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Patent No. 6266829

Combination Beverage Container and Spittoon

A combination beverage container and spittoon includes a bottom portion including outer wall and a first inner wall defining a spittoon space.

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Class 324/612 - Parameter related to the reproduction or fidelity of a signal affected by a circuit under test


Subclass of Class 324 - Electricity: measuring and testing
Definition: Subject matter wherein the parameter relates to the accuracy
No. of patents: 72
Last issue date: 03/20/2012


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NumberTitleIssue Date
8138767Transmissivity monitoring of an energy transmission element
A method for monitoring transmissivity of an energy transmission element for a protective earth conductor and an electrical machine with such transmissivity monitoring are provided. For a cost-effective solution for transmissivity monitoring, the protective earth co...
03/20/2012
7808251Method and apparatus for determining an interfering field strength in an aircraft
The disclosed embodiments relates to a method and an apparatus for determining the interfering field strength in an aircraft and the impairment of an electric system in the aircraft including cables between the outer shell and the interior panelling of the fuselage ...
10/05/2010
7405574Signal detector
A signal suppression filter (22) that inhibits high-frequency signals contained in power voltage and a signal separation filter (23) that prevents transmission of the high-frequency signals are provided in series on power lines (21A), (21...
07/29/2008
7385383Methods and systems for determining efficacy of stress protection circuitry
Methods and systems are provided for determining efficacy of stress protection circuitry. The methods and systems employ a ring oscillator that models at least one parameter of a functional circuit to be protected by the stress protection circuit. A stress signal is...
06/10/2008
7333051Methods and devices for determining the linearity of signals
A method (for example, machine-implemented, e.g., via a receiver), for determining whether a transmitted pulsed-signal is a linear or non-linear frequency modulated (FM) signal, includes: iteratively determining upper and lower bound slopes associated with frequency...
02/19/2008
7260507Method for improving the performance accuracy in differential absorption lidar for oil and gas pipeline leak detection and quantification
An improved method for determining whether a measurement point, measured using a differential absorption LIDAR (DIAL) system, represents a plume point or a non-plume point. Concentration path lengths (CPL's) for a plurality of measurement points are determined. An a...
08/21/2007
7221347Apparatus and method to improve a response speed of an LCD
An apparatus and method thereof to improve a response speed of an LCD includes a noise rejection unit and a comparator. The noise rejection unit rejects noise in current digital image data and previous digital image data at a same pixel position as in the current di...
05/22/2007
7205782Scanned impedance imaging system method and apparatus
The resolution and contrast of impedance measurements and scans are improved by using a non-contact impedance probe comprising an inner conductor configured to bear a measurement signal and an outer conductor configured to bear a shielding signal. The measurement si...
04/17/2007
7173434Method for determining the RF shielding effectiveness of a shielding structure
Determining the RF shielding effectiveness of a shielding structure including measuring RF isolation between a first and a second element of a directional coupler and providing a first measurement result, placing a shielding structure so that a part of the shielding...
02/06/2007
7170467Antenna couplers and method of production
A method of producing an antenna coupler for placement on an antenna under test (AUT) having an aperture. This method includes the steps of constructing a probe from a section of RF hard-line stock having a center conductor and an outer conductor. The outer conducto...
01/30/2007
7123023Method and device for measuring intermodulation distortion
A measuring device is provided for measuring intermodulation distortion of a measuring object. The measuring device includes a first signal generator which produces a first signal that is supplied to an input of a measuring object, a signal combining device having a...
10/17/2006
7119549Output calibrator with dynamic precision
An integrated circuit device having an output driver circuit and a control circuit. The output driver circuit outputs a first signal having a signal level according to a control value. The control circuit is coupled to receive the first signal from the output driver...
10/10/2006
7109931Method and apparatus to control an antenna efficiency test device
The present invention provides a method to measure antenna efficiency using the cavity method. In particular, the present invention provides a tunable cavity that can be tuned to avoid the anti resonance and antenna-cavity coupling problems. In particular, tuning pr...
09/19/2006
7109932Antenna efficiency test device
The present invention provides, an antenna test device to test antenna efficiency. The test device includes a cavity formed by at least one conductive sidewall. The cavity contains at least one tuning probe, at least one movable portion, or a combination thereof. Th...
09/19/2006
7068049Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration
A method of measuring a DUT provides a vector network analyzer with at least two measurement ports and measures characteristics of thru, reflect, and line calibration standards at the measurement ports. Error coefficients are calculated as well as a shifted electric...
06/27/2006
7038605Apparatus and method for measuring noise, and recording medium
A noise measuring unit 24 measures a noise power based on an output from a digitizer 16 and the amplification factor of a limiter amplifier 12 when an output from a device under test 10 is supplied for the digitizer 16 through the ...
05/02/2006
7002335Method for measuring a three-port device using a two-port vector network analyzer
A method for vector characterization of a frequency translation device (“FTD”) includes coupling a first signal from a first signal source through a reference directional coupler and through a test directional coupler of an electronic test set to a first port of...
02/21/2006
6998833System and method for determining S-parameters using a load
A system and method can be utilized to determine S-parameters of a network. In one embodiment a system includes an S-parameter calculator that computes the S-parameters of the network based on waveform parameters determined from single port measurements. At least on...
02/14/2006
6998850Systems and methods for measuring picoampere current levels
In one embodiment, a circuit measures picoampere current levels. The circuit comprises: an operational-amplifier that has differential inputs and differential outputs; a switching structure that switchably couples an input line to one of the differential inputs in r...
02/14/2006
6959250Method of analyzing electromagnetic interference
In contrast with a known dynamic gate-level simulation method, a method of analyzing electromagnetic interference (an EMI analysis method) according to the present invention enables estimation of EMI noise, by means of calculating signal propagation of each node thr...
10/25/2005
6937032Method, apparatus, and article of manufacture for characterizing a device and predicting electrical behavior of the device in a circuit
A method, apparatus and article of manufacture to aid in the characterization of a device establishes a device S-parameter matrix (SD) to represent electrical behavior of the device, an adapter T-parameter matrix (Ta) to represent all possible ...
08/30/2005
6933731Method and system for determining transistor degradation mechanisms
According to one embodiment, a method for isolating degradation mechanisms in transistors includes providing a ring oscillator having a plurality of delay elements. Each delay element operates as a delay element through the use of one or more transistors of only a f...
08/23/2005
6927580Detection of a variation in the environment of an integrated circuit
A method and a circuit for detecting variations of at least one environmental parameter of an integrated circuit, including evaluating a propagation delay of an edge in delay elements sensitive to variations of the environmental parameter, and comparing the present ...
08/09/2005
6922439Apparatus for and method of measuring jitter
A signal under measurement x(t) is transformed into a complex analytic signal zc(t), and an instantaneous phase of the xc(t) is estimated using the zc(t). A linear phase is removed from the instantaneous phase to obtain a phase noise...
07/26/2005
6914944Method and system for testing the functioning of a testing algorithm in a data transmission apparatus
The invention pertains in general to the testing of the operation of radio and other data transmission apparatus. In particular the invention pertains to the testing of the operation of a digital radio apparatus on the basis of error statistics. In order to test fun...
07/05/2005
6853197Method and apparatus for insuring integrity of a connectorized antenna
An antenna is provided with an electronic component or circuit that has a value corresponding to properties of the antenna. A read mechanism reads the value and sets an operational status of a transceiver based on the value. In one embodiment, electronic component i...
02/08/2005
6795788Method and apparatus for discovery of operational boundaries for shmoo tests
Method and apparatus for discovery of operational boundaries for shmoo tests. Specifically, a method of testing operational boundaries is described in one embodiment of the present invention. The method discloses the discovery of an operational range for a hardware ...
09/21/2004
6744262Method, apparatus, and article of manufacture for characterizing a device and predicting electrical behavior of the device in a circuit
A method, apparatus and article of manufacture to aid in the characterization of a device establishes a device S-parameter matrix (SD) to represent electrical behavior of the device, an adapter T-parameter matrix (Ta) to represent all possible ...
06/01/2004
6693439Apparatus and methods for measuring noise in a device
An exemplary system for measuring noise in a device comprises a CPU, a memory coupled to the CPU, an interface coupled to the CPU for providing instructions processed by the CPU, a control unit coupled to the interface for receiving the instructions, a pr...
02/17/2004
6597184Method and apparatus for electromagnetic emissions testing
The likelihood of a system complying with EMC regulations is determined for a system comprised equipment units which individually radiate electromagnetic emissions. The intensity contribution of the electric field from each of the equipment units is calcu...
07/22/2003
6539344Method and apparatus for extracting parameters for an electrical structure
A parameter extraction technique for an electrical structure is based on a definition of network parameters that isolates pure mode responses of the electrical structure, and that makes mode conversion responses of the electrical structure negligible. A s...
03/25/2003
6538453Detecting erratic resistance in temperature sensors
In a reproduction apparatus having a logic and control unit, and a fuser assembly including a heated fuser roller and a sensor for sensing the temperature of such fuser roller by utilizing heat to change sensor resistance to provide an electrical signal c...
03/25/2003
6525657Apparatus and method for production testing of the RF performance of wireless communications devices
A radio frequency (RF) multi-testing apparatus and method for rapid (e.g. production line) testing of a wireless communications device for operational adherence of the device to a pre-determined reference specification defining specific absorption rate (S...
02/25/2003
6515549Semiconductor device having critical path connected by feedback ring oscillator
In a semiconductor integrated circuit, a selector 1 selects a signal FB at the input thereof by giving a proper level to a signal EN. By setting two-phase scan clocks SC1, SC2 of F/F 2,4 so that F/F 2,4 are set to the through state, a signal can be passed...
02/04/2003
6448787Apparatus and method for measuring and tuning circularly polarized antennas
An apparatus and method is disclosed for measuring and tuning circularly polarized antennas to simultaneously optimize axial ratio, resonant frequency, and impedance match. The antenna under test is mounted within the test apparatus. Located in the zenith...
09/10/2002
6437761Monitor status information storage and display
A method for storing status information prior to shutdown of a video monitor due to a failure. An indication of an operational parameter is obtained. Based on the indication, it is determined if the failure occurs warranting shutdown. If the failure occur...
08/20/2002
6411101Method and apparatus for testing frequency-dependent electrical circuits
Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a ran...
06/25/2002
6331779Method and apparatus for testing frequency-dependent electrical circuits
Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a ran...
12/18/2001
6326793Method and apparatus for testing frequency-dependent electrical circuits
Electrical filter circuits are tested by connecting to the filter inputs without the need to connect to the filter outputs or to disconnect the outputs from a load. A signal generator of known source resistance applies a.c. signals successively over a ran...
12/04/2001
6263463Timing adjustment circuit for semiconductor test system
A timing adjustment circuit is used for a semiconductor test system having a plurality of test stations for testing a plurality of semiconductor devices in parallel at the same time. The timing adjustment circuit includes a wave formatter for commonly pro...
07/17/2001
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