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Class 324/637 - Using transmitted or reflected microwaves


Subclass of Class 324 - Electricity: measuring and testing
Definition: Subject matter wherein distributive type parameters associated
No. of patents: 379
Last issue date: 05/29/2012


1                    
NumberTitleIssue Date
8188752Yield improvement for Josephson junction test device formation
An apparatus for measuring component performance including a feed line having an input port and an output port, a first resonator connected to the feed line, a first Josephson junction device connected to the first resonator and to ground, and a second resonator con...
05/29/2012
8138770Methods and systems for the rapid detection of concealed objects
The present invention provides for an improved scanning process having microwave arrays comprised of microwave transmitters in radiographic alignment with microwave receivers. The microwave array emits controllably directed microwave radiation toward an object under...
03/20/2012
8138769Method and device for measuring the thickness of a layer of material
Described herein is a method for measuring, via a microwave sensor, the thickness of a layer of first material, said method envisaging: acquiring at least one frequency response of the layer of first material via a microwave sensor; setting the microwave sensor on a...
03/20/2012
8120369Dielectric characterization of bituminous froth
A method of determining a permittivity of a substance may include providing a probe having a planar end surface, providing a signal source and a signal receiver coupled to the probe, and physically contacting the substance with the planar end surface of the probe de...
02/21/2012
8093911Time-of-flight measurement based on transfer function and simulated exponential stimulus
Systems and methods are described for transmitting a waveform having a controllable attenuation and propagation velocity. An exemplary method comprises: generating an exponential waveform, the exponential waveform (a) being characterized by the equation Vin
01/10/2012
8035400High-resolution, nondestructive imaging of dielectric materials
The enhanced detection of defects and features in bulk dielectric materials is disclosed. Microwave radiation partly reflected at interfaces where the dielectric constant changes (e.g., where there are defects or structures). A sinusoidal or quasi-sinusoidal wave re...
10/11/2011
8022713Method for measuring antenna characteristics out operational frequency range of chamber
There is provided to a method for measuring antenna characteristics operating in an out-of-operational frequency range of a chamber, in the chamber having a predetermined operational frequency range, including the steps of: a) measuring reflected wave characteristic...
09/20/2011
7936173Method for direct measurement of the mixed-mode scattering matrix with a vectorial network analyzer
In a method for the excitation of port groups of a multi-port device under test with coherent incident waves of the same frequency, which provide defined amplitude ratios and phase differences within each port group, the waves are generated respectively by one signa...
05/03/2011
7911212Filter rod measuring station as well as method for measuring the mass of a softener, the moisture and/or the dry filter material in a filter rod
A filter rod measuring station is equipped with measuring devices which measure at least the mass (M) of a filter rod and the draw resistance (PD) of the filter rod, and a microwave measuring device is provided for measuring the mass of the softener and/or the moist...
03/22/2011
7902836Calibration device and calibration method for adjusting a directional-coupler measuring system
A calibration device for adjusting the forward power and reflected power measured via a single measuring directional coupler which is connected to a high-frequency transmitter, the forward power that is attenuated with ak+x and decoupled being used as a r...
03/08/2011
7852091Microwave determination of location and speed of an object inside a pipe
Apparatus and method are described for measuring the location and speed of an object, such as instrumentation on a movable platform, disposed within a pipe, using continuous-wave, amplitude-modulated microwave radiation. ...
12/14/2010
7825667Microwave imaging system and processes, and associated software products
A microwave imaging process, and a system controlled by an associated software product, illuminate a target with microwaves from a transmitting antenna. Receiving antennas receive microwaves scattered by the target, and form microwave data. The illumination and rece...
11/02/2010
7825668Spectroscopic method
A method related to a process for treating pharmaceutical contents in a pharmaceutical processing vessel is provided. The contents have a number of predefined parameters of variable values. According to the method electromagnetic radiation of various frequencies is ...
11/02/2010
7816926High frequency circuit analyser
An analyzer for measuring the response of an electronic device (DUT 206) to an RF input signal from a signal generator (240a) is described. An active load pull circuit (201) is connected to the DUT 206, which receives an output sig...
10/19/2010
7812616Systems and methods for detecting variations in composite structures
A system and method to detect changes in composite structures using RF signal pattern data interpretation. An RF signal is transmitted from a composite material manufactured structure and a plurality of sensors are employed to measure the RF signal. The measured RF ...
10/12/2010
7808253Test method of microstructure body and micromachine
It is an object to provide a test method of a process, an electric characteristic, and a mechanical characteristic of a structure body in a micromachine without contact. A structure body including a first conductive layer, a second conductive layer provided in paral...
10/05/2010
7791355Near field free space anisotropic materials characterization
An automated computer controlled electrical materials characterization system in which a material sample is subjected to focused near field polarization controlled microwave electrical energy radiation. Response of the material sample to either of reflected or trans...
09/07/2010
7782067Method and apparatus for inspecting an object using terahertz electromagnetic wave
An inspection apparatus including a transmission line for propagating an electromagnetic wave; an electromagnetic wave supply unit for supplying a terahertz wave to the transmission line; an electromagnetic wave detection unit for detecting the terahertz wave from t...
08/24/2010
7782066Sensor, method for sensing, measuring device, method for measuring, filter component, method for adapting a transfer behavior of a filter component, actuator system and method for controlling an actuator using a sensor
A sensor for sensing a measurand is described, the sensor comprising a coplanar waveguide with a first surface and a second surface opposite to the first surface; a first structure with a first periodically varying dielectric characteristic, the first structure bein...
08/24/2010
7777499High-resolution, nondestructive imaging of dielectric materials
The enhanced detection of defects in the bulk dielectric material (Specimen) having radiation partly reflected at interfaces where the dielectric constant changes (e.g., where there are defects or structures). A sinusoidal or quasisinusoidal wave (Microwave Source) ...
08/17/2010
7710124Method and apparatus for detecting panel conditions
A method and apparatus for detecting a predetermined condition of a panel by transmitting a cyclically-repeating energy wave through the material (41) of the panel from first location (43a) to a second location (43b); measuring the...
05/04/2010
7688078System and method for counting number of layers of multilayer object by means of electromagnetic wave
A system or method for counting the number of layers of a multilayer object is adapted for counting the number of layers by means of a simple arrangement of emitting an electromagnetic wave to strike the object that is in a multilayer state. In the system or method,...
03/30/2010
7679374Microwave sensing for determination of loading of filters
Method for determining loading of a filter. The filter has a first dielectric constant. The filter becomes loaded with contaminant material that has a second dielectric constant. The filter, such as a diesel particulate filter, is contained within a metallic enclosu...
03/16/2010
7656167Electric field generator incorporating a slow-wave structure
An improved E-field generator including a slow-wave transmission line structure is provided herein. In some cases, the improved E-field generator may include an inductively-loaded slow-wave transmission line structure driven by a power source at one end of the struc...
02/02/2010
7583091Printed circuit board, and backplane data transmission method
In a receiving-side printed circuit board, a reflected-waveform analyzing unit analyzes a reflected wave generated in a transmission line on a backplane along with transmission of a signal from a transmitting-side printed circuit board, and acquires waveform data th...
09/01/2009
7579845Methods and systems for the rapid detection of concealed objects
The present invention provides for an improved scanning process having microwave arrays comprised of microwave transmitters in radiographic alignment with microwave receivers. The microwave array emits controllably directed microwave radiation toward an object under...
08/25/2009
7570063Space-time microwave imaging for cancer detection
Microwave imaging via space-time beamforming is carried out by transmitting microwave signals from multiple antenna locations into an individual to be examined and receiving the backscattered microwave signals at multiple antenna locations to provide received signal...
08/04/2009
7557588Method and apparatus for inspecting an object using terahertz electromagnetic wave
An inspection apparatus including a transmission line for propagating an electromagnetic wave; an electromagnetic wave supply unit for supplying a terahertz wave to the transmission line; an electromagnetic wave detection unit for detecting the terahertz wave from t...
07/07/2009
7538561Method for detecting an interface between first and second strata of materials
Methods of detecting an interface between materials having different dielectric loss factors using an apparatus having a transmission line including an inner conductor surrounded by dielectric and a shielding conductor are disclosed. Sublengths of inner conductor ar...
05/26/2009
7535236Method of measuring thickness of thin film using microwave
The present invention relates to a thickness measurement method for thin films using microwaves. In the method, the Q-factors of a dielectric resonator are measured. The effective surface resistance (RSeff) of a superconductor or a conductor fi...
05/19/2009
7528613Apparatus and method for steering RF scans provided by an aircraft radar antenna
A radar system is disclosed. The radar system comprises an antenna mounting apparatus coupled to the aircraft, and an antenna rotatably coupled to the mounting apparatus. The antenna is configured to rotationally orientate for an azimuth scan and electronically orie...
05/05/2009
7521938Modeling and calibrating a three-port time-domain reflectometry system
A three-port TDR front end includes numerous components. An exemplary three-port TDR front-end is a DSL modem. Information-bearing TDR signals are distorted as they pass through these components. With a perfect model of the response of its front-end, a TDR system us...
04/21/2009
7501833Evanescent microwave microscopy probe and methodology
The present invention generally relates to an evanescent microwave spectroscopy probe and methods for making and using the same. Some embodiments relate to a probe in electrical communication with sapphire tuning capacitors that are arranged in parallel. Some embodi...
03/10/2009
7439749Non-destructive testing of physical characteristics of composite structures
A method for detecting an anomaly in a composite material comprising directing two transmitted electromagnetic wave signals orthogonally polarized with respect to each other from a probe to the composite material, wherein the probe and composite material are positio...
10/21/2008
RE40488Orientation measuring instrument
It is possible to generate a resonance mode such that a dielectric resonator (20) can be resonated and an electric field vector leaking out from the resonator (20) exists by arranging antennas (22a and 22b) for the resonator (20). ...
09/09/2008
7417440Methods and systems for the rapid detection of concealed objects
The present invention provides for an improved scanning process having microwave arrays comprised of microwave transmitters in radiographic alignment with microwave receivers. The microwave array emits controllably directed microwave radiation toward an object under...
08/26/2008
7378855Bi-directional three-Dimensional microwave scanning and volumetric mapping of a whole roll or pallet of paper
Bi-directional (longitudinal and angular) three-dimensional volumetric microwave scanning of a whole roll or pallet of paper (FIGS. 3, 4), including three-dimensional volumetric mapping of internal properties and characteristics (moisture content, density, ma...
05/27/2008
7379016Carrier phase detection system for radar sensors
A pulse detection system for expanded time radar, laser and TDR sensors detects specific cycles within bursts of cycles. A sensor transmits and receives short bursts of RF cycles. A transmit pulse detector triggers on a selected cycle of the detected transmit burst ...
05/27/2008
7374006Method and device for determining the roadway condition
A method and a device for determining the condition of roadway surfaces includes transmitting electromagnetic radiation at at least two different frequencies in the GHz range, reflecting and/or scattering the electromagnetic radiation by the roadway surface and subs...
05/20/2008
7367226Interface detection apparatus and method for detecting hidden interface using microwave
An interface detection apparatus detects a position of a hidden interface between first and second materials, the first material having a different physical property from the second material. The apparatus encompasses (a) an irradiation mechanism configured to irrad...
05/06/2008
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