least two currents to a thermal...
03/11/2008
7323140Moving microdroplets in a microfluidic device
The present invention relates to a system and method for moving samples, such as fluid, within a microfluidic system using a plurality of gas actuators for applying pressure at different locations within the microfluidic. The system includes a substrate which forms ...
01/29/2008
7270786Methods and systems for processing microfluidic samples of particle containing fluids
The present invention relates to a microfluidic system for processing a cell-containing liquid. The system includes a microfabricated substrate having an enrichment channel to prepare an enriched cell sample from the cell-containing liquid. A flow through member is ...
09/18/2007
7269993Gas detecting apparatus, gas detecting method and fuel cell vehicle
The gas detecting system of the present invention is equipped with a catalytic combustion type gas sensor 1a and a semiconductor type gas sensor 1b, in a gas detecting system 1 having an operating sate in which generation of electr...
09/18/2007
7255476On chip temperature measuring and monitoring circuit and method
A device temperature measurement circuit, an integrated circuit (IC) including a device temperature measurement circuit, a method of characterizing device temperature and a method of monitoring temperature. The circuit includes a constant current source and a clampi...
08/14/2007
7255784Polishing method and electropolishing apparatus
A polishing method for electropolishing a metal film formed on a wafer surface so as to fill concave portions formed on the wafer surface comprises a step of determining an electropolishing end point of the metal film on the basis of a change of a current waveform r...
08/14/2007
7242204Substrate aligning system
The present invention provides a substrate aligning system which prevents particles or the like from attaching to a substrate such as a wafer used in the semiconductor manufacturing process, and adjusts the orientation of the substrate accurately within a short peri...
07/10/2007
7220550Molecular wire injection sensors
Disclosed is a sensor for sensing the presence of an analyte component without relying on redox mediators. This sensor includes (a) a plurality of conductive polymer strands each having at least a first end and a second end and each aligned in a substantially common...
05/22/2007
7217354Method and apparatus for detection of chemical vapors
The present invention is a gas detector and method for using the gas detector for detecting and identifying volatile organic and/or volatile inorganic substances present in unknown vapors in an environment. The gas detector comprises a sensing means and a detecting ...
05/15/2007
7208759Semiconductor integrated circuit device and method of testing the same
Functional circuits such as a processor, an SRAM, a DRAM and a flash-EEPROM are mounted on a semiconductor chip. Of these functional circuits, for example, the flash-EEPROM which fluctuates a potential of the semiconductor chip is separated from the other circuits b...
04/24/2007
7200498System for remediating cross contamination in semiconductor manufacturing processes
The present invention defines a system (100) for detecting copper contamination within a semiconductor manufacturing process. According to the present invention, a semiconductor wafer (102) is transferred (108) from a semiconductor manufacturing...
04/03/2007
7195541Endpoint detection system for wafer polishing
An wafer polishing pad assembly for use in CMP includes an optical sensor for sensing reflectivity of the wafer during polishing, and produces a corresponding signal, and transmits the signal from the rotating pad to a stationary portion of the assembly. The signal ...
03/27/2007
7192557Methods and systems for releasing intracellular material from cells within microfluidic samples of fluids
The present invention relates to a microfluidic system for processing a cell-containing liquid. The system includes a lysing zone to receive the cell-containing sample and a positioning element to position the cell-containing sample in a lysing position in the vicin...
03/20/2007
7186576Stacked die module and techniques for forming a stacked die module
Embodiments of the present technique relate to forming die stacks. Specifically, embodiments of the present technique include a method of forming and testing semiconductor die comprising forming a die stack of at least two semiconductor die without attaching either ...
03/06/2007
7170275Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor
Method and system for periodically measuring the junction temperature of a semiconductor device. The junction is excited by at least two sequential predetermined currents of different magnitudes. The voltage response of the junction to the at least two currents is m...
01/30/2007
7171252Methods, computer program products, and devices for calibrating chronically tissue implanted sensors using chronically tissue
Calibration of in vivo oxygen and pH sensor systems can be performed by generating a constituent element of an environment proximate to an in vivo sensor electrode via an in vivo generating electrode and determining a level of the constituent element in the tissue v...
01/30/2007
7160368System and method for gettering gas-phase contaminants within a sealed enclosure
A getter and method for making is provided for removing unwanted impurities from the main body of a sealed hermetic enclosure or package containing one or more devices or objects that have sensitivity to contact with the impurity. The getter may be formulated from g...
01/09/2007
7158284Apparatus and methods of using second harmonic generation as a non-invasive optical probe for interface properties in layered structures
A method for non-invasively probing at least one interface property in a layered structure having at least one interface. In one embodiment, the method includes the steps of exposing the layered structure to an incident photon beam at an incident angle to produce a ...
01/02/2007
7140767Programmable ideality factor compensation in temperature sensors
A temperature sensor circuit and system providing accurate readings using a temperature diode whose ideality factor may fall within a determined range. In one set of embodiments a change in diode junction voltage (ΔVBE) proportional to the temperature of...
11/28/2006
7139671Semiconductor device fabrication method
A semiconductor device fabrication method comprises; a first step S1 of fabricating a plurality of semiconductor chips on a plurality of semiconductor wafers, respectively; a second step S4 of making a probe test on the plural semiconductor chips respe...
11/21/2006
7118274Method and reference circuit for bias current switching for implementing an integrated temperature sensor
A method and a reference circuit for bias current switching are provided for implementing an integrated temperature sensor. A first bias current is generated and constantly applied to a thermal sensing diode. A second bias current is provided to the thermal sensing ...
10/10/2006
7112509Method of producing a high resistivity SIMOX silicon substrate
The present invention provides a method for generating silicon-on-insulator (SOI) wafers that exhibit a high electrical resistivity. In one embodiment of a method according to the teachings of the invention, a SIMOX process is sandwiched between two Full Oxygen Prec...
09/26/2006
7091725Fast, high-resolution, indirect measurement of a physical value
A measurement method or system for measuring a physical value comprises, during a same clock cycle, forming an input signal, a reference signal and an offset signal, the input signal including a parasitic value and a useful measurement value. A relationship between ...
08/15/2006
7084641Measuring cell and measuring field comprising measuring cells of this type, use of a measuring and use of a measuring field
A measuring cell for recording an electrical potential of an analyte situated on the measuring cell. The measuring cell has a sensor, a layer arranged above the sensor and electrically insulating the analyte from the sensor, and an amplifier circuit connected to the...
08/01/2006
7078919In situ determination of resistivity, mobility and dopant concentration profiles
The present invention provides techniques for an in-situ measurement of resistivity profiles and dopant concentration distributions in semiconductor structures, such as shallow junctions. A substrate with a resistor test structure having a conduction circuit may be ...
07/18/2006
7077004Method and device for measuring humidity
A method and a device for measuring humidity may be suitable for determining the relative humidity in the high-humidity range. The device includes a sensor device, as well as a circuit connected to the same. The sensor device includes a capacitive humidity-sensor el...
07/18/2006
7075284Time limit function utilization
A time limit function utilization apparatus includes a first function block, a second function block, a signal line which connects the first and second function blocks and allows using a desired function that is generated by accessing the first and second function b...
07/11/2006
7074109Chemical mechanical polishing control system and method
A system, method, and computer program product for chemical mechanical polishing a substrate in which initially a plurality of predetermined pressures are applied to a plurality of regions of the substrate. A plurality of portions of the substrate are monitored duri...
07/11/2006
7070476In-situ metalization monitoring using eddy current measurements during the process for removing the film
A method for measuring conductance of a sample using an eddy current probe with a sensing coil. The method includes N repetitions of measuring first and second voltage pairs including in-phase and quadrature components of an induced AC voltage in the sensing coil, c...
07/04/2006
7067343ISFETs fabrication method
Methods for fabricating ion sensitive field effect transistors (ISFETs) with SnO2 extended gates. A SnO2 detection film is formed on a substrate by sol-gel technology to serve as an extended gate. The SnO2 detection film is electrica...
06/27/2006
7052366Endpoint detection system for wafer polishing
An wafer polishing pad assembly for use in CMP includes an optical sensor for sensing reflectivity of the wafer during polishing, and produces a corresponding signal, and transmits the signal from the rotating pad to a stationary portion of the assembly. The signal ...
05/30/2006
7011814Systems, methods and devices for in vivo monitoring of a localized response via a radiolabeled analyte in a subject
Methods, systems, devices and computer program products monitor in vivo detected radiation in a target localized site within a subject, over a selected time period, to do one or more of: (a) quantify a radiation dose received at a local site; (b) assess bioreceptive...
03/14/2006
7010440Method and a measuring circuit for determining temperature from a PN junction temperature sensor, and a temperature sensing circuit comprising the measuring circuit and a PN junction
A switched current temperature sensing circuit (1) comprises a measuring transistor (Q1) which is located remotely of a measuring circuit (5) which applies three excitation currents (I1,I2,I3) of different values...
03/07/2006
7010340Methods, systems, and associated implantable devices for dynamic monitoring of physiological and biological properties of tumors
Methods of monitoring and evaluating the status of a tumor undergoing treatment includes monitoring in vivo at least one physiological parameter associated with a tumor in a subject undergoing treatment, transmitting data from an in situ located sensor to a receiver...
03/07/2006
6979544Molecular wire injection sensors
Disclosed is a sensor for sensing the presence of an analyte component without relying on redox mediators. This sensor includes (a) a plurality of conductive polymer strands each having at least a first end and a second end and each aligned in a substantially common...
12/27/2005
1            
 
Sign InRegister
Username  
Password   
forgot password?