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| Number | Title | Issue Date |
| 8049522 | Ice thickness probe, ice thickness probe assembly and ice thickness monitoring apparatus An ice thickness probe includes a longitudinally-extending probe rod, an insulator casing and a sleeve. The probe rod is fabricated from an electrically-conductive material. The insulator casing is fabricated from an electrically-insulative material and is wrapped a... | 11/01/2011 |
| 7982473 | Position detector A method for diagnosing a position detector used in determining the position of a control means. The position detector includes a resistance track, and a first terminal in connection with its first end, and a second terminal in connection with second end of the resi... | 07/19/2011 |
| 7876109 | Sensor for detecting the position of a movable magnetic object and a conveying device having the sensor The sensor according to the invention for detecting the position of a movable magnetic object includes a resistance track and a contact electrode arranged thereon. Moreover the sensor includes a magnetic position transmitter, which is developed in such a way that it... | 01/25/2011 |
| 7852092 | Systems for inspection of shrouds A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The at least one resistive element is embedded within a thermal barrier coating layer deposited on a base portion of the shroud and ... | 12/14/2010 |
| 7825671 | Method and system for determining the thickness of a layer of lacquer The invention relates to electrophoretic immersion lacquering of objects, e.g. the bodies of automotive vehicles, wherein the object which is to be lacquered is immersed into lacquer immersion basin containing a lacquer fluid. An electric field is produced by the ob... | 11/02/2010 |
| 7688083 | Analogue measurement of alignment between layers of a semiconductor device A method of obtaining parametric test data for use in monitoring alignment between layers of a semiconductor device. The method employs a test structure comprising a meander (10, 30) of the material of a first layer of the semiconductor device, deposited rela... | 03/30/2010 |
| 7511516 | Methods and systems for monitoring the displacement of turbine blades A system for monitoring the displacement of turbine blades that includes a turbine blade with a cutting tooth and one or more sensor wires, each sensor wire including a severable portion, that become severed by the cutting tooth as turbine blade displacement occurs.... | 03/31/2009 |
| 7348890 | Pest control techniques A pest control system (20) includes pest control devices (110) installed about an area or building (22). These devices (110) each include a bait member and a communication circuit. The communication circuit may be in the form of a passive... | 03/25/2008 |
| 7343227 | Current sensing temperature control circuit and methods for maintaining operating temperatures within information handling systems An information handling system including a system fan control for maintaining operating temperatures of electronics within the information handling system is disclosed. The information handling system can include a power trace provided in association with a power ci... | 03/11/2008 |
| 7335395 | Methods of using pre-formed nanotubes to make carbon nanotube films, layers, fabrics, ribbons, elements and articles Methods of Using Preformed Nanotubes to Make Carbon Nanotube Films, Layers, Fabrics, Ribbons, Elements and Articles are disclosed. To make various articles, certain embodiments provide a substrate. Preformed nanotubes are applied to a surface of the substrate to cre... | 02/26/2008 |
| 7322229 | Device and method for measuring the profile of a surface The invention provides a surface profile measurement device for use on rigid or semi-rigid substrates, such as floors. The device includes (a) a beam; (b) at least one beam support mounted on the beam; (c) a sensor assembly slidably connected to said beam and adapte... | 01/29/2008 |
| 7288785 | Substrate and method for measuring the electro-physiological properties of cell membranes The present invention relates to a substantially planar substrate for use in patch clamp analysis of the electrophysiological properties of a cell membrane comprising a glycocalyx, wherein the substrate comprises an aperture having a rim, the rim being adapted to fo... | 10/30/2007 |
| 7282374 | Method and apparatus for comparing device and non-device structures The present invention provides a method and apparatus for comparing device and non-device structures. The method includes determining at least one characteristic parameter associated with at least one non-device structure on at least one workpiece and determining at... | 10/16/2007 |
| 7197974 | Position sensor A position sensor includes a stationary frame supporting a rotatable spool onto which a cable is wound in a plurality of individual windings. A distal end of the cable extends through a lead guide for attachment to an object whose position is desired to be sensed. A... | 04/03/2007 |
| 7193805 | Flying-type disk drive slider with micropad A slider (2′) with a reduced fly height is disclosed. The slider includes a small micropad (66) on the lower surface (22′) of the slider (2′). A sensor region (62) of a head (61) that is carried by the slider (2... | 03/20/2007 |
| 7176505 | Electromechanical three-trace junction devices Three trace electromechanical circuits and methods of using same. A circuit includes first and second electrically conductive elements with a nanotube ribbon (or other electromechanical elements) disposed therebetween. An insulative layer is disposed on one of the f... | 02/13/2007 |
| 7164276 | Method for determining the wall thickness of a metal tube A method for determining the wall thickness of a metal tube is described. This method has the following features: (a) preparation of a metal tube of a determined length; (b) arrangement of two clamp contacts on the metal tube with an exactly defined distance of sepa... | 01/16/2007 |
| 7157927 | Test pattern for testing resistance of pattern of semiconductor substrate A test pattern includes a test wiring pattern on a lower surface of a substrate. First, second, third and fourth upper patterns are formed on an upper surface of the substrate. First, second, third and fourth electrodes are formed respectively on the first, second, ... | 01/02/2007 |
| 7120047 | Device selection circuitry constructed with nanotube technology A memory system having electromechanical memory cells and decoders is disclosed. A decoder circuit selects at least one of the memory cells of an array of such cells. Each cell in the array is a crossbar junction at least one element of which is a nanotube or a nano... | 10/10/2006 |
| 7107203 | High speed software driven emulator comprised of a plurality of emulation processors with improved board-to-board interconnection cable length identification system A system and method for determining which of several possible cable lengths has been used by reversing the end-to-end correspondence of at least two conductors in the cable. A different two conductors are selected to identify respective different cable lengths. Each... | 09/12/2006 |
| 7095359 | Method of observing sea ice An ice thickness/drifting velocity observation of sea ice by using an ice thickness measurement sonar and a current meter moored into the sea and a sea ice observation by a high-resolution airborne SAR are synchronously performed, a correlation between a draft profi... | 08/22/2006 |
| 7052215 | Cutting tool with sensor and production method therefor A cutting tool with a sensor according to the present invention includes an electrically conductive substrate, an insulation film provided on a surface of the electrically conductive substrate, and a sensor circuit of an electrically conductive film provided on the ... | 05/30/2006 |
| 7041946 | Energization cycle counter for induction heating tool An induction heat treating process with a remote sensor for monitoring the duration of energization of an induction heating coil each time the induction heating coil is consecutively cycled. An identifying tag is preferably attached to, embedded within the induction... | 05/09/2006 |
| 7038472 | Methods and systems for measuring internal dimensions of microscale structures The present invention provides novel devices for measuring internal dimensions of microscale structures. Methods in accordance with the invention use the voltage measured at a midpoint between a reference structure and a sample structure to determine the resistance ... | 05/02/2006 |
| 7023217 | Method and apparatus for determining wear of resistive and conductive elements According to one embodiment, the present invention provides a system for determining wear of an electrical element. The system includes a current source, a voltmeter and a control unit. The control unit is operable to couple the current source and the voltmeter to a... | 04/04/2006 |
| 7019538 | Electrostatic capacitance sensor type measurement apparatus A measurement apparatus which measures a distance between a sensor probe and a target to be measured by using an electrostatic capacitance sensor, comprises first and second sensor probes (101, 102) which are arranged at respective predetermined gaps to the t... | 03/28/2006 |
| 7018165 | Method of minimizing the gap between a rotating turbine blade and a casing of a turbine, a turbine, and a method of determining the wear behavior of a wheel of a rotor Method of minimizing the gap between a wheel and a casing of a turbine, a turbine, and a method of determining the wear behavior of a wheel of a rotor. To minimize the gap between a wheel and a casing in a turbine, optical methods are also often used in order to min... | 03/28/2006 |
| 7010959 | Device and method for measuring mechanical path lengths by means of pneumatic pressure, in particular for sliding carbon contacts In a device and a method for measuring path lengths, particularly of brushes in sliding contacts, an air stream having a regularly fluctuating pressure is provided by a pump and conducted via an air supply line and a nozzle to an object to be measured. The object is... | 03/14/2006 |
| 7002360 | System and method for measuring the thickness or temperature of a circuit in a printed circuit board System for measuring a thickness of a circuit component on a printed circuit board (PCB). The system includes a first circuit, a power plane, a power strip, a calibration strip, a temperature sensor, and a second circuit. The power plane is coupled to the first circ... | 02/21/2006 |
| 6979590 | Methods of making electromechanical three-trace junction devices Methods of producing an electromechanical circuit element are described. A lower structure having lower support structures and a lower electrically conductive element is provided. A nanotube ribbon (or other electromechanically responsive element) is formed on an up... | 12/27/2005 |
| 6972576 | Electrical critical dimension measurement and defect detection for reticle fabrication A system for testing a reticle used in semiconductor wafer fabrication is provided. The system includes a reticle that has an opaque metal layer over a translucent substrate. The reticle includes one or more test features containing probe points operable for electri... | 12/06/2005 |
| 6965098 | Energization cycle counter for induction heating tool An induction heat treating process with a sensor for monitoring the duration of energization of an induction heating coil each time the induction heating coil is consecutively cycled. The sensor is preferably a counting mechanism attached to or embedded within the i... | 11/15/2005 |
| 6960922 | Apparatus for monitoring a sliding contact element in an electrical rotating machine An apparatus for monitoring a sliding contact element in an electrical rotating machine, in particular a generator, includes a holder for the sliding contact element and a sensor for detection of a state variable of the sliding contact element. An evaluation unit is... | 11/01/2005 |
| 6954062 | Apparatus for determining gaps between a proximity probe and a conductive target material A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a ... | 10/11/2005 |
| 6922070 | Evaluating pattern for measuring an erosion of a semiconductor wafer polished by a chemical mechanical polishing An evaluating pattern includes a conductive pattern formed on a substrate, an insulating layer which is formed on the conductive pattern, a plurality of contact holes formed in a rectangular area through the insulating layer, and a conductive material filled into th... | 07/26/2005 |
| 6919731 | Method for measuring a position of a conductive target material A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a ... | 07/19/2005 |
| 6919592 | Electromechanical memory array using nanotube ribbons and method for making same Electromechanical circuits, such as memory cells, and methods for making same are disclosed. The circuits include a structure having electrically conductive traces and supports extending from a surface of the substrate, and nanotube ribbons suspended by the supports... | 07/19/2005 |
| 6917896 | Method and apparatus for using eddy current transducers in magnetic fields A method for measuring the distance of a gap separating an eddy current transducer and a target is provided. The method includes determining a normalized impedance curve for the transducer, determining a time rate of change of the normalized impedance of the transdu... | 07/12/2005 |
| 6911682 | Electromechanical three-trace junction devices Three trace electromechanical circuits and methods of using same are described. A circuit includes first and second electrically conductive elements with a nanotube ribbon (or other electromechanical elements) disposed therebetween. The nanotube ribbon is movable to... | 06/28/2005 |
| 6861852 | Method for measuring a gap between a proximity probe and a conductive target material A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a ... | 03/01/2005 |
