Did You Know...
...that Thomas Edison's patent application on his phonograph was approved by the Patent Office in just seven weeks? In contrast, it took Gordon Gould, the inventor of the laser, 30 years to obtain his patent -- finally awarded in 1988!
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| Number | Title | Issue Date |
| 8111074 | Method and apparatus to measure differential phase and frequency modulation distortions for audio equipment A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dyna... | 02/07/2012 |
| 7579844 | Rotor blade system for rotor and rotor case inspection The present invention relates to a system used for inspecting the position of a compressor rotor within a compressor rotor case. A compressor rotor blade is moved about the rotor blade path of the compressor rotor case, a probe holder attached to the rotor blade has... | 08/25/2009 |
| 7550977 | Method and apparatus to measure differential phase and frequency modulation distortions for audio equipment A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dyna... | 06/23/2009 |
| 7466141 | Phase measurement device, method, program, and recording medium A phase measurement device measures an output of an amplifier when an input signal having input frequency components is fed to the amplifier, and includes multipliers for orthogonally transforming the output of the amplifier a phase acquisition section for acquiring... | 12/16/2008 |
| 7339365 | Phase detector and method of phase detection In order to provide a phase detector and a method of phase detection which are distinguished by greater sensitivity and simple implementability, at least one differential signal of two input signals (Ua; Ub) may be formed over at least one pred... | 03/04/2008 |
| 7323883 | Phase measurement device, method, program, and recording medium When a signal having two or more frequency components is fed to a circuit to be measured, a phase of the signal output from the circuit to be measured is measured. A phase measurement device measures an output when an input signal having two input frequency componen... | 01/29/2008 |
| 7313492 | Method and device for increasing the dynamic range and measuring accuracy of a measuring device for spectrum and/or network analysis A method and a device for increasing the dynamic range and measuring accuracy of a measuring device for spectrum and/or network analysis images a high-frequency electronic signal within a frequency range into at least two spectra through a first frequency translatio... | 12/25/2007 |
| 7295938 | Clock jitter calculation device, clock jitter calculation method, and clock jitter calculation program In a voltage drop analysis step S101, the process calculates a temporal variation of a power source voltage supplied to each cell along a transmission path of a clock signal. In a delay variation rate ratio calculation step S102, the process calculates... | 11/13/2007 |
| 7274236 | Variable delay line with multiple hierarchy Disclosed herein are improved, simplified designs for a hierarchical delay line (HDL). The HDL is useful in providing precise phase control between an input clock signal and an output clock signal, and has particular utility as the variable delay in a delay-locked l... | 09/25/2007 |
| 7268530 | Method to measure the mutual phase relationship of a set of spectral components generated by a signal generator A novel method is described that enables the measurement of the phase of the spectral components generated by an harmonic phase reference generator without using a calibrated sampling oscilloscope. First one uses a vector network analyzer to measure the output refle... | 09/11/2007 |
| 7257756 | Digital frequency synthesis clocked circuits Embodiments of the invention may include a reference input port to receive a reference clock, the reference clock being based on a bypass clock, a feedback input port to receive a feedback clock from a clocked circuit, and logic to compare the reference clock and th... | 08/14/2007 |
| 7253640 | Arc fault detector and method for locating an arc fault A circuit breaker for locating an arc fault for a protected circuit includes separable contacts interrupting the protected circuit and an arc fault detector determining an arc fault in the protected circuit. An analog to digital converter circuit measures a value of... | 08/07/2007 |
| 7251765 | Semiconductor integrated circuit and method for testing a semiconductor integrated circuit A semiconductor integrated circuit includes a first delay circuit generating a first delay clock; a second delay circuit generating a second delay clock; a first register registering a value of a first delay of the first delay clock; a second register registering a ... | 07/31/2007 |
| 7248981 | Jitter measurement device and jitter measurement method An orthogonal signal generating unit converts a signal to be measured into two orthogonal signals which are two signals whose phases are orthogonal to one another. An instantaneous phase calculating unit calculates an instantaneous phase based on the two orthogonal ... | 07/24/2007 |
| 7184470 | Method and apparatus for measurement of jitter A method and circuit for measurement of jitter in which a reference clock (404) runs at a frequency offset to the incoming signal (I) so that the phase of the two clocks drift over time, enabling detection of jitter in the input signal by measurement of the d... | 02/27/2007 |
| 7161358 | Impedance analyzer An impedance analyzer includes a reference signal, a first converter a first coupler, a second converter, a second coupler, a modification circuit, a reference signal detector, and a reflected signal detector. The first coupler couples the reference signal to the fi... | 01/09/2007 |
| 7145813 | Semiconductor device with circuit for detecting abnormal waveform of signal and preventing the signal from being transmitted A semiconductor device includes a first detection circuit, a second detection circuit, a determination circuit and a pulse generation circuit. The first detection circuit detects the leading edge of the pulse waveform of an input signal. The second detection circuit... | 12/05/2006 |
| 7124043 | Spectrum analyzer with phase noise compensation A spectrum analyzer with a compensation circuitry for prevention of measurement accuracy deterioration due to local oscillators phase noise. ... | 10/17/2006 |
| 7116092 | Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics Spectrum analyzer circuits and methods are provided which implement “zero-IF” (direct conversion) or “near-zero IF” (or very low IF) architectures that enable implementation of integrated (on-chip) spectrum analyzers for measuring the frequency spectrum of i... | 10/03/2006 |
| 7088109 | Method and apparatus for measuring a digital device A method and apparatus for characterizing a non-linear device stimulates the device with a repetitive digital signal and uses relative phase measurements made with a vector network analyzer to measure the device response to the digital stimulus. ... | 08/08/2006 |
| 7035743 | Phase noise compensation for phase noise measurements A system and method compensate for phase noise of a spectrum analyzer when measuring the phase noise of an applied signal based on an established model of the phase noise that accommodates a variety of operating states of the spectrum analyzer. Each operating state ... | 04/25/2006 |
| 7035324 | Phase-noise measurement with compensation for phase noise contributed by spectrum analyzer A method and apparatus compensates for phase noise added by a spectrum analyzer from phase noise measurements of a signal under test (SUT) taken by the spectrum analyzer. The method comprises the steps of measuring the phase noise of the SUT, determining the added p... | 04/25/2006 |
| 7002358 | Method and apparatus for measuring jitter A method of measuring jitter includes generating a jitter pulse having a width corresponding to an amount of jitter. The jitter pulse is provided to a plurality (M) of latches serially coupled to successively trim the pulse as it propagates through the serially coup... | 02/21/2006 |
| 6990417 | Jitter estimating apparatus and estimating method There is provided a jitter estimating apparatus for calculating phase noise waveform of an input signal and for estimating a peak value, a peak-to-peak value and a worst value of jitter of the input signal, and probability to generate jitter based on the phase noise... | 01/24/2006 |
| 6980915 | Phase noise compensation for spectral measurements A system and method compensate for phase noise of a spectrum analyzer based on an established model of the phase noise that accommodates a variety of operating states of the spectrum analyzer. The model is used to form an array that is applied to extract an output s... | 12/27/2005 |
| 6975951 | Meter apparatus and method for phase angle compensation employing linear interpolation of digital signals A method compensates for phase differences between sampled values of first and second AC waveforms. The method employs a phase angle compensation factor and sequentially samples a plurality of values of each of the waveforms. For a positive compensation factor, seco... | 12/13/2005 |
| 6956422 | Generation and measurement of timing delays by digital phase error compensation A circuit and method for generating a delayed event following a trigger pulse occurring at a random time between clock pulses is disclosed. The circuit includes a clock circuit, a voltage converter, an analog-to-digital converter circuit, a memory storage circuit, a... | 10/18/2005 |
| 6917204 | Addition of power at selected harmonics of plasma processor drive frequency A method for controlling the non-uniformities of plasma-processed semiconductor wafers by supplying the plasma with two electrical signals: a primary electrical signal that is used to excite the plasma, and a supplemental electrical signal. The supplemental signal m... | 07/12/2005 |
| 6911812 | Method and apparatus for measuring frequency pulling in oscillators A test apparatus and method of measuring pulling of the frequency of an oscillator. The apparatus includes a bias tee, a power supply, a spectrum analyzer, a second power supply, a symmetrical resistive power splitter, a power meter and a synthesized signal generato... | 06/28/2005 |
| 6807497 | Laser measurement system with digital delay compensation A method and system for determining and compensating for phase and time errors in an optical receiver. The method and system includes use of a measurement and reference signal; deriving phase and time errors; and providing compensation values to the optical receiver... | 10/19/2004 |
| 6696828 | Integrated circuit and lot selection system therefor An integrated circuit for testing a PLL circuit that includes a phase error generator to receive a signal gained by dividing an oscillated signal from a voltage controlled oscillator and a reference signal so as to detect a phase error signal between the ... | 02/24/2004 |
| 6621277 | Phase noise measurement module and method for a spectrum analyzer A phase noise measurement module (PNMM), system and method for measuring phase noise improve accuracy of phase noise measurements of a signal under test (SUT) using a spectrum analyzer. The PNMM includes an RF to hF frequency converter and a selectable fr... | 09/16/2003 |
| 6564658 | Electromagnetic method of liquid level monitoring A method and apparatus for monitoring one or more parameters of a variable physical structure, such as liquid level, is disclosed. The method and apparatus includes an electrodynamic element placed in proximity to a monitored structure and exciting within... | 05/20/2003 |
| 6545487 | System and method for producing an amplified signal with reduced distortion A distortion reduction system uses upstream signal information from carrier frequencies in a signal to be amplified, to determine at least one frequency for the distortion generated by an amplifier amplifying the signal. A sample of an output is taken, an... | 04/08/2003 |
| 6535785 | System and method for monitoring and controlling gas plasma processes A system and method for monitoring the conditions in a gas plasma processing system while varying or modulating the RF power supplied to the system, so that resulting signals of the electrical circuits of the system provide information regarding operation... | 03/18/2003 |
| 6496783 | Electric power calculation system A voltage (V1) and a current (A1), input from input terminals (T1) and (T2), are A/D converted to 1-bit output data by delta modulators and 1-bit output data of the delta modulator is delayed, using a phase-shifting circuit implemented by either a RAM (se... | 12/17/2002 |
| 6460001 | Apparatus for and method of measuring a peak jitter An input clock signal is transformed into a complex analytic signal zc (t) by an analytic signal transforming means 13 and an instantaneous phase of its real part xc (t) is estimated using the analytic signal zc (t). A lin... | 10/01/2002 |
| 6459278 | Method for characterizing delay of frequency translation devices Absolute delay of a FTD is characterized by applying a stimulus signal to a first port of the FTD. A second port of the FTD is coupled to a delay element having a known delay and a reflective termination. A drive signal is applied to a third port of the F... | 10/01/2002 |
| 6362631 | Method for characterizing delay of frequency translation devices Absolute delay of a FTD is characterized by applying a stimulus signal to a first port of the FTD. A second port of the FTD is coupled to a delay element having a known delay and a reflective termination. A drive signal is applied to a third port of the F... | 03/26/2002 |
| 6351683 | System and method for monitoring and controlling gas plasma processes A system and method for monitoring the conditions in a gas plasma processing system while varying or modulating the RF power supplied to the system, so that resulting signals of the electrical circuits of the system provide information regarding operation... | 02/26/2002 |
