Did You Know...
...that the video game, Pong, was invented by a guy who graduated at the bottom of his engineering class? Nolan Bushnell spent more time running the games at a local amusement park than he did on his studies at the University of Utah. His dreams of working for Disney's amusement empire were dashed when the company wouldn't hire him. Taking a boring job, Nolan daydreamed about electronic versions of popular games. He invented Pong, the first video game, and went on to found Atari Co.
PatentStorm News
Make the Most of Our Site
See this month's Top Inventors and Most Cited Patents.
Stay on top of the latest innovations by subscribing to an RSS feed.
Registered users: Manage your profile.
| Number | Title | Issue Date |
| 7808252 | Measurement apparatus and measurement method Provided is a test apparatus for testing the jitter tolerance of a device under test which receives a data signal and a strobe signal indicating the timing at which the data signal should be received, and acquires the data signal at the timing indicated by the strob... | 10/05/2010 |
| 7355413 | Testing method/arrangement measuring electromagnetic interference of noise in a to-be-tested printed circuit board A testing method for measuring electromagnetic interference of a noise on a to-be-tested printed circuit board, has the steps of: a) injecting a signal simulating an expected noise of a predetermined device mounted on the to-be-tested printed circuit board, into the... | 04/08/2008 |
| 7304469 | Adaptive method used to overcome channel to channel isolation Selectable attenuators are used in the reference and test paths of a VNA, with attenuation automatically inserted or deleted when the Device Under Test (DUT) attenuation reaches predetermined thresholds. Attenuation in the reference channel is removed when the signa... | 12/04/2007 |
| 7304482 | Characterization of the nonlinearities of a display device by adaptive bisection with continuous user refinement A method for measuring and characterizing the nonlinearities of a display device by adaptive bisection using human perception for measurement. This method makes no assumptions about a display device's characteristics and can characterize any type of display device w... | 12/04/2007 |
| 7285962 | Method and apparatus for evaluating susceptibility to common mode noise in a computer system A system for injecting noise signals onto power generated by a power source comprising: a voltage source; a device under test having a power input in operable communication with the noise introduction apparatus; and a noise introduction apparatus interposed between ... | 10/23/2007 |
| 7283013 | Contactless IC card system In a contactless IC card system, a modulating circuit manufactured in an IC form is operable at a high power efficiency. The demodulating apparatus is configured to include: first signal output means for outputting a first output signal having a predetermined phase ... | 10/16/2007 |
| 7221167 | Signal distortion measurement and assessment system and method The invention relates to an arrangement for measuring and assessing properties of a system (28) which transfers an electrical, mechanical or acoustical signal or converts an excitation signal x into another signal y. An error system (30) models the tra... | 05/22/2007 |
| 7176695 | Method and apparatus for measuring transfer characteristics of a semiconductor device A method and apparatus is provided for measuring alternating current (AC) and direct current (DC) characteristics of a plurality of semiconductor devices. A ring oscillator generates pulses to drive the plurality of semiconductor devices under test. Current/Voltage ... | 02/13/2007 |
| 7170297 | Transmission response measurement system and method of using time gating A method and a measurement system determine a transmission response of a device under test (DUT). The method includes measuring a reflection response from a first port of the DUT while a known reflective termination is on a second port of the DUT, and time gating th... | 01/30/2007 |
| 7145347 | Method and apparatus for measuring transfer characteristics of a semiconductor device A method and apparatus for measuring alternating current (AC) and direct current (DC) characteristics of a plurality of semiconductor devices. A ring oscillator generates pulses to drive the plurality of semiconductor devices under test. Current/Voltage (IV) and tra... | 12/05/2006 |
| 7113879 | Using vector network analyzer for aligning of time domain data A method of using a vector network analyzer (VNA) for coordinated Voltage Standing-Wave Ratio (VSWR) and Time Domain Reflectometry (TDR) measurement includes configuring the VNA for identifying discontinuities correlated to a VSWR lobe. In some embodiments, the meth... | 09/26/2006 |
| 7098670 | Method and system of characterizing a device under test A system and method of characterizing a device under test wherein a signal is injected into the device under test, the response to the injected signal is measured to determine the impedance of the device under test in the frequency domain, the impedance is converted... | 08/29/2006 |
| 7084615 | Performance measurement of device dedicated to phase locked loop using second order system approximation A method, system and program product to measure performance of a device dedicated to a phase locked loop (PLL). A resistor-inductor-capacitor (RLC) model is produced to simulate the PLL. The RLC model and the device to be measured are mapped together into a test cir... | 08/01/2006 |
| 7061219 | Independent measurement of complicated transfer functions A first test signal from a test signal source is provided to a spectrum analyzer to produce first measurement data. The test signal source is expressed by a first transfer function G(w) and the spectrum analyzer is expressed by second transfer function F(w). A secon... | 06/13/2006 |
| 7058528 | Automated optimization of asymmetric waveform generator LC tuning electronics Disclosed is method of controlling an asymmetric waveform generator including the steps of providing a reference timer signal, and generating an asymmetric waveform as a combination of a first sinusoidal wave having a first frequency and a second sinusoidal wave hav... | 06/06/2006 |
| 7046014 | ATE measurement technique for comparator threshold voltage A system and a method for testing a comparator include generating two triangular waveform segments having the same period and different amplitudes, inputting the two triangular waveform segments into a comparator, receiving an output of the comparator, and calculati... | 05/16/2006 |
| 7042232 | Cable and substrate compensating custom resistor A compensating resistor includes a substrate with a first termination at one end and a second termination at the other end. A frontside resistor is on the frontside of the substrate and extends between the first termination and the second termination. A backside res... | 05/09/2006 |
| 7007252 | Method and apparatus for characterizing the propagation of noise through a cell in an integrated circuit One embodiment of the invention provides a system that characterizes cells within an integrated circuit. During operation, the system obtains a number of input noise signals to be applied to the cell. The system then simulates responses of the cell to each of the in... | 02/28/2006 |
| 7002357 | Method and apparatus for phase calculation from attenuation values using a Hilbert transform for FDR measurements The invention concerns a method and a device for phase calculation from attenuation values using a Hilbert transform for reflectometric measurements in the frequency domain. The invention is characterized in that the measuring system comprises a signal source for a ... | 02/21/2006 |
| 6911827 | System and method of measuring low impedances A method comprises generating first and second current levels and measuring the first and second current levels. The method further comprises alternately generating the first and second current levels repeatedly to generate a periodic current waveform, and measuring... | 06/28/2005 |
| 6844741 | Method and system for electrical length matching According to one embodiment of the invention, a computerized method for tuning a wire to have a particular electrical length is provided. The method includes providing a reference wire and the wire to be tuned. The method also includes transmitting a reference signa... | 01/18/2005 |
| 6653848 | Method and apparatus for linear characterization of multi-terminal single-ended or balanced devices A method and apparatus for characterizing a device under test ("DUT") calibrates a multiport test set and measures S-parameters [S] of the DUT. The method and apparatus further involves determining elements of a scalar orthogonal matrix [M] corresponding ... | 11/25/2003 |
| 6529012 | Arrangement for determining the complex transmission function of a measuring device With a view to determining the complex transfer function of a measuring instrument, a line spectrum is fed in from a pulse generator which, for example, is constituted by a step-recovery diode, and the digitized output signal arising at the output of the ... | 03/04/2003 |
| 6518741 | Modulation analyzing apparatus with balance/imbalance converter An inversion in-phase component and a non-inversion in-phase component of a modulation signal inputted from a quadrature modulation section of a sample machine captured in a pair of signal lines, and an inversion quadrature component and a non-inversion q... | 02/11/2003 |
| 6516291 | RMS-to-DC converter with fault detection and recovery A circuit that provides the root-mean-square (RMS) value of an input signal and that detects and independently recovers from an output fault condition is provided. The circuit includes reconfigurable circuitry that changes from normal operating mode to fa... | 02/04/2003 |
| 6515486 | Method and structure to determine low threshold voltage and high threshold voltage A method is provided for quickly determining low threshold voltages and high threshold voltages of a test circuit. Specifically, a transformed voltage transfer curve for the test circuit is generated. The maximum and minimum points of the transfer circuit... | 02/04/2003 |
| 6459278 | Method for characterizing delay of frequency translation devices Absolute delay of a FTD is characterized by applying a stimulus signal to a first port of the FTD. A second port of the FTD is coupled to a delay element having a known delay and a reflective termination. A drive signal is applied to a third port of the F... | 10/01/2002 |
| 6411101 | Method and apparatus for testing frequency-dependent electrical circuits Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a ran... | 06/25/2002 |
| 6392398 | Sampling function generator A sampling function generator capable of providing continuous output corresponding to a sampling function. The sampling function generator 1 comprises a B spline function generation circuit 10, delay circuits 12 and 14, inverting amplifiers 16 and 18, and... | 05/21/2002 |
| 6362631 | Method for characterizing delay of frequency translation devices Absolute delay of a FTD is characterized by applying a stimulus signal to a first port of the FTD. A second port of the FTD is coupled to a delay element having a known delay and a reflective termination. A drive signal is applied to a third port of the F... | 03/26/2002 |
| 6331779 | Method and apparatus for testing frequency-dependent electrical circuits Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a ran... | 12/18/2001 |
| 6326793 | Method and apparatus for testing frequency-dependent electrical circuits Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a ran... | 12/04/2001 |
| 6292000 | Process for harmonic measurement with enhanced phase accuracy A method for determining the harmonic phase response .angle.POx of a device under test (DUT) is performed on a vector network analyzer (VNA). The phase .angle.GN1 of the transfer response GN1 of the DUT at the fundamental frequency is determined from VNA ... | 09/18/2001 |
| 6269318 | Method for determining transducer linear operational parameters An apparatus and method for determining a transducers principle operating parameters which utilizes two transfer functions; 1) the transfer function from the pressure response (50) to the voltage drop across the transducer (60); and 2) the transfer functi... | 07/31/2001 |
| 6252411 | Method and apparatus for testing frequency-dependent electrical circuits Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a ran... | 06/26/2001 |
| 6232760 | Method for determining and compensating the transmission function of a measurement apparatus, in particular of a spectrum analyzer For determination of the transmission function of a measurement apparatus, in particular of a spectrum analyzer, a calibration signal, modulated with a modulation signed such that a line spectrum arises within the frequency band of interest is provided in... | 05/15/2001 |
| 6227033 | Auto-calibration method for a wide range exhaust gas oxygen sensor An improved fuel control in which the transfer function of a wide-range exhaust gas oxygen sensor is automatically and periodically learned or re-learned in the course of vehicle operation. The oxygen sensor is calibrated at two different operating condit... | 05/08/2001 |
| 6211663 | Baseband time-domain waveform measurement method A time-domain baseband measurement method measures modulated microwave signals typically used in communication systems by converting microwave signals to baseband before measurement for improved accuracy compared to direct measurement at the microwave fre... | 04/03/2001 |
| 6121778 | Method and apparatus for testing frequency-dependent electrical circuits Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a ran... | 09/19/2000 |
| 6097194 | Method and apparatus for obtaining transfer characteristics of a device under test The invention relates to a time domain method for obtaining transfer characteristics of a device under test (DUT). The method comprises the steps of applying a sine sweep and a cosine sweep to an input of the DUT, and measuring response signals at an outp... | 08/01/2000 |
