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| Number | Title | Issue Date |
| 8093908 | Method and apparatus for measuring electrical impedance of thin fluid films According to typical inventive practice, the relative positioning of two press members is mechanically adjustable so that their respective flat surfaces remain parallel at selectively closer or further distances apart. During immersion or partial immersion of the tw... | 01/10/2012 |
| 7915900 | Measuring system A measuring system measuring an impedance of an object to be measured, including an impedance measuring instrument; a casing formed of a grounded conductor and capable of locating the object to be measured therein; and a radially-shaped electrode connected to the im... | 03/29/2011 |
| 7884618 | Testing system for electricity safety and a testing method therefor A system for testing the safety of electricity includes steps as following. First step is inserting a testing apparatus into a socket of utility power. Second step is providing a first amplifier and rectifier unit for measuring a first voltage wave as no-loading. Th... | 02/08/2011 |
| 7855564 | Acoustic wave device physical parameter sensor An acoustic wave sensor employs an electromagnetic device (EMD) to transduce and amplify the response of an impedance element to a physical measurand. A measurand is defined as a physical parameter being quantified by measurement. One embodiment uses a magnetic fiel... | 12/21/2010 |
| 7619419 | Wideband active-passive differential signal probe A wideband differential signal probe includes separate paths to convert a lower frequency component and a higher frequency component of a differential signal to a lower frequency single ended signal and a higher frequency single ended signal which are combined for t... | 11/17/2009 |
| 7554337 | Semiconductor device, method of authentifying and system The semiconductor device of the invention includes a circuit and a protecting structure. It is provided with a first and a second security element and with an input and an output. The security elements have a first and a second impedance, respectively, which impedan... | 06/30/2009 |
| 7463039 | Probe for electrical measurement methods, especially eddy current measurements When using a rigid substrate eddy current probe to measure a non-planer test piece, the probe must be adapted to the test piece shape in order to avoid incorrect measurement values. Disclosed is a probe which is configured in a flexible manner via a flexible substra... | 12/09/2008 |
| 7443310 | Remote sensor network system with redundancy A multi-sensor network having a plurality of receivers and sensors connected to a common communication line is provided. A controller will activate one of the plurality of receivers, thereby allowing one of the plurality of sensors to transmit data to the communicat... | 10/28/2008 |
| 7412359 | Mutual immittance calculation program, mutual immittance calculation apparatus and method, and electromagnetic-field strength calculation program In a mutual immittance calculation apparatus, an input section inputs data of a model of an electric circuit apparatus, being a target for analysis of the electromagnetic-field strength and being divided into a plurality of patches. A mutual immittance calculation s... | 08/12/2008 |
| 7412346 | Real-time temperture detection during test Apparatuses, methods, and systems associated with and/or having components capable of, detecting a temperature of an integrated circuit in real time during testing are disclosed herein. In exemplary embodiments, an integrated circuit includes a register to store a t... | 08/12/2008 |
| 7397252 | Measurement of critical dimension and quantification of electron beam size at real time using electron beam induced current A method for accurately measuring feature sizes and quantifying the beam spot size in a CDSEM at real time is provided. The inventive method is based on a scanning microscope and it works on both conductive and non-conductive features. The measurement of conductive ... | 07/08/2008 |
| 7391221 | On-die impedance calibration One exemplary device has a plurality of leads with termination impedances, and a standard impedance. Among the termination impedances are master impedances arranged to be calibrated by comparison with the standard impedance and slave impedances arranged to be calibr... | 06/24/2008 |
| 7383141 | Faraday system integrity determination A system, method and program product for determining the integrity of a faraday system are disclosed. The invention uses a computer infrastructure to control an automatic determination of a faraday system integrity, when the faraday system is not in operation. The d... | 06/03/2008 |
| 7379016 | Carrier phase detection system for radar sensors A pulse detection system for expanded time radar, laser and TDR sensors detects specific cycles within bursts of cycles. A sensor transmits and receives short bursts of RF cycles. A transmit pulse detector triggers on a selected cycle of the detected transmit burst ... | 05/27/2008 |
| 7352166 | Resistance ratio digitizing ohmmeter system A digitizing ohmmeter system for providing a digital resistance ratio measurement includes a high impedance current source providing a DC excitation current to an impedance-varying input sensor and a reference resistor and an ADC circuit including a charge-balancing... | 04/01/2008 |
| 7349526 | Methods for testing cable pairs in a telecommunications network Methods are disclosed for testing cable pairs in a telecommunications network. One method connects a test line to a telecommunications switch. The test line is connected to an inactive cable pair. The inactive cable pair has no telecommunications service established... | 03/25/2008 |
| 7340437 | Circuit configuration and method for identifying error situations in interconnected systems The circuit configuration according to the invention comprises an electrical signal line loop, several partial systems connected thereto, which evaluate the state of the signal line loop, wherein a first selectable switching means is looped in between a first end of... | 03/04/2008 |
| 7296103 | Method and system for dynamically selecting wafer lots for metrology processing The present invention is generally directed to various methods and systems for dynamically controlling metrology work in progress. In one illustrative embodiment, the method comprises providing a metrology control unit that is adapted to control metrology work flow ... | 11/13/2007 |
| 7292047 | High-frequency power source A high-frequency power source supplies high-frequency power to a load whose reflection characteristic for the power varies with time. The power source includes a frequency-variable power generator, a power detector for detecting the power into the load and the power... | 11/06/2007 |
| 7289878 | Apparatus and method for modifying operation of an electric gun driver A method and apparatus for providing adjustment of current-related dispensing parameters in an electric dispensing gun. A control circuit receives user-selected inputs corresponding to dispensing parameters of the gun and converts those inputs into digital signals. ... | 10/30/2007 |
| 7276206 | Electrical field stimulation of eukaryotic cells Methods of identifying activators and inhibitors of voltage-gated ion channels are provided in which the methods employ electrical field stimulation of the cells in order to manipulate the open/close state transition of the voltage-gated ion channels. This allows fo... | 10/02/2007 |
| 7274921 | AM data recovery circuit The present invention provides a passive RFID chip with on-chip charge pumps for generating electrical power for the chip from radio frequencies. The passive RFID chip comprises an analog portion and a digital portion. The analog portion primarily comprises a voltag... | 09/25/2007 |
| 7256585 | Match-corrected power measurements with a vector network analyzer A network analysis system and methods facilitate a match-corrected signal power measurement using a vector network analyzer (VNA). The network analysis system includes the VNA and a computer program stored in memory and executed by a controller. The computer program... | 08/14/2007 |
| 7252009 | System and method for pressure measurement A system and method for pressure measurement may include the ability to readily produce a pressure measurement system. In one general aspect, a process for producing a pressure measurement system includes providing an assembly including a stem, a pressure detector, ... | 08/07/2007 |
| 7235981 | Impedance conversion circuit and integrated circuit including thereof An impedance conversion circuit including: a first voltage-to-current converter and a second voltage-to-current converter supplied with differential input signal voltages; an inverting amplifier; and a third voltage-to-current converter for feedback; wherein a first... | 06/26/2007 |
| 7230494 | Method and apparatus for an LNA with high linearity and improved gain control A method of amplifying an input signal comprises providing a semiconductor die, forming an LNA input stage having a transconductance, on the semiconductor die, and desensitizing the LNA input stage transconductance to variations in process and environmental conditio... | 06/12/2007 |
| 7225754 | Plasma processing apparatus including a plurality of plasma processing units having reduced variation A plasma processing apparatus comprising a plurality of plasma processing units is provided. Each of the plasma processing units has a matching circuit connected between a radiofrequency generator and a plasma excitation electrode. Among these plasma processing unit... | 06/05/2007 |
| 7222034 | In-circuit measurement of saturation flux density Bsat, coercivity Hc, and permiability of magnetic components using a digital storage oscilloscope An oscilloscope performs an in-circuit measurement of voltage across, and current through, a core winding of an inductor, and derives the actual B and H values with n number of turns, receives data indicative of the magnetic length of the circuit, and plots the B_H ... | 05/22/2007 |
| 7208094 | Methods of bridging lateral nanowires and device using same A semiconductor nanowire is grown laterally. A method of growing the nanowire forms a vertical surface on a substrate, and activates the vertical surface with a nanoparticle catalyst. A method of laterally bridging the nanowire grows the nanowire from the activated ... | 04/24/2007 |
| 7200502 | Dual connection power line parameter analysis method and system A method and apparatus is disclosed for determining the power line parameters of a system. Specifically, there is provided a method comprising perturbing a voltage waveform through a first connection, measuring a characteristic of the perturbation through a second c... | 04/03/2007 |
| 7199577 | Characterizing multiple DC supplies decoupling capacitors in PCB by anti-resonant frequencies Methods and systems formulate the impedance for decoupling capacitors of a multiple power supply printed circuit board considering plane capacitance, series resonant frequencies, parallel resonant frequencies and impedance. The impedances are evaluated at anti-reson... | 04/03/2007 |
| 7188038 | Method of determining an electrical capacitance of a circuit component and method of defining a dimension of such a component A method of estimating an electrical capacitance of a circuit component is carried out by decomposing the capacitance into a sum of terms associated with respective contributions from a central part and peripheral parts of the component. A component to which the met... | 03/06/2007 |
| 7161357 | Apparatus for measuring read range between RFID tag and reader Provided is an apparatus for measuring a read range between a tag and a reader, which includes an electromagnetic anechoic chamber formed by connecting at least one unit cell in a row, the unit cell having an electromagnetic wave absorbent provided on an inner wall ... | 01/09/2007 |
| 7155959 | Nanodisk sensor and sensor array The invention provides a sensor array with different nanodisk sensors that may be fabricated by direct site-specific dip-pen nanopatterning (DPN) using precursor inks. The good flow characteristics and strong affinity of the sols to measurement electrodes enable int... | 01/02/2007 |
| 7132678 | Electronic device including a self-assembled monolayer, and a method of fabricating the same An electronic device includes a source region and a drain region, a self-assembled monolayer disposed adjacent to the source region and the drain region, the self-assembled monolayer including at least one conjugated molecule, and a conductive substrate disposed adj... | 11/07/2006 |
| 7129800 | Compensation technique to mitigate aging effects in integrated circuit components A method and apparatus for compensating for age related degradation in the performance of integrated circuits. In one embodiment, the phase-locked loop (PLL) charge pump is provided with multiple legs that can be selectively enabled or disabled to compensate for the... | 10/31/2006 |
| 7109725 | Integrated circuit test probe A method and apparatus for testing integrated circuits by subjecting the circuits to an electromagnetic disturbance. A probe is provided, equipped with a horn cover designed to be applied to a printed circuit on which an integrated circuit is mounted. Within this ho... | 09/19/2006 |
| 7081764 | Interconnection and control of alien cross-talk test signal units An alien cross-talking testing system employs a plurality of alien cross-talk test signal units, an alien cross-talk measurement unit and an interconnection base unit. Each alien cross-talk test signal unit is in electrical communication with a different disturber c... | 07/25/2006 |
| 7081763 | Test system and method for field measurement of alien cross-talk An alien cross-talk method involves a victim cable and one or more disturber cables. The method encompasses a transmission of a RF test signal on each disturber cable between an alien cross-talk test signal unit connected to one end of a disturber cable and another ... | 07/25/2006 |
| 7076321 | Method and system for dynamically adjusting metrology sampling based upon available metrology capacity The present invention is generally directed to various methods and systems for dynamically adjusting metrology sampling based upon available metrology capacity. In one illustrative embodiment, the method comprises providing a metrology control unit that is adapted t... | 07/11/2006 |
