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| Number | Title | Issue Date |
| 8089286 | System and method for quantum computer calibration and performance estimation A system and method for characterizing noise in a quantum system includes determining pulse sequences for unitary twirling operations. Twirling processes are applied to a quantum system to calibrate errors and to determine channel parameters. Noise characteristics a... | 01/03/2012 |
| 8076946 | Leakage calibration An integrated circuit and a method for efficiently operating integrated circuit devices. The integrated circuit includes an input that is configured to receive a first current which is representative of a leakage current drawn by leakage in a portion of the integrat... | 12/13/2011 |
| 8076945 | Autosensitive detector and measurement system This disclosure relates to an autosensitive detector and an autosensitive measurement system with a self-adjustable set-off value, and more specifically, to a probe for adaptation to an environmental parameter such as liquids adapted to reset its measured sensitivit... | 12/13/2011 |
| 8076947 | Device, method, program, and recording medium for error factor determination, and output correction device and reflection coefficient measurement device provided with the device An error factor determination device includes an error factor recording unit which records error factors Eija in a signal generation system which includes a signal generation unit for generating a signal and an output terminal for outputting the signal, a reflection... | 12/13/2011 |
| 8044668 | Method and system for calibrating measurement tools for semiconductor device manufacturing A method and system for calibrating a plurality of measurement systems. The method includes obtaining a first plurality of calibration standards. The first plurality of calibration standards is associated with a plurality of predetermined values. Additionally, the m... | 10/25/2011 |
| 8008933 | System and method for baseband calibration A system includes at least one of a first generator, at least two of a second generator, and a load board. The at least one of a first generator one of receives and transmits analog signals. The at least two of a second generator one of receives and transmits digita... | 08/30/2011 |
| 7994801 | Calibrated S-parameter measurements of a high impedance probe A new methodology for the measurement of the S-parameters of a high impedance probe allows obtaining a full two port S-parameter set for the high impedance probe. The measured probe S-parameters are then used for characterization of probes. An alternative method cha... | 08/09/2011 |
| 7994800 | Systems and methods for online phase calibration A system for online relative phase calibration is provided. The system includes at least one excitation source configured to generate multiple excitation signals. The system also includes at least two sensors coupled to respective ones of the at least one excitation... | 08/09/2011 |
| 7986150 | Calibration circuit To include a first replica buffer that has substantially the same circuit configuration as a pull-up circuit which constitutes an output buffer and a second replica buffer that has substantially the same circuit configuration as a pull-down circuit which constitutes... | 07/26/2011 |
| 7973539 | Methods for measuring dielectric properties of parts A method is disclosed for calibrating a capacitance of an apparatus for measuring dielectric properties of a part. The apparatus includes an electrically grounded chamber, a lower electrode disposed within the chamber and connected to a radiofrequency (RF) transmiss... | 07/05/2011 |
| 7924024 | Automatic calibration techniques with improved accuracy and lower complexity for high frequency vector network analyzers A calibration module, for use in calibrating a VNA, includes ports connectable to the VNA, calibration standards, and single pole multi throw (SPMT) switches. Each SPMT includes a single pole terminal, multiple throw terminals and a shunt terminal corresponding to e... | 04/12/2011 |
| 7888949 | Electrical tester setup and calibration device An electronic testing machine includes a plurality of test modules. Each test module has a plurality of contact pairs for testing electronic components. An apparatus and process for electrical test setup and calibration of the electronic testing machine includes a p... | 02/15/2011 |
| 7888948 | Controlling an analog signal in an integrated circuit A method of controlling an analog signal in an integrated circuit includes generating a first control signal having a first predetermined duration within the integrated circuit. The first control signal is configured to cause the analog signal to have a first signal... | 02/15/2011 |
| 7884619 | Method and apparatus for minimizing skew between signals Delay associated with each of two signals along respective transmission paths is accurately measured using a delay measurement circuit that is fabricated in situ on the actual device where the circuitry for propagating the two signals is fabricated. Thus, the measur... | 02/08/2011 |
| 7859270 | Method for correcting differential output mismatch in a passive CMOS mixer circuit A passive CMOS differential mixer circuit with a mismatch correction circuit for balancing the electrical characteristics of the two output paths. Once the output paths of the differential circuit are balanced, or matched as closely as possible, second order intermo... | 12/28/2010 |
| 7834641 | Phase-gain calibration of impedance/admittance meter A method for calibrating an impedance/admittance meter for measurements of a DUT includes measuring a pure capacitance at a desired frequency; using the capacitance measurement to establish the phase response of the meter; measuring the admittance value of a resisto... | 11/16/2010 |
| 7821272 | Method for calibrating an electrostatic discharge tester The present disclosure relates to a method for calibrating transient behaviour of an electrostatic discharge (ESD) test system. The system includes an ESD pulse generator and probe needles for applying a predetermined pulse on a device under test. The probe needles ... | 10/26/2010 |
| 7786737 | Modeling and calibrating a three-port time-domain reflectometry system A three-port TDR front end comprises numerous components. An exemplary three-port TDR front end is a DSL modem. Information-bearing TDR signals are distorted as they pass through these components. With a perfect model of the response of its front-end, a TDR system u... | 08/31/2010 |
| 7782065 | Method of calibrating a network analyzer A method for calibrating a network analyzer having at least two test ports is described in which a completely known, transmitting first calibration standard, is designed as a two-port standard and is connected between two test ports of the network analyzer, is measu... | 08/24/2010 |
| 7777497 | Method and system for tracking scattering parameter test system calibration Embodiments describe methods of correcting S-parameter measurements for a DUT. The method includes coupling at least one tracking module associated with a set of electrical standards to a S-parameter measurement device to form a test system. An initial calibration f... | 08/17/2010 |
| 7768271 | Method for calibration of a vectorial network analyzer having more than two ports Method for calibrating a vectorial network analyzer, with n measurement ports (n>2) and at least m measurement sites, where m>n+1 includes measurement of three different n-port reflection standards, connected between measurement ports in any desired order, and succe... | 08/03/2010 |
| 7759944 | Method for verifying the calibration of a multiport network analyzer and corresponding calibration unit The described method and calibration unit are used to verify the calibration of a multiport network analyzer which uses a calibration unit for calibration, the unit having a plurality of calibration ports corresponding to the number of measuring ports of the network... | 07/20/2010 |
| 7755366 | Calibration circuit, semiconductor device including the same, and method of adjusting output characteristics of semiconductor device A calibration circuit includes: a replica buffer that drives a calibration terminal ZQ; a reference voltage generating circuit that generates a reference voltage VMID; a comparing circuit that compares a voltage appearing in the calibration terminal ZQ with the refe... | 07/13/2010 |
| 7741855 | Calibration circuit for resistance component A calibration circuit including a plurality of first resistance components, a plurality of second resistance components, and a first feedback system is provided. The first feedback system selects M1 first resistance components and N1 second res... | 06/22/2010 |
| 7723999 | Calibration structures for differential signal probing A plurality of calibration structures facilitate calibration of a probing system that includes a differential signal probe having a linear array of probe tips. ... | 05/25/2010 |
| 7705608 | Calibrating a light-sensitive chip A method for use with a light-sensitive integrated circuit includes applying different wavelengths of light to the integrated circuit to produce output signals in response to the different wavelengths of light, measuring the output signals to obtain measured values,... | 04/27/2010 |
| 7701227 | High precision voltage source for electrical impedance tomography An EIT system includes a plurality of voltage sources for supplying a corresponding plurality of voltages to a corresponding number of other structures, voltage source calibration means for calibrating each voltage source, and switching means for individually connec... | 04/20/2010 |
| 7652484 | Self calibration apparatus and methods In one method of calibrating an instrument having N ports, where N>=2, cables of a first type are characterized by connecting a first cable between two of the ports; performing an “unknown-thru” full two-port calibration between the two ports; obtaining a S-para... | 01/26/2010 |
| 7649364 | Circuit comprising a MOS transistor and a control circuit for the MOS transistor A circuit includes a MOS transistor having a control electrode and a control capacitance, and including a control circuit for the MOS transistor. The control circuit includes an input to supply a control signal and an output to supply a drive signal, the output bein... | 01/19/2010 |
| 7649363 | Method and apparatus for a voltage/current probe test arrangements A diagnostic tool for performing electrical measurements to calibrate a plasma processing chamber probe is provided. The diagnostic tool includes an RF generator. The diagnostic tool also includes a first impedance circuit. The first impedance circuit is a voltage-l... | 01/19/2010 |
| 7616007 | Device, method, program, and recording medium for error factor measurement, and output correction device and reflection coefficient measurement device provided with the device for error factor measurement There is provided an error factor measurement device for measuring an error factor in a switch branch signal source including a signal source and a switch, and the error factor measurement device includes a reference error factor component recording unit which recor... | 11/10/2009 |
| 7595645 | Calibration circuit and semiconductor device incorporating the same Impedance adjusting transistors are once inactivated on every occasion of changing an impedance adjusting code. After restoring the potential to an initially set potential by once inactivating the impedance adjusting transistors, the state of the transistors is swit... | 09/29/2009 |
| 7545150 | Differential vector network analyzer A measurement and correction method provides for a complete full correction of a true-mode system using only the single ended error matrix developed for 4 port correction of single ended measurements. The degree of misalignment of the balanced sources may be determi... | 06/09/2009 |
| 7545151 | Characterizing test fixtures Provided herein are techniques for characterizing a test fixture that is used for connecting a device under test (DUT) to a vector network analyzer (VNA), e.g., to thereby enable de-embedding of the test fixture from measurements of the DUT connected to the test fix... | 06/09/2009 |
| 7532014 | LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers A method and apparatus for radio frequency vector calibration of s-parameter measurements to the tips of the wafer probe needles of an automatic test equipment production tester. The method involves a modified Line-Reflect-Line (LRL) calibration routine that uses a ... | 05/12/2009 |
| 7518378 | Cable compensation for pulsed I-V measurements The errors related to the resistance of test conductors and sense/load resistances for a pulse I-V measurement system are determined by making open circuit and through circuit measurements using a combination of DC and pulse instrument measurements. ... | 04/14/2009 |
| 7495453 | Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit To decrease the circuit scale necessary for the calibration of the output circuit and to decrease the time required for the calibration operation. The invention includes a first output buffer and a second output buffer that are connected to a data pin, and a calibra... | 02/24/2009 |
| 7486085 | Calibration circuit for resistance component A calibration circuit including a plurality of first resistance components, a plurality of second resistance components, and a first feedback system is provided. The first feedback system selects M1 first resistance components and N1 second res... | 02/03/2009 |
| 7444268 | Method and apparatus for identifying a drift in a quantized signal in a computer system One embodiment of the present invention provides a system that identifies a drift in a signal in a computer system. During operation, the system receives a sequence of quantized signal values of the signal. Next, the system generates a statistical distribution based... | 10/28/2008 |
| 7439748 | Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics A signal conductor whose first end is an open end, and a ground conductor are connected to associated measurement ports of a network analyzer. A short standard is connected between the signal conductor and the ground conductor at least three points in the longitudin... | 10/21/2008 |
